[PATCH] show/show_logs: Add dynamic creation of fwts-test logs
Deborah McLemore
debmc at us.ibm.com
Tue Jul 5 19:34:55 UTC 2016
Hi Colin,
The static log files (which are the two sources which are deleted below)
are already a maintenance item which must be updated with each new test
which is added.
The burden is only moved from updating the 2 static log files which are
then compared to the real output from the show and show all command.
Maybe I am not following the reply, can you elaborate ?
This patch allows the conditional compilation of what goes in the two log
files below.
> delete mode 100644 fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
> delete mode 100644
fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
=====================================
Deb McLemore
IBM OpenPower - IBM Systems
(512) 286 9980
debmc at us.ibm.com
debmc at linux.vnet.ibm.com - (plain text)
=====================================
From: Colin Ian King <colin.king at canonical.com>
To: Deb McLemore <debmc at linux.vnet.ibm.com>,
fwts-devel at lists.ubuntu.com
Date: 07/05/2016 02:16 PM
Subject: Re: [PATCH] show/show_logs: Add dynamic creation of fwts-test
logs
Sent by: fwts-devel-bounces at lists.ubuntu.com
On 05/07/16 20:05, Deb McLemore wrote:
> We added the capability to dynamically create (based on test)
> the content of the log files used to validate the show commands.
> This allows customization of the Makefile.am to optionally
> include objects to be linked.
>
> Signed-off-by: Deb McLemore <debmc at linux.vnet.ibm.com>
> ---
> configure.ac | 2 +
> .../arg-show-tests-0001/arg-show-tests-0001.log | 187 ---
> fwts-test/arg-show-tests-0001/test-0001.sh | 20 +-
> fwts-test/arg-show-tests-0001/test-0002.sh | 26 +-
> .../arg-show-tests-full-0001.log | 930 ------------
> fwts-test/arg-show-tests-full-0001/test-0001.sh | 19 +-
> src/Makefile.am | 1 +
> src/show/show_logs.c | 1480 ++++++++++++++
++++++
> 8 files changed, 1519 insertions(+), 1146 deletions(-)
> delete mode 100644 fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
> delete mode 100644
fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> create mode 100644 src/show/show_logs.c
>
> diff --git a/configure.ac b/configure.ac
> index e3e7512..0f15540 100644
> --- a/configure.ac
> +++ b/configure.ac
> @@ -71,6 +71,8 @@
> ])
> AM_CONDITIONAL([HAVE_LIBFDT],
> [test "x$ac_cv_search_fdt_check_header" !=
"xno"])
> + fwts_srcdir=`readlink -f $srcdir`
> + AC_DEFINE_UNQUOTED([FWTS_SRCDIR],["$fwts_srcdir"], [FWTS
absolute src path])
> AC_FUNC_MALLOC
> AC_FUNC_FORK
> AC_FUNC_LSTAT_FOLLOWS_SLASHED_SYMLINK
> diff --git a/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
b/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
> deleted file mode 100644
> index 1a76b9d..0000000
> --- a/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
> +++ /dev/null
> @@ -1,187 +0,0 @@
> -ACPI tests:
> - acpiinfo General ACPI information test.
> - acpitables ACPI table headers sanity tests.
> - apicinstance Test for single instance of APIC/MADT table.
> - asf ASF! Alert Standard Format Table test.
> - aspt ASPT Table test.
> - bert BERT Boot Error Record Table test.
> - bgrt BGRT Boot Graphics Resource Table test.
> - boot BOOT Table test.
> - checksum ACPI table checksum test.
> - cpep CPEP Corrected Platform Error Polling Table test.
> - csrt CSRT Core System Resource Table test.
> - cstates Processor C state support test.
> - dbg2 DBG2 (Debug Port Table 2) test.
> - dbgp DBGP (Debug Port) Table test.
> - dmar DMA Remapping (VT-d) test.
> - ecdt ECDT Embedded Controller Boot Resources Table test.
> - einj EINJ Error Injection Table test.
> - erst ERST Error Record Serialization Table test.
> - facs FACS Firmware ACPI Control Structure test.
> - fadt FADT Fixed ACPI Description Table tests.
> - fpdt FPDT Firmware Performance Data Table test.
> - gtdt GTDT Generic Timer Description Table test.
> - hest HEST Hardware Error Source Table test.
> - hpet HPET IA-PC High Precision Event Timer Table tests.
> - iort IORT IO Remapping Table test.
> - lpit LPIT Low Power Idle Table test.
> - madt MADT Multiple APIC Description Table (spec compliant).
> - mcfg MCFG PCI Express* memory mapped config space test.
> - mchi MCHI Management Controller Host Interface Table test.
> - method ACPI DSDT Method Semantic tests.
> - msct MSCT Maximum System Characteristics Table test.
> - msdm MSDM Microsoft Data Management Table test.
> - pcc Processor Clocking Control (PCC) test.
> - rsdp RSDP Root System Description Pointer test.
> - rsdt RSDT Root System Description Table test.
> - sbst SBST Smart Battery Specification Table test.
> - slic SLIC Software Licensing Description Table test.
> - slit SLIT System Locality Distance Information test.
> - spcr SPCR Serial Port Console Redirection Table test.
> - spmi SPMI Service Processor Management Interface Description
Table test.
> - srat SRAT System Resource Affinity Table test.
> - stao STAO Status Override Table test.
> - tcpa TCPA Trusted Computing Platform Alliance Capabilities
Table test.
> - tpm2 TPM2 Trusted Platform Module 2 test.
> - uefi UEFI Data Table test.
> - waet WAET Windows ACPI Emulated Devices Table test.
> - wdat WDAT Microsoft Hardware Watchdog Action Table test.
> - wmi Extract and analyse Windows Management Instrumentation
(WMI).
> - xenv XENV Xen Environment Table tests.
> - xsdt XSDT Extended System Description Table test.
> -
> -Batch tests:
> - acpiinfo General ACPI information test.
> - acpitables ACPI table headers sanity tests.
> - apicedge APIC edge/level test.
> - apicinstance Test for single instance of APIC/MADT table.
> - asf ASF! Alert Standard Format Table test.
> - aspm PCIe ASPM test.
> - aspt ASPT Table test.
> - autobrightness Automated LCD brightness test.
> - bert BERT Boot Error Record Table test.
> - bgrt BGRT Boot Graphics Resource Table test.
> - bios32 BIOS32 Service Directory test.
> - bios_info Gather BIOS DMI information.
> - bmc_info BMC Info
> - boot BOOT Table test.
> - checksum ACPI table checksum test.
> - cpep CPEP Corrected Platform Error Polling Table test.
> - cpufreq CPU frequency scaling tests.
> - crs Test PCI host bridge configuration using _CRS.
> - csm UEFI Compatibility Support Module test.
> - csrt CSRT Core System Resource Table test.
> - cstates Processor C state support test.
> - dbg2 DBG2 (Debug Port Table 2) test.
> - dbgp DBGP (Debug Port) Table test.
> - dmar DMA Remapping (VT-d) test.
> - dmicheck DMI/SMBIOS table tests.
> - dt_base Base device tree validity check
> - dt_sysinfo Device tree system information test
> - ebda Test EBDA region is mapped and reserved in memory map
table.
> - ecdt ECDT Embedded Controller Boot Resources Table test.
> - einj EINJ Error Injection Table test.
> - erst ERST Error Record Serialization Table test.
> - facs FACS Firmware ACPI Control Structure test.
> - fadt FADT Fixed ACPI Description Table tests.
> - fan Simple fan tests.
> - fpdt FPDT Firmware Performance Data Table test.
> - gtdt GTDT Generic Timer Description Table test.
> - hda_audio HDA Audio Pin Configuration test.
> - hest HEST Hardware Error Source Table test.
> - hpet HPET IA-PC High Precision Event Timer Table tests.
> - iort IORT IO Remapping Table test.
> - klog Scan kernel log for errors and warnings.
> - lpit LPIT Low Power Idle Table test.
> - madt MADT Multiple APIC Description Table (spec compliant).
> - maxfreq Test max CPU frequencies against max scaling frequency.
> - maxreadreq Test firmware has set PCI Express MaxReadReq to a
higher value on non-motherboard devices.
> - mcfg MCFG PCI Express* memory mapped config space test.
> - mchi MCHI Management Controller Host Interface Table test.
> - method ACPI DSDT Method Semantic tests.
> - microcode Test if system is using latest microcode.
> - mpcheck MultiProcessor Tables tests.
> - msct MSCT Maximum System Characteristics Table test.
> - msdm MSDM Microsoft Data Management Table test.
> - msr MSR register tests.
> - mtrr MTRR tests.
> - nx Test if CPU NX is disabled by the BIOS.
> - olog Run OLOG scan and analysis checks.
> - oops Scan kernel log for Oopses.
> - osilinux Disassemble DSDT to check for _OSI("Linux").
> - pcc Processor Clocking Control (PCC) test.
> - pciirq PCI IRQ Routing Table test.
> - pnp BIOS Support Installation structure test.
> - prd_info OPAL Processor Recovery Diagnostics Info
> - rsdp RSDP Root System Description Pointer test.
> - rsdt RSDT Root System Description Table test.
> - sbst SBST Smart Battery Specification Table test.
> - securebootcert UEFI secure boot test.
> - slic SLIC Software Licensing Description Table test.
> - slit SLIT System Locality Distance Information test.
> - spcr SPCR Serial Port Console Redirection Table test.
> - spmi SPMI Service Processor Management Interface Description
Table test.
> - srat SRAT System Resource Affinity Table test.
> - stao STAO Status Override Table test.
> - syntaxcheck Re-assemble DSDT and SSDTs to find syntax errors and
warnings.
> - tcpa TCPA Trusted Computing Platform Alliance Capabilities
Table test.
> - tpm2 TPM2 Trusted Platform Module 2 test.
> - uefi UEFI Data Table test.
> - uefibootpath Sanity check for UEFI Boot Path Boot####.
> - version Gather kernel system information.
> - virt CPU Virtualisation Configuration test.
> - waet WAET Windows ACPI Emulated Devices Table test.
> - wakealarm ACPI Wakealarm tests.
> - wdat WDAT Microsoft Hardware Watchdog Action Table test.
> - wmi Extract and analyse Windows Management Instrumentation
(WMI).
> - xenv XENV Xen Environment Table tests.
> - xsdt XSDT Extended System Description Table test.
> -
> -Interactive tests:
> - ac_adapter Interactive ac_adapter power test.
> - battery Battery tests.
> - brightness Interactive LCD brightness test.
> - hotkey Hotkey scan code tests.
> - lid Interactive lid button test.
> - power_button Interactive power_button button test.
> -
> -Power States tests:
> - s3 S3 suspend/resume test.
> - s3power S3 power loss during suspend test (takes minimum of 10
minutes to run).
> - s4 S4 hibernate/resume test.
> -
> -Utilities:
> - acpidump Dump ACPI tables.
> - cmosdump Dump CMOS Memory.
> - crsdump Dump ACPI _CRS resources.
> - ebdadump Dump EBDA region.
> - esrtdump Dump ESRT table.
> - gpedump Dump GPEs.
> - memmapdump Dump system memory map.
> - mpdump Dump MultiProcessor Data.
> - plddump Dump ACPI _PLD (Physical Device Location).
> - prsdump Dump ACPI _PRS resources.
> - romdump Dump ROM data.
> - uefidump Dump UEFI variables.
> - uefivarinfo UEFI variable info query.
> -
> -Unsafe tests:
> - uefirtauthvar Authenticated variable tests.
> - uefirtmisc UEFI miscellaneous runtime service interface tests.
> - uefirttime UEFI Runtime service time interface tests.
> - uefirtvariable UEFI Runtime service variable interface tests.
> -
> -UEFI tests:
> - csm UEFI Compatibility Support Module test.
> - esrt Sanity check UEFI ESRT Table.
> - securebootcert UEFI secure boot test.
> - uefibootpath Sanity check for UEFI Boot Path Boot####.
> - uefirtauthvar Authenticated variable tests.
> - uefirtmisc UEFI miscellaneous runtime service interface tests.
> - uefirttime UEFI Runtime service time interface tests.
> - uefirtvariable UEFI Runtime service variable interface tests.
> -
> -ACPI Spec Compliance tests:
> - fadt FADT Fixed ACPI Description Table tests.
> - madt MADT Multiple APIC Description Table (spec compliant).
> - rsdp RSDP Root System Description Pointer test.
> diff --git a/fwts-test/arg-show-tests-0001/test-0001.sh
b/fwts-test/arg-show-tests-0001/test-0001.sh
> index a62071c..ade98a3 100755
> --- a/fwts-test/arg-show-tests-0001/test-0001.sh
> +++ b/fwts-test/arg-show-tests-0001/test-0001.sh
> @@ -3,23 +3,21 @@
> TEST="Test -s option"
> NAME=test-0001.sh
> TMPLOG=$TMP/arg-show-tests.log.$$
> +export FWTS_SHOW_LOGS="BASE"
>
> -#
> -# Non-x86 tests don't have WMI so skip this test
> -#
> -$FWTS --show-tests | grep wmi > /dev/null
> -if [ $? -eq 1 ]; then
> +# Dynamically create the log template per test
> +$FWTS show_logs &> /dev/null
> +if [ $? -ne 0 ]; then
> echo SKIP: $TEST, $NAME
> exit 77
> fi
>
> -cols=$(stty -a | tr ';' '\n' | grep "columns" | cut -d' ' -f3)
2> /dev/null
> #
> # If we can't set the tty then we can't test
> #
> -stty cols 80 2> /dev/null
> -if [ $? -eq 1 ]; then
> - tset 2> /dev/null
> +stty cols 80 &> /dev/null
> +if [ $? -ne 0 ]; then
> + tset &> /dev/null
> echo SKIP: $TEST, $NAME
> exit 77
> fi
> @@ -32,8 +30,8 @@ else
> echo FAILED: $TEST, $NAME
> fi
>
> -stty cols 80 2> /dev/null
> -tset 2> /dev/null
> +stty cols 80 &> /dev/null
> +tset &> /dev/null
>
> rm $TMPLOG
> exit $ret
> diff --git a/fwts-test/arg-show-tests-0001/test-0002.sh
b/fwts-test/arg-show-tests-0001/test-0002.sh
> index f92fd8f..078f3e7 100755
> --- a/fwts-test/arg-show-tests-0001/test-0002.sh
> +++ b/fwts-test/arg-show-tests-0001/test-0002.sh
> @@ -3,27 +3,25 @@
> TEST="Test --show-tests option"
> NAME=test-0002.sh
> TMPLOG=$TMP/arg-show-tests.log.$$
> +export FWTS_SHOW_LOGS="BASE"
>
> -#
> -# Non-x86 tests don't have WMI so skip this test
> -#
> -$FWTS --show-tests | grep wmi > /dev/null
> -if [ $? -eq 1 ]; then
> +# Dynamically create the log template per test
> +$FWTS show_logs &> /dev/null
> +if [ $? -ne 0 ]; then
> echo SKIP: $TEST, $NAME
> exit 77
> fi
>
> -cols=$(stty -a | tr ';' '\n' | grep "columns" | cut -d' ' -f3)
2> /dev/null
> #
> # If we can't set the tty then we can't test
> #
> -stty cols 80 2> /dev/null
> -if [ $? -eq 1 ]; then
> - tset 2> /dev/null
> - echo SKIP: $TEST, $NAME
> - exit 77
> +stty cols 80 &> /dev/null
> +if [ $? -ne 0 ]; then
> + tset &> /dev/null
> + echo SKIP: $TEST, $NAME
> + exit 77
> fi
> -$FWTS -s > $TMPLOG
> +$FWTS --show-tests > $TMPLOG
> diff $TMPLOG $FWTSTESTDIR/arg-show-tests-0001/arg-show-tests-0001.log >>
$FAILURE_LOG
> ret=$?
> if [ $ret -eq 0 ]; then
> @@ -32,8 +30,8 @@ else
> echo FAILED: $TEST, $NAME
> fi
>
> -stty cols 80 2> /dev/null
> -tset 2> /dev/null
> +stty cols 80 &> /dev/null
> +tset &> /dev/null
>
> rm $TMPLOG
> exit $ret
> diff --git
a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
b/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> deleted file mode 100644
> index 3eb5e3e..0000000
> --- a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> +++ /dev/null
> @@ -1,930 +0,0 @@
> -ACPI tests:
> - acpiinfo (3 tests):
> - Determine Kernel ACPI version.
> - Determine machine's ACPI version.
> - Determine AML compiler.
> - acpitables (1 test):
> - Test ACPI headers.
> - apicinstance (1 test):
> - Test for single instance of APIC/MADT table.
> - asf (1 test):
> - ASF! Alert Standard Format Table test.
> - aspt (1 test):
> - ASPT Table test.
> - bert (1 test):
> - BERT Boot Error Record Table test.
> - bgrt (1 test):
> - BGRT Boot Graphics Resource Table test.
> - boot (1 test):
> - BOOT Table test.
> - checksum (1 test):
> - ACPI table checksum test.
> - cpep (1 test):
> - CPEP Corrected Platform Error Polling Table test.
> - csrt (1 test):
> - CSRT Core System Resource Table test.
> - cstates (1 test):
> - Test all CPUs C-states.
> - dbg2 (1 test):
> - DBG2 (Debug Port Table 2) test.
> - dbgp (1 test):
> - DBGP (Debug Port) Table test.
> - dmar (1 test):
> - DMA Remapping test.
> - ecdt (1 test):
> - ECDT Embedded Controller Boot Resources Table test.
> - einj (1 test):
> - EINJ Error Injection Table test.
> - erst (1 test):
> - ERST Error Record Serialization Table test.
> - facs (1 test):
> - FACS Firmware ACPI Control Structure test.
> - fadt (6 tests):
> - ACPI FADT Description Table flag info.
> - FADT checksum test.
> - FADT revision test.
> - ACPI FADT Description Table tests.
> - Test FADT SCI_EN bit is enabled.
> - Test FADT reset register.
> - fpdt (1 test):
> - FPDT Firmware Performance Data Table test.
> - gtdt (1 test):
> - GTDT Generic Timer Description Table test.
> - hest (1 test):
> - HEST Hardware Error Source Table test.
> - hpet (4 tests):
> - Test HPET base in kernel log.
> - Test HPET base in HPET table.
> - Test HPET base in DSDT and/or SSDT.
> - Test HPET configuration.
> - iort (1 test):
> - IORT IO Remapping Table test.
> - lpit (1 test):
> - LPIT Low Power Idle Table test.
> - madt (5 tests):
> - MADT checksum test.
> - MADT revision test.
> - MADT architecture minimum revision test.
> - MADT flags field reserved bits test.
> - MADT subtable tests.
> - mcfg (2 tests):
> - Validate MCFG table.
> - Validate MCFG PCI config space.
> - mchi (1 test):
> - MCHI Management Controller Host Interface Table test.
> - method (191 tests):
> - Test Method Names.
> - Test _AEI.
> - Test _EVT (Event Method).
> - Test _DLM (Device Lock Mutex).
> - Test _PIC (Inform AML of Interrupt Model).
> - Test _CID (Compatible ID).
> - Test _DDN (DOS Device Name).
> - Test _HID (Hardware ID).
> - Test _HRV (Hardware Revision Number).
> - Test _MLS (Multiple Language String).
> - Test _PLD (Physical Device Location).
> - Test _SUB (Subsystem ID).
> - Test _SUN (Slot User Number).
> - Test _STR (String).
> - Test _UID (Unique ID).
> - Test _CDM (Clock Domain).
> - Test _CRS (Current Resource Settings).
> - Test _DSD (Device Specific Data).
> - Test _DIS (Disable).
> - Test _DMA (Direct Memory Access).
> - Test _FIX (Fixed Register Resource Provider).
> - Test _GSB (Global System Interrupt Base).
> - Test _HPP (Hot Plug Parameters).
> - Test _PRS (Possible Resource Settings).
> - Test _PRT (PCI Routing Table).
> - Test _PXM (Proximity).
> - Test _CCA (Cache Coherency Attribute).
> - Test _EDL (Eject Device List).
> - Test _EJD (Ejection Dependent Device).
> - Test _EJ0 (Eject).
> - Test _EJ1 (Eject).
> - Test _EJ2 (Eject).
> - Test _EJ3 (Eject).
> - Test _EJ4 (Eject).
> - Test _LCK (Lock).
> - Test _RMV (Remove).
> - Test _STA (Status).
> - Test _DEP (Operational Region Dependencies).
> - Test _BDN (BIOS Dock Name).
> - Test _BBN (Base Bus Number).
> - Test _DCK (Dock).
> - Test _INI (Initialize).
> - Test _GLK (Global Lock).
> - Test _SEG (Segment).
> - Test _OFF (Set resource off).
> - Test _ON_ (Set resource on).
> - Test _DSW (Device Sleep Wake).
> - Test _IRC (In Rush Current).
> - Test _PRE (Power Resources for Enumeration).
> - Test _PR0 (Power Resources for D0).
> - Test _PR1 (Power Resources for D1).
> - Test _PR2 (Power Resources for D2).
> - Test _PR3 (Power Resources for D3).
> - Test _PRW (Power Resources for Wake).
> - Test _PS0 (Power State 0).
> - Test _PS1 (Power State 1).
> - Test _PS2 (Power State 2).
> - Test _PS3 (Power State 3).
> - Test _PSC (Power State Current).
> - Test _PSE (Power State for Enumeration).
> - Test _PSW (Power State Wake).
> - Test _S1D (S1 Device State).
> - Test _S2D (S2 Device State).
> - Test _S3D (S3 Device State).
> - Test _S4D (S4 Device State).
> - Test _S0W (S0 Device Wake State).
> - Test _S1W (S1 Device Wake State).
> - Test _S2W (S2 Device Wake State).
> - Test _S3W (S3 Device Wake State).
> - Test _S4W (S4 Device Wake State).
> - Test _RST (Device Reset).
> - Test _PRR (Power Resource for Reset).
> - Test _S0_ (S0 System State).
> - Test _S1_ (S1 System State).
> - Test _S2_ (S2 System State).
> - Test _S3_ (S3 System State).
> - Test _S4_ (S4 System State).
> - Test _S5_ (S5 System State).
> - Test _SWS (System Wake Source).
> - Test _PSS (Performance Supported States).
> - Test _CPC (Continuous Performance Control).
> - Test _CSD (C State Dependencies).
> - Test _CST (C States).
> - Test _PCT (Performance Control).
> - Test _PDL (P-State Depth Limit).
> - Test _PPC (Performance Present Capabilities).
> - Test _PPE (Polling for Platform Error).
> - Test _PSD (Power State Dependencies).
> - Test _PTC (Processor Throttling Control).
> - Test _TDL (T-State Depth Limit).
> - Test _TPC (Throttling Present Capabilities).
> - Test _TSD (Throttling State Dependencies).
> - Test _TSS (Throttling Supported States).
> - Test _LPI (Low Power Idle States).
> - Test _RDI (Resource Dependencies for Idle).
> - Test _PUR (Processor Utilization Request).
> - Test _MSG (Message).
> - Test _SST (System Status).
> - Test _ALC (Ambient Light Colour Chromaticity).
> - Test _ALI (Ambient Light Illuminance).
> - Test _ALT (Ambient Light Temperature).
> - Test _ALP (Ambient Light Polling).
> - Test _ALR (Ambient Light Response).
> - Test _LID (Lid Status).
> - Test _GTF (Get Task File).
> - Test _GTM (Get Timing Mode).
> - Test _MBM (Memory Bandwidth Monitoring Data).
> - Test _UPC (USB Port Capabilities).
> - Test _UPD (User Presence Detect).
> - Test _UPP (User Presence Polling).
> - Test _GCP (Get Capabilities).
> - Test _GRT (Get Real Time).
> - Test _GWS (Get Wake Status).
> - Test _CWS (Clear Wake Status).
> - Test _STP (Set Expired Timer Wake Policy).
> - Test _STV (Set Timer Value).
> - Test _TIP (Expired Timer Wake Policy).
> - Test _TIV (Timer Values).
> - Test _SBS (Smart Battery Subsystem).
> - Test _BCT (Battery Charge Time).
> - Test _BIF (Battery Information).
> - Test _BIX (Battery Information Extended).
> - Test _BMA (Battery Measurement Averaging).
> - Test _BMC (Battery Maintenance Control).
> - Test _BMD (Battery Maintenance Data).
> - Test _BMS (Battery Measurement Sampling Time).
> - Test _BST (Battery Status).
> - Test _BTP (Battery Trip Point).
> - Test _BTH (Battery Throttle Limit).
> - Test _BTM (Battery Time).
> - Test _PCL (Power Consumer List).
> - Test _PIF (Power Source Information).
> - Test _PRL (Power Source Redundancy List).
> - Test _PSR (Power Source).
> - Test _GAI (Get Averaging Level).
> - Test _GHL (Get Harware Limit).
> - Test _PMC (Power Meter Capabilities).
> - Test _PMD (Power Meter Devices).
> - Test _PMM (Power Meter Measurement).
> - Test _WPC (Wireless Power Calibration).
> - Test _WPP (Wireless Power Polling).
> - Test _FIF (Fan Information).
> - Test _FPS (Fan Performance States).
> - Test _FSL (Fan Set Level).
> - Test _FST (Fan Status).
> - Test _ACx (Active Cooling).
> - Test _ART (Active Cooling Relationship Table).
> - Test _CRT (Critical Trip Point).
> - Test _CR3 (Warm/Standby Temperature).
> - Test _DTI (Device Temperature Indication).
> - Test _HOT (Hot Temperature).
> - Test _MTL (Minimum Throttle Limit).
> - Test _NTT (Notification Temp Threshold).
> - Test _PSL (Passive List).
> - Test _PSV (Passive Temp).
> - Test _RTV (Relative Temp Values).
> - Test _SCP (Set Cooling Policy).
> - Test _TC1 (Thermal Constant 1).
> - Test _TC2 (Thermal Constant 2).
> - Test _TFP (Thermal fast Sampling Period).
> - Test _TMP (Thermal Zone Current Temp).
> - Test _TPT (Trip Point Temperature).
> - Test _TRT (Thermal Relationship Table).
> - Test _TSN (Thermal Sensor Device).
> - Test _TSP (Thermal Sampling Period).
> - Test _TST (Temperature Sensor Threshold).
> - Test _TZD (Thermal Zone Devices).
> - Test _TZM (Thermal Zone member).
> - Test _TZP (Thermal Zone Polling).
> - Test _GPE (General Purpose Events).
> - Test _EC_ (EC Offset Query).
> - Test _PTS (Prepare to Sleep).
> - Test _TTS (Transition to State).
> - Test _WAK (System Wake).
> - Test _ADR (Return Unique ID for Device).
> - Test _BCL (Query List of Brightness Control Levels Supported).
> - Test _BCM (Set Brightness Level).
> - Test _BQC (Brightness Query Current Level).
> - Test _DCS (Return the Status of Output Device).
> - Test _DDC (Return the EDID for this Device).
> - Test _DSS (Device Set State).
> - Test _DGS (Query Graphics State).
> - Test _DOD (Enumerate All Devices Attached to Display Adapter).
> - Test _DOS (Enable/Disable Output Switching).
> - Test _GPD (Get POST Device).
> - Test _ROM (Get ROM Data).
> - Test _SPD (Set POST Device).
> - Test _VPO (Video POST Options).
> - Test _CBA (Configuration Base Address).
> - Test _IFT (IPMI Interface Type).
> - Test _SRV (IPMI Interface Revision).
> - msct (1 test):
> - MSCT Maximum System Characteristics Table test.
> - msdm (1 test):
> - MSDM Microsoft Data Management Table test.
> - pcc (1 test):
> - Processor Clocking Control (PCC) test.
> - rsdp (1 test):
> - RSDP Root System Description Pointer test.
> - rsdt (1 test):
> - RSDT Root System Description Table test.
> - sbst (1 test):
> - SBST Smart Battery Specificiation Table test.
> - slic (1 test):
> - SLIC Software Licensing Description Table test.
> - slit (1 test):
> - SLIT System Locality Distance Information test.
> - spcr (1 test):
> - SPCR Serial Port Console Redirection Table test.
> - spmi (1 test):
> - SPMI Service Processor Management Interface Description Table test.
> - srat (1 test):
> - SRAT System Resource Affinity Table test.
> - stao (1 test):
> - STAO Status Override Table test.
> - tcpa (1 test):
> - Validate TCPA table.
> - tpm2 (1 test):
> - Validate TPM2 table.
> - uefi (1 test):
> - UEFI Data Table test.
> - waet (1 test):
> - Windows ACPI Emulated Devices Table test.
> - wdat (1 test):
> - WDAT Microsoft Hardware Watchdog Action Table test.
> - wmi (1 test):
> - Windows Management Instrumentation test.
> - xenv (1 test):
> - Validate XENV table.
> - xsdt (1 test):
> - XSDT Extended System Description Table test.
> -
> -Batch tests:
> - acpiinfo (3 tests):
> - Determine Kernel ACPI version.
> - Determine machine's ACPI version.
> - Determine AML compiler.
> - acpitables (1 test):
> - Test ACPI headers.
> - apicedge (1 test):
> - Legacy and PCI Interrupt Edge/Level trigger tests.
> - apicinstance (1 test):
> - Test for single instance of APIC/MADT table.
> - asf (1 test):
> - ASF! Alert Standard Format Table test.
> - aspm (2 tests):
> - PCIe ASPM ACPI test.
> - PCIe ASPM registers test.
> - aspt (1 test):
> - ASPT Table test.
> - autobrightness (2 tests):
> - Test for maximum and actual brightness.
> - Change actual brightness.
> - bert (1 test):
> - BERT Boot Error Record Table test.
> - bgrt (1 test):
> - BGRT Boot Graphics Resource Table test.
> - bios32 (1 test):
> - BIOS32 Service Directory test.
> - bios_info (1 test):
> - Gather BIOS DMI information
> - bmc_info (1 test):
> - BMC Info
> - boot (1 test):
> - BOOT Table test.
> - checksum (1 test):
> - ACPI table checksum test.
> - cpep (1 test):
> - CPEP Corrected Platform Error Polling Table test.
> - cpufreq (7 tests):
> - CPU frequency table consistency
> - CPU frequency table duplicates
> - CPU frequency firmware limits
> - CPU frequency claimed maximum
> - CPU frequency SW_ANY control
> - CPU frequency SW_ALL control
> - CPU frequency performance tests.
> - crs (1 test):
> - Test PCI host bridge configuration using _CRS.
> - csm (1 test):
> - UEFI Compatibility Support Module test.
> - csrt (1 test):
> - CSRT Core System Resource Table test.
> - cstates (1 test):
> - Test all CPUs C-states.
> - dbg2 (1 test):
> - DBG2 (Debug Port Table 2) test.
> - dbgp (1 test):
> - DBGP (Debug Port) Table test.
> - dmar (1 test):
> - DMA Remapping test.
> - dmicheck (3 tests):
> - Find and test SMBIOS Table Entry Points.
> - Test DMI/SMBIOS tables for errors.
> - Test DMI/SMBIOS3 tables for errors.
> - dt_base (3 tests):
> - Check device tree presence
> - Check device tree baseline validity
> - Check device tree warnings
> - dt_sysinfo (3 tests):
> - Check model property
> - Check system-id property
> - Check OpenPOWER Reference compatible
> - ebda (1 test):
> - Test EBDA is reserved in E820 table.
> - ecdt (1 test):
> - ECDT Embedded Controller Boot Resources Table test.
> - einj (1 test):
> - EINJ Error Injection Table test.
> - erst (1 test):
> - ERST Error Record Serialization Table test.
> - facs (1 test):
> - FACS Firmware ACPI Control Structure test.
> - fadt (6 tests):
> - ACPI FADT Description Table flag info.
> - FADT checksum test.
> - FADT revision test.
> - ACPI FADT Description Table tests.
> - Test FADT SCI_EN bit is enabled.
> - Test FADT reset register.
> - fan (2 tests):
> - Test fan status.
> - Load system, check CPU fan status.
> - fpdt (1 test):
> - FPDT Firmware Performance Data Table test.
> - gtdt (1 test):
> - GTDT Generic Timer Description Table test.
> - hda_audio (1 test):
> - HDA Audio Pin Configuration test.
> - hest (1 test):
> - HEST Hardware Error Source Table test.
> - hpet (4 tests):
> - Test HPET base in kernel log.
> - Test HPET base in HPET table.
> - Test HPET base in DSDT and/or SSDT.
> - Test HPET configuration.
> - iort (1 test):
> - IORT IO Remapping Table test.
> - klog (1 test):
> - Kernel log error check.
> - lpit (1 test):
> - LPIT Low Power Idle Table test.
> - madt (5 tests):
> - MADT checksum test.
> - MADT revision test.
> - MADT architecture minimum revision test.
> - MADT flags field reserved bits test.
> - MADT subtable tests.
> - maxfreq (1 test):
> - Maximum CPU frequency test.
> - maxreadreq (1 test):
> - Test firmware settings MaxReadReq for PCI Express devices.
> - mcfg (2 tests):
> - Validate MCFG table.
> - Validate MCFG PCI config space.
> - mchi (1 test):
> - MCHI Management Controller Host Interface Table test.
> - method (191 tests):
> - Test Method Names.
> - Test _AEI.
> - Test _EVT (Event Method).
> - Test _DLM (Device Lock Mutex).
> - Test _PIC (Inform AML of Interrupt Model).
> - Test _CID (Compatible ID).
> - Test _DDN (DOS Device Name).
> - Test _HID (Hardware ID).
> - Test _HRV (Hardware Revision Number).
> - Test _MLS (Multiple Language String).
> - Test _PLD (Physical Device Location).
> - Test _SUB (Subsystem ID).
> - Test _SUN (Slot User Number).
> - Test _STR (String).
> - Test _UID (Unique ID).
> - Test _CDM (Clock Domain).
> - Test _CRS (Current Resource Settings).
> - Test _DSD (Device Specific Data).
> - Test _DIS (Disable).
> - Test _DMA (Direct Memory Access).
> - Test _FIX (Fixed Register Resource Provider).
> - Test _GSB (Global System Interrupt Base).
> - Test _HPP (Hot Plug Parameters).
> - Test _PRS (Possible Resource Settings).
> - Test _PRT (PCI Routing Table).
> - Test _PXM (Proximity).
> - Test _CCA (Cache Coherency Attribute).
> - Test _EDL (Eject Device List).
> - Test _EJD (Ejection Dependent Device).
> - Test _EJ0 (Eject).
> - Test _EJ1 (Eject).
> - Test _EJ2 (Eject).
> - Test _EJ3 (Eject).
> - Test _EJ4 (Eject).
> - Test _LCK (Lock).
> - Test _RMV (Remove).
> - Test _STA (Status).
> - Test _DEP (Operational Region Dependencies).
> - Test _BDN (BIOS Dock Name).
> - Test _BBN (Base Bus Number).
> - Test _DCK (Dock).
> - Test _INI (Initialize).
> - Test _GLK (Global Lock).
> - Test _SEG (Segment).
> - Test _OFF (Set resource off).
> - Test _ON_ (Set resource on).
> - Test _DSW (Device Sleep Wake).
> - Test _IRC (In Rush Current).
> - Test _PRE (Power Resources for Enumeration).
> - Test _PR0 (Power Resources for D0).
> - Test _PR1 (Power Resources for D1).
> - Test _PR2 (Power Resources for D2).
> - Test _PR3 (Power Resources for D3).
> - Test _PRW (Power Resources for Wake).
> - Test _PS0 (Power State 0).
> - Test _PS1 (Power State 1).
> - Test _PS2 (Power State 2).
> - Test _PS3 (Power State 3).
> - Test _PSC (Power State Current).
> - Test _PSE (Power State for Enumeration).
> - Test _PSW (Power State Wake).
> - Test _S1D (S1 Device State).
> - Test _S2D (S2 Device State).
> - Test _S3D (S3 Device State).
> - Test _S4D (S4 Device State).
> - Test _S0W (S0 Device Wake State).
> - Test _S1W (S1 Device Wake State).
> - Test _S2W (S2 Device Wake State).
> - Test _S3W (S3 Device Wake State).
> - Test _S4W (S4 Device Wake State).
> - Test _RST (Device Reset).
> - Test _PRR (Power Resource for Reset).
> - Test _S0_ (S0 System State).
> - Test _S1_ (S1 System State).
> - Test _S2_ (S2 System State).
> - Test _S3_ (S3 System State).
> - Test _S4_ (S4 System State).
> - Test _S5_ (S5 System State).
> - Test _SWS (System Wake Source).
> - Test _PSS (Performance Supported States).
> - Test _CPC (Continuous Performance Control).
> - Test _CSD (C State Dependencies).
> - Test _CST (C States).
> - Test _PCT (Performance Control).
> - Test _PDL (P-State Depth Limit).
> - Test _PPC (Performance Present Capabilities).
> - Test _PPE (Polling for Platform Error).
> - Test _PSD (Power State Dependencies).
> - Test _PTC (Processor Throttling Control).
> - Test _TDL (T-State Depth Limit).
> - Test _TPC (Throttling Present Capabilities).
> - Test _TSD (Throttling State Dependencies).
> - Test _TSS (Throttling Supported States).
> - Test _LPI (Low Power Idle States).
> - Test _RDI (Resource Dependencies for Idle).
> - Test _PUR (Processor Utilization Request).
> - Test _MSG (Message).
> - Test _SST (System Status).
> - Test _ALC (Ambient Light Colour Chromaticity).
> - Test _ALI (Ambient Light Illuminance).
> - Test _ALT (Ambient Light Temperature).
> - Test _ALP (Ambient Light Polling).
> - Test _ALR (Ambient Light Response).
> - Test _LID (Lid Status).
> - Test _GTF (Get Task File).
> - Test _GTM (Get Timing Mode).
> - Test _MBM (Memory Bandwidth Monitoring Data).
> - Test _UPC (USB Port Capabilities).
> - Test _UPD (User Presence Detect).
> - Test _UPP (User Presence Polling).
> - Test _GCP (Get Capabilities).
> - Test _GRT (Get Real Time).
> - Test _GWS (Get Wake Status).
> - Test _CWS (Clear Wake Status).
> - Test _STP (Set Expired Timer Wake Policy).
> - Test _STV (Set Timer Value).
> - Test _TIP (Expired Timer Wake Policy).
> - Test _TIV (Timer Values).
> - Test _SBS (Smart Battery Subsystem).
> - Test _BCT (Battery Charge Time).
> - Test _BIF (Battery Information).
> - Test _BIX (Battery Information Extended).
> - Test _BMA (Battery Measurement Averaging).
> - Test _BMC (Battery Maintenance Control).
> - Test _BMD (Battery Maintenance Data).
> - Test _BMS (Battery Measurement Sampling Time).
> - Test _BST (Battery Status).
> - Test _BTP (Battery Trip Point).
> - Test _BTH (Battery Throttle Limit).
> - Test _BTM (Battery Time).
> - Test _PCL (Power Consumer List).
> - Test _PIF (Power Source Information).
> - Test _PRL (Power Source Redundancy List).
> - Test _PSR (Power Source).
> - Test _GAI (Get Averaging Level).
> - Test _GHL (Get Harware Limit).
> - Test _PMC (Power Meter Capabilities).
> - Test _PMD (Power Meter Devices).
> - Test _PMM (Power Meter Measurement).
> - Test _WPC (Wireless Power Calibration).
> - Test _WPP (Wireless Power Polling).
> - Test _FIF (Fan Information).
> - Test _FPS (Fan Performance States).
> - Test _FSL (Fan Set Level).
> - Test _FST (Fan Status).
> - Test _ACx (Active Cooling).
> - Test _ART (Active Cooling Relationship Table).
> - Test _CRT (Critical Trip Point).
> - Test _CR3 (Warm/Standby Temperature).
> - Test _DTI (Device Temperature Indication).
> - Test _HOT (Hot Temperature).
> - Test _MTL (Minimum Throttle Limit).
> - Test _NTT (Notification Temp Threshold).
> - Test _PSL (Passive List).
> - Test _PSV (Passive Temp).
> - Test _RTV (Relative Temp Values).
> - Test _SCP (Set Cooling Policy).
> - Test _TC1 (Thermal Constant 1).
> - Test _TC2 (Thermal Constant 2).
> - Test _TFP (Thermal fast Sampling Period).
> - Test _TMP (Thermal Zone Current Temp).
> - Test _TPT (Trip Point Temperature).
> - Test _TRT (Thermal Relationship Table).
> - Test _TSN (Thermal Sensor Device).
> - Test _TSP (Thermal Sampling Period).
> - Test _TST (Temperature Sensor Threshold).
> - Test _TZD (Thermal Zone Devices).
> - Test _TZM (Thermal Zone member).
> - Test _TZP (Thermal Zone Polling).
> - Test _GPE (General Purpose Events).
> - Test _EC_ (EC Offset Query).
> - Test _PTS (Prepare to Sleep).
> - Test _TTS (Transition to State).
> - Test _WAK (System Wake).
> - Test _ADR (Return Unique ID for Device).
> - Test _BCL (Query List of Brightness Control Levels Supported).
> - Test _BCM (Set Brightness Level).
> - Test _BQC (Brightness Query Current Level).
> - Test _DCS (Return the Status of Output Device).
> - Test _DDC (Return the EDID for this Device).
> - Test _DSS (Device Set State).
> - Test _DGS (Query Graphics State).
> - Test _DOD (Enumerate All Devices Attached to Display Adapter).
> - Test _DOS (Enable/Disable Output Switching).
> - Test _GPD (Get POST Device).
> - Test _ROM (Get ROM Data).
> - Test _SPD (Set POST Device).
> - Test _VPO (Video POST Options).
> - Test _CBA (Configuration Base Address).
> - Test _IFT (IPMI Interface Type).
> - Test _SRV (IPMI Interface Revision).
> - microcode (1 test):
> - Test for most recent microcode being loaded.
> - mpcheck (9 tests):
> - Test MP header.
> - Test MP CPU entries.
> - Test MP Bus entries.
> - Test MP IO APIC entries.
> - Test MP IO Interrupt entries.
> - Test MP Local Interrupt entries.
> - Test MP System Address entries.
> - Test MP Bus Hierarchy entries.
> - Test MP Compatible Bus Address Space entries.
> - msct (1 test):
> - MSCT Maximum System Characteristics Table test.
> - msdm (1 test):
> - MSDM Microsoft Data Management Table test.
> - msr (5 tests):
> - Test CPU generic MSRs.
> - Test CPU specific model MSRs.
> - Test all P State Ratios.
> - Test C1 and C3 autodemotion.
> - Test SMRR MSR registers.
> - mtrr (3 tests):
> - Validate the kernel MTRR IOMEM setup.
> - Validate the MTRR setup across all processors.
> - Test for AMD MtrrFixDramModEn being cleared by the BIOS.
> - nx (3 tests):
> - Test CPU NX capability.
> - Test all CPUs have same BIOS set NX flag.
> - Test all CPUs have same msr setting in MSR 0x1a0.
> - olog (1 test):
> - OLOG scan and analysis checks results.
> - oops (1 test):
> - Kernel log oops check.
> - osilinux (1 test):
> - Disassemble DSDT to check for _OSI("Linux").
> - pcc (1 test):
> - Processor Clocking Control (PCC) test.
> - pciirq (1 test):
> - PCI IRQ Routing Table test.
> - pnp (1 test):
> - PnP BIOS Support Installation structure test.
> - prd_info (1 test):
> - OPAL Processor Recovery Diagnostics Info
> - rsdp (1 test):
> - RSDP Root System Description Pointer test.
> - rsdt (1 test):
> - RSDT Root System Description Table test.
> - sbst (1 test):
> - SBST Smart Battery Specificiation Table test.
> - securebootcert (1 test):
> - UEFI secure boot test.
> - slic (1 test):
> - SLIC Software Licensing Description Table test.
> - slit (1 test):
> - SLIT System Locality Distance Information test.
> - spcr (1 test):
> - SPCR Serial Port Console Redirection Table test.
> - spmi (1 test):
> - SPMI Service Processor Management Interface Description Table test.
> - srat (1 test):
> - SRAT System Resource Affinity Table test.
> - stao (1 test):
> - STAO Status Override Table test.
> - syntaxcheck (1 test):
> - Disassemble and reassemble DSDT and SSDTs.
> - tcpa (1 test):
> - Validate TCPA table.
> - tpm2 (1 test):
> - Validate TPM2 table.
> - uefi (1 test):
> - UEFI Data Table test.
> - uefibootpath (1 test):
> - Test UEFI Boot Path Boot####.
> - version (4 tests):
> - Gather kernel signature.
> - Gather kernel system information.
> - Gather kernel boot command line.
> - Gather ACPI driver version.
> - virt (1 test):
> - CPU Virtualisation Configuration test.
> - waet (1 test):
> - Windows ACPI Emulated Devices Table test.
> - wakealarm (5 tests):
> - Test existence of RTC with alarm interface.
> - Trigger wakealarm for 1 seconds in the future.
> - Test if wakealarm is fired.
> - Multiple wakealarm firing tests.
> - Reset wakealarm time.
> - wdat (1 test):
> - WDAT Microsoft Hardware Watchdog Action Table test.
> - wmi (1 test):
> - Windows Management Instrumentation test.
> - xenv (1 test):
> - Validate XENV table.
> - xsdt (1 test):
> - XSDT Extended System Description Table test.
> -
> -Interactive tests:
> - ac_adapter (3 tests):
> - Test ACPI ac_adapter state.
> - Test ac_adapter initial on-line state.
> - Test ac_adapter state changes.
> - battery (1 test):
> - Battery test.
> - brightness (3 tests):
> - Observe all brightness changes.
> - Observe min, max brightness changes.
> - Test brightness hotkeys.
> - hotkey (1 test):
> - Hotkey keypress checks.
> - lid (3 tests):
> - Test LID buttons report open correctly.
> - Test LID buttons on a single open/close.
> - Test LID buttons on multiple open/close events.
> - power_button (1 test):
> - Test press of power button and ACPI event.
> -
> -Power States tests:
> - s3 (1 test):
> - S3 suspend/resume test.
> - s3power (1 test):
> - S3 power loss during suspend test.
> - s4 (1 test):
> - S4 hibernate/resume test.
> -
> -Utilities:
> - acpidump (1 test):
> - Dump ACPI tables.
> - cmosdump (1 test):
> - Dump CMOS Memory.
> - crsdump (1 test):
> - Dump ACPI _CRS (Current Resource Settings).
> - ebdadump (1 test):
> - Dump EBDA region.
> - esrtdump (1 test):
> - Dump ESRT Table.
> - gpedump (1 test):
> - Dump GPEs.
> - memmapdump (1 test):
> - Dump system memory map.
> - mpdump (1 test):
> - Dump Multi Processor Data.
> - plddump (1 test):
> - Dump ACPI _PLD (Physical Device Location).
> - prsdump (1 test):
> - Dump ACPI _PRS (Possible Resource Settings).
> - romdump (1 test):
> - Dump ROM data.
> - uefidump (1 test):
> - Dump UEFI Variables.
> - uefivarinfo (1 test):
> - UEFI variable info query.
> -
> -Unsafe tests:
> - uefirtauthvar (12 tests):
> - Create authenticated variable test.
> - Authenticated variable test with the same authenticated variable.
> - Authenticated variable test with another valid authenticated variable.
> - Append authenticated variable test.
> - Update authenticated variable test.
> - Authenticated variable test with old authenticated variable.
> - Delete authenticated variable test.
> - Authenticated variable test with invalid modified data.
> - Authenticated variable test with invalid modified timestamp.
> - Authenticated variable test with different guid.
> - Authenticated variable test with invalid attributes.
> - Set and delete authenticated variable created by different key test.
> - uefirtmisc (3 tests):
> - Test for UEFI miscellaneous runtime service interfaces.
> - Stress test for UEFI miscellaneous runtime service interfaces.
> - Test GetNextHighMonotonicCount with invalid NULL parameter.
> - uefirttime (35 tests):
> - Test UEFI RT service get time interface.
> - Test UEFI RT service get time interface, NULL time parameter.
> - Test UEFI RT service get time interface, NULL time and NULL
capabilties parameters.
> - Test UEFI RT service set time interface.
> - Test UEFI RT service set time interface, invalid year 1899.
> - Test UEFI RT service set time interface, invalid year 10000.
> - Test UEFI RT service set time interface, invalid month 0.
> - Test UEFI RT service set time interface, invalid month 13.
> - Test UEFI RT service set time interface, invalid day 0.
> - Test UEFI RT service set time interface, invalid day 32.
> - Test UEFI RT service set time interface, invalid hour 24.
> - Test UEFI RT service set time interface, invalid minute 60.
> - Test UEFI RT service set time interface, invalid second 60.
> - Test UEFI RT service set time interface, invalid nanosecond
1000000000.
> - Test UEFI RT service set time interface, invalid timezone -1441.
> - Test UEFI RT service set time interface, invalid timezone 1441.
> - Test UEFI RT service get wakeup time interface.
> - Test UEFI RT service get wakeup time interface, NULL enabled
parameter.
> - Test UEFI RT service get wakeup time interface, NULL pending
parameter.
> - Test UEFI RT service get wakeup time interface, NULL time parameter.
> - Test UEFI RT service get wakeup time interface, NULL enabled, pending
and time parameters.
> - Test UEFI RT service set wakeup time interface.
> - Test UEFI RT service set wakeup time interface, NULL time parameter.
> - Test UEFI RT service set wakeup time interface, invalid year 1899.
> - Test UEFI RT service set wakeup time interface, invalid year 10000.
> - Test UEFI RT service set wakeup time interface, invalid month 0.
> - Test UEFI RT service set wakeup time interface, invalid month 13.
> - Test UEFI RT service set wakeup time interface, invalid day 0.
> - Test UEFI RT service set wakeup time interface, invalid day 32.
> - Test UEFI RT service set wakeup time interface, invalid hour 24.
> - Test UEFI RT service set wakeup time interface, invalid minute 60.
> - Test UEFI RT service set wakeup time interface, invalid second 60.
> - Test UEFI RT service set wakeup time interface, invalid nanosecond
1000000000.
> - Test UEFI RT service set wakeup time interface, invalid timezone
-1441.
> - Test UEFI RT service set wakeup time interface, invalid timezone 1441.
> - uefirtvariable (8 tests):
> - Test UEFI RT service get variable interface.
> - Test UEFI RT service get next variable name interface.
> - Test UEFI RT service set variable interface.
> - Test UEFI RT service query variable info interface.
> - Test UEFI RT service variable interface stress test.
> - Test UEFI RT service set variable interface stress test.
> - Test UEFI RT service query variable info interface stress test.
> - Test UEFI RT service get variable interface, invalid parameters.
> -
> -UEFI tests:
> - csm (1 test):
> - UEFI Compatibility Support Module test.
> - esrt (1 test):
> - Sanity check UEFI ESRT Table.
> - securebootcert (1 test):
> - UEFI secure boot test.
> - uefibootpath (1 test):
> - Test UEFI Boot Path Boot####.
> - uefirtauthvar (12 tests):
> - Create authenticated variable test.
> - Authenticated variable test with the same authenticated variable.
> - Authenticated variable test with another valid authenticated variable.
> - Append authenticated variable test.
> - Update authenticated variable test.
> - Authenticated variable test with old authenticated variable.
> - Delete authenticated variable test.
> - Authenticated variable test with invalid modified data.
> - Authenticated variable test with invalid modified timestamp.
> - Authenticated variable test with different guid.
> - Authenticated variable test with invalid attributes.
> - Set and delete authenticated variable created by different key test.
> - uefirtmisc (3 tests):
> - Test for UEFI miscellaneous runtime service interfaces.
> - Stress test for UEFI miscellaneous runtime service interfaces.
> - Test GetNextHighMonotonicCount with invalid NULL parameter.
> - uefirttime (35 tests):
> - Test UEFI RT service get time interface.
> - Test UEFI RT service get time interface, NULL time parameter.
> - Test UEFI RT service get time interface, NULL time and NULL
capabilties parameters.
> - Test UEFI RT service set time interface.
> - Test UEFI RT service set time interface, invalid year 1899.
> - Test UEFI RT service set time interface, invalid year 10000.
> - Test UEFI RT service set time interface, invalid month 0.
> - Test UEFI RT service set time interface, invalid month 13.
> - Test UEFI RT service set time interface, invalid day 0.
> - Test UEFI RT service set time interface, invalid day 32.
> - Test UEFI RT service set time interface, invalid hour 24.
> - Test UEFI RT service set time interface, invalid minute 60.
> - Test UEFI RT service set time interface, invalid second 60.
> - Test UEFI RT service set time interface, invalid nanosecond
1000000000.
> - Test UEFI RT service set time interface, invalid timezone -1441.
> - Test UEFI RT service set time interface, invalid timezone 1441.
> - Test UEFI RT service get wakeup time interface.
> - Test UEFI RT service get wakeup time interface, NULL enabled
parameter.
> - Test UEFI RT service get wakeup time interface, NULL pending
parameter.
> - Test UEFI RT service get wakeup time interface, NULL time parameter.
> - Test UEFI RT service get wakeup time interface, NULL enabled, pending
and time parameters.
> - Test UEFI RT service set wakeup time interface.
> - Test UEFI RT service set wakeup time interface, NULL time parameter.
> - Test UEFI RT service set wakeup time interface, invalid year 1899.
> - Test UEFI RT service set wakeup time interface, invalid year 10000.
> - Test UEFI RT service set wakeup time interface, invalid month 0.
> - Test UEFI RT service set wakeup time interface, invalid month 13.
> - Test UEFI RT service set wakeup time interface, invalid day 0.
> - Test UEFI RT service set wakeup time interface, invalid day 32.
> - Test UEFI RT service set wakeup time interface, invalid hour 24.
> - Test UEFI RT service set wakeup time interface, invalid minute 60.
> - Test UEFI RT service set wakeup time interface, invalid second 60.
> - Test UEFI RT service set wakeup time interface, invalid nanosecond
1000000000.
> - Test UEFI RT service set wakeup time interface, invalid timezone
-1441.
> - Test UEFI RT service set wakeup time interface, invalid timezone 1441.
> - uefirtvariable (8 tests):
> - Test UEFI RT service get variable interface.
> - Test UEFI RT service get next variable name interface.
> - Test UEFI RT service set variable interface.
> - Test UEFI RT service query variable info interface.
> - Test UEFI RT service variable interface stress test.
> - Test UEFI RT service set variable interface stress test.
> - Test UEFI RT service query variable info interface stress test.
> - Test UEFI RT service get variable interface, invalid parameters.
> -
> -ACPI Spec Compliance tests:
> - fadt (6 tests):
> - ACPI FADT Description Table flag info.
> - FADT checksum test.
> - FADT revision test.
> - ACPI FADT Description Table tests.
> - Test FADT SCI_EN bit is enabled.
> - Test FADT reset register.
> - madt (5 tests):
> - MADT checksum test.
> - MADT revision test.
> - MADT architecture minimum revision test.
> - MADT flags field reserved bits test.
> - MADT subtable tests.
> - rsdp (1 test):
> - RSDP Root System Description Pointer test.
> diff --git a/fwts-test/arg-show-tests-full-0001/test-0001.sh
b/fwts-test/arg-show-tests-full-0001/test-0001.sh
> index b4e74f7..1302bd3 100755
> --- a/fwts-test/arg-show-tests-full-0001/test-0001.sh
> +++ b/fwts-test/arg-show-tests-full-0001/test-0001.sh
> @@ -3,17 +3,25 @@
> TEST="Test --show-tests-full option"
> NAME=test-0001.sh
> TMPLOG=$TMP/arg-show-tests-full.log.$$
> +export FWTS_SHOW_LOGS="FULL"
> +
> +# Dynamically create the log template per test
> +$FWTS show_logs &> /dev/null
> +if [ $? -ne 0 ]; then
> + echo SKIP: $TEST, $NAME
> + exit 77
> +fi
>
> #
> -# Non-x86 tests don't have WMI so skip this test
> +# If we can't set the tty then we can't test
> #
> -$FWTS --show-tests | grep wmi > /dev/null
> -if [ $? -eq 1 ]; then
> +stty cols 80 &> /dev/null
> +if [ $? -ne 0 ]; then
> + tset &> /dev/null
> echo SKIP: $TEST, $NAME
> exit 77
> fi
>
> -stty cols 80
> $FWTS --show-tests-full > $TMPLOG
> diff $TMPLOG
$FWTSTESTDIR/arg-show-tests-full-0001/arg-show-tests-full-0001.log >>
$FAILURE_LOG
> ret=$?
> @@ -23,5 +31,8 @@ else
> echo FAILED: $TEST, $NAME
> fi
>
> +stty cols 80 &> /dev/null
> +tset &> /dev/null
> +
> rm $TMPLOG
> exit $ret
> diff --git a/src/Makefile.am b/src/Makefile.am
> index 100eaa3..8ac67b4 100644
> --- a/src/Makefile.am
> +++ b/src/Makefile.am
> @@ -132,6 +132,7 @@ fwts_SOURCES = main.c
\
> pci/aspm/aspm.c \
> pci/crs/crs.c \
> pci/maxreadreq/maxreadreq.c \
> + show/show_logs.c \
> uefi/csm/csm.c \
> uefi/uefidump/uefidump.c \
> uefi/uefirttime/uefirttime.c \
> diff --git a/src/show/show_logs.c b/src/show/show_logs.c
> new file mode 100644
> index 0000000..7b958ff
> --- /dev/null
> +++ b/src/show/show_logs.c
> @@ -0,0 +1,1480 @@
> +/*
> + * Copyright (C) 2010-2016 Canonical
> + * Some of this work - Copyright (C) 2016 IBM
> + *
> + * This program is free software; you can redistribute it and/or
> + * modify it under the terms of the GNU General Public License
> + * as published by the Free Software Foundation; either version 2
> + * of the License, or (at your option) any later version.
> + *
> + * This program is distributed in the hope that it will be useful,
> + * but WITHOUT ANY WARRANTY; without even the implied warranty of
> + * MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
> + * GNU General Public License for more details.
> + *
> + * You should have received a copy of the GNU General Public License
> + * along with this program; if not, write to the Free Software
> + * Foundation, Inc., 51 Franklin Street, Fifth Floor, Boston, MA
02110-1301, USA.
> + *
> + */
> +
> +
> +#include "fwts.h"
> +
> +static char *fwts_show[] = {
> +"ACPI tests:",
> +" acpiinfo General ACPI information test.",
> +" acpitables ACPI table headers sanity tests.",
> +#ifdef FWTS_ARCH_INTEL
> +" apicinstance Test for single instance of APIC/MADT table.",
> +#endif
> +" asf ASF! Alert Standard Format Table test.",
> +" aspt ASPT Table test.",
> +" bert BERT Boot Error Record Table test.",
> +" bgrt BGRT Boot Graphics Resource Table test.",
> +" boot BOOT Table test.",
> +" checksum ACPI table checksum test.",
> +" cpep CPEP Corrected Platform Error Polling Table test.",
> +" csrt CSRT Core System Resource Table test.",
> +#ifdef FWTS_ARCH_INTEL
> +" cstates Processor C state support test.",
> +#endif
> +" dbg2 DBG2 (Debug Port Table 2) test.",
> +" dbgp DBGP (Debug Port) Table test.",
> +#ifdef FWTS_ARCH_INTEL
> +" dmar DMA Remapping (VT-d) test.",
> +#endif
> +" ecdt ECDT Embedded Controller Boot Resources Table test.",
> +" einj EINJ Error Injection Table test.",
> +" erst ERST Error Record Serialization Table test.",
> +" facs FACS Firmware ACPI Control Structure test.",
> +" fadt FADT Fixed ACPI Description Table tests.",
> +" fpdt FPDT Firmware Performance Data Table test.",
> +" gtdt GTDT Generic Timer Description Table test.",
> +" hest HEST Hardware Error Source Table test.",
> +#ifdef FWTS_ARCH_INTEL
> +" hpet HPET IA-PC High Precision Event Timer Table tests.",
> +#endif
> +" iort IORT IO Remapping Table test.",
> +" lpit LPIT Low Power Idle Table test.",
> +" madt MADT Multiple APIC Description Table "
> + "(spec compliant).",
> +#ifdef FWTS_ARCH_INTEL
> +" mcfg MCFG PCI Express* memory mapped config space test.",
> +#endif
> +" mchi MCHI Management Controller Host Interface"
> + " Table test.",
> +" method ACPI DSDT Method Semantic tests.",
> +" msct MSCT Maximum System Characteristics Table test.",
> +" msdm MSDM Microsoft Data Management Table test.",
> +#ifdef FWTS_ARCH_INTEL
> +" pcc Processor Clocking Control (PCC) test.",
> +#endif
> +" rsdp RSDP Root System Description Pointer test.",
> +" rsdt RSDT Root System Description Table test.",
> +" sbst SBST Smart Battery Specification Table test.",
> +" slic SLIC Software Licensing Description Table test.",
> +" slit SLIT System Locality Distance Information test.",
> +" spcr SPCR Serial Port Console Redirection Table test.",
> +" spmi SPMI Service Processor Management Interface"
> + " Description Table test.",
> +" srat SRAT System Resource Affinity Table test.",
> +" stao STAO Status Override Table test.",
> +" tcpa TCPA Trusted Computing Platform Alliance"
> + " Capabilities Table test.",
> +" tpm2 TPM2 Trusted Platform Module 2 test.",
> +" uefi UEFI Data Table test.",
> +" waet WAET Windows ACPI Emulated Devices Table test.",
> +" wdat WDAT Microsoft Hardware Watchdog Action Table test.",
> +#ifdef FWTS_ARCH_INTEL
> +" wmi Extract and analyse Windows Management"
> + " Instrumentation (WMI).",
> +#endif
> +" xenv XENV Xen Environment Table tests.",
> +" xsdt XSDT Extended System Description Table test.",
> +"",
> +"Batch tests:",
> +" acpiinfo General ACPI information test.",
> +" acpitables ACPI table headers sanity tests.",
> +#ifdef FWTS_ARCH_INTEL
> +" apicedge APIC edge/level test.",
> +" apicinstance Test for single instance of APIC/MADT table.",
> +#endif
> +" asf ASF! Alert Standard Format Table test.",
> +" aspm PCIe ASPM test.",
> +" aspt ASPT Table test.",
> +#ifdef FWTS_ARCH_INTEL
> +" autobrightness Automated LCD brightness test.",
> +#endif
> +" bert BERT Boot Error Record Table test.",
> +" bgrt BGRT Boot Graphics Resource Table test.",
> +#ifdef FWTS_ARCH_INTEL
> +" bios32 BIOS32 Service Directory test.",
> +" bios_info Gather BIOS DMI information.",
> +#endif
> +" bmc_info BMC Info",
> +" boot BOOT Table test.",
> +" checksum ACPI table checksum test.",
> +" cpep CPEP Corrected Platform Error Polling Table test.",
> +" cpufreq CPU frequency scaling tests.",
> +#ifdef FWTS_ARCH_INTEL
> +" crs Test PCI host bridge configuration using _CRS.",
> +" csm UEFI Compatibility Support Module test.",
> +#endif
> +" csrt CSRT Core System Resource Table test.",
> +#ifdef FWTS_ARCH_INTEL
> +" cstates Processor C state support test.",
> +#endif
> +" dbg2 DBG2 (Debug Port Table 2) test.",
> +" dbgp DBGP (Debug Port) Table test.",
> +#ifdef FWTS_ARCH_INTEL
> +" dmar DMA Remapping (VT-d) test.",
> +" dmicheck DMI/SMBIOS table tests.",
> +#endif
> +#ifdef HAVE_LIBFDT
> +" dt_base Base device tree validity check",
> +" dt_sysinfo Device tree system information test",
> +#endif
> +#ifdef FWTS_ARCH_INTEL
> +" ebda Test EBDA region is mapped and reserved in memory"
> + " map table.",
> +#endif
> +" ecdt ECDT Embedded Controller Boot Resources Table test.",
> +" einj EINJ Error Injection Table test.",
> +" erst ERST Error Record Serialization Table test.",
> +" facs FACS Firmware ACPI Control Structure test.",
> +" fadt FADT Fixed ACPI Description Table tests.",
> +#ifdef FWTS_ARCH_INTEL
> +" fan Simple fan tests.",
> +#endif
> +" fpdt FPDT Firmware Performance Data Table test.",
> +" gtdt GTDT Generic Timer Description Table test.",
> +" hda_audio HDA Audio Pin Configuration test.",
> +" hest HEST Hardware Error Source Table test.",
> +#ifdef FWTS_ARCH_INTEL
> +" hpet HPET IA-PC High Precision Event Timer Table tests.",
> +#endif
> +" iort IORT IO Remapping Table test.",
> +" klog Scan kernel log for errors and warnings.",
> +" lpit LPIT Low Power Idle Table test.",
> +" madt MADT Multiple APIC Description Table"
> + " (spec compliant).",
> +#ifdef FWTS_ARCH_INTEL
> +" maxfreq Test max CPU frequencies against max scaling"
> + " frequency.",
> +#endif
> +" maxreadreq Test firmware has set PCI Express MaxReadReq to a"
> + " higher value on non-motherboard devices.",
> +#ifdef FWTS_ARCH_INTEL
> +" mcfg MCFG PCI Express* memory mapped config space test.",
> +#endif
> +" mchi MCHI Management Controller Host Interface Table
test.",
> +" method ACPI DSDT Method Semantic tests.",
> +#ifdef FWTS_ARCH_INTEL
> +" microcode Test if system is using latest microcode.",
> +" mpcheck MultiProcessor Tables tests.",
> +#endif
> +" msct MSCT Maximum System Characteristics Table test.",
> +" msdm MSDM Microsoft Data Management Table test.",
> +#ifdef FWTS_ARCH_INTEL
> +" msr MSR register tests.",
> +" mtrr MTRR tests.",
> +#endif
> +#ifdef FWTS_ARCH_INTEL
> +" nx Test if CPU NX is disabled by the BIOS.",
> +#endif
> +" olog Run OLOG scan and analysis checks.",
> +" oops Scan kernel log for Oopses.",
> +#ifdef FWTS_ARCH_INTEL
> +" osilinux Disassemble DSDT to check for _OSI(\"Linux\").",
> +" pcc Processor Clocking Control (PCC) test.",
> +" pciirq PCI IRQ Routing Table test.",
> +" pnp BIOS Support Installation structure test.",
> +#endif
> +" prd_info OPAL Processor Recovery Diagnostics Info",
> +" rsdp RSDP Root System Description Pointer test.",
> +" rsdt RSDT Root System Description Table test.",
> +" sbst SBST Smart Battery Specification Table test.",
> +" securebootcert UEFI secure boot test.",
> +" show_logs Show Tests Log Files",
> +" slic SLIC Software Licensing Description Table test.",
> +" slit SLIT System Locality Distance Information test.",
> +" spcr SPCR Serial Port Console Redirection Table test.",
> +" spmi SPMI Service Processor Management Interface"
> + " Description Table test.",
> +" srat SRAT System Resource Affinity Table test.",
> +" stao STAO Status Override Table test.",
> +" syntaxcheck Re-assemble DSDT and SSDTs to find syntax errors"
> + " and warnings.",
> +" tcpa TCPA Trusted Computing Platform Alliance"
> + " Capabilities Table test.",
> +" tpm2 TPM2 Trusted Platform Module 2 test.",
> +" uefi UEFI Data Table test.",
> +" uefibootpath Sanity check for UEFI Boot Path Boot####.",
> +" version Gather kernel system information.",
> +#ifdef FWTS_ARCH_INTEL
> +" virt CPU Virtualisation Configuration test.",
> +#endif
> +" waet WAET Windows ACPI Emulated Devices Table test.",
> +" wakealarm ACPI Wakealarm tests.",
> +" wdat WDAT Microsoft Hardware Watchdog Action Table test.",
> +#ifdef FWTS_ARCH_INTEL
> +" wmi Extract and analyse Windows Management"
> + " Instrumentation (WMI).",
> +#endif
> +" xenv XENV Xen Environment Table tests.",
> +" xsdt XSDT Extended System Description Table test.",
> +"",
> +#ifdef FWTS_ARCH_INTEL
> +"Interactive tests:",
> +" ac_adapter Interactive ac_adapter power test.",
> +" battery Battery tests.",
> +" brightness Interactive LCD brightness test.",
> +" hotkey Hotkey scan code tests.",
> +" lid Interactive lid button test.",
> +" power_button Interactive power_button button test.",
> +"",
> +"Power States tests:",
> +" s3 S3 suspend/resume test.",
> +" s3power S3 power loss during suspend test (takes minimum"
> + " of 10 minutes to run).",
> +" s4 S4 hibernate/resume test.",
> +"",
> +#endif
> +"Utilities:",
> +" acpidump Dump ACPI tables.",
> +#ifdef FWTS_ARCH_INTEL
> +" cmosdump Dump CMOS Memory.",
> +#endif
> +" crsdump Dump ACPI _CRS resources.",
> +#ifdef FWTS_ARCH_INTEL
> +" ebdadump Dump EBDA region.",
> +#endif
> +" esrtdump Dump ESRT table.",
> +" gpedump Dump GPEs.",
> +#ifdef FWTS_ARCH_INTEL
> +" memmapdump Dump system memory map.",
> +" mpdump Dump MultiProcessor Data.",
> +#endif
> +" plddump Dump ACPI _PLD (Physical Device Location).",
> +" prsdump Dump ACPI _PRS resources.",
> +#ifdef FWTS_ARCH_INTEL
> +" romdump Dump ROM data.",
> +#endif
> +" uefidump Dump UEFI variables.",
> +" uefivarinfo UEFI variable info query.",
> +"",
> +"Unsafe tests:",
> +" uefirtauthvar Authenticated variable tests.",
> +" uefirtmisc UEFI miscellaneous runtime service interface tests.",
> +" uefirttime UEFI Runtime service time interface tests.",
> +" uefirtvariable UEFI Runtime service variable interface tests.",
> +"",
> +"UEFI tests:",
> +#ifdef FWTS_ARCH_INTEL
> +" csm UEFI Compatibility Support Module test.",
> +#endif
> +" esrt Sanity check UEFI ESRT Table.",
> +" securebootcert UEFI secure boot test.",
> +" uefibootpath Sanity check for UEFI Boot Path Boot####.",
> +" uefirtauthvar Authenticated variable tests.",
> +" uefirtmisc UEFI miscellaneous runtime service interface tests.",
> +" uefirttime UEFI Runtime service time interface tests.",
> +" uefirtvariable UEFI Runtime service variable interface tests.",
> +"",
> +"ACPI Spec Compliance tests:",
> +" fadt FADT Fixed ACPI Description Table tests.",
> +" madt MADT Multiple APIC Description Table"
> + " (spec compliant).",
> +" rsdp RSDP Root System Description Pointer test.",
> +};
> +
> +static char *fwts_show_all[] = {
> +"ACPI tests:",
> +" acpiinfo (3 tests):",
> +" Determine Kernel ACPI version.",
> +" Determine machine's ACPI version.",
> +" Determine AML compiler.",
> +" acpitables (1 test):",
> +" Test ACPI headers.",
> +#ifdef FWTS_ARCH_INTEL
> +" apicinstance (1 test):",
> +" Test for single instance of APIC/MADT table.",
> +#endif
> +" asf (1 test):",
> +" ASF! Alert Standard Format Table test.",
> +" aspt (1 test):",
> +" ASPT Table test.",
> +" bert (1 test):",
> +" BERT Boot Error Record Table test.",
> +" bgrt (1 test):",
> +" BGRT Boot Graphics Resource Table test.",
> +" boot (1 test):",
> +" BOOT Table test.",
> +" checksum (1 test):",
> +" ACPI table checksum test.",
> +" cpep (1 test):",
> +" CPEP Corrected Platform Error Polling Table test.",
> +" csrt (1 test):",
> +" CSRT Core System Resource Table test.",
> +#ifdef FWTS_ARCH_INTEL
> +" cstates (1 test):",
> +" Test all CPUs C-states.",
> +#endif
> +" dbg2 (1 test):",
> +" DBG2 (Debug Port Table 2) test.",
> +" dbgp (1 test):",
> +" DBGP (Debug Port) Table test.",
> +#ifdef FWTS_ARCH_INTEL
> +" dmar (1 test):",
> +" DMA Remapping test.",
> +#endif
> +" ecdt (1 test):",
> +" ECDT Embedded Controller Boot Resources Table test.",
> +" einj (1 test):",
> +" EINJ Error Injection Table test.",
> +" erst (1 test):",
> +" ERST Error Record Serialization Table test.",
> +" facs (1 test):",
> +" FACS Firmware ACPI Control Structure test.",
> +" fadt (6 tests):",
> +" ACPI FADT Description Table flag info.",
> +" FADT checksum test.",
> +" FADT revision test.",
> +" ACPI FADT Description Table tests.",
> +" Test FADT SCI_EN bit is enabled.",
> +" Test FADT reset register.",
> +" fpdt (1 test):",
> +" FPDT Firmware Performance Data Table test.",
> +" gtdt (1 test):",
> +" GTDT Generic Timer Description Table test.",
> +" hest (1 test):",
> +" HEST Hardware Error Source Table test.",
> +#ifdef FWTS_ARCH_INTEL
> +" hpet (4 tests):",
> +" Test HPET base in kernel log.",
> +" Test HPET base in HPET table.",
> +" Test HPET base in DSDT and/or SSDT.",
> +" Test HPET configuration.",
> +#endif
> +" iort (1 test):",
> +" IORT IO Remapping Table test.",
> +" lpit (1 test):",
> +" LPIT Low Power Idle Table test.",
> +" madt (5 tests):",
> +" MADT checksum test.",
> +" MADT revision test.",
> +" MADT architecture minimum revision test.",
> +" MADT flags field reserved bits test.",
> +" MADT subtable tests.",
> +#ifdef FWTS_ARCH_INTEL
> +" mcfg (2 tests):",
> +" Validate MCFG table.",
> +" Validate MCFG PCI config space.",
> +#endif
> +" mchi (1 test):",
> +" MCHI Management Controller Host Interface Table test.",
> +" method (191 tests):",
> +" Test Method Names.",
> +" Test _AEI.",
> +" Test _EVT (Event Method).",
> +" Test _DLM (Device Lock Mutex).",
> +" Test _PIC (Inform AML of Interrupt Model).",
> +" Test _CID (Compatible ID).",
> +" Test _DDN (DOS Device Name).",
> +" Test _HID (Hardware ID).",
> +" Test _HRV (Hardware Revision Number).",
> +" Test _MLS (Multiple Language String).",
> +" Test _PLD (Physical Device Location).",
> +" Test _SUB (Subsystem ID).",
> +" Test _SUN (Slot User Number).",
> +" Test _STR (String).",
> +" Test _UID (Unique ID).",
> +" Test _CDM (Clock Domain).",
> +" Test _CRS (Current Resource Settings).",
> +" Test _DSD (Device Specific Data).",
> +" Test _DIS (Disable).",
> +" Test _DMA (Direct Memory Access).",
> +" Test _FIX (Fixed Register Resource Provider).",
> +" Test _GSB (Global System Interrupt Base).",
> +" Test _HPP (Hot Plug Parameters).",
> +" Test _PRS (Possible Resource Settings).",
> +" Test _PRT (PCI Routing Table).",
> +" Test _PXM (Proximity).",
> +" Test _CCA (Cache Coherency Attribute).",
> +" Test _EDL (Eject Device List).",
> +" Test _EJD (Ejection Dependent Device).",
> +" Test _EJ0 (Eject).",
> +" Test _EJ1 (Eject).",
> +" Test _EJ2 (Eject).",
> +" Test _EJ3 (Eject).",
> +" Test _EJ4 (Eject).",
> +" Test _LCK (Lock).",
> +" Test _RMV (Remove).",
> +" Test _STA (Status).",
> +" Test _DEP (Operational Region Dependencies).",
> +" Test _BDN (BIOS Dock Name).",
> +" Test _BBN (Base Bus Number).",
> +" Test _DCK (Dock).",
> +" Test _INI (Initialize).",
> +" Test _GLK (Global Lock).",
> +" Test _SEG (Segment).",
> +" Test _OFF (Set resource off).",
> +" Test _ON_ (Set resource on).",
> +" Test _DSW (Device Sleep Wake).",
> +" Test _IRC (In Rush Current).",
> +" Test _PRE (Power Resources for Enumeration).",
> +" Test _PR0 (Power Resources for D0).",
> +" Test _PR1 (Power Resources for D1).",
> +" Test _PR2 (Power Resources for D2).",
> +" Test _PR3 (Power Resources for D3).",
> +" Test _PRW (Power Resources for Wake).",
> +" Test _PS0 (Power State 0).",
> +" Test _PS1 (Power State 1).",
> +" Test _PS2 (Power State 2).",
> +" Test _PS3 (Power State 3).",
> +" Test _PSC (Power State Current).",
> +" Test _PSE (Power State for Enumeration).",
> +" Test _PSW (Power State Wake).",
> +" Test _S1D (S1 Device State).",
> +" Test _S2D (S2 Device State).",
> +" Test _S3D (S3 Device State).",
> +" Test _S4D (S4 Device State).",
> +" Test _S0W (S0 Device Wake State).",
> +" Test _S1W (S1 Device Wake State).",
> +" Test _S2W (S2 Device Wake State).",
> +" Test _S3W (S3 Device Wake State).",
> +" Test _S4W (S4 Device Wake State).",
> +" Test _RST (Device Reset).",
> +" Test _PRR (Power Resource for Reset).",
> +" Test _S0_ (S0 System State).",
> +" Test _S1_ (S1 System State).",
> +" Test _S2_ (S2 System State).",
> +" Test _S3_ (S3 System State).",
> +" Test _S4_ (S4 System State).",
> +" Test _S5_ (S5 System State).",
> +" Test _SWS (System Wake Source).",
> +" Test _PSS (Performance Supported States).",
> +" Test _CPC (Continuous Performance Control).",
> +" Test _CSD (C State Dependencies).",
> +" Test _CST (C States).",
> +" Test _PCT (Performance Control).",
> +" Test _PDL (P-State Depth Limit).",
> +" Test _PPC (Performance Present Capabilities).",
> +" Test _PPE (Polling for Platform Error).",
> +" Test _PSD (Power State Dependencies).",
> +" Test _PTC (Processor Throttling Control).",
> +" Test _TDL (T-State Depth Limit).",
> +" Test _TPC (Throttling Present Capabilities).",
> +" Test _TSD (Throttling State Dependencies).",
> +" Test _TSS (Throttling Supported States).",
> +" Test _LPI (Low Power Idle States).",
> +" Test _RDI (Resource Dependencies for Idle).",
> +" Test _PUR (Processor Utilization Request).",
> +" Test _MSG (Message).",
> +" Test _SST (System Status).",
> +" Test _ALC (Ambient Light Colour Chromaticity).",
> +" Test _ALI (Ambient Light Illuminance).",
> +" Test _ALT (Ambient Light Temperature).",
> +" Test _ALP (Ambient Light Polling).",
> +" Test _ALR (Ambient Light Response).",
> +" Test _LID (Lid Status).",
> +" Test _GTF (Get Task File).",
> +" Test _GTM (Get Timing Mode).",
> +" Test _MBM (Memory Bandwidth Monitoring Data).",
> +" Test _UPC (USB Port Capabilities).",
> +" Test _UPD (User Presence Detect).",
> +" Test _UPP (User Presence Polling).",
> +" Test _GCP (Get Capabilities).",
> +" Test _GRT (Get Real Time).",
> +" Test _GWS (Get Wake Status).",
> +" Test _CWS (Clear Wake Status).",
> +" Test _STP (Set Expired Timer Wake Policy).",
> +" Test _STV (Set Timer Value).",
> +" Test _TIP (Expired Timer Wake Policy).",
> +" Test _TIV (Timer Values).",
> +" Test _SBS (Smart Battery Subsystem).",
> +" Test _BCT (Battery Charge Time).",
> +" Test _BIF (Battery Information).",
> +" Test _BIX (Battery Information Extended).",
> +" Test _BMA (Battery Measurement Averaging).",
> +" Test _BMC (Battery Maintenance Control).",
> +" Test _BMD (Battery Maintenance Data).",
> +" Test _BMS (Battery Measurement Sampling Time).",
> +" Test _BST (Battery Status).",
> +" Test _BTP (Battery Trip Point).",
> +" Test _BTH (Battery Throttle Limit).",
> +" Test _BTM (Battery Time).",
> +" Test _PCL (Power Consumer List).",
> +" Test _PIF (Power Source Information).",
> +" Test _PRL (Power Source Redundancy List).",
> +" Test _PSR (Power Source).",
> +" Test _GAI (Get Averaging Level).",
> +" Test _GHL (Get Harware Limit).",
> +" Test _PMC (Power Meter Capabilities).",
> +" Test _PMD (Power Meter Devices).",
> +" Test _PMM (Power Meter Measurement).",
> +" Test _WPC (Wireless Power Calibration).",
> +" Test _WPP (Wireless Power Polling).",
> +" Test _FIF (Fan Information).",
> +" Test _FPS (Fan Performance States).",
> +" Test _FSL (Fan Set Level).",
> +" Test _FST (Fan Status).",
> +" Test _ACx (Active Cooling).",
> +" Test _ART (Active Cooling Relationship Table).",
> +" Test _CRT (Critical Trip Point).",
> +" Test _CR3 (Warm/Standby Temperature).",
> +" Test _DTI (Device Temperature Indication).",
> +" Test _HOT (Hot Temperature).",
> +" Test _MTL (Minimum Throttle Limit).",
> +" Test _NTT (Notification Temp Threshold).",
> +" Test _PSL (Passive List).",
> +" Test _PSV (Passive Temp).",
> +" Test _RTV (Relative Temp Values).",
> +" Test _SCP (Set Cooling Policy).",
> +" Test _TC1 (Thermal Constant 1).",
> +" Test _TC2 (Thermal Constant 2).",
> +" Test _TFP (Thermal fast Sampling Period).",
> +" Test _TMP (Thermal Zone Current Temp).",
> +" Test _TPT (Trip Point Temperature).",
> +" Test _TRT (Thermal Relationship Table).",
> +" Test _TSN (Thermal Sensor Device).",
> +" Test _TSP (Thermal Sampling Period).",
> +" Test _TST (Temperature Sensor Threshold).",
> +" Test _TZD (Thermal Zone Devices).",
> +" Test _TZM (Thermal Zone member).",
> +" Test _TZP (Thermal Zone Polling).",
> +" Test _GPE (General Purpose Events).",
> +" Test _EC_ (EC Offset Query).",
> +" Test _PTS (Prepare to Sleep).",
> +" Test _TTS (Transition to State).",
> +" Test _WAK (System Wake).",
> +" Test _ADR (Return Unique ID for Device).",
> +" Test _BCL (Query List of Brightness Control Levels Supported).",
> +" Test _BCM (Set Brightness Level).",
> +" Test _BQC (Brightness Query Current Level).",
> +" Test _DCS (Return the Status of Output Device).",
> +" Test _DDC (Return the EDID for this Device).",
> +" Test _DSS (Device Set State).",
> +" Test _DGS (Query Graphics State).",
> +" Test _DOD (Enumerate All Devices Attached to Display Adapter).",
> +" Test _DOS (Enable/Disable Output Switching).",
> +" Test _GPD (Get POST Device).",
> +" Test _ROM (Get ROM Data).",
> +" Test _SPD (Set POST Device).",
> +" Test _VPO (Video POST Options).",
> +" Test _CBA (Configuration Base Address).",
> +" Test _IFT (IPMI Interface Type).",
> +" Test _SRV (IPMI Interface Revision).",
> +" msct (1 test):",
> +" MSCT Maximum System Characteristics Table test.",
> +" msdm (1 test):",
> +" MSDM Microsoft Data Management Table test.",
> +#ifdef FWTS_ARCH_INTEL
> +" pcc (1 test):",
> +" Processor Clocking Control (PCC) test.",
> +#endif
> +" rsdp (1 test):",
> +" RSDP Root System Description Pointer test.",
> +" rsdt (1 test):",
> +" RSDT Root System Description Table test.",
> +" sbst (1 test):",
> +" SBST Smart Battery Specificiation Table test.",
> +" slic (1 test):",
> +" SLIC Software Licensing Description Table test.",
> +" slit (1 test):",
> +" SLIT System Locality Distance Information test.",
> +" spcr (1 test):",
> +" SPCR Serial Port Console Redirection Table test.",
> +" spmi (1 test):",
> +" SPMI Service Processor Management Interface Description Table test.",
> +" srat (1 test):",
> +" SRAT System Resource Affinity Table test.",
> +" stao (1 test):",
> +" STAO Status Override Table test.",
> +" tcpa (1 test):",
> +" Validate TCPA table.",
> +" tpm2 (1 test):",
> +" Validate TPM2 table.",
> +" uefi (1 test):",
> +" UEFI Data Table test.",
> +" waet (1 test):",
> +" Windows ACPI Emulated Devices Table test.",
> +" wdat (1 test):",
> +" WDAT Microsoft Hardware Watchdog Action Table test.",
> +#ifdef FWTS_ARCH_INTEL
> +" wmi (1 test):",
> +" Windows Management Instrumentation test.",
> +#endif
> +" xenv (1 test):",
> +" Validate XENV table.",
> +" xsdt (1 test):",
> +" XSDT Extended System Description Table test.",
> +"",
> +"Batch tests:",
> +" acpiinfo (3 tests):",
> +" Determine Kernel ACPI version.",
> +" Determine machine's ACPI version.",
> +" Determine AML compiler.",
> +" acpitables (1 test):",
> +" Test ACPI headers.",
> +#ifdef FWTS_ARCH_INTEL
> +" apicedge (1 test):",
> +" Legacy and PCI Interrupt Edge/Level trigger tests.",
> +" apicinstance (1 test):",
> +" Test for single instance of APIC/MADT table.",
> +#endif
> +" asf (1 test):",
> +" ASF! Alert Standard Format Table test.",
> +" aspm (2 tests):",
> +" PCIe ASPM ACPI test.",
> +" PCIe ASPM registers test.",
> +" aspt (1 test):",
> +" ASPT Table test.",
> +#ifdef FWTS_ARCH_INTEL
> +" autobrightness (2 tests):",
> +" Test for maximum and actual brightness.",
> +" Change actual brightness.",
> +#endif
> +" bert (1 test):",
> +" BERT Boot Error Record Table test.",
> +" bgrt (1 test):",
> +" BGRT Boot Graphics Resource Table test.",
> +#ifdef FWTS_ARCH_INTEL
> +" bios32 (1 test):",
> +" BIOS32 Service Directory test.",
> +" bios_info (1 test):",
> +" Gather BIOS DMI information",
> +#endif
> +" bmc_info (1 test):",
> +" BMC Info",
> +" boot (1 test):",
> +" BOOT Table test.",
> +" checksum (1 test):",
> +" ACPI table checksum test.",
> +" cpep (1 test):",
> +" CPEP Corrected Platform Error Polling Table test.",
> +" cpufreq (7 tests):",
> +" CPU frequency table consistency",
> +" CPU frequency table duplicates",
> +" CPU frequency firmware limits",
> +" CPU frequency claimed maximum",
> +" CPU frequency SW_ANY control",
> +" CPU frequency SW_ALL control",
> +" CPU frequency performance tests.",
> +#ifdef FWTS_ARCH_INTEL
> +" crs (1 test):",
> +" Test PCI host bridge configuration using _CRS.",
> +" csm (1 test):",
> +" UEFI Compatibility Support Module test.",
> +#endif
> +" csrt (1 test):",
> +" CSRT Core System Resource Table test.",
> +#ifdef FWTS_ARCH_INTEL
> +" cstates (1 test):",
> +" Test all CPUs C-states.",
> +#endif
> +" dbg2 (1 test):",
> +" DBG2 (Debug Port Table 2) test.",
> +" dbgp (1 test):",
> +" DBGP (Debug Port) Table test.",
> +#ifdef FWTS_ARCH_INTEL
> +" dmar (1 test):",
> +" DMA Remapping test.",
> +" dmicheck (3 tests):",
> +" Find and test SMBIOS Table Entry Points.",
> +" Test DMI/SMBIOS tables for errors.",
> +" Test DMI/SMBIOS3 tables for errors.",
> +#endif
> +#ifdef HAVE_LIBFDT
> +" dt_base (3 tests):",
> +" Check device tree presence",
> +" Check device tree baseline validity",
> +" Check device tree warnings",
> +" dt_sysinfo (3 tests):",
> +" Check model property",
> +" Check system-id property",
> +" Check OpenPOWER Reference compatible",
> +#endif
> +#ifdef FWTS_ARCH_INTEL
> +" ebda (1 test):",
> +" Test EBDA is reserved in E820 table.",
> +#endif
> +" ecdt (1 test):",
> +" ECDT Embedded Controller Boot Resources Table test.",
> +" einj (1 test):",
> +" EINJ Error Injection Table test.",
> +" erst (1 test):",
> +" ERST Error Record Serialization Table test.",
> +" facs (1 test):",
> +" FACS Firmware ACPI Control Structure test.",
> +" fadt (6 tests):",
> +" ACPI FADT Description Table flag info.",
> +" FADT checksum test.",
> +" FADT revision test.",
> +" ACPI FADT Description Table tests.",
> +" Test FADT SCI_EN bit is enabled.",
> +" Test FADT reset register.",
> +#ifdef FWTS_ARCH_INTEL
> +" fan (2 tests):",
> +" Test fan status.",
> +" Load system, check CPU fan status.",
> +#endif
> +" fpdt (1 test):",
> +" FPDT Firmware Performance Data Table test.",
> +" gtdt (1 test):",
> +" GTDT Generic Timer Description Table test.",
> +" hda_audio (1 test):",
> +" HDA Audio Pin Configuration test.",
> +" hest (1 test):",
> +" HEST Hardware Error Source Table test.",
> +#ifdef FWTS_ARCH_INTEL
> +" hpet (4 tests):",
> +" Test HPET base in kernel log.",
> +" Test HPET base in HPET table.",
> +" Test HPET base in DSDT and/or SSDT.",
> +" Test HPET configuration.",
> +#endif
> +" iort (1 test):",
> +" IORT IO Remapping Table test.",
> +" klog (1 test):",
> +" Kernel log error check.",
> +" lpit (1 test):",
> +" LPIT Low Power Idle Table test.",
> +" madt (5 tests):",
> +" MADT checksum test.",
> +" MADT revision test.",
> +" MADT architecture minimum revision test.",
> +" MADT flags field reserved bits test.",
> +" MADT subtable tests.",
> +#ifdef FWTS_ARCH_INTEL
> +" maxfreq (1 test):",
> +" Maximum CPU frequency test.",
> +#endif
> +" maxreadreq (1 test):",
> +" Test firmware settings MaxReadReq for PCI Express devices.",
> +#ifdef FWTS_ARCH_INTEL
> +" mcfg (2 tests):",
> +" Validate MCFG table.",
> +" Validate MCFG PCI config space.",
> +#endif
> +" mchi (1 test):",
> +" MCHI Management Controller Host Interface Table test.",
> +" method (191 tests):",
> +" Test Method Names.",
> +" Test _AEI.",
> +" Test _EVT (Event Method).",
> +" Test _DLM (Device Lock Mutex).",
> +" Test _PIC (Inform AML of Interrupt Model).",
> +" Test _CID (Compatible ID).",
> +" Test _DDN (DOS Device Name).",
> +" Test _HID (Hardware ID).",
> +" Test _HRV (Hardware Revision Number).",
> +" Test _MLS (Multiple Language String).",
> +" Test _PLD (Physical Device Location).",
> +" Test _SUB (Subsystem ID).",
> +" Test _SUN (Slot User Number).",
> +" Test _STR (String).",
> +" Test _UID (Unique ID).",
> +" Test _CDM (Clock Domain).",
> +" Test _CRS (Current Resource Settings).",
> +" Test _DSD (Device Specific Data).",
> +" Test _DIS (Disable).",
> +" Test _DMA (Direct Memory Access).",
> +" Test _FIX (Fixed Register Resource Provider).",
> +" Test _GSB (Global System Interrupt Base).",
> +" Test _HPP (Hot Plug Parameters).",
> +" Test _PRS (Possible Resource Settings).",
> +" Test _PRT (PCI Routing Table).",
> +" Test _PXM (Proximity).",
> +" Test _CCA (Cache Coherency Attribute).",
> +" Test _EDL (Eject Device List).",
> +" Test _EJD (Ejection Dependent Device).",
> +" Test _EJ0 (Eject).",
> +" Test _EJ1 (Eject).",
> +" Test _EJ2 (Eject).",
> +" Test _EJ3 (Eject).",
> +" Test _EJ4 (Eject).",
> +" Test _LCK (Lock).",
> +" Test _RMV (Remove).",
> +" Test _STA (Status).",
> +" Test _DEP (Operational Region Dependencies).",
> +" Test _BDN (BIOS Dock Name).",
> +" Test _BBN (Base Bus Number).",
> +" Test _DCK (Dock).",
> +" Test _INI (Initialize).",
> +" Test _GLK (Global Lock).",
> +" Test _SEG (Segment).",
> +" Test _OFF (Set resource off).",
> +" Test _ON_ (Set resource on).",
> +" Test _DSW (Device Sleep Wake).",
> +" Test _IRC (In Rush Current).",
> +" Test _PRE (Power Resources for Enumeration).",
> +" Test _PR0 (Power Resources for D0).",
> +" Test _PR1 (Power Resources for D1).",
> +" Test _PR2 (Power Resources for D2).",
> +" Test _PR3 (Power Resources for D3).",
> +" Test _PRW (Power Resources for Wake).",
> +" Test _PS0 (Power State 0).",
> +" Test _PS1 (Power State 1).",
> +" Test _PS2 (Power State 2).",
> +" Test _PS3 (Power State 3).",
> +" Test _PSC (Power State Current).",
> +" Test _PSE (Power State for Enumeration).",
> +" Test _PSW (Power State Wake).",
> +" Test _S1D (S1 Device State).",
> +" Test _S2D (S2 Device State).",
> +" Test _S3D (S3 Device State).",
> +" Test _S4D (S4 Device State).",
> +" Test _S0W (S0 Device Wake State).",
> +" Test _S1W (S1 Device Wake State).",
> +" Test _S2W (S2 Device Wake State).",
> +" Test _S3W (S3 Device Wake State).",
> +" Test _S4W (S4 Device Wake State).",
> +" Test _RST (Device Reset).",
> +" Test _PRR (Power Resource for Reset).",
> +" Test _S0_ (S0 System State).",
> +" Test _S1_ (S1 System State).",
> +" Test _S2_ (S2 System State).",
> +" Test _S3_ (S3 System State).",
> +" Test _S4_ (S4 System State).",
> +" Test _S5_ (S5 System State).",
> +" Test _SWS (System Wake Source).",
> +" Test _PSS (Performance Supported States).",
> +" Test _CPC (Continuous Performance Control).",
> +" Test _CSD (C State Dependencies).",
> +" Test _CST (C States).",
> +" Test _PCT (Performance Control).",
> +" Test _PDL (P-State Depth Limit).",
> +" Test _PPC (Performance Present Capabilities).",
> +" Test _PPE (Polling for Platform Error).",
> +" Test _PSD (Power State Dependencies).",
> +" Test _PTC (Processor Throttling Control).",
> +" Test _TDL (T-State Depth Limit).",
> +" Test _TPC (Throttling Present Capabilities).",
> +" Test _TSD (Throttling State Dependencies).",
> +" Test _TSS (Throttling Supported States).",
> +" Test _LPI (Low Power Idle States).",
> +" Test _RDI (Resource Dependencies for Idle).",
> +" Test _PUR (Processor Utilization Request).",
> +" Test _MSG (Message).",
> +" Test _SST (System Status).",
> +" Test _ALC (Ambient Light Colour Chromaticity).",
> +" Test _ALI (Ambient Light Illuminance).",
> +" Test _ALT (Ambient Light Temperature).",
> +" Test _ALP (Ambient Light Polling).",
> +" Test _ALR (Ambient Light Response).",
> +" Test _LID (Lid Status).",
> +" Test _GTF (Get Task File).",
> +" Test _GTM (Get Timing Mode).",
> +" Test _MBM (Memory Bandwidth Monitoring Data).",
> +" Test _UPC (USB Port Capabilities).",
> +" Test _UPD (User Presence Detect).",
> +" Test _UPP (User Presence Polling).",
> +" Test _GCP (Get Capabilities).",
> +" Test _GRT (Get Real Time).",
> +" Test _GWS (Get Wake Status).",
> +" Test _CWS (Clear Wake Status).",
> +" Test _STP (Set Expired Timer Wake Policy).",
> +" Test _STV (Set Timer Value).",
> +" Test _TIP (Expired Timer Wake Policy).",
> +" Test _TIV (Timer Values).",
> +" Test _SBS (Smart Battery Subsystem).",
> +" Test _BCT (Battery Charge Time).",
> +" Test _BIF (Battery Information).",
> +" Test _BIX (Battery Information Extended).",
> +" Test _BMA (Battery Measurement Averaging).",
> +" Test _BMC (Battery Maintenance Control).",
> +" Test _BMD (Battery Maintenance Data).",
> +" Test _BMS (Battery Measurement Sampling Time).",
> +" Test _BST (Battery Status).",
> +" Test _BTP (Battery Trip Point).",
> +" Test _BTH (Battery Throttle Limit).",
> +" Test _BTM (Battery Time).",
> +" Test _PCL (Power Consumer List).",
> +" Test _PIF (Power Source Information).",
> +" Test _PRL (Power Source Redundancy List).",
> +" Test _PSR (Power Source).",
> +" Test _GAI (Get Averaging Level).",
> +" Test _GHL (Get Harware Limit).",
> +" Test _PMC (Power Meter Capabilities).",
> +" Test _PMD (Power Meter Devices).",
> +" Test _PMM (Power Meter Measurement).",
> +" Test _WPC (Wireless Power Calibration).",
> +" Test _WPP (Wireless Power Polling).",
> +" Test _FIF (Fan Information).",
> +" Test _FPS (Fan Performance States).",
> +" Test _FSL (Fan Set Level).",
> +" Test _FST (Fan Status).",
> +" Test _ACx (Active Cooling).",
> +" Test _ART (Active Cooling Relationship Table).",
> +" Test _CRT (Critical Trip Point).",
> +" Test _CR3 (Warm/Standby Temperature).",
> +" Test _DTI (Device Temperature Indication).",
> +" Test _HOT (Hot Temperature).",
> +" Test _MTL (Minimum Throttle Limit).",
> +" Test _NTT (Notification Temp Threshold).",
> +" Test _PSL (Passive List).",
> +" Test _PSV (Passive Temp).",
> +" Test _RTV (Relative Temp Values).",
> +" Test _SCP (Set Cooling Policy).",
> +" Test _TC1 (Thermal Constant 1).",
> +" Test _TC2 (Thermal Constant 2).",
> +" Test _TFP (Thermal fast Sampling Period).",
> +" Test _TMP (Thermal Zone Current Temp).",
> +" Test _TPT (Trip Point Temperature).",
> +" Test _TRT (Thermal Relationship Table).",
> +" Test _TSN (Thermal Sensor Device).",
> +" Test _TSP (Thermal Sampling Period).",
> +" Test _TST (Temperature Sensor Threshold).",
> +" Test _TZD (Thermal Zone Devices).",
> +" Test _TZM (Thermal Zone member).",
> +" Test _TZP (Thermal Zone Polling).",
> +" Test _GPE (General Purpose Events).",
> +" Test _EC_ (EC Offset Query).",
> +" Test _PTS (Prepare to Sleep).",
> +" Test _TTS (Transition to State).",
> +" Test _WAK (System Wake).",
> +" Test _ADR (Return Unique ID for Device).",
> +" Test _BCL (Query List of Brightness Control Levels Supported).",
> +" Test _BCM (Set Brightness Level).",
> +" Test _BQC (Brightness Query Current Level).",
> +" Test _DCS (Return the Status of Output Device).",
> +" Test _DDC (Return the EDID for this Device).",
> +" Test _DSS (Device Set State).",
> +" Test _DGS (Query Graphics State).",
> +" Test _DOD (Enumerate All Devices Attached to Display Adapter).",
> +" Test _DOS (Enable/Disable Output Switching).",
> +" Test _GPD (Get POST Device).",
> +" Test _ROM (Get ROM Data).",
> +" Test _SPD (Set POST Device).",
> +" Test _VPO (Video POST Options).",
> +" Test _CBA (Configuration Base Address).",
> +" Test _IFT (IPMI Interface Type).",
> +" Test _SRV (IPMI Interface Revision).",
> +#ifdef FWTS_ARCH_INTEL
> +" microcode (1 test):",
> +" Test for most recent microcode being loaded.",
> +" mpcheck (9 tests):",
> +" Test MP header.",
> +" Test MP CPU entries.",
> +" Test MP Bus entries.",
> +" Test MP IO APIC entries.",
> +" Test MP IO Interrupt entries.",
> +" Test MP Local Interrupt entries.",
> +" Test MP System Address entries.",
> +" Test MP Bus Hierarchy entries.",
> +" Test MP Compatible Bus Address Space entries.",
> +#endif
> +" msct (1 test):",
> +" MSCT Maximum System Characteristics Table test.",
> +" msdm (1 test):",
> +" MSDM Microsoft Data Management Table test.",
> +#ifdef FWTS_ARCH_INTEL
> +" msr (5 tests):",
> +" Test CPU generic MSRs.",
> +" Test CPU specific model MSRs.",
> +" Test all P State Ratios.",
> +" Test C1 and C3 autodemotion.",
> +" Test SMRR MSR registers.",
> +" mtrr (3 tests):",
> +" Validate the kernel MTRR IOMEM setup.",
> +" Validate the MTRR setup across all processors.",
> +" Test for AMD MtrrFixDramModEn being cleared by the BIOS.",
> +" nx (3 tests):",
> +" Test CPU NX capability.",
> +" Test all CPUs have same BIOS set NX flag.",
> +" Test all CPUs have same msr setting in MSR 0x1a0.",
> +#endif
> +" olog (1 test):",
> +" OLOG scan and analysis checks results.",
> +" oops (1 test):",
> +" Kernel log oops check.",
> +#ifdef FWTS_ARCH_INTEL
> +" osilinux (1 test):",
> +" Disassemble DSDT to check for _OSI(\"Linux\").",
> +" pcc (1 test):",
> +" Processor Clocking Control (PCC) test.",
> +" pciirq (1 test):",
> +" PCI IRQ Routing Table test.",
> +" pnp (1 test):",
> +" PnP BIOS Support Installation structure test.",
> +#endif
> +" prd_info (1 test):",
> +" OPAL Processor Recovery Diagnostics Info",
> +" rsdp (1 test):",
> +" RSDP Root System Description Pointer test.",
> +" rsdt (1 test):",
> +" RSDT Root System Description Table test.",
> +" sbst (1 test):",
> +" SBST Smart Battery Specificiation Table test.",
> +" securebootcert (1 test):",
> +" UEFI secure boot test.",
> +" show_logs (1 test):",
> +" Show Tests Log Files",
> +" slic (1 test):",
> +" SLIC Software Licensing Description Table test.",
> +" slit (1 test):",
> +" SLIT System Locality Distance Information test.",
> +" spcr (1 test):",
> +" SPCR Serial Port Console Redirection Table test.",
> +" spmi (1 test):",
> +" SPMI Service Processor Management Interface Description Table test.",
> +" srat (1 test):",
> +" SRAT System Resource Affinity Table test.",
> +" stao (1 test):",
> +" STAO Status Override Table test.",
> +" syntaxcheck (1 test):",
> +" Disassemble and reassemble DSDT and SSDTs.",
> +" tcpa (1 test):",
> +" Validate TCPA table.",
> +" tpm2 (1 test):",
> +" Validate TPM2 table.",
> +" uefi (1 test):",
> +" UEFI Data Table test.",
> +" uefibootpath (1 test):",
> +" Test UEFI Boot Path Boot####.",
> +" version (4 tests):",
> +" Gather kernel signature.",
> +" Gather kernel system information.",
> +" Gather kernel boot command line.",
> +" Gather ACPI driver version.",
> +#ifdef FWTS_ARCH_INTEL
> +" virt (1 test):",
> +" CPU Virtualisation Configuration test.",
> +#endif
> +" waet (1 test):",
> +" Windows ACPI Emulated Devices Table test.",
> +" wakealarm (5 tests):",
> +" Test existence of RTC with alarm interface.",
> +" Trigger wakealarm for 1 seconds in the future.",
> +" Test if wakealarm is fired.",
> +" Multiple wakealarm firing tests.",
> +" Reset wakealarm time.",
> +" wdat (1 test):",
> +" WDAT Microsoft Hardware Watchdog Action Table test.",
> +#ifdef FWTS_ARCH_INTEL
> +" wmi (1 test):",
> +" Windows Management Instrumentation test.",
> +#endif
> +" xenv (1 test):",
> +" Validate XENV table.",
> +" xsdt (1 test):",
> +" XSDT Extended System Description Table test.",
> +"",
> +#ifdef FWTS_ARCH_INTEL
> +"Interactive tests:",
> +" ac_adapter (3 tests):",
> +" Test ACPI ac_adapter state.",
> +" Test ac_adapter initial on-line state.",
> +" Test ac_adapter state changes.",
> +" battery (1 test):",
> +" Battery test.",
> +" brightness (3 tests):",
> +" Observe all brightness changes.",
> +" Observe min, max brightness changes.",
> +" Test brightness hotkeys.",
> +" hotkey (1 test):",
> +" Hotkey keypress checks.",
> +" lid (3 tests):",
> +" Test LID buttons report open correctly.",
> +" Test LID buttons on a single open/close.",
> +" Test LID buttons on multiple open/close events.",
> +" power_button (1 test):",
> +" Test press of power button and ACPI event.",
> +"",
> +"Power States tests:",
> +" s3 (1 test):",
> +" S3 suspend/resume test.",
> +" s3power (1 test):",
> +" S3 power loss during suspend test.",
> +" s4 (1 test):",
> +" S4 hibernate/resume test.",
> +"",
> +#endif
> +"Utilities:",
> +" acpidump (1 test):",
> +" Dump ACPI tables.",
> +#ifdef FWTS_ARCH_INTEL
> +" cmosdump (1 test):",
> +" Dump CMOS Memory.",
> +#endif
> +" crsdump (1 test):",
> +" Dump ACPI _CRS (Current Resource Settings).",
> +#ifdef FWTS_ARCH_INTEL
> +" ebdadump (1 test):",
> +" Dump EBDA region.",
> +#endif
> +" esrtdump (1 test):",
> +" Dump ESRT Table.",
> +" gpedump (1 test):",
> +" Dump GPEs.",
> +#ifdef FWTS_ARCH_INTEL
> +" memmapdump (1 test):",
> +" Dump system memory map.",
> +" mpdump (1 test):",
> +" Dump Multi Processor Data.",
> +#endif
> +" plddump (1 test):",
> +" Dump ACPI _PLD (Physical Device Location).",
> +" prsdump (1 test):",
> +" Dump ACPI _PRS (Possible Resource Settings).",
> +#ifdef FWTS_ARCH_INTEL
> +" romdump (1 test):",
> +" Dump ROM data.",
> +#endif
> +" uefidump (1 test):",
> +" Dump UEFI Variables.",
> +" uefivarinfo (1 test):",
> +" UEFI variable info query.",
> +"",
> +"Unsafe tests:",
> +" uefirtauthvar (12 tests):",
> +" Create authenticated variable test.",
> +" Authenticated variable test with the same authenticated variable.",
> +" Authenticated variable test with another valid authenticated"
> + " variable.",
> +" Append authenticated variable test.",
> +" Update authenticated variable test.",
> +" Authenticated variable test with old authenticated variable.",
> +" Delete authenticated variable test.",
> +" Authenticated variable test with invalid modified data.",
> +" Authenticated variable test with invalid modified timestamp.",
> +" Authenticated variable test with different guid.",
> +" Authenticated variable test with invalid attributes.",
> +" Set and delete authenticated variable created by different"
> + " key test.",
> +" uefirtmisc (3 tests):",
> +" Test for UEFI miscellaneous runtime service interfaces.",
> +" Stress test for UEFI miscellaneous runtime service interfaces.",
> +" Test GetNextHighMonotonicCount with invalid NULL parameter.",
> +" uefirttime (35 tests):",
> +" Test UEFI RT service get time interface.",
> +" Test UEFI RT service get time interface, NULL time parameter.",
> +" Test UEFI RT service get time interface, NULL time and NULL"
> + " capabilties parameters.",
> +" Test UEFI RT service set time interface.",
> +" Test UEFI RT service set time interface, invalid year 1899.",
> +" Test UEFI RT service set time interface, invalid year 10000.",
> +" Test UEFI RT service set time interface, invalid month 0.",
> +" Test UEFI RT service set time interface, invalid month 13.",
> +" Test UEFI RT service set time interface, invalid day 0.",
> +" Test UEFI RT service set time interface, invalid day 32.",
> +" Test UEFI RT service set time interface, invalid hour 24.",
> +" Test UEFI RT service set time interface, invalid minute 60.",
> +" Test UEFI RT service set time interface, invalid second 60.",
> +" Test UEFI RT service set time interface, invalid nanosecond"
> + " 1000000000.",
> +" Test UEFI RT service set time interface, invalid timezone -1441.",
> +" Test UEFI RT service set time interface, invalid timezone 1441.",
> +" Test UEFI RT service get wakeup time interface.",
> +" Test UEFI RT service get wakeup time interface, NULL enabled"
> + " parameter.",
> +" Test UEFI RT service get wakeup time interface, NULL pending"
> + " parameter.",
> +" Test UEFI RT service get wakeup time interface, NULL time"
> + " parameter.",
> +" Test UEFI RT service get wakeup time interface, NULL enabled,"
> + " pending and time parameters.",
> +" Test UEFI RT service set wakeup time interface.",
> +" Test UEFI RT service set wakeup time interface, NULL time"
> + " parameter.",
> +" Test UEFI RT service set wakeup time interface, invalid year 1899.",
> +" Test UEFI RT service set wakeup time interface, invalid year 10000.",
> +" Test UEFI RT service set wakeup time interface, invalid month 0.",
> +" Test UEFI RT service set wakeup time interface, invalid month 13.",
> +" Test UEFI RT service set wakeup time interface, invalid day 0.",
> +" Test UEFI RT service set wakeup time interface, invalid day 32.",
> +" Test UEFI RT service set wakeup time interface, invalid hour 24.",
> +" Test UEFI RT service set wakeup time interface, invalid minute 60.",
> +" Test UEFI RT service set wakeup time interface, invalid second 60.",
> +" Test UEFI RT service set wakeup time interface, invalid"
> + " nanosecond 1000000000.",
> +" Test UEFI RT service set wakeup time interface, invalid"
> + " timezone -1441.",
> +" Test UEFI RT service set wakeup time interface, invalid"
> + " timezone 1441.",
> +" uefirtvariable (8 tests):",
> +" Test UEFI RT service get variable interface.",
> +" Test UEFI RT service get next variable name interface.",
> +" Test UEFI RT service set variable interface.",
> +" Test UEFI RT service query variable info interface.",
> +" Test UEFI RT service variable interface stress test.",
> +" Test UEFI RT service set variable interface stress test.",
> +" Test UEFI RT service query variable info interface stress test.",
> +" Test UEFI RT service get variable interface, invalid parameters.",
> +"",
> +"UEFI tests:",
> +#ifdef FWTS_ARCH_INTEL
> +" csm (1 test):",
> +" UEFI Compatibility Support Module test.",
> +#endif
> +" esrt (1 test):",
> +" Sanity check UEFI ESRT Table.",
> +" securebootcert (1 test):",
> +" UEFI secure boot test.",
> +" uefibootpath (1 test):",
> +" Test UEFI Boot Path Boot####.",
> +" uefirtauthvar (12 tests):",
> +" Create authenticated variable test.",
> +" Authenticated variable test with the same authenticated variable.",
> +" Authenticated variable test with another valid authenticated"
> + " variable.",
> +" Append authenticated variable test.",
> +" Update authenticated variable test.",
> +" Authenticated variable test with old authenticated variable.",
> +" Delete authenticated variable test.",
> +" Authenticated variable test with invalid modified data.",
> +" Authenticated variable test with invalid modified timestamp.",
> +" Authenticated variable test with different guid.",
> +" Authenticated variable test with invalid attributes.",
> +" Set and delete authenticated variable created by different"
> + " key test.",
> +" uefirtmisc (3 tests):",
> +" Test for UEFI miscellaneous runtime service interfaces.",
> +" Stress test for UEFI miscellaneous runtime service interfaces.",
> +" Test GetNextHighMonotonicCount with invalid NULL parameter.",
> +" uefirttime (35 tests):",
> +" Test UEFI RT service get time interface.",
> +" Test UEFI RT service get time interface, NULL time parameter.",
> +" Test UEFI RT service get time interface, NULL time and NULL"
> + " capabilties parameters.",
> +" Test UEFI RT service set time interface.",
> +" Test UEFI RT service set time interface, invalid year 1899.",
> +" Test UEFI RT service set time interface, invalid year 10000.",
> +" Test UEFI RT service set time interface, invalid month 0.",
> +" Test UEFI RT service set time interface, invalid month 13.",
> +" Test UEFI RT service set time interface, invalid day 0.",
> +" Test UEFI RT service set time interface, invalid day 32.",
> +" Test UEFI RT service set time interface, invalid hour 24.",
> +" Test UEFI RT service set time interface, invalid minute 60.",
> +" Test UEFI RT service set time interface, invalid second 60.",
> +" Test UEFI RT service set time interface, invalid"
> + " nanosecond 1000000000.",
> +" Test UEFI RT service set time interface, invalid timezone -1441.",
> +" Test UEFI RT service set time interface, invalid timezone 1441.",
> +" Test UEFI RT service get wakeup time interface.",
> +" Test UEFI RT service get wakeup time interface, NULL"
> + " enabled parameter.",
> +" Test UEFI RT service get wakeup time interface, NULL"
> + " pending parameter.",
> +" Test UEFI RT service get wakeup time interface, NULL"
> + " time parameter.",
> +" Test UEFI RT service get wakeup time interface, NULL"
> + " enabled, pending and time parameters.",
> +" Test UEFI RT service set wakeup time interface.",
> +" Test UEFI RT service set wakeup time interface, NULL"
> + " time parameter.",
> +" Test UEFI RT service set wakeup time interface, invalid year 1899.",
> +" Test UEFI RT service set wakeup time interface, invalid year 10000.",
> +" Test UEFI RT service set wakeup time interface, invalid month 0.",
> +" Test UEFI RT service set wakeup time interface, invalid month 13.",
> +" Test UEFI RT service set wakeup time interface, invalid day 0.",
> +" Test UEFI RT service set wakeup time interface, invalid day 32.",
> +" Test UEFI RT service set wakeup time interface, invalid hour 24.",
> +" Test UEFI RT service set wakeup time interface, invalid minute 60.",
> +" Test UEFI RT service set wakeup time interface, invalid second 60.",
> +" Test UEFI RT service set wakeup time interface, invalid"
> + " nanosecond 1000000000.",
> +" Test UEFI RT service set wakeup time interface, invalid"
> + " timezone -1441.",
> +" Test UEFI RT service set wakeup time interface, invalid"
> + " timezone 1441.",
> +" uefirtvariable (8 tests):",
> +" Test UEFI RT service get variable interface.",
> +" Test UEFI RT service get next variable name interface.",
> +" Test UEFI RT service set variable interface.",
> +" Test UEFI RT service query variable info interface.",
> +" Test UEFI RT service variable interface stress test.",
> +" Test UEFI RT service set variable interface stress test.",
> +" Test UEFI RT service query variable info interface stress test.",
> +" Test UEFI RT service get variable interface, invalid parameters.",
> +"",
> +"ACPI Spec Compliance tests:",
> +" fadt (6 tests):",
> +" ACPI FADT Description Table flag info.",
> +" FADT checksum test.",
> +" FADT revision test.",
> +" ACPI FADT Description Table tests.",
> +" Test FADT SCI_EN bit is enabled.",
> +" Test FADT reset register.",
> +" madt (5 tests):",
> +" MADT checksum test.",
> +" MADT revision test.",
> +" MADT architecture minimum revision test.",
> +" MADT flags field reserved bits test.",
> +" MADT subtable tests.",
> +" rsdp (1 test):",
> +" RSDP Root System Description Pointer test.",
> +};
> +
> +static int show_log_create(fwts_framework *fw,
> + char *show_abs_path_name,
> + const char *log_name,
> + char * log_template[],
> + int log_array_size)
> +{
> + int i, count;
> + FILE *show_log;
> +
> + char fq_log_name[PATH_MAX+1];
> +
> + memset(fq_log_name, 0, sizeof(fq_log_name));
> +
> + /* -1 for the slash in the snprintf concatenation */
> + if (strlen(show_abs_path_name) + strlen(log_name)
> + >= sizeof(fq_log_name)-1) {
> + fwts_failed(fw, LOG_LEVEL_LOW, "show_log_create1",
> + "Unable to properly create"
> + " the fwts-test logs.");
> + return FWTS_ERROR;
> + }
> + count = snprintf(fq_log_name, sizeof(fq_log_name), "%s/%s",
> + show_abs_path_name, log_name);
> +
> + if ((count < 0) || (count >= (int)sizeof(fq_log_name))) {
> + fwts_failed(fw, LOG_LEVEL_LOW, "show_log_create2",
> + "Unable to properly create"
> + " the fwts-test logs.");
> + return FWTS_ERROR;
> + }
> +
> + show_log = fopen(fq_log_name, "w+");
> +
> + if (!show_log) {
> + fwts_failed(fw, LOG_LEVEL_LOW, "show_log_create3",
> + "Unable to properly create"
> + " the fwts-test logs.");
> + return FWTS_ERROR;
> + }
> +
> + for ( i= 0; i < log_array_size; i++) {
> + fprintf(show_log, "%s\n", log_template[i]);
> +
> + }
> + if (fclose(show_log)) {
> + fwts_failed(fw, LOG_LEVEL_LOW, "show_log_create4",
> + "Unable to properly create"
> + " the fwts-test logs.");
> + return FWTS_ERROR;
> + }
> +
> + fwts_log_info(fw,
> + "Dynamic creation of %s is complete", fq_log_name);
> +
> + return FWTS_OK;
> +}
> +
> +static int show_logs_test1(fwts_framework *fw)
> +{
> + const char show_all_log_name[] =
> + "arg-show-tests-0001/arg-show-tests-0001.log";
> + const char show_all_full_log_name[] =
> + "arg-show-tests-full-0001/arg-show-tests-full-0001.log";
> +
> + int rc = 0;
> + char *fwtstestdir = NULL, *fwts_show_log_flags = NULL;
> +
> + char *fwts_abs_path_name;
> + char tmp_abs_path [PATH_MAX+1];
> +
> + memset(tmp_abs_path, 0, sizeof(tmp_abs_path));
> +
> + /* Use the inherited env var since these logs */
> + /* are only used during make check tests */
> + /* For a fail safe use the FWTS_SRCDIR */
> + /* from config.h during direct invocation */
> + /* of show_logs */
> +
> + fwtstestdir = getenv("FWTSTESTDIR");
> + fwts_show_log_flags = getenv("FWTS_SHOW_LOGS");
> +
> + if (fwtstestdir != NULL) {
> + fwts_abs_path_name = realpath(fwtstestdir,
> + tmp_abs_path);
> + } else {
> + if (FWTS_SRCDIR == NULL) {
> + fwts_failed(fw, LOG_LEVEL_LOW,
> + "show-logs-fq-log1",
> + "Unable to properly
create"
> + " the fwts-test logs.");
> + return FWTS_ERROR;
> + } else {
> + if (strlen(FWTS_SRCDIR)+11
> + <= sizeof(tmp_abs_path)) {
> + if (!(strncpy
(tmp_abs_path,
> + FWTS_SRCDIR,
> + sizeof
(tmp_abs_path))
> + == NULL)) {
> +
fwts_abs_path_name =
> +
strncat(tmp_abs_path,
> +
"/fwts-test", 11);
> + } else {
> + fwts_failed
(fw, LOG_LEVEL_LOW,
> +
"show-logs-fq-log2",
> + "Unable to
properly create"
> + " the
fwts-test logs.");
> + return
FWTS_ERROR;
> + }
> + }
> + }
> + }
> +
> + if (fwts_abs_path_name == NULL) {
> + fwts_failed(fw, LOG_LEVEL_LOW,
"show-logs-fq-log3",
> + "Unable to properly create"
> + " the fwts-test logs.");
> + return FWTS_ERROR;
> + }
> +
> + if (fwts_show_log_flags == NULL) {
> + rc = show_log_create(fw,
> + fwts_abs_path_name,
> + show_all_full_log_name,
> + fwts_show_all,
> + FWTS_ARRAY_LEN(fwts_show_all));
> + if (!rc) {
> + rc = show_log_create(fw,
> + fwts_abs_path_name,
> + show_all_log_name,
> + fwts_show,
> + FWTS_ARRAY_LEN
(fwts_show));
> + }
> + } else {
> + if (!strncmp(fwts_show_log_flags, "BASE", 4)){
> + rc = show_log_create(fw,
> + fwts_abs_path_name,
> + show_all_log_name,
> + fwts_show,
> + FWTS_ARRAY_LEN
(fwts_show));
> + } else {
> + if (!strncmp(fwts_show_log_flags,
"FULL", 4)) {
> + rc = show_log_create(fw,
> +
fwts_abs_path_name,
> +
show_all_full_log_name,
> + fwts_show_all,
> + FWTS_ARRAY_LEN
(fwts_show_all));
> + }
> + }
> + }
> +
> + if (!rc) {
> + fwts_passed(fw, "Show Tests Log Files"
> + " completed successfully.");
> + } /* subroutines logged fwts failures */
> +
> + return rc;
> +}
> +
> +static fwts_framework_minor_test show_logs_tests[] = {
> + { show_logs_test1, "Show Tests Log Files" },
> + { NULL, NULL }
> +};
> +
> +static fwts_framework_ops show_logs_ops = {
> + .description = "Show Tests Log Files",
> + .minor_tests = show_logs_tests
> +};
> +
> +FWTS_REGISTER("show_logs", &show_logs_ops, FWTS_TEST_EARLY,
> + FWTS_FLAG_BATCH)
>
The show* text is auto-generated from the each test at startup time, so
this is not really a good solution as we're duplicating this in
fwts_show_all[] and fwts_show[] arrays. Plus, maintaining this when we
add extra tests will be a maintenance burden.
Sorry, NACK.
Colin
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