<html><body>Hi Colin, The static log files (which are the two sources which are deleted below) are already a maintenance item which must be updated with each new test which is added. The burden is only moved from updating the 2 static log files which are then compared to the real output from the show and show all command. Maybe I am not following the reply, can you elaborate ? This patch allows the conditional compilation of what goes in the two log files below. > delete mode 100644 fwts-test/arg-show-tests-0001/arg-show-tests-0001.log > delete mode 100644 fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log ===================================== Deb McLemore IBM OpenPower - IBM Systems (512) 286 9980 debmc@us.ibm.com debmc@linux.vnet.ibm.com - (plain text) ===================================== <img width="16" height="16" src="cid:4__=09BBF574DFF8C9438f9e8a93df938690918c09B@" border="0" alt="Inactive hide details for Colin Ian King ---07/05/2016 02:16:40 PM---On 05/07/16 20:05, Deb McLemore wrote: > We added the capa">Colin Ian King ---07/05/2016 02:16:40 PM---On 05/07/16 20:05, Deb McLemore wrote: > We added the capability to dynamically create (based on tes From: Colin Ian King <colin.king@canonical.com> To: Deb McLemore <debmc@linux.vnet.ibm.com>, fwts-devel@lists.ubuntu.com Date: 07/05/2016 02:16 PM Subject: Re: [PATCH] show/show_logs: Add dynamic creation of fwts-test logs Sent by: fwts-devel-bounces@lists.ubuntu.com <hr width="100%" size="2" align="left" noshade style="color:#8091A5; "> <tt>On 05/07/16 20:05, Deb McLemore wrote: > We added the capability to dynamically create (based on test) > the content of the log files used to validate the show commands. > This allows customization of the Makefile.am to optionally > include objects to be linked. > > Signed-off-by: Deb McLemore <debmc@linux.vnet.ibm.com> > --- > configure.ac | 2 + > .../arg-show-tests-0001/arg-show-tests-0001.log | 187 --- > fwts-test/arg-show-tests-0001/test-0001.sh | 20 +- > fwts-test/arg-show-tests-0001/test-0002.sh | 26 +- > .../arg-show-tests-full-0001.log | 930 ------------ > fwts-test/arg-show-tests-full-0001/test-0001.sh | 19 +- > src/Makefile.am | 1 + > src/show/show_logs.c | 1480 ++++++++++++++++++++ > 8 files changed, 1519 insertions(+), 1146 deletions(-) > delete mode 100644 fwts-test/arg-show-tests-0001/arg-show-tests-0001.log > delete mode 100644 fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log > create mode 100644 src/show/show_logs.c > > diff --git a/configure.ac b/configure.ac > index e3e7512..0f15540 100644 > --- a/configure.ac > +++ b/configure.ac > @@ -71,6 +71,8 @@ > ]) > AM_CONDITIONAL([HAVE_LIBFDT], > [test "x$ac_cv_search_fdt_check_header" != "xno"]) > + fwts_srcdir=`readlink -f $srcdir` > + AC_DEFINE_UNQUOTED([FWTS_SRCDIR],["$fwts_srcdir"], [FWTS absolute src path]) > AC_FUNC_MALLOC > AC_FUNC_FORK > AC_FUNC_LSTAT_FOLLOWS_SLASHED_SYMLINK > diff --git a/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log b/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log > deleted file mode 100644 > index 1a76b9d..0000000 > --- a/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log > +++ /dev/null > @@ -1,187 +0,0 @@ > -ACPI tests: > - acpiinfo General ACPI information test. > - acpitables ACPI table headers sanity tests. > - apicinstance Test for single instance of APIC/MADT table. > - asf ASF! Alert Standard Format Table test. > - aspt ASPT Table test. > - bert BERT Boot Error Record Table test. > - bgrt BGRT Boot Graphics Resource Table test. > - boot BOOT Table test. > - checksum ACPI table checksum test. > - cpep CPEP Corrected Platform Error Polling Table test. > - csrt CSRT Core System Resource Table test. > - cstates Processor C state support test. > - dbg2 DBG2 (Debug Port Table 2) test. > - dbgp DBGP (Debug Port) Table test. > - dmar DMA Remapping (VT-d) test. > - ecdt ECDT Embedded Controller Boot Resources Table test. > - einj EINJ Error Injection Table test. > - erst ERST Error Record Serialization Table test. > - facs FACS Firmware ACPI Control Structure test. > - fadt FADT Fixed ACPI Description Table tests. > - fpdt FPDT Firmware Performance Data Table test. > - gtdt GTDT Generic Timer Description Table test. > - hest HEST Hardware Error Source Table test. > - hpet HPET IA-PC High Precision Event Timer Table tests. > - iort IORT IO Remapping Table test. > - lpit LPIT Low Power Idle Table test. > - madt MADT Multiple APIC Description Table (spec compliant). > - mcfg MCFG PCI Express* memory mapped config space test. > - mchi MCHI Management Controller Host Interface Table test. > - method ACPI DSDT Method Semantic tests. > - msct MSCT Maximum System Characteristics Table test. > - msdm MSDM Microsoft Data Management Table test. > - pcc Processor Clocking Control (PCC) test. > - rsdp RSDP Root System Description Pointer test. > - rsdt RSDT Root System Description Table test. > - sbst SBST Smart Battery Specification Table test. > - slic SLIC Software Licensing Description Table test. > - slit SLIT System Locality Distance Information test. > - spcr SPCR Serial Port Console Redirection Table test. > - spmi SPMI Service Processor Management Interface Description Table test. > - srat SRAT System Resource Affinity Table test. > - stao STAO Status Override Table test. > - tcpa TCPA Trusted Computing Platform Alliance Capabilities Table test. > - tpm2 TPM2 Trusted Platform Module 2 test. > - uefi UEFI Data Table test. > - waet WAET Windows ACPI Emulated Devices Table test. > - wdat WDAT Microsoft Hardware Watchdog Action Table test. > - wmi Extract and analyse Windows Management Instrumentation (WMI). > - xenv XENV Xen Environment Table tests. > - xsdt XSDT Extended System Description Table test. > - > -Batch tests: > - acpiinfo General ACPI information test. > - acpitables ACPI table headers sanity tests. > - apicedge APIC edge/level test. > - apicinstance Test for single instance of APIC/MADT table. > - asf ASF! Alert Standard Format Table test. > - aspm PCIe ASPM test. > - aspt ASPT Table test. > - autobrightness Automated LCD brightness test. > - bert BERT Boot Error Record Table test. > - bgrt BGRT Boot Graphics Resource Table test. > - bios32 BIOS32 Service Directory test. > - bios_info Gather BIOS DMI information. > - bmc_info BMC Info > - boot BOOT Table test. > - checksum ACPI table checksum test. > - cpep CPEP Corrected Platform Error Polling Table test. > - cpufreq CPU frequency scaling tests. > - crs Test PCI host bridge configuration using _CRS. > - csm UEFI Compatibility Support Module test. > - csrt CSRT Core System Resource Table test. > - cstates Processor C state support test. > - dbg2 DBG2 (Debug Port Table 2) test. > - dbgp DBGP (Debug Port) Table test. > - dmar DMA Remapping (VT-d) test. > - dmicheck DMI/SMBIOS table tests. > - dt_base Base device tree validity check > - dt_sysinfo Device tree system information test > - ebda Test EBDA region is mapped and reserved in memory map table. > - ecdt ECDT Embedded Controller Boot Resources Table test. > - einj EINJ Error Injection Table test. > - erst ERST Error Record Serialization Table test. > - facs FACS Firmware ACPI Control Structure test. > - fadt FADT Fixed ACPI Description Table tests. > - fan Simple fan tests. > - fpdt FPDT Firmware Performance Data Table test. > - gtdt GTDT Generic Timer Description Table test. > - hda_audio HDA Audio Pin Configuration test. > - hest HEST Hardware Error Source Table test. > - hpet HPET IA-PC High Precision Event Timer Table tests. > - iort IORT IO Remapping Table test. > - klog Scan kernel log for errors and warnings. > - lpit LPIT Low Power Idle Table test. > - madt MADT Multiple APIC Description Table (spec compliant). > - maxfreq Test max CPU frequencies against max scaling frequency. > - maxreadreq Test firmware has set PCI Express MaxReadReq to a higher value on non-motherboard devices. > - mcfg MCFG PCI Express* memory mapped config space test. > - mchi MCHI Management Controller Host Interface Table test. > - method ACPI DSDT Method Semantic tests. > - microcode Test if system is using latest microcode. > - mpcheck MultiProcessor Tables tests. > - msct MSCT Maximum System Characteristics Table test. > - msdm MSDM Microsoft Data Management Table test. > - msr MSR register tests. > - mtrr MTRR tests. > - nx Test if CPU NX is disabled by the BIOS. > - olog Run OLOG scan and analysis checks. > - oops Scan kernel log for Oopses. > - osilinux Disassemble DSDT to check for _OSI("Linux"). > - pcc Processor Clocking Control (PCC) test. > - pciirq PCI IRQ Routing Table test. > - pnp BIOS Support Installation structure test. > - prd_info OPAL Processor Recovery Diagnostics Info > - rsdp RSDP Root System Description Pointer test. > - rsdt RSDT Root System Description Table test. > - sbst SBST Smart Battery Specification Table test. > - securebootcert UEFI secure boot test. > - slic SLIC Software Licensing Description Table test. > - slit SLIT System Locality Distance Information test. > - spcr SPCR Serial Port Console Redirection Table test. > - spmi SPMI Service Processor Management Interface Description Table test. > - srat SRAT System Resource Affinity Table test. > - stao STAO Status Override Table test. > - syntaxcheck Re-assemble DSDT and SSDTs to find syntax errors and warnings. > - tcpa TCPA Trusted Computing Platform Alliance Capabilities Table test. > - tpm2 TPM2 Trusted Platform Module 2 test. > - uefi UEFI Data Table test. > - uefibootpath Sanity check for UEFI Boot Path Boot####. > - version Gather kernel system information. > - virt CPU Virtualisation Configuration test. > - waet WAET Windows ACPI Emulated Devices Table test. > - wakealarm ACPI Wakealarm tests. > - wdat WDAT Microsoft Hardware Watchdog Action Table test. > - wmi Extract and analyse Windows Management Instrumentation (WMI). > - xenv XENV Xen Environment Table tests. > - xsdt XSDT Extended System Description Table test. > - > -Interactive tests: > - ac_adapter Interactive ac_adapter power test. > - battery Battery tests. > - brightness Interactive LCD brightness test. > - hotkey Hotkey scan code tests. > - lid Interactive lid button test. > - power_button Interactive power_button button test. > - > -Power States tests: > - s3 S3 suspend/resume test. > - s3power S3 power loss during suspend test (takes minimum of 10 minutes to run). > - s4 S4 hibernate/resume test. > - > -Utilities: > - acpidump Dump ACPI tables. > - cmosdump Dump CMOS Memory. > - crsdump Dump ACPI _CRS resources. > - ebdadump Dump EBDA region. > - esrtdump Dump ESRT table. > - gpedump Dump GPEs. > - memmapdump Dump system memory map. > - mpdump Dump MultiProcessor Data. > - plddump Dump ACPI _PLD (Physical Device Location). > - prsdump Dump ACPI _PRS resources. > - romdump Dump ROM data. > - uefidump Dump UEFI variables. > - uefivarinfo UEFI variable info query. > - > -Unsafe tests: > - uefirtauthvar Authenticated variable tests. > - uefirtmisc UEFI miscellaneous runtime service interface tests. > - uefirttime UEFI Runtime service time interface tests. > - uefirtvariable UEFI Runtime service variable interface tests. > - > -UEFI tests: > - csm UEFI Compatibility Support Module test. > - esrt Sanity check UEFI ESRT Table. > - securebootcert UEFI secure boot test. > - uefibootpath Sanity check for UEFI Boot Path Boot####. > - uefirtauthvar Authenticated variable tests. > - uefirtmisc UEFI miscellaneous runtime service interface tests. > - uefirttime UEFI Runtime service time interface tests. > - uefirtvariable UEFI Runtime service variable interface tests. > - > -ACPI Spec Compliance tests: > - fadt FADT Fixed ACPI Description Table tests. > - madt MADT Multiple APIC Description Table (spec compliant). > - rsdp RSDP Root System Description Pointer test. > diff --git a/fwts-test/arg-show-tests-0001/test-0001.sh b/fwts-test/arg-show-tests-0001/test-0001.sh > index a62071c..ade98a3 100755 > --- a/fwts-test/arg-show-tests-0001/test-0001.sh > +++ b/fwts-test/arg-show-tests-0001/test-0001.sh > @@ -3,23 +3,21 @@ > TEST="Test -s option" > NAME=test-0001.sh > TMPLOG=$TMP/arg-show-tests.log.$$ > +export FWTS_SHOW_LOGS="BASE" > > -# > -# Non-x86 tests don't have WMI so skip this test > -# > -$FWTS --show-tests | grep wmi > /dev/null > -if [ $? -eq 1 ]; then > +# Dynamically create the log template per test > +$FWTS show_logs &> /dev/null > +if [ $? -ne 0 ]; then > echo SKIP: $TEST, $NAME > exit 77 > fi > > -cols=$(stty -a | tr ';' '\n' | grep "columns" | cut -d' ' -f3) 2> /dev/null > # > # If we can't set the tty then we can't test > # > -stty cols 80 2> /dev/null > -if [ $? -eq 1 ]; then > - tset 2> /dev/null > +stty cols 80 &> /dev/null > +if [ $? -ne 0 ]; then > + tset &> /dev/null > echo SKIP: $TEST, $NAME > exit 77 > fi > @@ -32,8 +30,8 @@ else > echo FAILED: $TEST, $NAME > fi > > -stty cols 80 2> /dev/null > -tset 2> /dev/null > +stty cols 80 &> /dev/null > +tset &> /dev/null > > rm $TMPLOG > exit $ret > diff --git a/fwts-test/arg-show-tests-0001/test-0002.sh b/fwts-test/arg-show-tests-0001/test-0002.sh > index f92fd8f..078f3e7 100755 > --- a/fwts-test/arg-show-tests-0001/test-0002.sh > +++ b/fwts-test/arg-show-tests-0001/test-0002.sh > @@ -3,27 +3,25 @@ > TEST="Test --show-tests option" > NAME=test-0002.sh > TMPLOG=$TMP/arg-show-tests.log.$$ > +export FWTS_SHOW_LOGS="BASE" > > -# > -# Non-x86 tests don't have WMI so skip this test > -# > -$FWTS --show-tests | grep wmi > /dev/null > -if [ $? -eq 1 ]; then > +# Dynamically create the log template per test > +$FWTS show_logs &> /dev/null > +if [ $? -ne 0 ]; then > echo SKIP: $TEST, $NAME > exit 77 > fi > > -cols=$(stty -a | tr ';' '\n' | grep "columns" | cut -d' ' -f3) 2> /dev/null > # > # If we can't set the tty then we can't test > # > -stty cols 80 2> /dev/null > -if [ $? -eq 1 ]; then > - tset 2> /dev/null > - echo SKIP: $TEST, $NAME > - exit 77 > +stty cols 80 &> /dev/null > +if [ $? -ne 0 ]; then > + tset &> /dev/null > + echo SKIP: $TEST, $NAME > + exit 77 > fi > -$FWTS -s > $TMPLOG > +$FWTS --show-tests > $TMPLOG > diff $TMPLOG $FWTSTESTDIR/arg-show-tests-0001/arg-show-tests-0001.log >> $FAILURE_LOG > ret=$? > if [ $ret -eq 0 ]; then > @@ -32,8 +30,8 @@ else > echo FAILED: $TEST, $NAME > fi > > -stty cols 80 2> /dev/null > -tset 2> /dev/null > +stty cols 80 &> /dev/null > +tset &> /dev/null > > rm $TMPLOG > exit $ret > diff --git a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log b/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log > deleted file mode 100644 > index 3eb5e3e..0000000 > --- a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log > +++ /dev/null > @@ -1,930 +0,0 @@ > -ACPI tests: > - acpiinfo (3 tests): > - Determine Kernel ACPI version. > - Determine machine's ACPI version. > - Determine AML compiler. > - acpitables (1 test): > - Test ACPI headers. > - apicinstance (1 test): > - Test for single instance of APIC/MADT table. > - asf (1 test): > - ASF! Alert Standard Format Table test. > - aspt (1 test): > - ASPT Table test. > - bert (1 test): > - BERT Boot Error Record Table test. > - bgrt (1 test): > - BGRT Boot Graphics Resource Table test. > - boot (1 test): > - BOOT Table test. > - checksum (1 test): > - ACPI table checksum test. > - cpep (1 test): > - CPEP Corrected Platform Error Polling Table test. > - csrt (1 test): > - CSRT Core System Resource Table test. > - cstates (1 test): > - Test all CPUs C-states. > - dbg2 (1 test): > - DBG2 (Debug Port Table 2) test. > - dbgp (1 test): > - DBGP (Debug Port) Table test. > - dmar (1 test): > - DMA Remapping test. > - ecdt (1 test): > - ECDT Embedded Controller Boot Resources Table test. > - einj (1 test): > - EINJ Error Injection Table test. > - erst (1 test): > - ERST Error Record Serialization Table test. > - facs (1 test): > - FACS Firmware ACPI Control Structure test. > - fadt (6 tests): > - ACPI FADT Description Table flag info. > - FADT checksum test. > - FADT revision test. > - ACPI FADT Description Table tests. > - Test FADT SCI_EN bit is enabled. > - Test FADT reset register. > - fpdt (1 test): > - FPDT Firmware Performance Data Table test. > - gtdt (1 test): > - GTDT Generic Timer Description Table test. > - hest (1 test): > - HEST Hardware Error Source Table test. > - hpet (4 tests): > - Test HPET base in kernel log. > - Test HPET base in HPET table. > - Test HPET base in DSDT and/or SSDT. > - Test HPET configuration. > - iort (1 test): > - IORT IO Remapping Table test. > - lpit (1 test): > - LPIT Low Power Idle Table test. > - madt (5 tests): > - MADT checksum test. > - MADT revision test. > - MADT architecture minimum revision test. > - MADT flags field reserved bits test. > - MADT subtable tests. > - mcfg (2 tests): > - Validate MCFG table. > - Validate MCFG PCI config space. > - mchi (1 test): > - MCHI Management Controller Host Interface Table test. > - method (191 tests): > - Test Method Names. > - Test _AEI. > - Test _EVT (Event Method). > - Test _DLM (Device Lock Mutex). > - Test _PIC (Inform AML of Interrupt Model). > - Test _CID (Compatible ID). > - Test _DDN (DOS Device Name). > - Test _HID (Hardware ID). > - Test _HRV (Hardware Revision Number). > - Test _MLS (Multiple Language String). > - Test _PLD (Physical Device Location). > - Test _SUB (Subsystem ID). > - Test _SUN (Slot User Number). > - Test _STR (String). > - Test _UID (Unique ID). > - Test _CDM (Clock Domain). > - Test _CRS (Current Resource Settings). > - Test _DSD (Device Specific Data). > - Test _DIS (Disable). > - Test _DMA (Direct Memory Access). > - Test _FIX (Fixed Register Resource Provider). > - Test _GSB (Global System Interrupt Base). > - Test _HPP (Hot Plug Parameters). > - Test _PRS (Possible Resource Settings). > - Test _PRT (PCI Routing Table). > - Test _PXM (Proximity). > - Test _CCA (Cache Coherency Attribute). > - Test _EDL (Eject Device List). > - Test _EJD (Ejection Dependent Device). > - Test _EJ0 (Eject). > - Test _EJ1 (Eject). > - Test _EJ2 (Eject). > - Test _EJ3 (Eject). > - Test _EJ4 (Eject). > - Test _LCK (Lock). > - Test _RMV (Remove). > - Test _STA (Status). > - Test _DEP (Operational Region Dependencies). > - Test _BDN (BIOS Dock Name). > - Test _BBN (Base Bus Number). > - Test _DCK (Dock). > - Test _INI (Initialize). > - Test _GLK (Global Lock). > - Test _SEG (Segment). > - Test _OFF (Set resource off). > - Test _ON_ (Set resource on). > - Test _DSW (Device Sleep Wake). > - Test _IRC (In Rush Current). > - Test _PRE (Power Resources for Enumeration). > - Test _PR0 (Power Resources for D0). > - Test _PR1 (Power Resources for D1). > - Test _PR2 (Power Resources for D2). > - Test _PR3 (Power Resources for D3). > - Test _PRW (Power Resources for Wake). > - Test _PS0 (Power State 0). > - Test _PS1 (Power State 1). > - Test _PS2 (Power State 2). > - Test _PS3 (Power State 3). > - Test _PSC (Power State Current). > - Test _PSE (Power State for Enumeration). > - Test _PSW (Power State Wake). > - Test _S1D (S1 Device State). > - Test _S2D (S2 Device State). > - Test _S3D (S3 Device State). > - Test _S4D (S4 Device State). > - Test _S0W (S0 Device Wake State). > - Test _S1W (S1 Device Wake State). > - Test _S2W (S2 Device Wake State). > - Test _S3W (S3 Device Wake State). > - Test _S4W (S4 Device Wake State). > - Test _RST (Device Reset). > - Test _PRR (Power Resource for Reset). > - Test _S0_ (S0 System State). > - Test _S1_ (S1 System State). > - Test _S2_ (S2 System State). > - Test _S3_ (S3 System State). > - Test _S4_ (S4 System State). > - Test _S5_ (S5 System State). > - Test _SWS (System Wake Source). > - Test _PSS (Performance Supported States). > - Test _CPC (Continuous Performance Control). > - Test _CSD (C State Dependencies). > - Test _CST (C States). > - Test _PCT (Performance Control). > - Test _PDL (P-State Depth Limit). > - Test _PPC (Performance Present Capabilities). > - Test _PPE (Polling for Platform Error). > - Test _PSD (Power State Dependencies). > - Test _PTC (Processor Throttling Control). > - Test _TDL (T-State Depth Limit). > - Test _TPC (Throttling Present Capabilities). > - Test _TSD (Throttling State Dependencies). > - Test _TSS (Throttling Supported States). > - Test _LPI (Low Power Idle States). > - Test _RDI (Resource Dependencies for Idle). > - Test _PUR (Processor Utilization Request). > - Test _MSG (Message). > - Test _SST (System Status). > - Test _ALC (Ambient Light Colour Chromaticity). > - Test _ALI (Ambient Light Illuminance). > - Test _ALT (Ambient Light Temperature). > - Test _ALP (Ambient Light Polling). > - Test _ALR (Ambient Light Response). > - Test _LID (Lid Status). > - Test _GTF (Get Task File). > - Test _GTM (Get Timing Mode). > - Test _MBM (Memory Bandwidth Monitoring Data). > - Test _UPC (USB Port Capabilities). > - Test _UPD (User Presence Detect). > - Test _UPP (User Presence Polling). > - Test _GCP (Get Capabilities). > - Test _GRT (Get Real Time). > - Test _GWS (Get Wake Status). > - Test _CWS (Clear Wake Status). > - Test _STP (Set Expired Timer Wake Policy). > - Test _STV (Set Timer Value). > - Test _TIP (Expired Timer Wake Policy). > - Test _TIV (Timer Values). > - Test _SBS (Smart Battery Subsystem). > - Test _BCT (Battery Charge Time). > - Test _BIF (Battery Information). > - Test _BIX (Battery Information Extended). > - Test _BMA (Battery Measurement Averaging). > - Test _BMC (Battery Maintenance Control). > - Test _BMD (Battery Maintenance Data). > - Test _BMS (Battery Measurement Sampling Time). > - Test _BST (Battery Status). > - Test _BTP (Battery Trip Point). > - Test _BTH (Battery Throttle Limit). > - Test _BTM (Battery Time). > - Test _PCL (Power Consumer List). > - Test _PIF (Power Source Information). > - Test _PRL (Power Source Redundancy List). > - Test _PSR (Power Source). > - Test _GAI (Get Averaging Level). > - Test _GHL (Get Harware Limit). > - Test _PMC (Power Meter Capabilities). > - Test _PMD (Power Meter Devices). > - Test _PMM (Power Meter Measurement). > - Test _WPC (Wireless Power Calibration). > - Test _WPP (Wireless Power Polling). > - Test _FIF (Fan Information). > - Test _FPS (Fan Performance States). > - Test _FSL (Fan Set Level). > - Test _FST (Fan Status). > - Test _ACx (Active Cooling). > - Test _ART (Active Cooling Relationship Table). > - Test _CRT (Critical Trip Point). > - Test _CR3 (Warm/Standby Temperature). > - Test _DTI (Device Temperature Indication). > - Test _HOT (Hot Temperature). > - Test _MTL (Minimum Throttle Limit). > - Test _NTT (Notification Temp Threshold). > - Test _PSL (Passive List). > - Test _PSV (Passive Temp). > - Test _RTV (Relative Temp Values). > - Test _SCP (Set Cooling Policy). > - Test _TC1 (Thermal Constant 1). > - Test _TC2 (Thermal Constant 2). > - Test _TFP (Thermal fast Sampling Period). > - Test _TMP (Thermal Zone Current Temp). > - Test _TPT (Trip Point Temperature). > - Test _TRT (Thermal Relationship Table). > - Test _TSN (Thermal Sensor Device). > - Test _TSP (Thermal Sampling Period). > - Test _TST (Temperature Sensor Threshold). > - Test _TZD (Thermal Zone Devices). > - Test _TZM (Thermal Zone member). > - Test _TZP (Thermal Zone Polling). > - Test _GPE (General Purpose Events). > - Test _EC_ (EC Offset Query). > - Test _PTS (Prepare to Sleep). > - Test _TTS (Transition to State). > - Test _WAK (System Wake). > - Test _ADR (Return Unique ID for Device). > - Test _BCL (Query List of Brightness Control Levels Supported). > - Test _BCM (Set Brightness Level). > - Test _BQC (Brightness Query Current Level). > - Test _DCS (Return the Status of Output Device). > - Test _DDC (Return the EDID for this Device). > - Test _DSS (Device Set State). > - Test _DGS (Query Graphics State). > - Test _DOD (Enumerate All Devices Attached to Display Adapter). > - Test _DOS (Enable/Disable Output Switching). > - Test _GPD (Get POST Device). > - Test _ROM (Get ROM Data). > - Test _SPD (Set POST Device). > - Test _VPO (Video POST Options). > - Test _CBA (Configuration Base Address). > - Test _IFT (IPMI Interface Type). > - Test _SRV (IPMI Interface Revision). > - msct (1 test): > - MSCT Maximum System Characteristics Table test.</tt> <tt>> - msdm (1 test): > - MSDM Microsoft Data Management Table test. > - pcc (1 test): > - Processor Clocking Control (PCC) test. > - rsdp (1 test): > - RSDP Root System Description Pointer test. > - rsdt (1 test): > - RSDT Root System Description Table test. > - sbst (1 test): > - SBST Smart Battery Specificiation Table test. > - slic (1 test): > - SLIC Software Licensing Description Table test. > - slit (1 test): > - SLIT System Locality Distance Information test. > - spcr (1 test): > - SPCR Serial Port Console Redirection Table test. > - spmi (1 test): > - SPMI Service Processor Management Interface Description Table test. > - srat (1 test): > - SRAT System Resource Affinity Table test. > - stao (1 test): > - STAO Status Override Table test. > - tcpa (1 test): > - Validate TCPA table. > - tpm2 (1 test): > - Validate TPM2 table. > - uefi (1 test): > - UEFI Data Table test. > - waet (1 test): > - Windows ACPI Emulated Devices Table test. > - wdat (1 test): > - WDAT Microsoft Hardware Watchdog Action Table test. > - wmi (1 test): > - Windows Management Instrumentation test. > - xenv (1 test): > - Validate XENV table. > - xsdt (1 test): > - XSDT Extended System Description Table test. > - > -Batch tests: > - acpiinfo (3 tests): > - Determine Kernel ACPI version. > - Determine machine's ACPI version. > - Determine AML compiler. > - acpitables (1 test): > - Test ACPI headers. > - apicedge (1 test): > - Legacy and PCI Interrupt Edge/Level trigger tests. > - apicinstance (1 test): > - Test for single instance of APIC/MADT table. > - asf (1 test): > - ASF! Alert Standard Format Table test. > - aspm (2 tests): > - PCIe ASPM ACPI test. > - PCIe ASPM registers test. > - aspt (1 test): > - ASPT Table test. > - autobrightness (2 tests): > - Test for maximum and actual brightness. > - Change actual brightness. > - bert (1 test): > - BERT Boot Error Record Table test. > - bgrt (1 test): > - BGRT Boot Graphics Resource Table test. > - bios32 (1 test): > - BIOS32 Service Directory test. > - bios_info (1 test): > - Gather BIOS DMI information > - bmc_info (1 test): > - BMC Info > - boot (1 test): > - BOOT Table test. > - checksum (1 test): > - ACPI table checksum test. > - cpep (1 test): > - CPEP Corrected Platfor m Error Polling Table test. > - cpufreq (7 tests): > - CPU frequency table consistency > - CPU frequency table duplicates > - CPU frequency firmware limits > - CPU frequency claimed maximum > - CPU frequency SW_ANY control > - CPU frequency SW_ALL control > - CPU frequency performance tests. > - crs (1 test): > - Test PCI host bridge configuration using _CRS. > - csm (1 test): > - UEFI Compatibility Support Module test. > - csrt (1 test): > - CSRT Core System Resource Table test. > - cstates (1 test): > - Test all CPUs C-states. > - dbg2 (1 test): > - DBG2 (Debug Port Table 2) test. > - dbgp (1 test): > - DBGP (Debug Port) Table test. > - dmar (1 test): > - DMA Remapping test. > - dmicheck (3 tests): > - Find and test SMBIOS Table Entry Points. > - Test DMI/SMBIOS tables for errors. > - Test DMI/SMBIOS3 tables for errors. > - dt_base (3 tests): > - Check device tree presence > - Check device tree baseline validity > - Check device tree warnings > - dt_sysinfo (3 tests): > - Check model property > - Check system-id property > - Check OpenPOWER Reference compatible > - ebda (1 test): > - Test EBDA is reserved in E820 table. > - ecdt (1 test): > - ECDT Embedded Controller Boot Resources Table test. > - einj (1 test): > - EINJ Error Injection Table test. > - erst (1 test): > - ERST Error Record Serialization Table test. > - facs (1 test): > - FACS Firmware ACPI Control Structure test. > - fadt (6 tests): > - ACPI FADT Description Table flag info. > - FADT checksum test. > - FADT revision test. > - ACPI FADT Description Table tests. > - Test FADT SCI_EN bit is enabled. > - Test FADT reset register. > - fan (2 tests): > - Test fan status. > - Load system, check CPU fan status. > - fpdt (1 test): > - FPDT Firmware Performance Data Table test. > - gtdt (1 test): > - GTDT Generic Timer Description Table test. > - hda_audio (1 test): > - HDA Audio Pin Configuration test. > - hest (1 test): > - HEST Hardware Error Source Table test. > - hpet (4 tests): > - Test HPET base in kernel log. > - Test HPET base in HPET table. > - Test HPET base in DSDT and/or SSDT. > - Test HPET configuration. > - iort (1 test): > - IORT IO Remapping Table test. > - klog (1 test): > - Kernel log error check. > - lpit (1 test): > - LPIT Low Power Idle Table test. > - madt (5 tests): > - MADT checksum test. > - MADT revision test. > - MADT architecture minimum revision test. > - MADT flags field reserved bits test. > - MADT subtable tests. > - maxfreq (1 test): > - Maximum CPU frequency test. > - maxreadreq (1 test): > - Test firmware settings MaxReadReq for PCI Express devices. > - mcfg (2 tests): > - Validate MCFG table. > - Validate MCFG PCI config space. > - mchi (1 test): > - MCHI Management Controller Host Interface Table test. > - method (191 tests): > - Test Method Names. > - Test _AEI. > - Test _EVT (Event Method). > - Test _DLM (Device Lock Mutex). > - Test _PIC (Inform AML of Interrupt Model). > - Test _CID (Compatible ID). > - Test _DDN (DOS Device Name). > - Test _HID (Hardware ID). > - Test _HRV (Hardware Revision Number). > - Test _MLS (Multiple Language String). > - Test _PLD (Physical Device Location). > - Test _SUB (Subsystem ID). > - Test _SUN (Slot User Number). > - Test _STR (String). > - Test _UID (Unique ID). > - Test _CDM (Clock Domain). > - Test _CRS (Current Resource Settings). > - Test _DSD (Device Specific Data). > - Test _DIS (Disable). > - Test _DMA (Direct Memory Access). > - Test _FIX (Fixed Register Resource Provider). > - Test _GSB (Global System Interrupt Base). > - Test _HPP (Hot Plug Parameters). > - Test _PRS (Possible Resource Settings). > - Test _PRT (PCI Routing Table). > - Test _PXM (Proximity). > - Test _CCA (Cache Coherency Attribute). > - Test _EDL (Eject Device List). > - Test _EJD (Ejection Dependent Device). > - Test _EJ0 (Eject). > - Test _EJ1 (Eject). > - Test _EJ2 (Eject). > - Test _EJ3 (Eject). > - Test _EJ4 (Eject). > - Test _LCK (Lock). > - Test _RMV (Remove). > - Test _STA (Status). > - Test _DEP (Operational Region Dependencies). > - Test _BDN (BIOS Dock Name). > - Test _BBN (Base Bus Number). > - Test _DCK (Dock). > - Test _INI (Initialize). > - Test _GLK (Global Lock). > - Test _SEG (Segment). > - Test _OFF (Set resource off). > - Test _ON_ (Set resource on). > - Test _DSW (Device Sleep Wake). > - Test _IRC (In Rush Current). > - Test _PRE (Power Resources for Enumeration). > - Test _PR0 (Power Resources for D0). > - Test _PR1 (Power Resources for D1). > - Test _PR2 (Power Resources for D2). > - Test _PR3 (Power Resources for D3). > - Test _PRW (Power Resources for Wake). > - Test _PS0 (Power State 0). > - Test _PS1 (Power State 1). > - Test _PS2 (Power State 2). > - Test _PS3 (Power State 3). > - Test _PSC (Power State Current). > - Test _PSE (Power State for Enumeration). > - Test _PSW (Power State Wake). > - Test _S1D (S1 Device State). > - Test _S2D (S2 Device State). > - Test _S3D (S3 Device State). > - Test _S4D (S4 Device State). > - Test _S0W (S0 Device Wake State). > - Test _S1W (S1 Device Wake State). > - Test _S2W (S2 Device Wake State). > - Test _S3W (S3 Device Wake State). > - Test _S4W (S4 Device Wake State). > - Test _RST (Device Reset). > - Test _PRR (Power Resource for Reset). > - Test _S0_ (S0 System State). > - Test _S1_ (S1 System State). > - Test _S2_ (S2 System State). > - Test _S3_ (S3 System State). > - Test _S4_ (S4 System State). > - Test _S5_ (S5 System State). > - Test _SWS (System Wake Source). > - Test _PSS (Performance Supported States). > - Test _CPC (Continuous Performance Control). > - Test _CSD (C State Dependencies). > - Test _CST (C States). > - Test _PCT (Performance Control). > - Test _PDL (P-State Depth Limit). > - Test _PPC (Performance Present Capabilities). > - Test _PPE (Polling for Platform Error). > - Test _PSD (Power State Dependencies). > - Test _PTC (Processor Throttling Control). > - Test _TDL (T-State Depth Limit). > - Test _TPC (Throttling Present Capabilities). > - Test _TSD (Throttling State Dependencies). > - Test _TSS (Throttling Supported States). > - Test _LPI (Low Power Idle States). > - Test _RDI (Resource Dependencies for Idle). > - Test _PUR (Processor Utilization Request). > - Test _MSG (Message). > - Test _SST (System Status). > - Test _ALC (Ambient Light Colour Chromaticity). > - Test _ALI (Ambient Light Illuminance). > - Test _ALT (Ambient Light Temperature). > - Test _ALP (Ambient Light Polling). > - Test _ALR (Ambient Light Response). > - Test _LID (Lid Status). > - Test _GTF (Get Task File). > - Test _GTM (Get Timing Mode). > - Test _MBM (Memory Bandwidth Monitoring Data). > - Test _UPC (USB Port Capabilities). > - Test _UPD (User Presence Detect). > - Test _UPP (User Presence Polling). > - Test _GCP (Get Capabilities). > - Test _GRT (Get Real Time). > - Test _GWS (Get Wake Status). > - Test _CWS (Clear Wake Status). > - Test _STP (Set Expired Timer Wake Policy). > - Test _STV (Set Timer Value). > - Test _TIP (Expired Timer Wake Policy). > - Test _TIV (Timer Values). > - Test _SBS (Smart Battery Subsystem). > - Test _BCT (Battery Charge Time). > - Test _BIF (Battery Information). > - Test _BIX (Battery Information Extended). > - Test _BMA (Battery Measurement Averaging). > - Test _BMC (Battery Maintenance Control). > - Test _BMD (Battery Maintenance Data). > - Test _BMS (Battery Measurement Sampling Time). > - Test _BST (Battery Status). > - Test _BTP (Battery Trip Point). > - Test _BTH (Battery Throttle Limit). > - Test _BTM (Battery Time). > - Test _PCL (Power Consumer List). > - Test _PIF (Power Source Information). > - Test _PRL (Power Source Redundancy List). > - Test _PSR (Power Source). > - Test _GAI (Get Averaging Level). > - Test _GHL (Get Harware Limit). > - Test _PMC (Power Meter Capabilities). > - Test _PMD (Power Meter Devices). > - Test _PMM (Power Meter Measurement). > - Test _WPC (Wireless Power Calibration). > - Test _WPP (Wireless Power Polling). > - Test _FIF (Fan Information). > - Test _FPS (Fan Performance States). > - Test _FSL (Fan Set Level). > - Test _FST (Fan Status). > - Test _ACx (Active Cooling). > - Test _ART (Active Cooling Relationship Table). > - Test _CRT (Critical Trip Point). > - Test _CR3 (Warm/Standby Temperature). > - Test _DTI (Device Temperature Indication). > - Test _HOT (Hot Temperature). > - Test _MTL (Minimum Throttle Limit). > - Test _NTT (Notification Temp Threshold). > - Test _PSL (Passive List). > - Test _PSV (Passive Temp). > - Test _RTV (Relative Temp Values). > - Test _SCP (Set Cooling Policy). > - Test _TC1 (Thermal Constant 1). > - Test _TC2 (Thermal Constant 2). > - Test _TFP (Thermal fast Sampling Period). > - Test _TMP (Thermal Zone Current Temp). > - Test _TPT (Trip Point Temperature). > - Test _TRT (Thermal Relationship Table). > - Test _TSN (Thermal Sensor Device). > - Test _TSP (Thermal Sampling Period). > - Test _TST (Temperature Sensor Threshold). > - Test _TZD (Thermal Zone Devices). > - Test _TZM (Thermal Zone member). > - Test _TZP (Thermal Zone Polling). > - Test _GPE (General Purpose Events). > - Test _EC_ (EC Offset Query). > - Test _PTS (Prepare to Sleep). > - Test _TTS (Transition to State). > - Test _WAK (System Wake). > - Test _ADR (Return Unique ID for Device). > - Test _BCL (Query List of Brightness Control Levels Supported). > - Test _BCM (Set Brightness Level). > - Test _BQC (Brightness Query Current Level). > - Test _DCS (Return the Status of Output Device). > - Test _DDC (Return the EDID for this Device). > - Test _DSS (Device Set State). > - Test _DGS (Query Graphics State). > - Test _DOD (Enumerate All Devices Attached to Display Adapter). > - Test _DOS (Enable/Disable Output Switching). > - Test _GPD (Get POST Device). > - Test _ROM (Get ROM Data). > - Test _SPD (Set POST Device). > - Test _VPO (Video POST Options). > - Test _CBA (Configuration Base Address). > - Test _IFT (IPMI Interface Type). > - Test _SRV (IPMI Interface Revision). > - microcode (1 test): > - Test for most recent microcode being loaded. > - mpcheck (9 tests): > - Test MP header. > - Test MP CPU entries. > - Test MP Bus entries. > - Test MP IO APIC entries. > - Test MP IO Interrupt entries. > - Test MP Local Interrupt entries. > - Test MP System Address entries. > - Test MP Bus Hierarchy entries. > - Test MP Compatible Bus Address Space entries. > - msct (1 test): > - MSCT Maximum System Characteristics Table test. > - msdm (1 test): > - MSDM Microsoft Data Management Table test. > - msr (5 tests): > - Test CPU generic MSRs. > - Test CPU specific model MSRs. > - Test all P State Ratios. > - Test C1 and C3 autodemotion. > - Test SMRR MSR registers. > - mtrr (3 tests): > - Validate the kernel MTRR IOMEM setup. > - Validate the MTRR setup across all processors. > - Test for AMD MtrrFixDramModEn being cleared by the BIOS. > - nx (3 tests): > - Test CPU NX capability. > - Test all CPUs have same BIOS set NX flag. > - Test all CPUs have same msr setting in MSR 0x1a0. > - olog (1 test): > - OLOG scan and analysis checks results. > - oops (1 test): > - Kernel log oops check. > - osilinux (1 test): > - Disassemble DSDT to check for _OSI("Linux"). > - pcc (1 test): > - Processor Clocking Control (PCC) test. > - pciirq (1 test): > - PCI IRQ Routing Table test. > - pnp (1 test): > - PnP BIOS Support Installation structure test. > - prd_info (1 test): > - OPAL Processor Recovery Diagnostics Info > - rsdp (1 test): > - RSDP Root System Description Pointer test. > - rsdt (1 test): > - RSDT Root System Description Table test. > - sbst (1 test): > - SBST Smart Battery Specificiation Table test. > - securebootcert (1 test): > - UEFI secure boot test. > - slic (1 test): > - SLIC Software Licensing Description Table test. > - slit (1 test): > - SLIT System Locality Distance Information test. > - spcr (1 test): > - SPCR Serial Port Console Redirection Table test. > - spmi (1 test): > - SPMI Service Processor Management Interface Description Table test. > - srat (1 test): > - SRAT System Resource Affinity Table test. > - stao (1 test): > - STAO Status Override Table test. > - syntaxcheck (1 test): > - Disassemble and reassemble DSDT and SSDTs. > - tcpa (1 test): > - Validate TCPA table. > - tpm2 (1 test): > - Validate TPM2 table. > - uefi (1 test): > - UEFI Data Table test. > - uefibootpath (1 test): > - Test UEFI Boot Path Boot####. > - version (4 tests): > - Gather kernel signature. > - Gather kernel system information. > - Gather kernel boot command line. > - Gather ACPI driver version. > - virt (1 test): > - CPU Virtualisation Configuration test. > - waet (1 test): > - Windows ACPI Emulated Devices Table test. > - wakealarm (5 tests): > - Test existence of RTC with alarm interface. > - Trigger wakealarm for 1 seconds in the future. > - Test if wakealarm is fired. > - Multiple wakealarm firing tests. > - Reset wakealarm time. > - wdat (1 test): > - WDAT Microsoft Hardware Watchdog Action Table test. > - wmi (1 test): > - Windows Management Instrumentation test. > - xenv (1 test): > - Validate XENV table. > - xsdt (1 test): > - XSDT Extended System Description Table test. > - > -Interactive tests: > - ac_adapter (3 tests): > - Test ACPI ac_adapter state. > - Test ac_adapter initial on-line state. > - Test ac_adapter state changes. > - battery (1 test): > - Battery test. > - brightness (3 tests): > - Observe all brightness changes. > - Observe min, max brightness changes. > - Test brightness hotkeys. > - hotkey (1 test): > - Hotkey keypress checks. > - lid (3 tests): > - Test LID buttons report open correctly. > - Test LID buttons on a single open/close. > - Test LID buttons on multiple open/close events. > - power_button (1 test): > - Test press of power button and ACPI event. > - > -Power States tests: > - s3 (1 test): > - S3 suspend/resume test. > - s3power (1 test): > - S3 power loss during suspend test. > - s4 (1 test): > - S4 hibernate/resume test. > - > -Utilities: > - acpidump (1 test): > - Dump ACPI tables. > - cmosdump (1 test): > - Dump CMOS Memory. > - crsdump (1 test): > - Dump ACPI _CRS (Current Resource Settings). > - ebdadump (1 test): > - Dump EBDA region. > - esrtdump (1 test): > - Dump ESRT Table. > - gpedump (1 test): > - Dump GPEs. > - memmapdump (1 test): > - Dump system memory map. > - mpdump (1 test): > - Dump Multi Processor Data. > - plddump (1 test): > - Dump ACPI _PLD (Physical Device Location). > - prsdump (1 test): > - Dump ACPI _PRS (Possible Resource Settings). > - romdump (1 test): > - Dump ROM data. > - uefidump (1 test): > - Dump UEFI Variables. > - uefivarinfo (1 test): > - UEFI variable info query. > - > -Unsafe tests: > - uefirtauthvar (12 tests): > - Create authenticated variable test. > - Authenticated variable test with the same authenticated variable. > - Authenticated variable test with another valid authenticated variable. > - Append authenticated variable test. > - Update authenticated variable test. > - Authenticated variable test with old authenticated variable. > - Delete authenticated variable test. > - Authenticated variable test with invalid modified data. > - Authenticated variable test with invalid modified timestamp. > - Authenticated variable test with different guid. > - Authenticated variable test with invalid attributes. > - Set and delete authenticated variable created by different key test. > - uefirtmisc (3 tests): > - Test for UEFI miscellaneous runtime service interfaces. > - Stress test for UEFI miscellaneous runtime service interfaces. > - Test GetNextHighMonotonicCount with invalid NULL parameter. > - uefirttime (35 tests): > - Test UEFI RT service get time interface. > - Test UEFI RT service get time interface, NULL time parameter. > - Test UEFI RT service get time interface, NULL time and NULL capabilties parameters. > - Test UEFI RT service set time interface. > - Test UEFI RT service set time interface, invalid year 1899. > - Test UEFI RT service set time interface, invalid year 10000. > - Test UEFI RT service set time interface, invalid month 0. > - Test UEFI RT service set time interface, invalid month 13. > - Test UEFI RT service set time interface, invalid day 0. > - Test UEFI RT service set time interface, invalid day 32. > - Test UEFI RT service set time interface, invalid hour 24. > - Test UEFI RT service set time interface, invalid minute 60. > - Test UEFI RT service set time interface, invalid second 60. > - Test UEFI RT service set time interface, invalid nanosecond 1000000000. > - Test UEFI RT service set time interface, invalid timezone -1441. > - Test UEFI RT service set time interface, invalid timezone 1441. > - Test UEFI RT service get wakeup time interface. > - Test UEFI RT service get wakeup time interface, NULL enabled parameter. > - Test UEFI RT service get wakeup time interface, NULL pending parameter. > - Test UEFI RT service get wakeup time interface, NULL time parameter. > - Test UEFI RT service get wakeup time interface, NULL enabled, pending and time parameters. > - Test UEFI RT service set wakeup time interface. > - Test UEFI RT service set wakeup time interface, NULL time parameter. > - Test UEFI RT service set wakeup time interface, invalid year 1899. > - Test UEFI RT service set wakeup time interface, invalid year 10000. > - Test UEFI RT service set wakeup time interface, invalid month 0. > - Test UEFI RT service set wakeup time interface, invalid month 13. > - Test UEFI RT service set wakeup time interface, invalid day 0. > - Test UEFI RT service set wakeup time interface, invalid day 32. > - Test UEFI RT service set wakeup time interface, invalid hour 24. > - Test UEFI RT service set wakeup time interface, invalid minute 60. > - Test UEFI RT service set wakeup time interface, invalid second 60. > - Test UEFI RT service set wakeup time interface, invalid nanosecond 1000000000. > - Test UEFI RT service set wakeup time interface, invalid timezone -1441. > - Test UEFI RT service set wakeup time interface, invalid timezone 1441. > - uefirtvariable (8 tests): > - Test UEFI RT service get variable interface. > - Test UEFI RT service get next variable name interface. > - Test UEFI RT service set variable interface. > - Test UEFI RT service query variable info interface. > - Test UEFI RT service variable interface stress test. > - Test UEFI RT service set variable interface stress test. > - Test UEFI RT service query variable info interface stress test. > - Test UEFI RT service get variable interface, invalid parameters. > - > -UEFI tests: > - csm (1 test): > - UEFI Compatibility Support Module test. > - esrt (1 test): > - Sanity check UEFI ESRT Table. > - securebootcert (1 test): > - UEFI secure boot test. > - uefibootpath (1 test): > - Test UEFI Boot Path Boot####. > - uefirtauthvar (12 tests): > - Create authenticated variable test. > - Authenticated variable test with the same authenticated variable. > - Authenticated variable test with another valid authenticated variable. > - Append authenticated variable test. > - Update authenticated variable test. > - Authenticated variable test with old authenticated variable. > - Delete authenticated variable test. > - Authenticated variable test with invalid modified data. > - Authenticated variable test with invalid modified timestamp. > - Authenticated variable test with different guid. > - Authenticated variable test with invalid attributes. > - Set and delete authenticated variable created by different key test. > - uefirtmisc (3 tests): > - Test for UEFI miscellaneous runtime service interfaces. > - Stress test for UEFI miscellaneous runtime service interfaces. > - Test GetNextHighMonotonicCount with invalid NULL parameter.</tt> <tt>> - uefirttime (35 tests): > - Test UEFI RT service get time interface. > - Test UEFI RT service get time interface, NULL time parameter. > - Test UEFI RT service get time interface, NULL time and NULL capabilties parameters. > - Test UEFI RT service set time interface. > - Test UEFI RT service set time interface, invalid year 1899. > - Test UEFI RT service set time interface, invalid year 10000. > - Test UEFI RT service set time interface, invalid month 0. > - Test UEFI RT service set time interface, invalid month 13. > - Test UEFI RT service set time interface, invalid day 0. > - Test UEFI RT service set time interface, invalid day 32. > - Test UEFI RT service set time interface, invalid hour 24. > - Test UEFI RT service set time interface, invalid minute 60. > - Test UEFI RT service set time interface, invalid second 60. > - Test UEFI RT service set time interface, invalid nanosecond 1000000000. > - Test UEFI RT service set time interface, invalid timezone -1441. > - Test UEFI RT service set time interface, invalid timezone 1441. > - Test UEFI RT service get wakeup time interface. > - Test UEFI RT service get wakeup time interface, NULL enabled parameter. > - Test UEFI RT service get wakeup time interface, NULL pending parameter. > - Test UEFI RT service get wakeup time interface, NULL time parameter. > - Test UEFI RT service get wakeup time interface, NULL enabled, pending and time parameters. > - Test UEFI RT service set wakeup time interface. > - Test UEFI RT service set wakeup time interface, NULL time parameter. > - Test UEFI RT service set wakeup time interface, invalid year 1899. > - Test UEFI RT service set wakeup time interface, invalid year 10000. > - Test UEFI RT service set wakeup time interface, invalid month 0. > - Test UEFI RT service set wakeup time interface, invalid month 13. > - Test UEFI RT service set wakeup time interface, invalid day 0. > - Test UEFI RT service set wakeup time interface, invalid day 32. > - Test UEFI RT service set wakeup time interface, invalid hour 24. > - Test UEFI RT service set wakeup time interface, invalid minute 60. > - Test UEFI RT service set wakeup time interface, invalid second 60. > - Test UEFI RT service set wakeup time interface, invalid nanosecond 1000000000. > - Test UEFI RT service set wakeup time interface, invalid timezone -1441. > - Test UEFI RT service set wakeup time interface, invalid timezone 1441. > - uefirtvariable (8 tests): > - Test UEFI RT service get variable interface. > - Test UEFI RT service get next variable name interface. > - Test UEFI RT service set variable interface. > - Test UEFI RT service query variable info interface. > - Test UEFI RT service variable interface stress test. > - Test UEFI RT service set variable interface stress test. > - Test UEFI RT service query variable info interface stress test. > - Test UEFI RT service get variable interface, invalid parameters. > - > -ACPI Spec Compliance tests: > - fadt (6 tests): > - ACPI FADT Description Table flag info. > - FADT checksum test. > - FADT revision test. > - ACPI FADT Description Table tests. > - Test FADT SCI_EN bit is enabled. > - Test FADT reset register. > - madt (5 tests): > - MADT checksum test. > - MADT revision test. > - MADT architecture minimum revision test. > - MADT flags field reserved bits test. > - MADT subtable tests. > - rsdp (1 test): > - RSDP Root System Description Pointer test. > diff --git a/fwts-test/arg-show-tests-full-0001/test-0001.sh b/fwts-test/arg-show-tests-full-0001/test-0001.sh > index b4e74f7..1302bd3 100755 > --- a/fwts-test/arg-show-tests-full-0001/test-0001.sh > +++ b/fwts-test/arg-show-tests-full-0001/test-0001.sh > @@ -3,17 +3,25 @@ > TEST="Test --show-tests-full option" > NAME=test-0001.sh > TMPLOG=$TMP/arg-show-tests-full.log.$$ > +export FWTS_SHOW_LOGS="FULL" > + > +# Dynamically create the log template per test > +$FWTS show_logs &> /dev/null > +if [ $? -ne 0 ]; then > + echo SKIP: $TEST, $NAME > + exit 77 > +fi > > # > -# Non-x86 tests don't have WMI so skip this test > +# If we can't set the tty then we can't test > # > -$FWTS --show-tests | grep wmi > /dev/null > -if [ $? -eq 1 ]; then > +stty cols 80 &> /dev/null > +if [ $? -ne 0 ]; then > + tset &> /dev/null > echo SKIP: $TEST, $NAME > exit 77 > fi > > -stty cols 80 > $FWTS --show-tests-full > $TMPLOG > diff $TMPLOG $FWTSTESTDIR/arg-show-tests-full-0001/arg-show-tests-full-0001.log >> $FAILURE_LOG > ret=$? > @@ -23,5 +31,8 @@ else > echo FAILED: $TEST, $NAME > fi > > +stty cols 80 &> /dev/null > +tset &> /dev/null > + > rm $TMPLOG > exit $ret > diff --git a/src/Makefile.am b/src/Makefile.am > index 100eaa3..8ac67b4 100644 > --- a/src/Makefile.am > +++ b/src/Makefile.am > @@ -132,6 +132,7 @@ fwts_SOURCES = main.c \ > pci/aspm/aspm.c \ > pci/crs/crs.c \ > pci/maxreadreq/maxreadreq.c \ > + show/show_logs.c \ > uefi/csm/csm.c \ > uefi/uefidump/uefidump.c \ > uefi/uefirttime/uefirttime.c \ > diff --git a/src/show/show_logs.c b/src/show/show_logs.c > new file mode 100644 > index 0000000..7b958ff > --- /dev/null > +++ b/src/show/show_logs.c > @@ -0,0 +1,1480 @@ > +/* > + * Copyright (C) 2010-2016 Canonical > + * Some of this work - Copyright (C) 2016 IBM > + * > + * This program is free software; you can redistribute it and/or > + * modify it under the terms of the GNU General Public License > + * as published by the Free Software Foundation; either version 2 > + * of the License, or (at your option) any later version. > + * > + * This program is distributed in the hope that it will be useful, > + * but WITHOUT ANY WARRANTY; without even the implied warranty of > + * MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the > + * GNU General Public License for more details. > + * > + * You should have received a copy of the GNU General Public License > + * along with this program; if not, write to the Free Software > + * Foundation, Inc., 51 Franklin Street, Fifth Floor, Boston, MA 02110-1301, USA. > + * > + */ > + > + > +#include "fwts.h" > + > +static char *fwts_show[] = { > +"ACPI tests:", > +" acpiinfo General ACPI information test.", > +" acpitables ACPI table headers sanity tests.", > +#ifdef FWTS_ARCH_INTEL > +" apicinstance Test for single instance of APIC/MADT table.", > +#endif > +" asf ASF! Alert Standard Format Table test.", > +" aspt ASPT Table test.", > +" bert BERT Boot Error Record Table test.", > +" bgrt BGRT Boot Graphics Resource Table test.", > +" boot BOOT Table test.", > +" checksum ACPI table checksum test.", > +" cpep CPEP Corrected Platform Error Polling Table test.", > +" csrt CSRT Core System Resource Table test.", > +#ifdef FWTS_ARCH_INTEL > +" cstates Processor C state support test.", > +#endif > +" dbg2 DBG2 (Debug Port Table 2) test.", > +" dbgp DBGP (Debug Port) Table test.", > +#ifdef FWTS_ARCH_INTEL > +" dmar DMA Remapping (VT-d) test.", > +#endif > +" ecdt ECDT Embedded Controller Boot Resources Table test.", > +" einj EINJ Error Injection Table test.", > +" erst ERST Error Record Serialization Table test.", > +" facs FACS Firmware ACPI Control Structure test.", > +" fadt FADT Fixed ACPI Description Table tests.", > +" fpdt FPDT Firmware Performance Data Table test.", > +" gtdt GTDT Generic Timer Description Table test.", > +" hest HEST Hardware Error Source Table test.", > +#ifdef FWTS_ARCH_INTEL > +" hpet HPET IA-PC High Precision Event Timer Table tests.", > +#endif > +" iort IORT IO Remapping Table test.", > +" lpit LPIT Low Power Idle Table test.", > +" madt MADT Multiple APIC Description Table " > + "(spec compliant).", > +#ifdef FWTS_ARCH_INTEL > +" mcfg MCFG PCI Express* memory mapped config space test.", > +#endif > +" mchi MCHI Management Controller Host Interface" > + " Table test.", > +" method ACPI DSDT Method Semantic tests.", > +" msct MSCT Maximum System Characteristics Table test.", > +" msdm MSDM Microsoft Data Management Table test.", > +#ifdef FWTS_ARCH_INTEL > +" pcc Processor Clocking Control (PCC) test.", > +#endif > +" rsdp RSDP Root System Description Pointer test.", > +" rsdt RSDT Root System Description Table test.", > +" sbst SBST Smart Battery Specification Table test.", > +" slic SLIC Software Licensing Description Table test.", > +" slit SLIT System Locality Distance Information test.", > +" spcr SPCR Serial Port Console Redirection Table test.", > +" spmi SPMI Service Processor Management Interface" > + " Description Table test.", > +" srat SRAT System Resource Affinity Table test.", > +" stao STAO Status Override Table test.", > +" tcpa TCPA Trusted Computing Platform Alliance" > + " Capabilities Table test.", > +" tpm2 TPM2 Trusted Platform Module 2 test.", > +" uefi UEFI Data Table test.", > +" waet WAET Windows ACPI Emulated Devices Table test.", > +" wdat WDAT Microsoft Hardware Watchdog Action Table test.", > +#ifdef FWTS_ARCH_INTEL > +" wmi Extract and analyse Windows Management" > + " Instrumentation (WMI).", > +#endif > +" xenv XENV Xen Environment Table tests.", > +" xsdt XSDT Extended System Description Table test.", > +" ", > +"Batch tests:", > +" acpiinfo General ACPI information test.", > +" acpitables ACPI table headers sanity tests.", > +#ifdef FWTS_ARCH_INTEL > +" apicedge APIC edge/level test.", > +" apicinstance Test for single instance of APIC/MADT table.", > +#endif > +" asf ASF! Alert Standard Format Table test.", > +" aspm PCIe ASPM test.", > +" aspt ASPT Table test.", > +#ifdef FWTS_ARCH_INTEL > +" autobrightness Automated LCD brightness test.", > +#endif > +" bert BERT Boot Error Record Table test.", > +" bgrt BGRT Boot Graphics Resource Table test.", > +#ifdef FWTS_ARCH_INTEL > +" bios32 BIOS32 Service Directory test.", > +" bios_info Gather BIOS DMI information.", > +#endif > +" bmc_info BMC Info", > +" boot BOOT Table test.", > +" checksum ACPI table checksum test.", > +" cpep CPEP Corrected Platform Error Polling Table test.", > +" cpufreq CPU frequency scaling tests.", > +#ifdef FWTS_ARCH_INTEL > +" crs Test PCI host bridge configuration using _CRS.", > +" csm UEFI Compatibility Support Module test.", > +#endif > +" csrt CSRT Core System Resource Table test.", > +#ifdef FWTS_ARCH_INTEL > +" cstates Processor C state support test.", > +#endif > +" dbg2 DBG2 (Debug Port Table 2) test.", > +" dbgp DBGP (Debug Port) Table test.", > +#ifdef FWTS_ARCH_INTEL > +" dmar DMA Remapping (VT-d) test.", > +" dmicheck DMI/SMBIOS table tests.", > +#endif > +#ifdef HAVE_LIBFDT > +" dt_base Base device tree validity check", > +" dt_sysinfo Device tree system information test", > +#endif > +#ifdef FWTS_ARCH_INTEL > +" ebda Test EBDA region is mapped and reserved in memory" > + " map table.", > +#endif > +" ecdt ECDT Embedded Controller Boot Resources Table test.", > +" einj EINJ Error Injection Table test.", > +" erst ERST Error Record Serialization Table test.", > +" facs FACS Firmware ACPI Control Structure test.", > +" fadt FADT Fixed ACPI Description Table tests.", > +#ifdef FWTS_ARCH_INTEL > +" fan Simple fan tests.", > +#endif > +" fpdt FPDT Firmware Performance Data Table test.", > +" gtdt GTDT Generic Timer Description Table test.", > +" hda_audio HDA Audio Pin Configuration test.", > +" hest HEST Hardware Error Source Table test.", > +#ifdef FWTS_ARCH_INTEL > +" hpet HPET IA-PC High Precision Event Timer Table tests.", > +#endif > +" iort IORT IO Remapping Table test.", > +" klog Scan kernel log for errors and warnings.", > +" lpit LPIT Low Power Idle Table test.", > +" madt MADT Multiple APIC Description Table" > + " (spec compliant).", > +#ifdef FWTS_ARCH_INTEL > +" maxfreq Test max CPU frequencies against max scaling" > + " frequency.", > +#endif > +" maxreadreq Test firmware has set PCI Express MaxReadReq to a" > + " higher value on non-motherboard devices.", > +#ifdef FWTS_ARCH_INTEL > +" mcfg MCFG PCI Express* memory mapped config space test.", > +#endif > +" mchi MCHI Management Controller Host Interface Table test.", > +" method ACPI DSDT Method Semantic tests.", > +#ifdef FWTS_ARCH_INTEL > +" microcode Test if system is using latest microcode.", > +" mpcheck MultiProcessor Tables tests.", > +#endif > +" msct MSCT Maximum System Characteristics Table test.", > +" msdm MSDM Microsoft Data Management Table test.", > +#ifdef FWTS_ARCH_INTEL > +" msr MSR register tests.", > +" mtrr MTRR tests.", > +#endif > +#ifdef FWTS_ARCH_INTEL > +" nx Test if CPU NX is disabled by the BIOS.", > +#endif > +" olog Run OLOG scan and analysis checks.", > +" oops Scan kernel log for Oopses.", > +#ifdef FWTS_ARCH_INTEL > +" osilinux Disassemble DSDT to check for _OSI(\"Linux\").", > +" pcc Processor Clocking Control (PCC) test.", > +" pciirq PCI IRQ Routing Table test.", > +" pnp BIOS Support Installation structure test.", > +#endif > +" prd_info OPAL Processor Recovery Diagnostics Info", > +" rsdp RSDP Root System Description Pointer test.", > +" rsdt RSDT Root System Description Table test.", > +" sbst SBST Smart Battery Specification Table test.", > +" securebootcert UEFI secure boot test.", > +" show_logs Show Tests Log Files", > +" slic SLIC Software Licensing Description Table test.", > +" slit SLIT System Locality Distance Information test.", > +" spcr SPCR Serial Port Console Redirection Table test.", > +" spmi SPMI Service Processor Management Interface" > + " Description Table test.", > +" srat SRAT System Resource Affinity Table test.", > +" stao STAO Status Override Table test.", > +" syntaxcheck Re-assemble DSDT and SSDTs to find syntax errors" > + " and warnings.", > +" tcpa TCPA Trusted Computing Platform Alliance" > + " Capabilities Table test.", > +" tpm2 TPM2 Trusted Platform Module 2 test.", > +" uefi UEFI Data Table test.", > +" uefibootpath Sanity check for UEFI Boot Path Boot####.", > +" version Gather kernel system information.", > +#ifdef FWTS_ARCH_INTEL > +" virt CPU Virtualisation Configuration test.", > +#endif > +" waet WAET Windows ACPI Emulated Devices Table test.", > +" wakealarm ACPI Wakealarm tests.", > +" wdat WDAT Microsoft Hardware Watchdog Action Table test.", > +#ifdef FWTS_ARCH_INTEL > +" wmi Extract and analyse Windows Management" > + " Instrumentation (WMI).", > +#endif > +" xenv XENV Xen Environment Table tests.", > +" xsdt XSDT Extended System Description Table test.", > +"", > +#ifdef FWTS_ARCH_INTEL > +"Interactive tests:", > +" ac_adapter Interactive ac_adapter power test.", > +" battery Battery tests.", > +" brightness Interactive LCD brightness test.", > +" hotkey Hotkey scan code tests.", > +" lid Interactive lid button test.", > +" power_button Interactive power_button button test.", > +"", > +"Power States tests:", > +" s3 S3 suspend/resume test.", > +" s3power S3 power loss during suspend test (takes minimum" > + " of 10 minutes to run).", > +" s4 S4 hibernate/resume test.", > +"", > +#endif > +"Utilities:", > +" acpidump Dump ACPI tables.", > +#ifdef FWTS_ARCH_INTEL > +" cmosdump Dump CMOS Memory.", > +#endif > +" crsdump Dump ACPI _CRS resources.", > +#ifdef FWTS_ARCH_INTEL > +" ebdadump Dump EBDA region.", > +#endif > +" esrtdump Dump ESRT table.", > +" gpedump Dump GPEs.", > +#ifdef FWTS_ARCH_INTEL > +" memmapdump Dump system memory map.", > +" mpdump Dump MultiProcessor Data.", > +#endif > +" plddump Dump ACPI _PLD (Physical Device Location).", > +" prsdump Dump ACPI _PRS resources.", > +#ifdef FWTS_ARCH_INTEL > +" romdump Dump ROM data.", > +#endif > +" uefidump Dump UEFI variables.", > +" uefivarinfo UEFI variable info query.", > +"", > +"Unsafe tests:", > +" uefirtauthvar Authenticated variable tests.", > +" uefirtmisc UEFI miscellaneous runtime service interface tests.", > +" uefirttime UEFI Runtime service time interface tests.", > +" uefirtvariable UEFI Runtime service variable interface tests.", > +"", > +"UEFI tests:", > +#ifdef FWTS_ARCH_INTEL > +" csm UEFI Compatibility Support Module test.", > +#endif > +" esrt Sanity check UEFI ESRT Table.", > +" securebootcert UEFI secure boot test.", > +" uefibootpath Sanity check for UEFI Boot Path Boot####.", > +" uefirtauthvar Authenticated variable tests.", > +" uefirtmisc UEFI miscellaneous runtime service interface tests.", > +" uefirttime UEFI Runtime service time interface tests.", > +" uefirtvariable UEFI Runtime service variable interface tests.", > +"", > +"ACPI Spec Compliance tests:", > +" fadt FADT Fixed ACPI Description Table tests.", > +" madt MADT Multiple APIC Description Table" > + " (spec compliant).", > +" rsdp RSDP Root System Description Pointer test.", > +}; > + > +static char *fwts_show_all[] = { > +"ACPI tests:", > +" acpiinfo (3 tests):", > +" Determine Kernel ACPI version.", > +" Determine machine's ACPI version.", > +" Determine AML compiler.", > +" acpitables (1 test):", > +" Test ACPI headers.", > +#ifdef FWTS_ARCH_INTEL > +" apicinstance (1 test):", > +" Test for single instance of APIC/MADT table.", > +#endif > +" asf (1 test):", > +" ASF! Alert Standard Format Table test.", > +" aspt (1 test):", > +" ASPT Table test.", > +" bert (1 test):", > +" BERT Boot Error Record Table test.", > +" bgrt (1 test):", > +" BGRT Boot Graphics Resource Table test.", > +" boot (1 test):", > +" BOOT Table test.", > +" checksum (1 test):", > +" ACPI table checksum test.", > +" cpep (1 test):", > +" CPEP Corrected Platform Error Polling Table test.", > +" csrt (1 test):", > +" CSRT Core System Resource Table test.", > +#ifdef FWTS_ARCH_INTEL > +" cstates (1 test):", > +" Test all CPUs C-states.", > +#endif > +" dbg2 (1 test):", > +" DBG2 (Debug Port Table 2) test.", > +" dbgp (1 test):", > +" DBGP (Debug Port) Table test.", > +#ifdef FWTS_ARCH_INTEL > +" dmar (1 test):", > +" DMA Remapping test.", > +#endif > +" ecdt (1 test):", > +" ECDT Embedded Controller Boot Resources Table test.", > +" einj (1 test):", > +" EINJ Error Injection Table test.", > +" erst (1 test):", > +" ERST Error Record Serialization Table test.", > +" facs (1 test):", > +" FACS Firmware ACPI Control Structure test.", > +" fadt (6 tests):", > +" ACPI FADT Description Table flag info.", > +" FADT checksum test.", > +" FADT revision test.", > +" ACPI FADT Description Table tests.", > +" Test FADT SCI_EN bit is enabled.", > +" Test FADT reset register.", > +" fpdt (1 test):", > +" FPDT Firmware Performance Data Table test.", > +" gtdt (1 test):", > +" GTDT Generic Timer Description Table test.", > +" hest (1 test):", > +" HEST Hardware Error Source Table test.", > +#ifdef FWTS_ARCH_INTEL > +" hpet (4 tests):", > +" Test HPET base in kernel log.", > +" Test HPET base in HPET table.", > +" Test HPET base in DSDT and/or SSDT.", > +" Test HPET configuration.", > +#endif > +" iort (1 test):", > +" IORT IO Remapping Table test.", > +" lpit (1 test):", > +" LPIT Low Power Idle Table test.", > +" madt (5 tests):", > +" MADT checksum test.", > +" MADT revision test.", > +" MADT architecture minimum revision test.", > +" MADT flags field reserved bits test.", > +" MADT subtable tests.", > +#ifdef FWTS_ARCH_INTEL > +" mcfg (2 tests):", > +" Validate MCFG table.", > +" Validate MCFG PCI config space.", > +#endif > +" mchi (1 test):", > +" MCHI Management Controller Host Interface Table test.", > +" method (191 tests):", > +" Test Method Names.", > +" Test _AEI.", > +" Test _EVT (Event Method).", > +" Test _DLM (Device Lock Mutex).", > +" Test _PIC (Inform AML of Interrupt Model).", > +" Test _CID (Compatible ID).", > +" Test _DDN (DOS Device Name).", > +" Test _HID (Hardware ID).", > +" Test _HRV (Hardware Revision Number).", > +" Test _MLS (Multiple Language String).", > +" Test _PLD (Physical Device Location).", > +" Test _SUB (Subsystem ID).", > +" Test _SUN (Slot User Number).", > +" Test _STR (String).", > +" Test _UID (Unique ID).", > +" Test _CDM (Clock Domain).", > +" Test _CRS (Current Resource Settings).", > +" Test _DSD (Device Specific Data).", > +" Test _DIS (Disable).", > +" Test _DMA (Direct Memory Access).", > +" Test _FIX (Fixed Register Resource Provider).", > +" Test _GSB (Global System Interrupt Base).", > +" Test _HPP (Hot Plug Parameters).", > +" Test _PRS (Possible Resource Settings).", > +" Test _PRT (PCI Routing Table).", > +" Test _PXM (Proximity).", > +" Test _CCA (Cache Coherency Attribute).", > +" Test _EDL (Eject Device List).", > +" Test _EJD (Ejection Dependent Device).", > +" Test _EJ0 (Eject).", > +" Test _EJ1 (Eject).", > +" Test _EJ2 (Eject).", > +" Test _EJ3 (Eject).", > +" Test _EJ4 (Eject).", > +" Test _LCK (Lock).", > +" Test _RMV (Remove).", > +" Test _STA (Status).", > +" Test _DEP (Operational Region Dependencies).", > +" Test _BDN (BIOS Dock Name).", > +" Test _BBN (Base Bus Number).", > +" Test _DCK (Dock).", > +" Test _INI (Initialize).", > +" Test _GLK (Global Lock).", > +" Test _SEG (Segment).", > +" Test _OFF (Set resource off).", > +" Test _ON_ (Set resource on).", > +" Test _DSW (Device Sleep Wake).", > +" Test _IRC (In Rush Current).", > +" Test _PRE (Power Resources for Enumeration).", > +" Test _PR0 (Power Resources for D0).", > +" Test _PR1 (Power Resources for D1).", > +" Test _PR2 (Power Resources for D2).", > +" Test _PR3 (Power Resources for D3).", > +" Test _PRW (Power Resources for Wake).", > +" Test _PS0 (Power State 0).", > +" Test _PS1 (Power State 1).", > +" Test _PS2 (Power State 2).", > +" Test _PS3 (Power State 3).", > +" Test _PSC (Power State Current).", > +" Test _PSE (Power State for Enumeration).", > +" Test _PSW (Power State Wake).", > +" Test _S1D (S1 Device State).", > +" Test _S2D (S2 Device State).", > +" Test _S3D (S3 Device State).", > +" Test _S4D (S4 Device State).", > +" Test _S0W (S0 Device Wake State).", > +" Test _S1W (S1 Device Wake State).", > +" Test _S2W (S2 Device Wake State).", > +" Test _S3W (S3 Device Wake State).", > +" Test _S4W (S4 Device Wake State).", > +" Test _RST (Device Reset).", > +" Test _PRR (Power Resource for Reset).", > +" Test _S0_ (S0 System State).", > +" Test _S1_ (S1 System State).", > +" Test _S2_ (S2 System State).", > +" Test _S3_ (S3 System State).", > +" Test _S4_ (S4 System State).", > +" Test _S5_ (S5 System State).", > +" Test _SWS (System Wake Source).", > +" Test _PSS (Performance Supported States).", > +" Test _CPC (Continuous Performance Control).", > +" Test _CSD (C State Dependencies).", > +" Test _CST (C States).", > +" Test _PCT (Performance Control).", > +" Test _PDL (P-State Depth Limit).", > +" Test _PPC (Performance Present Capabilities).", > +" Test _PPE (Polling for Platform Error).", > +" Test _PSD (Power State Dependencies).", > +" Test _PTC (Processor Throttling Control).", > +" Test _TDL (T-State Depth Limit).", > +" Test _TPC (Throttling Present Capabilities).", > +" Test _TSD (Throttling State Dependencies).", > +" Test _TSS (Throttling Supported States).", > +" Test _LPI (Low Power Idle States).", > +" Test _RDI (Resource Dependencies for Idle).", > +" Test _PUR (Processor Utilization Request).", > +" Test _MSG (Message).", > +" Test _SST (System Status).", > +" Test _ALC (Ambient Light Colour Chromaticity).", > +" Test _ALI (Ambient Light Illuminance).",</tt> <tt>> +" Test _ALT (Ambient Light Temperature).", > +" Test _ALP (Ambient Light Polling).", > +" Test _ALR (Ambient Light Response).", > +" Test _LID (Lid Status).", > +" Test _GTF (Get Task File).", > +" Test _GTM (Get Timing Mode).", > +" Test _MBM (Memory Bandwidth Monitoring Data).", > +" Test _UPC (USB Port Capabilities).", > +" Test _UPD (User Presence Detect).", > +" Test _UPP (User Presence Polling).", > +" Test _GCP (Get Capabilities).", > +" Test _GRT (Get Real Time).", > +" Test _GWS (Get Wake Status).", > +" Test _CWS (Clear Wake Status).", > +" Test _STP (Set Expired Timer Wake Policy).", > +" Test _STV (Set Timer Value).", > +" Test _TIP (Expired Timer Wake Policy).", > +" Test _TIV (Timer Values).", > +" Test _SBS (Smart Battery Subsystem).", > +" Test _BCT (Battery Charge Time).", > +" Test _BIF (Battery Information).", > +" Test _BIX (Battery Information Extended).", > +" Test _BMA (Battery Measurement Averaging).", > +" Test _BMC (Battery Maintenance Control).", > +" Test _BMD (Battery Maintenance Data).", > +" Test _BMS (Battery Measurement Sampling Time).", > +" Test _BST (Battery Status).", > +" Test _BTP (Battery Trip Point).", > +" Test _BTH (Battery Throttle Limit).", > +" Test _BTM (Battery Time).", > +" Test _PCL (Power Consumer List).", > +" Test _PIF (Power Source Information).", > +" Test _PRL (Power Source Redundancy List).", > +" Test _PSR (Power Source).", > +" Test _GAI (Get Averaging Level).", > +" Test _GHL (Get Harware Limit).", > +" Test _PMC (Power Meter Capabilities).", > +" Test _PMD (Power Meter Devices).", > +" Test _PMM (Power Meter Measurement).", > +" Test _WPC (Wireless Power Calibration).", > +" Test _WPP (Wireless Power Polling).", > +" Test _FIF (Fan Information).", > +" Test _FPS (Fan Performance States).", > +" Test _FSL (Fan Set Level).", > +" Test _FST (Fan Status).", > +" Test _ACx (Active Cooling).", > +" Test _ART (Active Cooling Relationship Table).", > +" Test _CRT (Critical Trip Point).", > +" Test _CR3 (Warm/Standby Temperature).", > +" Test _DTI (Device Temperature Indication).", > +" Test _HOT (Hot Temperature).", > +" Test _MTL (Minimum Throttle Limit).", > +" Test _NTT (Notification Temp Threshold).", > +" Test _PSL (Passive List).", > +" Test _PSV (Passive Temp).", > +" Test _RTV (Relative Temp Values).", > +" Test _SCP (Set Cooling Policy).", > +" Test _TC1 (Thermal Constant 1).", > +" Test _TC2 (Thermal Constant 2).", > +" Test _TFP (Thermal fast Sampling Period).", > +" Test _TMP (Thermal Zone Current Temp).", > +" Test _TPT (Trip Point Temperature).", > +" Test _TRT (Thermal Relationship Table).", > +" Test _TSN (Thermal Sensor Device).", > +" Test _TSP (Thermal Sampling Period).", > +" Test _TST (Temperature Sensor Threshold).", > +" Test _TZD (Thermal Zone Devices).", > +" Test _TZM (Thermal Zone member).", > +" Test _TZP (Thermal Zone Polling).", > +" Test _GPE (General Purpose Events).", > +" Test _EC_ (EC Offset Query).", > +" Test _PTS (Prepare to Sleep).", > +" Test _TTS (Transition to State).", > +" Test _WAK (System Wake).", > +" Test _ADR (Return Unique ID for Device).", > +" Test _BCL (Query List of Brightness Control Levels Supported).", > +" Test _BCM (Set Brightness Level).", > +" Test _BQC (Brightness Query Current Level).", > +" Test _DCS (Return the Status of Output Device).", > +" Test _DDC (Return the EDID for this Device).", > +" Test _DSS (Device Set State).", > +" Test _DGS (Query Graphics State).", > +" Test _DOD (Enumerate All Devices Attached to Display Adapter).", > +" Test _DOS (Enable/Disable Output Switching).", > +" Test _GPD (Get POST Device).", > +" Test _ROM (Get ROM Data).", > +" Test _SPD (Set POST Device).", > +" Test _VPO (Video POST Options).", > +" Test _CBA (Configuration Base Address).", > +" Test _IFT (IPMI Interface Type).", > +" Test _SRV (IPMI Interface Revision).", > +" msct (1 test):", > +" MSCT Maximum System Characteristics Table test.", > +" msdm (1 test):", > +" MSDM Microsoft Data Management Table test.", > +#ifdef FWTS_ARCH_INTEL > +" pcc (1 test):", > +" Processor Clocking Control (PCC) test.", > +#endif > +" rsdp (1 test):", > +" RSDP Root System Description Pointer test.", > +" rsdt (1 test):", > +" RSDT Root System Description Table test.", > +" sbst (1 test):", > +" SBST Smart Battery Specificiation Table test.", > +" slic (1 test):", > +" SLIC Software Licensing Description Table test.", > +" slit (1 test):", > +" SLIT System Locality Distance Information test.", > +" spcr (1 test):", > +" SPCR Serial Port Console Redirection Table test.", > +" spmi (1 test):", > +" SPMI Service Processor Management Interface Description Table test.", > +" srat (1 test):", > +" SRAT System Resource Affinity Table test.", > +" stao (1 test):", > +" STAO Status Override Table test.", > +" tcpa (1 test):", > +" Validate TCPA table.", > +" tpm2 (1 test):", > +" Validate TPM2 table.", > +" uefi (1 test):", > +" UEFI Data Table test.", > +" waet (1 test):", > +" Windows ACPI Emulated Devices Table test.", > +" wdat (1 test):", > +" WDAT Microsoft Hardware Watchdog Action Table test.", > +#ifdef FWTS_ARCH_INTEL > +" wmi (1 test):", > +" Windows Management Instrumentation test.", > +#endif > +" xenv (1 test):", > +" Validate XENV table.", > +" xsdt (1 test):", > +" XSDT Extended System Description Table test.", > +"", > +"Batch tests:", > +" acpiinfo (3 tests):", > +" Determine Kernel ACPI version.", > +" Determine machine's ACPI version.", > +" Determine AML compiler.", > +" acpitables (1 test):", > +" Test ACPI headers.", > +#ifdef FWTS_ARCH_INTEL > +" apicedge (1 test):", > +" Legacy and PCI Interrupt Edge/Level trigger tests.", > +" apicinstance (1 test):", > +" Test for single instance of APIC/MADT table.", > +#endif > +" asf (1 test):", > +" ASF! Alert Standard Format Table test.", > +" aspm (2 tests):", > +" PCIe ASPM ACPI test.", > +" PCIe ASPM registers test.", > +" aspt (1 test):", > +" ASPT Table test.", > +#ifdef FWTS_ARCH_INTEL > +" autobrightness (2 tests):", > +" Test for maximum and actual brightness.", > +" Change actual brightness.", > +#endif > +" bert (1 test):", > +" BERT Boot Error Record Table test.", > +" bgrt (1 test):", > +" BGRT Boot Graphics Resource Table test.", > +#ifdef FWTS_ARCH_INTEL > +" bios32 (1 test):", > +" BIOS32 Service Directory test.", > +" bios_info (1 test):", > +" Gather BIOS DMI information", > +#endif > +" bmc_info (1 test):", > +" BMC Info", > +" boot (1 test):", > +" BOOT Table test.", > +" checksum (1 test):", > +" ACPI table checksum test.", > +" cpep (1 test):", > +" CPEP Corrected Platform Error Polling Table test.", > +" cpufreq (7 tests):", > +" CPU frequency table consistency", > +" CPU frequency table duplicates", > +" CPU frequency firmware limits", > +" CPU frequency claimed maximum", > +" CPU frequency SW_ANY control", > +" CPU frequency SW_ALL control", > +" CPU frequency performance tests.", > +#ifdef FWTS_ARCH_INTEL > +" crs (1 test):", > +" Test PCI host bridge configuration using _CRS.", > +" csm (1 test):", > +" UEFI Compatibility Support Module test.", > +#endif > +" csrt (1 test):", > +" CSRT Core System Resource Table test.", > +#ifdef FWTS_ARCH_INTEL > +" cstates (1 test):", > +" Test all CPUs C-states.", > +#endif > +" dbg2 (1 test):", > +" DBG2 (Debug Port Table 2) test.", > +" dbgp (1 test):", > +" DBGP (Debug Port) Table test.", > +#ifdef FWTS_ARCH_INTEL > +" dmar (1 test):", > +" DMA Remapping test.", > +" dmicheck (3 tests):", > +" Find and test SMBIOS Table Entry Points.", > +" Test DMI/SMBIOS tables for errors.", > +" Test DMI/SMBIOS3 tables for errors.", > +#endif > +#ifdef HAVE_LIBFDT > +" dt_base (3 tests):", > +" Check device tree presence", > +" Check device tree baseline validity", > +" Check device tree warnings", > +" dt_sysinfo (3 tests):", > +" Check model property", > +" Check system-id property", > +" Check OpenPOWER Reference compatible", > +#endif > +#ifdef FWTS_ARCH_INTEL > +" ebda (1 test):", > +" Test EBDA is reserved in E820 table.", > +#endif > +" ecdt (1 test):", > +" ECDT Embedded Controller Boot Resources Table test.", > +" einj (1 test):", > +" EINJ Error Injection Table test.", > +" erst (1 test):", > +" ERST Error Record Serialization Table test.", > +" facs (1 test):", > +" FACS Firmware ACPI Control Structure test.", > +" fadt (6 tests):", > +" ACPI FADT Description Table flag info.", > +" FADT checksum test.", > +" FADT revision test.", > +" ACPI FADT Description Table tests.", > +" Test FADT SCI_EN bit is enabled.", > +" Test FADT reset register.", > +#ifdef FWTS_ARCH_INTEL > +" fan (2 tests):", > +" Test fan status.", > +" Load system, check CPU fan status.", > +#endif > +" fpdt (1 test):", > +" FPDT Firmware Performance Data Table test.", > +" gtdt (1 test):", > +" GTDT Generic Timer Description Table test.", > +" hda_audio (1 test):", > +" HDA Audio Pin Configuration test.", > +" hest (1 test):", > +" HEST Hardware Error Source Table test.", > +#ifdef FWTS_ARCH_INTEL > +" hpet (4 tests):", > +" Test HPET base in kernel log.", > +" Test HPET base in HPET table.", > +" Test HPET base in DSDT and/or SSDT.", > +" Test HPET configuration.", > +#endif > +" iort (1 test):", > +" IORT IO Remapping Table test.", > +" klog (1 test):", > +" Kernel log error check.", > +" lpit (1 test):", > +" LPIT Low Power Idle Table test.", > +" madt (5 tests):", > +" MADT checksum test.", > +" MADT revision test.", > +" MADT architecture minimum revision test.", > +" MADT flags field reserved bits test.", > +" MADT subtable tests.", > +#ifdef FWTS_ARCH_INTEL > +" maxfreq (1 test):", > +" Maximum CPU frequency test.", > +#endif > +" maxreadreq (1 test):", > +" Test firmware settings MaxReadReq for PCI Express devices.", > +#ifdef FWTS_ARCH_INTEL > +" mcfg (2 tests):", > +" Validate MCFG table.", > +" Validate MCFG PCI config space.", > +#endif > +" mchi (1 test):", > +" MCHI Management Controller Host Interface Table test.", > +" method (191 tests):", > +" Test Method Names.", > +" Test _AEI.", > +" Test _EVT (Event Method).", > +" Test _DLM (Device Lock Mutex).", > +" Test _PIC (Inform AML of Interrupt Model).", > +" Test _CID (Compatible ID).", > +" Test _DDN (DOS Device Name).", > +" Test _HID (Hardware ID).", > +" Test _HRV (Hardware Revision Number).", > +" Test _MLS (Multiple Language String).", > +" Test _PLD (Physical Device Location).", > +" Test _SUB (Subsystem ID).", > +" Test _SUN (Slot User Number).", > +" Test _STR (String).", > +" Test _UID (Unique ID).", > +" Test _CDM (Clock Domain).", > +" Test _CRS (Current Resource Settings).", > +" Test _DSD (Device Specific Data).", > +" Test _DIS (Disable).", > +" Test _DMA (Direct Memory Access).", > +" Test _FIX (Fixed Register Resource Provider).", > +" Test _GSB (Global System Interrupt Base).", > +" Test _HPP (Hot Plug Parameters).", > +" Test _PRS (Possible Resource Settings).", > +" Test _PRT (PCI Routing Table).", > +" Test _PXM (Proximity).", > +" Test _CCA (Cache Coherency Attribute).", > +" Test _EDL (Eject Device List).", > +" Test _EJD (Ejection Dependent Device).", > +" Test _EJ0 (Eject).", > +" Test _EJ1 (Eject).", > +" Test _EJ2 (Eject).", > +" Test _EJ3 (Eject).", > +" Test _EJ4 (Eject).", > +" Test _LCK (Lock).", > +" Test _RMV (Remove).", > +" Test _STA (Status).", > +" Test _DEP (Operational Region Dependencies).", > +" Test _BDN (BIOS Dock Name).", > +" Test _BBN (Base Bus Number).", > +" Test _DCK (Dock).", > +" Test _INI (Initialize).", > +" Test _GLK (Global Lock).", > +" Test _SEG (Segment).", > +" Test _OFF (Set resource off).", > +" Test _ON_ (Set resource on).", > +" Test _DSW (Device Sleep Wake).", > +" Test _IRC (In Rush Current).", > +" Test _PRE (Power Resources for Enumeration).", > +" Test _PR0 (Power Resources for D0).", > +" Test _PR1 (Power Resources for D1).", > +" Test _PR2 (Power Resources for D2).", > +" Test _PR3 (Power Resources for D3).", > +" Test _PRW (Power Resources for Wake).", > +" Test _PS0 (Power State 0).", > +" Test _PS1 (Power State 1).", > +" Test _PS2 (Power State 2).", > +" Test _PS3 (Power State 3).", > +" Test _PSC (Power State Current).", > +" Test _PSE (Power State for Enumeration).", > +" Test _PSW (Power State Wake).", > +" Test _S1D (S1 Device State).", > +" Test _S2D (S2 Device State).", > +" Test _S3D (S3 Device State).", > +" Test _S4D (S4 Device State).", > +" Test _S0W (S0 Device Wake State).", > +" Test _S1W (S1 Device Wake State).", > +" Test _S2W (S2 Device Wake State).", > +" Test _S3W (S3 Device Wake State).", > +" Test _S4W (S4 Device Wake State).", > +" Test _RST (Device Reset).", > +" Test _PRR (Power Resource for Reset).", > +" Test _S0_ (S0 System State).", > +" Test _S1_ (S1 System State).", > +" Test _S2_ (S2 System State).", > +" Test _S3_ (S3 System State).", > +" Test _S4_ (S4 System State).", > +" Test _S5_ (S5 System State).", > +" Test _SWS (System Wake Source).", > +" Test _PSS (Performance Supported States).", > +" Test _CPC (Continuous Performance Control).", > +" Test _CSD (C State Dependencies).", > +" Test _CST (C States).", > +" Test _PCT (Performance Control).", > +" Test _PDL (P-State Depth Limit).", > +" Test _PPC (Performance Present Capabilities).", > +" Test _PPE (Polling for Platform Error).", > +" Test _PSD (Power State Dependencies).", > +" Test _PTC (Processor Throttling Control).", > +" Test _TDL (T-State Depth Limit).", > +" Test _TPC (Throttling Present Capabilities).", > +" Test _TSD (Throttling State Dependencies).", > +" Test _TSS (Throttling Supported States).", > +" Test _LPI (Low Power Idle States).", > +" Test _RDI (Resource Dependencies for Idle).", > +" Test _PUR (Processor Utilization Request).", > +" Test _MSG (Message).", > +" Test _SST (System Status).", > +" Test _ALC (Ambient Light Colour Chromaticity).", > +" Test _ALI (Ambient Light Illuminance).", > +" Test _ALT (Ambient Light Temperature).", > +" Test _ALP (Ambient Light Polling).", > +" Test _ALR (Ambient Light Response).", > +" Test _LID (Lid Status).", > +" Test _GTF (Get Task File).", > +" Test _GTM (Get Timing Mode).", > +" Test _MBM (Memory Bandwidth Monitoring Data).", > +" Test _UPC (USB Port Capabilities).", > +" Test _UPD (User Presence Detect).", > +" Test _UPP (User Presence Polling).", > +" Test _GCP (Get Capabilities).", > +" Test _GRT (Get Real Time).", > +" Test _GWS (Get Wake Status).", > +" Test _CWS (Clear Wake Status).", > +" Test _STP (Set Expired Timer Wake Policy).", > +" Test _STV (Set Timer Value).", > +" Test _TIP (Expired Timer Wake Policy).", > +" Test _TIV (Timer Values).", > +" Test _SBS (Smart Battery Subsystem).", > +" Test _BCT (Battery Charge Time).", > +" Test _BIF (Battery Information).", > +" Test _BIX (Battery Information Extended).", > +" Test _BMA (Battery Measurement Averaging).", > +" Test _BMC (Battery Maintenance Control).", > +" Test _BMD (Battery Maintenance Data).", > +" Test _BMS (Battery Measurement Sampling Time).", > +" Test _BST (Battery Status).", > +" Test _BTP (Battery Trip Point).", > +" Test _BTH (Battery Throttle Limit).", > +" Test _BTM (Battery Time).", > +" Test _PCL (Power Consumer List).", > +" Test _PIF (Power Source Information).", > +" Test _PRL (Power Source Redundancy List).", > +" Test _PSR (Power Source).", > +" Test _GAI (Get Averaging Level).", > +" Test _GHL (Get Harware Limit).", > +" Test _PMC (Power Meter Capabilities).", > +" Test _PMD (Power Meter Devices).", > +" Test _PMM (Power Meter Measurement).", > +" Test _WPC (Wireless Power Calibration).", > +" Test _WPP (Wireless Power Polling).", > +" Test _FIF (Fan Information).", > +" Test _FPS (Fan Performance States).", > +" Test _FSL (Fan Set Level).", > +" Test _FST (Fan Status).", > +" Test _ACx (Active Cooling).", > +" Test _ART (Active Cooling Relationship Table).", > +" Test _CRT (Critical Trip Point).", > +" Test _CR3 (Warm/Standby Temperature).", > +" Test _DTI (Device Temperature Indication).", > +" Test _HOT (Hot Temperature).", > +" Test _MTL (Minimum Throttle Limit).", > +" Test _NTT (Notification Temp Threshold).", > +" Test _PSL (Passive List).", > +" Test _PSV (Passive Temp).", > +" Test _RTV (Relative Temp Values).", > +" Test _SCP (Set Cooling Policy).", > +" Test _TC1 (Thermal Constant 1).", > +" Test _TC2 (Thermal Constant 2).", > +" Test _TFP (Thermal fast Sampling Period).", > +" Test _TMP (Thermal Zone Current Temp).", > +" Test _TPT (Trip Point Temperature).", > +" Test _TRT (Thermal Relationship Table).", > +" Test _TSN (Thermal Sensor Device).", > +" Test _TSP (Thermal Sampling Period).", > +" Test _TST (Temperature Sensor Threshold).", > +" Test _TZD (Thermal Zone Devices).", > +" Test _TZM (Thermal Zone member).", > +" Test _TZP (Thermal Zone Polling).", > +" Test _GPE (General Purpose Events).", > +" Test _EC_ (EC Offset Query).", > +" Test _PTS (Prepare to Sleep).", > +" Test _TTS (Transition to State).", > +" Test _WAK (System Wake).", > +" Test _ADR (Return Unique ID for Device).", > +" Test _BCL (Query List of Brightness Control Levels Supported).", > +" Test _BCM (Set Brightness Level).", > +" Test _BQC (Brightness Query Current Level).", > +" Test _DCS (Return the Status of Output Device).", > +" Test _DDC (Return the EDID for this Device).", > +" Test _DSS (Device Set State).", > +" Test _DGS (Query Graphics State).", > +" Test _DOD (Enumerate All Devices Attached to Display Adapter).", > +" Test _DOS (Enable/Disable Output Switching).", > +" Test _GPD (Get POST Device).", > +" Test _ROM (Get ROM Data).", > +" Test _SPD (Set POST Device).", > +" Test _VPO (Video POST Options).", > +" Test _CBA (Configuration Base Address).", > +" Test _IFT (IPMI Interface Type).", > +" Test _SRV (IPMI Interface Revision).", > +#ifdef FWTS_ARCH_INTEL > +" microcode (1 test):", > +" Test for most recent microcode being loaded.", > +" mpcheck (9 tests):", > +" Test MP header.", > +" Test MP CPU entries.", > +" Test MP Bus entries.", > +" Test MP IO APIC entries.", > +" Test MP IO Interrupt entries.", > +" Test MP Local Interrupt entries.", > +" Test MP System Address entries.", > +" Test MP Bus Hierarchy entries.", > +" Test MP Compatible Bus Address Space entries.", > +#endif > +" msct (1 test):", > +" MSCT Maximum System Characteristics Table test.", > +" msdm (1 test):", > +" MSDM Microsoft Data Management Table test.", > +#ifdef FWTS_ARCH_INTEL > +" msr (5 tests):", > +" Test CPU generic MSRs.", > +" Test CPU specific model MSRs.", > +" Test all P State Ratios.", > +" Test C1 and C3 autodemotion.", > +" Test SMRR MSR registers.", > +" mtrr (3 tests):", > +" Validate the kernel MTRR IOMEM setup.", > +" Validate the MTRR setup across all processors.", > +" Test for AMD MtrrFixDramModEn being cleared by the BIOS.", > +" nx (3 tests):", > +" Test CPU NX capability.", > +" Test all CPUs have same BIOS set NX flag.", > +" Test all CPUs have same msr setting in MSR 0x1a0.", > +#endif > +" olog (1 test):", > +" OLOG scan and analysis checks results.", > +" oops (1 test):", > +" Kernel log oops check.", > +#ifdef FWTS_ARCH_INTEL > +" osilinux (1 test):", > +" Disassemble DSDT to check for _OSI(\"Linux\").", > +" pcc (1 test):", > +" Processor Clocking Control (PCC) test.", > +" pciirq (1 test):", > +" PCI IRQ Routing Table test.", > +" pnp (1 test):", > +" PnP BIOS Support Installation structure test.", > +#endif > +" prd_info (1 test):", > +" OPAL Processor Recovery Diagnostics Info", > +" rsdp (1 test):", > +" RSDP Root System Description Pointer test.", > +" rsdt (1 test):", > +" RSDT Root System Description Table test.", > +" sbst (1 test):", > +" SBST Smart Battery Specificiation Table test.", > +" securebootcert (1 test):", > +" UEFI secure boot test.", > +" show_logs (1 test):", > +" Show Tests Log Files", > +" slic (1 test):", > +" SLIC Software Licensing Description Table test.", > +" slit (1 test):", > +" SLIT System Locality Distance Information test.", > +" spcr (1 test):", > +" SPCR Serial Port Console Redirection Table test.", > +" spmi (1 test):", > +" SPMI Service Processor Management Interface Description Table test.", > +" srat (1 test):", > +" SRAT System Resource Affinity Table test.", > +" stao (1 test):", > +" STAO Status Override Table test.", > +" syntaxcheck (1 test):", > +" Disassemble and reassemble DSDT and SSDTs.", > +" tcpa (1 test):", > +" Validate TCPA table.", > +" tpm2 (1 test):", > +" Validate TPM2 table.", > +" uefi (1 test):", > +" UEFI Data Table test.", > +" uefibootpath (1 test):", > +" Test UEFI Boot Path Boot####.", > +" version (4 tests):", > +" Gather kernel signature.", > +" Gather kernel system information.", > +" Gather kernel boot command line.", > +" Gather ACPI driver version.", > +#ifdef FWTS_ARCH_INTEL > +" virt (1 test):", > +" CPU Virtualisation Configuration test.", > +#endif > +" waet (1 test):", > +" Windows ACPI Emulated Devices Table test.", > +" wakealarm (5 tests):", > +" Test existence of RTC with alarm interface.", > +" Trigger wakealarm for 1 seconds in the future.", > +" Test if wakealarm is fired.", > +" Multiple wakealarm firing tests.", > +" Reset wakealarm time.", > +" wdat (1 test):", > +" WDAT Microsoft Hardware Watchdog Action Table test.", > +#ifdef FWTS_ARCH_INTEL > +" wmi (1 test):", > +" Windows Management Instrumentation test.", > +#endif > +" xenv (1 test):", > +" Validate XENV table.", > +" xsdt (1 test):", > +" XSDT Extended System Description Table test.", > +"", > +#ifdef FWTS_ARCH_INTEL > +"Interactive tests:", > +" ac_adapter (3 tests):", > +" Test ACPI ac_adapter state.", > +" Test ac_adapter initial on-line state.", > +" Test ac_adapter state changes.", > +" battery (1 test):", > +" Battery test.", > +" brightness (3 tests):", > +" Observe all brightness changes.", > +" Observe min, max brightness changes.", > +" Test brightness hotkeys.", > +" hotkey (1 test):",</tt> <tt>> +" Hotkey keypress checks.", > +" lid (3 tests):", > +" Test LID buttons report open correctly.", > +" Test LID buttons on a single open/close.", > +" Test LID buttons on multiple open/close events.", > +" power_button (1 test):", > +" Test press of power button and ACPI event.", > +"", > +"Power States tests:", > +" s3 (1 test):", > +" S3 suspend/resume test.", > +" s3power (1 test):", > +" S3 power loss during suspend test.", > +" s4 (1 test):", > +" S4 hibernate/resume test.", > +"", > +#endif > +"Utilities:", > +" acpidump (1 test):", > +" Dump ACPI tables.", > +#ifdef FWTS_ARCH_INTEL > +" cmosdump (1 test):", > +" Dump CMOS Memory.", > +#endif > +" crsdump (1 test):", > +" Dump ACPI _CRS (Current Resource Settings).", > +#ifdef FWTS_ARCH_INTEL > +" ebdadump (1 test):", > +" Dump EBDA region.", > +#endif > +" esrtdump (1 test):", > +" Dump ESRT Table.", > +" gpedump (1 test):", > +" Dump GPEs.", > +#ifdef FWTS_ARCH_INTEL > +" memmapdump (1 test):", > +" Dump system memory map.", > +" mpdump (1 test):", > +" Dump Multi Processor Data.", > +#endif > +" plddump (1 test):", > +" Dump ACPI _PLD (Physical Device Location).", > +" prsdump (1 test):", > +" Dump ACPI _PRS (Possible Resource Settings).", > +#ifdef FWTS_ARCH_INTEL > +" romdump (1 test):", > +" Dump ROM data.", > +#endif > +" uefidump (1 test):", > +" Dump UEFI Variables.", > +" uefivarinfo (1 test):", > +" UEFI variable info query.", > +"", > +"Unsafe tests:", > +" uefirtauthvar (12 tests):", > +" Create authenticated variable test.", > +" Authenticated variable test with the same authenticated variable.", > +" Authenticated variable test with another valid authenticated" > + " variable.", > +" Append authenticated variable test.", > +" Update authenticated variable test.", > +" Authenticated variable test with old authenticated variable.", > +" Delete authenticated variable test.", > +" Authenticated variable test with invalid modified data.", > +" Authenticated variable test with invalid modified timestamp.", > +" Authenticated variable test with different guid.", > +" Authenticated variable test with invalid attributes.", > +" Set and delete authenticated variable created by different" > + " key test.", > +" uefirtmisc (3 tests):", > +" Test for UEFI miscellaneous runtime service interfaces.", > +" Stress test for UEFI miscellaneous runtime service interfaces.", > +" Test GetNextHighMonotonicCount with invalid NULL parameter.", > +" uefirttime (35 tests):", > +" Test UEFI RT service get time interface.", > +" Test UEFI RT service get time interface, NULL time parameter.", > +" Test UEFI RT service get time interface, NULL time and NULL" > + " capabilties parameters.", > +" Test UEFI RT service set time interface.", > +" Test UEFI RT service set time interface, invalid year 1899.", > +" Test UEFI RT service set time interface, invalid year 10000.", > +" Test UEFI RT service set time interface, invalid month 0.", > +" Test UEFI RT service set time interface, invalid month 13.", > +" Test UEFI RT service set time interface, invalid day 0.", > +" Test UEFI RT service set time interface, invalid day 32.", > +" Test UEFI RT service set time interface, invalid hour 24.", > +" Test UEFI RT service set time interface, invalid minute 60.", > +" Test UEFI RT service set time interface, invalid second 60.", > +" Test UEFI RT service set time interface, invalid nanosecond" > + " 1000000000.", > +" Test UEFI RT service set time interface, invalid timezone -1441.", > +" Test UEFI RT service set time interface, invalid timezone 1441.", > +" Test UEFI RT service get wakeup time interface.", > +" Test UEFI RT service get wakeup time interface, NULL enabled" > + " parameter.", > +" Test UEFI RT service get wakeup time interface, NULL pending" > + " parameter.", > +" Test UEFI RT service get wakeup time interface, NULL time" > + " parameter.", > +" Test UEFI RT service get wakeup time interface, NULL enabled," > + " pending and time parameters.", > +" Test UEFI RT service set wakeup time interface.", > +" Test UEFI RT service set wakeup time interface, NULL time" > + " parameter.", > +" Test UEFI RT service set wakeup time interface, invalid year 1899.", > +" Test UEFI RT service set wakeup time interface, invalid year 10000.", > +" Test UEFI RT service set wakeup time interface, invalid month 0.", > +" Test UEFI RT service set wakeup time interface, invalid month 13.", > +" Test UEFI RT service set wakeup time interface, invalid day 0.", > +" Test UEFI RT service set wakeup time interface, invalid day 32.", > +" Test UEFI RT service set wakeup time interface, invalid hour 24.", > +" Test UEFI RT service set wakeup time interface, invalid minute 60.", > +" Test UEFI RT service set wakeup time interface, invalid second 60.", > +" Test UEFI RT service set wakeup time interface, invalid" > + " nanosecond 1000000000.", > +" Test UEFI RT service set wakeup time interface, invalid" > + " timezone -1441.", > +" Test UEFI RT service set wakeup time interface, invalid" > + " timezone 1441.", > +" uefirtvariable (8 tests):", > +" Test UEFI RT service get variable interface.", > +" Test UEFI RT service get next variable name interface.", > +" Test UEFI RT service set variable interface.", > +" Test UEFI RT service query variable info interface.", > +" Test UEFI RT service variable interface stress test.", > +" Test UEFI RT service set variable interface stress test.", > +" Test UEFI RT service query variable info interface stress test.", > +" Test UEFI RT service get variable interface, invalid parameters.", > +"", > +"UEFI tests:", > +#ifdef FWTS_ARCH_INTEL > +" csm (1 test):", > +" UEFI Compatibility Support Module test.", > +#endif > +" esrt (1 test):", > +" Sanity check UEFI ESRT Table.", > +" securebootcert (1 test):", > +" UEFI secure boot test.", > +" uefibootpath (1 test):", > +" Test UEFI Boot Path Boot####.", > +" uefirtauthvar (12 tests):", > +" Create authenticated variable test.", > +" Authenticated variable test with the same authenticated variable.", > +" Authenticated variable test with another valid authenticated" > + " variable.", > +" Append authenticated variable test.", > +" Update authenticated variable test.", > +" Authenticated variable test with old authenticated variable.", > +" Delete authenticated variable test.", > +" Authenticated variable test with invalid modified data.", > +" Authenticated variable test with invalid modified timestamp.", > +" Authenticated variable test with different guid.", > +" Authenticated variable test with invalid attributes.", > +" Set and delete authenticated variable created by different" > + " key test.", > +" uefirtmisc (3 tests):", > +" Test for UEFI miscellaneous runtime service interfaces.", > +" Stress test for UEFI miscellaneous runtime service interfaces.", > +" Test GetNextHighMonotonicCount with invalid NULL parameter.", > +" uefirttime (35 tests):", > +" Test UEFI RT service get time interface.", > +" Test UEFI RT service get time interface, NULL time parameter.", > +" Test UEFI RT service get time interface, NULL time and NULL" > + " capabilties parameters.", > +" Test UEFI RT service set time interface.", > +" Test UEFI RT service set time interface, invalid year 1899.", > +" Test UEFI RT service set time interface, invalid year 10000.", > +" Test UEFI RT service set time interface, invalid month 0.", > +" Test UEFI RT service set time interface, invalid month 13.", > +" Test UEFI RT service set time interface, invalid day 0.", > +" Test UEFI RT service set time interface, invalid day 32.", > +" Test UEFI RT service set time interface, invalid hour 24.", > +" Test UEFI RT service set time interface, invalid minute 60.", > +" Test UEFI RT service set time interface, invalid second 60.", > +" Test UEFI RT service set time interface, invalid" > + " nanosecond 1000000000.", > +" Test UEFI RT service set time interface, invalid timezone -1441.", > +" Test UEFI RT service set time interface, invalid timezone 1441.", > +" Test UEFI RT service get wakeup time interface.", > +" Test UEFI RT service get wakeup time interface, NULL" > + " enabled parameter.", > +" Test UEFI RT service get wakeup time interface, NULL" > + " pending parameter.", > +" Test UEFI RT service get wakeup time interface, NULL" > + " time parameter.", > +" Test UEFI RT service get wakeup time interface, NULL" > + " enabled, pending and time parameters.", > +" Test UEFI RT service set wakeup time interface.", > +" Test UEFI RT service set wakeup time interface, NULL" > + " time parameter.", > +" Test UEFI RT service set wakeup time interface, invalid year 1899.", > +" Test UEFI RT service set wakeup time interface, invalid year 10000.", > +" Test UEFI RT service set wakeup time interface, invalid month 0.", > +" Test UEFI RT service set wakeup time interface, invalid month 13.", > +" Test UEFI RT service set wakeup time interface, invalid day 0.", > +" Test UEFI RT service set wakeup time interface, invalid day 32.", > +" Test UEFI RT service set wakeup time interface, invalid hour 24.", > +" Test UEFI RT service set wakeup time interface, invalid minute 60.", > +" Test UEFI RT service set wakeup time interface, invalid second 60.", > +" Test UEFI RT service set wakeup time interface, invalid" > + " nanosecond 1000000000.", > +" Test UEFI RT service set wakeup time interface, invalid" > + " timezone -1441.", > +" Test UEFI RT service set wakeup time interface, invalid" > + " timezone 1441.", > +" uefirtvariable (8 tests):", > +" Test UEFI RT service get variable interface.", > +" Test UEFI RT service get next variable name interface.", > +" Test UEFI RT service set variable interface.", > +" Test UEFI RT service query variable info interface.", > +" Test UEFI RT service variable interface stress test.", > +" Test UEFI RT service set variable interface stress test.", > +" Test UEFI RT service query variable info interface stress test.", > +" Test UEFI RT service get variable interface, invalid parameters.", > +"", > +"ACPI Spec Compliance tests:", > +" fadt (6 tests):", > +" ACPI FADT Description Table flag info.", > +" FADT checksum test.", > +" FADT revision test.", > +" ACPI FADT Description Table tests.", > +" Test FADT SCI_EN bit is enabled.", > +" Test FADT reset register.", > +" madt (5 tests):", > +" MADT checksum test.", > +" MADT revision test.", > +" MADT architecture minimum revision test.", > +" MADT flags field reserved bits test.", > +" MADT subtable tests.", > +" rsdp (1 test):", > +" RSDP Root System Description Pointer test.", > +}; > + > +static int show_log_create(fwts_framework *fw, > + char *show_abs_path_name, > + const char *log_name, > + char * log_template[], > + int log_array_size) > +{ > + int i, count; > + FILE *show_log; > + > + char fq_log_name[PATH_MAX+1]; > + > + memset(fq_log_name, 0, sizeof(fq_log_name)); > + > + /* -1 for the slash in the snprintf concatenation */ > + if (strlen(show_abs_path_name) + strlen(log_name) > + >= sizeof(fq_log_name)-1) { > + fwts_failed(fw, LOG_LEVEL_LOW, "show_log_create1", > + "Unable to properly create" > + " the fwts-test logs."); > + return FWTS_ERROR; > + } > + count = snprintf(fq_log_name, sizeof(fq_log_name), "%s/%s", > + show_abs_path_name, log_name); > + > + if ((count < 0) || (count >= (int)sizeof(fq_log_name))) { > + fwts_failed(fw, LOG_LEVEL_LOW, "show_log_create2", > + "Unable to properly create" > + " the fwts-test logs."); > + return FWTS_ERROR; > + } > + > + show_log = fopen(fq_log_name, "w+"); > + > + if (!show_log) { > + fwts_failed(fw, LOG_LEVEL_LOW, "show_log_create3", > + "Unable to properly create" > + " the fwts-test logs."); > + return FWTS_ERROR; > + } > + > + for ( i= 0; i < log_array_size; i++) { > + fprintf(show_log, "%s\n", log_template[i]); > + > + } > + if (fclose(show_log)) { > + fwts_failed(fw, LOG_LEVEL_LOW, "show_log_create4", > + "Unable to properly create" > + " the fwts-test logs."); > + return FWTS_ERROR; > + } > + > + fwts_log_info(fw, > + "Dynamic creation of %s is complete", fq_log_name); > + > + return FWTS_OK; > +} > + > +static int show_logs_test1(fwts_framework *fw) > +{ > + const char show_all_log_name[] = > + "arg-show-tests-0001/arg-show-tests-0001.log"; > + const char show_all_full_log_name[] = > + "arg-show-tests-full-0001/arg-show-tests-full-0001.log"; > + > + int rc = 0; > + char *fwtstestdir = NULL, *fwts_show_log_flags = NULL; > + > + char *fwts_abs_path_name; > + char tmp_abs_path [PATH_MAX+1]; > + > + memset(tmp_abs_path, 0, sizeof(tmp_abs_path)); > + > + /* Use the inherited env var since these logs */ > + /* are only used during make check tests */ > + /* For a fail safe use the FWTS_SRCDIR */ > + /* from config.h during direct invocation */ > + /* of show_logs */ > + > + fwtstestdir = getenv("FWTSTESTDIR"); > + fwts_show_log_flags = getenv("FWTS_SHOW_LOGS"); > + > + if (fwtstestdir != NULL) { > + fwts_abs_path_name = realpath(fwtstestdir, > + tmp_abs_path); > + } else { > + if (FWTS_SRCDIR == NULL) { > + fwts_failed(fw, LOG_LEVEL_LOW, > + "show-logs-fq-log1", > + "Unable to properly create" > + " the fwts-test logs."); > + return FWTS_ERROR; > + } else { > + if (strlen(FWTS_SRCDIR)+11 > + <= sizeof(tmp_abs_path)) { > + if (!(strncpy(tmp_abs_path, > + FWTS_SRCDIR, > + sizeof(tmp_abs_path)) > + == NULL)) { > + fwts_abs_path_name = > + strncat(tmp_abs_path, > + "/fwts-test", 11); > + } else { > + fwts_failed(fw, LOG_LEVEL_LOW, > + "show-logs-fq-log2", > + "Unable to properly create" > + " the fwts-test logs."); > + return FWTS_ERROR; > + } > + } > + } > + } > + > + if (fwts_abs_path_name == NULL) { > + fwts_failed(fw, LOG_LEVEL_LOW, "show-logs-fq-log3", > + "Unable to properly create" > + " the fwts-test logs."); > + return FWTS_ERROR; > + } > + > + if (fwts_show_log_flags == NULL) { > + rc = show_log_create(fw, > + fwts_abs_path_name, > + show_all_full_log_name, > + fwts_show_all, > + FWTS_ARRAY_LEN(fwts_show_all)); > + if (!rc) { > + rc = show_log_create(fw, > + fwts_abs_path_name, > + show_all_log_name, > + fwts_show, > + FWTS_ARRAY_LEN(fwts_show)); > + } > + } else { > + if (!strncmp(fwts_show_log_flags, "BASE", 4)){ > + rc = show_log_create(fw, > + fwts_abs_path_name, > + show_all_log_name, > + fwts_show, > + FWTS_ARRAY_LEN(fwts_show)); > + } else { > + if (!strncmp(fwts_show_log_flags, "FULL", 4)) { > + rc = show_log_create(fw, > + fwts_abs_path_name, > + show_all_full_log_name, > + fwts_show_all, > + FWTS_ARRAY_LEN(fwts_show_all)); > + } > + } > + } > + > + if (!rc) { > + fwts_passed(fw, "Show Tests Log Files" > + " completed successfully."); > + } /* subroutines logged fwts failures */ > + > + return rc; > +} > + > +static fwts_framework_minor_test show_logs_tests[] = { > + { show_logs_test1, "Show Tests Log Files" }, > + { NULL, NULL } > +}; > + > +static fwts_framework_ops show_logs_ops = { > + .description = "Show Tests Log Files", > + .minor_tests = show_logs_tests > +}; > + > +FWTS_REGISTER("show_logs", &show_logs_ops, FWTS_TEST_EARLY, > + FWTS_FLAG_BATCH) > The show* text is auto-generated from the each test at startup time, so this is not really a good solution as we're duplicating this in fwts_show_all[] and fwts_show[] arrays. Plus, maintaining this when we add extra tests will be a maintenance burden. Sorry, NACK. Colin -- fwts-devel mailing list fwts-devel@lists.ubuntu.com Modify settings or unsubscribe at: </tt><tt><a href="https://lists.ubuntu.com/mailman/listinfo/fwts-devel">https://lists.ubuntu.com/mailman/listinfo/fwts-devel</a></tt><tt> </tt> </body></html>