[Bug 110636] Re: hdparm - cannot set dma on IDE hard drive that works via pata
heret1c
swt at mail2norway.com
Wed Feb 27 12:46:56 UTC 2008
Here's a fresh dmesg. Recalcitrante - did "hdparm -d1" etc work after modifying the kernel? I am not a programmer (some may have guessed...;) so messing around with the kernel is a bit like a layman performing brain surgery. So. Should I wait until there is an official fix, or attempt to learn the black art of kernel building from scratch?
Here's a fresh hdparm -Tt, followed by smartctl --all (for good
measure):
/dev/sda:
Timing cached reads: 522 MB in 2.00 seconds = 260.48 MB/sec
Timing buffered disk reads: 112 MB in 3.13 seconds = 35.76 MB/sec
(A bit sluggish in my book)
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG HM080GC
Serial Number: S15HJD0Q204757
Firmware Version: LP100-10
User Capacity: 80,026,361,856 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0
Local Time is: Wed Feb 27 13:45:07 2008 CET
==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for
details.
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 32) The self-test routine was interrupted
by the host with a hard or soft reset.
Total time to complete Offline
data collection: ( 31) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 31) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0007 252 252 025 Pre-fail Always - 2062
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 5
5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x000e 252 252 051 Old_age Always - 0
8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0
9 Power_On_Hours 0x0032 252 252 000 Old_age Always - 88
10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 4
191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 2510
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 2
194 Temperature_Celsius 0x0022 109 088 000 Old_age Always - 43 (Lifetime Min/Max 18/50)
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 111
196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0
197 Current_Pending_Sector 0x0012 252 252 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0036 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age Always - 0
201 Soft_Read_Error_Rate 0x0032 252 252 000 Old_age Always - 0
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 66
225 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 3906
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1
SMART Selective self-test log data structure revision number 0
Warning: ATA Specification requires selective self-test log data structure revision number = 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Interrupted [00% left] (0-65535)
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
----------------------------
Hope this helps! -)
** Attachment added: "dmesg.zip"
http://launchpadlibrarian.net/12254191/dmesg.zip
--
hdparm - cannot set dma on IDE hard drive that works via pata
https://bugs.launchpad.net/bugs/110636
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