[ubuntu-uk] Reverse engineering data files
gareth.france at cliftonts.co.uk
Thu Nov 27 08:14:32 UTC 2014
I have confirmed the earth and insulation readings are indeed F2 and F3.
So far earth readings make sense but I just don't understand what is
going on with the insulation:
F3 01 48 79 - 99.99
F3 01 90 B7 - 42.79
F3 01 48 D8 - 99.99
F3 01 48 DB - 99.99
F3 01 48 DB - 99.99
F3 01 48 D6 - 99.99
F3 01 97 78 - 60.08
On 26/11/14 12:29, Paul Sladen wrote:
> On Wed, 26 Nov 2014, Gareth France wrote:
>>> f2 80 05 f3 4e 08 f6 80 49 00 08 f8 80 00 (Washing machine)
>>> f2 80 06 f3 4e 08 f6 80 01 00 08 f8 80 00 (Fridge)
>> ID Earth Insulation Load Leakage Continuity Descript
>> D7785 0.05 >99.99 0.05 0.73 (No result) Washing Machine
>> D7786 0.06 >99.99 0.05 0.1 (No result) Fridge
> I recall this thread started with the premise of obtaining extra
> detail ("...several features which are only downloadable in their
> custom format"). I don't think we should be surprised when we do
> find that extra precision is available in the file, beyond
> the rounded/simplified values shown on the display/report output.
> Reviewing the specification for another Seaward PAT tester suggests
> that the Earth Insulation measuring range is going to be in the range:
> Seaward SuperNova Plus - Pat Testing Equipment
> Range 40mΩ - 19.99mΩ <---------------
> Resolution 0.01Ω
> Accuracy +/- 5% of reading, +/- 2 digits upto 5.00Ω
> Therefore we can expect that the sampled value is likely
> somewhere between 40 and 1999 units. And indeed we find:
> 0x4e08 (19976 decimal)
> So it would be reasonable to conclude that the test equipment measures
> and stores a value between 0 and 19999 kOhms, and that the measured
> value is simplified (for display purposes only) to a percentage.
>> Also in there may be visual test pass/fail,
> In the sample provided D7782, D7783 were both failed with broken
> strain reliefs; these two records show '0x02' while the rest show
> '0x01' at the expected position (so this is the visual pass/fail).
>> (25A, 10A, 100ma) but this is probably stored in that large string.
> I don't have domain-specific knowledge about how test-parameter
> strings are configured, but they clearly follow a pattern:
> "K8B7000021 S121111111"
> "K3C7000021 S121111111"
> "I1C7003061 S121111111"
> "H172008021 S121111111"
> "H1C2008021 S121111111"
> "I010000022 S121111111"
> To establish the mapping for (25A, 10A, 100ma) only requires
> performing the three tests (without changing anything else) and
> posting the results! 
>  (I can't do this as I don't have the device...)
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