[PATCH 08/16] fwts-test: sync up with _BPC, _BPS, _BPT, NFIT and HMAT tests
Alex Hung
alex.hung at canonical.com
Tue Jan 26 20:30:32 UTC 2021
Signed-off-by: Alex Hung <alex.hung at canonical.com>
---
fwts-test/hmat-0001/acpidump-0002.log | 2 +-
fwts-test/hmat-0001/hmat-0002.log | 4 +-
fwts-test/method-0001/method-0001.log | 759 +++++++++++++-------------
fwts-test/nfit-0001/acpidump-0002.log | 2 +-
fwts-test/nfit-0001/nfit-0002.log | 4 +-
5 files changed, 392 insertions(+), 379 deletions(-)
diff --git a/fwts-test/hmat-0001/acpidump-0002.log b/fwts-test/hmat-0001/acpidump-0002.log
index 5464e818..d220dc5d 100644
--- a/fwts-test/hmat-0001/acpidump-0002.log
+++ b/fwts-test/hmat-0001/acpidump-0002.log
@@ -29,7 +29,7 @@ HMAT @ 0x0000000000000000
0020: 29 06 17 20 00 00 00 00 00 00 01 00 28 00 00 00 ).. ........(...
0030: 0f 00 02 00 00 00 00 00 00 00 00 00 03 00 00 00 ................
0040: 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 ................
- 0050: 01 00 04 00 40 00 00 00 3f 06 05 00 02 00 00 00 .... at ...?.......
+ 0050: 01 00 04 00 40 00 00 00 7f 06 05 00 02 00 00 00 .... at ...?.......
0060: 03 00 00 00 06 00 00 00 00 00 00 00 00 00 00 00 ................
0070: 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 ................
0080: 00 00 00 00 00 00 01 00 02 00 03 00 04 00 05 00 ................
diff --git a/fwts-test/hmat-0001/hmat-0002.log b/fwts-test/hmat-0001/hmat-0002.log
index 567b069c..ddaea180 100644
--- a/fwts-test/hmat-0001/hmat-0002.log
+++ b/fwts-test/hmat-0001/hmat-0002.log
@@ -27,7 +27,7 @@ hmat System Locality Latency and Bandwidth Information (Type 1):
hmat Type: 0x0001
hmat Reserved: 0x0004
hmat Length: 0x00000040
-hmat Flags: 0x3f
+hmat Flags: 0x7f
hmat Data Type: 0x06
hmat Reserved: 0x0005
hmat Number of Initiator PDs: 0x00000002
@@ -37,7 +37,7 @@ hmat Entry Base Unit: 0x0000000000000000
hmat FAILED [MEDIUM] HMATReservedNonZero: Test 1, HMAT Reserved
hmat field must be zero, got 0x0004 instead
hmat FAILED [HIGH] HMATReservedBitsNonZero: Test 1, HMAT Flags
-hmat Bits [7..4] must be zero, got 0x3f instead
+hmat Bits [7..6] must be zero, got 0x7f instead
hmat FAILED [CRITICAL] HMATBadFDataType: Test 1, HMAT Data Type
hmat must be 0..5, got 0x06 instead
hmat FAILED [MEDIUM] HMATReservedNonZero: Test 1, HMAT Reserved
diff --git a/fwts-test/method-0001/method-0001.log b/fwts-test/method-0001/method-0001.log
index 6b876aa9..d4296b6f 100644
--- a/fwts-test/method-0001/method-0001.log
+++ b/fwts-test/method-0001/method-0001.log
@@ -1,41 +1,41 @@
method method: ACPI DSDT Method Semantic tests.
method ----------------------------------------------------------
-method Test 1 of 203: Test Method Names.
+method Test 1 of 206: Test Method Names.
method Found 1061 Objects
method PASSED: Test 1, Method names contain legal characters.
method
-method Test 2 of 203: Test _AEI.
+method Test 2 of 206: Test _AEI.
method SKIPPED: Test 2, Skipping test for non-existent object
method _AEI.
method
-method Test 3 of 203: Test _EVT (Event Method).
+method Test 3 of 206: Test _EVT (Event Method).
method SKIPPED: Test 3, Skipping test for non-existent object
method _EVT.
method
-method Test 4 of 203: Test _DLM (Device Lock Mutex).
+method Test 4 of 206: Test _DLM (Device Lock Mutex).
method SKIPPED: Test 4, Skipping test for non-existent object
method _DLM.
method
-method Test 5 of 203: Test _PIC (Inform AML of Interrupt Model).
+method Test 5 of 206: Test _PIC (Inform AML of Interrupt Model).
method PASSED: Test 5, \_PIC returned no values as expected.
method PASSED: Test 5, \_PIC returned no values as expected.
method PASSED: Test 5, \_PIC returned no values as expected.
method
-method Test 6 of 203: Test _CID (Compatible ID).
+method Test 6 of 206: Test _CID (Compatible ID).
method PASSED: Test 6, \_SB_.PCI0._CID returned an integer
method 0x030ad041 (EISA ID PNP0A03).
method PASSED: Test 6, \_SB_.PCI0.LPCB.HPET._CID returned an
method integer 0x010cd041 (EISA ID PNP0C01).
method
-method Test 7 of 203: Test _CLS (Class Code).
+method Test 7 of 206: Test _CLS (Class Code).
method SKIPPED: Test 7, Skipping test for non-existent object
method _CLS.
method
-method Test 8 of 203: Test _DDN (DOS Device Name).
+method Test 8 of 206: Test _DDN (DOS Device Name).
method SKIPPED: Test 8, Skipping test for non-existent object
method _DDN.
method
-method Test 9 of 203: Test _HID (Hardware ID).
+method Test 9 of 206: Test _HID (Hardware ID).
method PASSED: Test 9, \_SB_.AMW0._HID returned a string
method 'PNP0C14' as expected.
method PASSED: Test 9, \_SB_.LID0._HID returned an integer
@@ -89,31 +89,31 @@ method integer 0x0303d041 (EISA ID PNP0303).
method PASSED: Test 9, \_SB_.PCI0.LPCB.PS2M._HID returned an
method integer 0x130fd041 (EISA ID PNP0F13).
method
-method Test 10 of 203: Test _HRV (Hardware Revision Number).
+method Test 10 of 206: Test _HRV (Hardware Revision Number).
method SKIPPED: Test 10, Skipping test for non-existent object
method _HRV.
method
-method Test 11 of 203: Test _MLS (Multiple Language String).
+method Test 11 of 206: Test _MLS (Multiple Language String).
method SKIPPED: Test 11, Skipping test for non-existent object
method _MLS.
method
-method Test 12 of 203: Test _PLD (Physical Device Location).
+method Test 12 of 206: Test _PLD (Physical Device Location).
method SKIPPED: Test 12, Skipping test for non-existent object
method _PLD.
method
-method Test 13 of 203: Test _SUB (Subsystem ID).
+method Test 13 of 206: Test _SUB (Subsystem ID).
method SKIPPED: Test 13, Skipping test for non-existent object
method _SUB.
method
-method Test 14 of 203: Test _SUN (Slot User Number).
+method Test 14 of 206: Test _SUN (Slot User Number).
method SKIPPED: Test 14, Skipping test for non-existent object
method _SUN.
method
-method Test 15 of 203: Test _STR (String).
+method Test 15 of 206: Test _STR (String).
method SKIPPED: Test 15, Skipping test for non-existent object
method _STR.
method
-method Test 16 of 203: Test _UID (Unique ID).
+method Test 16 of 206: Test _UID (Unique ID).
method PASSED: Test 16, \_SB_.AMW0._UID correctly returned sane
method looking value 0x00000000.
method PASSED: Test 16, \_SB_.PCI0.PDRC._UID correctly returned
@@ -139,11 +139,11 @@ method returned sane looking value 0x00000002.
method PASSED: Test 16, \_SB_.PCI0.LPCB.BAT1._UID correctly
method returned sane looking value 0x00000001.
method
-method Test 17 of 203: Test _CDM (Clock Domain).
+method Test 17 of 206: Test _CDM (Clock Domain).
method SKIPPED: Test 17, Skipping test for non-existent object
method _CDM.
method
-method Test 18 of 203: Test _CRS (Current Resource Settings).
+method Test 18 of 206: Test _CRS (Current Resource Settings).
method PASSED: Test 18, \_SB_.PCI0._CRS (WORD Address Space
method Descriptor) looks sane.
method PASSED: Test 18, \_SB_.PCI0.PDRC._CRS (32-bit Fixed
@@ -187,11 +187,11 @@ method Descriptor) looks sane.
method PASSED: Test 18, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ
method Descriptor) looks sane.
method
-method Test 19 of 203: Test _DSD (Device Specific Data).
+method Test 19 of 206: Test _DSD (Device Specific Data).
method SKIPPED: Test 19, Skipping test for non-existent object
method _DSD.
method
-method Test 20 of 203: Test _DIS (Disable).
+method Test 20 of 206: Test _DIS (Disable).
method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKA._DIS returned no
method values as expected.
method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKB._DIS returned no
@@ -209,28 +209,28 @@ method values as expected.
method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKH._DIS returned no
method values as expected.
method
-method Test 21 of 203: Test _DMA (Direct Memory Access).
+method Test 21 of 206: Test _DMA (Direct Memory Access).
method SKIPPED: Test 21, Skipping test for non-existent object
method _DMA.
method
-method Test 22 of 203: Test _FIX (Fixed Register Resource
+method Test 22 of 206: Test _FIX (Fixed Register Resource
method Provider).
method SKIPPED: Test 22, Skipping test for non-existent object
method _FIX.
method
-method Test 23 of 203: Test _GSB (Global System Interrupt Base).
+method Test 23 of 206: Test _GSB (Global System Interrupt Base).
method SKIPPED: Test 23, Skipping test for non-existent object
method _GSB.
method
-method Test 24 of 203: Test _HPP (Hot Plug Parameters).
+method Test 24 of 206: Test _HPP (Hot Plug Parameters).
method SKIPPED: Test 24, Skipping test for non-existent object
method _HPP.
method
-method Test 25 of 203: Test _MAT (Multiple APIC Table Entry).
+method Test 25 of 206: Test _MAT (Multiple APIC Table Entry).
method SKIPPED: Test 25, Skipping test for non-existent object
method _MAT.
method
-method Test 26 of 203: Test _PRS (Possible Resource Settings).
+method Test 26 of 206: Test _PRS (Possible Resource Settings).
method PASSED: Test 26, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ
method Descriptor) looks sane.
method PASSED: Test 26, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ
@@ -248,7 +248,7 @@ method Descriptor) looks sane.
method PASSED: Test 26, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ
method Descriptor) looks sane.
method
-method Test 27 of 203: Test _PRT (PCI Routing Table).
+method Test 27 of 206: Test _PRT (PCI Routing Table).
method PASSED: Test 27, \_SB_.PCI0._PRT correctly returned a sane
method looking package.
method PASSED: Test 27, \_SB_.PCI0.PEGP._PRT correctly returned a
@@ -268,55 +268,55 @@ method sane looking package.
method PASSED: Test 27, \_SB_.PCI0.PCIB._PRT correctly returned a
method sane looking package.
method
-method Test 28 of 203: Test _PXM (Proximity).
+method Test 28 of 206: Test _PXM (Proximity).
method SKIPPED: Test 28, Skipping test for non-existent object
method _PXM.
method
-method Test 29 of 203: Test _SLI (System Locality Information).
+method Test 29 of 206: Test _SLI (System Locality Information).
method SKIPPED: Test 29, Skipping test for non-existent object
method _SLI.
method
-method Test 30 of 203: Test _CCA (Cache Coherency Attribute).
+method Test 30 of 206: Test _CCA (Cache Coherency Attribute).
method SKIPPED: Test 30, Skipping test for non-existent object
method _CCA.
method
-method Test 31 of 203: Test _EDL (Eject Device List).
+method Test 31 of 206: Test _EDL (Eject Device List).
method SKIPPED: Test 31, Skipping test for non-existent object
method _EDL.
method
-method Test 32 of 203: Test _EJD (Ejection Dependent Device).
+method Test 32 of 206: Test _EJD (Ejection Dependent Device).
method SKIPPED: Test 32, Skipping test for non-existent object
method _EJD.
method
-method Test 33 of 203: Test _EJ0 (Eject).
+method Test 33 of 206: Test _EJ0 (Eject).
method SKIPPED: Test 33, Skipping test for non-existent object
method _EJ0.
method
-method Test 34 of 203: Test _EJ1 (Eject).
+method Test 34 of 206: Test _EJ1 (Eject).
method SKIPPED: Test 34, Skipping test for non-existent object
method _EJ1.
method
-method Test 35 of 203: Test _EJ2 (Eject).
+method Test 35 of 206: Test _EJ2 (Eject).
method SKIPPED: Test 35, Skipping test for non-existent object
method _EJ2.
method
-method Test 36 of 203: Test _EJ3 (Eject).
+method Test 36 of 206: Test _EJ3 (Eject).
method SKIPPED: Test 36, Skipping test for non-existent object
method _EJ3.
method
-method Test 37 of 203: Test _EJ4 (Eject).
+method Test 37 of 206: Test _EJ4 (Eject).
method SKIPPED: Test 37, Skipping test for non-existent object
method _EJ4.
method
-method Test 38 of 203: Test _LCK (Lock).
+method Test 38 of 206: Test _LCK (Lock).
method SKIPPED: Test 38, Skipping test for non-existent object
method _LCK.
method
-method Test 39 of 203: Test _RMV (Remove).
+method Test 39 of 206: Test _RMV (Remove).
method PASSED: Test 39, \_SB_.PCI0.RP03.PXSX._RMV correctly
method returned sane looking value 0x00000001.
method
-method Test 40 of 203: Test _STA (Status).
+method Test 40 of 206: Test _STA (Status).
method PASSED: Test 40, \_SB_.PCI0.PEGP.VGA_._STA correctly
method returned sane looking value 0x0000000f.
method PASSED: Test 40, \_SB_.PCI0.LPCB.LNKA._STA correctly
@@ -340,81 +340,81 @@ method returned sane looking value 0x00000000.
method PASSED: Test 40, \_SB_.PCI0.LPCB.BAT1._STA correctly
method returned sane looking value 0x0000001f.
method
-method Test 41 of 203: Test _DEP (Operational Region
+method Test 41 of 206: Test _DEP (Operational Region
method Dependencies).
method SKIPPED: Test 41, Skipping test for non-existent object
method _DEP.
method
-method Test 42 of 203: Test _FIT (Firmware Interface Table).
+method Test 42 of 206: Test _FIT (Firmware Interface Table).
method SKIPPED: Test 42, Skipping test for non-existent object
method _FIT.
method
-method Test 43 of 203: Test _BDN (BIOS Dock Name).
+method Test 43 of 206: Test _BDN (BIOS Dock Name).
method SKIPPED: Test 43, Skipping test for non-existent object
method _BDN.
method
-method Test 44 of 203: Test _BBN (Base Bus Number).
+method Test 44 of 206: Test _BBN (Base Bus Number).
method SKIPPED: Test 44, Skipping test for non-existent object
method _BBN.
method
-method Test 45 of 203: Test _DCK (Dock).
+method Test 45 of 206: Test _DCK (Dock).
method SKIPPED: Test 45, Skipping test for non-existent object
method _DCK.
method
-method Test 46 of 203: Test _INI (Initialize).
+method Test 46 of 206: Test _INI (Initialize).
method PASSED: Test 46, \_SB_._INI returned no values as
method expected.
method
-method Test 47 of 203: Test _GLK (Global Lock).
+method Test 47 of 206: Test _GLK (Global Lock).
method SKIPPED: Test 47, Skipping test for non-existent object
method _GLK.
method
-method Test 48 of 203: Test _SEG (Segment).
+method Test 48 of 206: Test _SEG (Segment).
method SKIPPED: Test 48, Skipping test for non-existent object
method _SEG.
method
-method Test 49 of 203: Test _LSI (Label Storage Information).
+method Test 49 of 206: Test _LSI (Label Storage Information).
method SKIPPED: Test 49, Skipping test for non-existent object
method _LSI.
method
-method Test 50 of 203: Test _OFF (Set resource off).
+method Test 50 of 206: Test _OFF (Set resource off).
method SKIPPED: Test 50, Skipping test for non-existent object
method _OFF.
method
-method Test 51 of 203: Test _ON_ (Set resource on).
+method Test 51 of 206: Test _ON_ (Set resource on).
method SKIPPED: Test 51, Skipping test for non-existent object
method _ON_.
method
-method Test 52 of 203: Test _DSW (Device Sleep Wake).
+method Test 52 of 206: Test _DSW (Device Sleep Wake).
method SKIPPED: Test 52, Skipping test for non-existent object
method _DSW.
method
-method Test 53 of 203: Test _IRC (In Rush Current).
+method Test 53 of 206: Test _IRC (In Rush Current).
method SKIPPED: Test 53, Skipping test for non-existent object
method _IRC.
method
-method Test 54 of 203: Test _PRE (Power Resources for
+method Test 54 of 206: Test _PRE (Power Resources for
method Enumeration).
method SKIPPED: Test 54, Skipping test for non-existent object
method _PRE.
method
-method Test 55 of 203: Test _PR0 (Power Resources for D0).
+method Test 55 of 206: Test _PR0 (Power Resources for D0).
method SKIPPED: Test 55, Skipping test for non-existent object
method _PR0.
method
-method Test 56 of 203: Test _PR1 (Power Resources for D1).
+method Test 56 of 206: Test _PR1 (Power Resources for D1).
method SKIPPED: Test 56, Skipping test for non-existent object
method _PR1.
method
-method Test 57 of 203: Test _PR2 (Power Resources for D2).
+method Test 57 of 206: Test _PR2 (Power Resources for D2).
method SKIPPED: Test 57, Skipping test for non-existent object
method _PR2.
method
-method Test 58 of 203: Test _PR3 (Power Resources for D3).
+method Test 58 of 206: Test _PR3 (Power Resources for D3).
method SKIPPED: Test 58, Skipping test for non-existent object
method _PR3.
method
-method Test 59 of 203: Test _PRW (Power Resources for Wake).
+method Test 59 of 206: Test _PRW (Power Resources for Wake).
method PASSED: Test 59, \_SB_.PCI0.HDEF._PRW correctly returned a
method sane looking package.
method PASSED: Test 59, \_SB_.PCI0.RP03.PXSX._PRW correctly
@@ -434,34 +434,34 @@ method sane looking package.
method PASSED: Test 59, \_SB_.PCI0.EHC2._PRW correctly returned a
method sane looking package.
method
-method Test 60 of 203: Test _PS0 (Power State 0).
+method Test 60 of 206: Test _PS0 (Power State 0).
method PASSED: Test 60, \_SB_.PCI0.PEGP.VGA_._PS0 returned no
method values as expected.
method PASSED: Test 60, \_PS0 returned no values as expected.
method
-method Test 61 of 203: Test _PS1 (Power State 1).
+method Test 61 of 206: Test _PS1 (Power State 1).
method PASSED: Test 61, \_SB_.PCI0.PEGP.VGA_._PS1 returned no
method values as expected.
method
-method Test 62 of 203: Test _PS2 (Power State 2).
+method Test 62 of 206: Test _PS2 (Power State 2).
method SKIPPED: Test 62, Skipping test for non-existent object
method _PS2.
method
-method Test 63 of 203: Test _PS3 (Power State 3).
+method Test 63 of 206: Test _PS3 (Power State 3).
method PASSED: Test 63, \_SB_.PCI0.PEGP.VGA_._PS3 returned no
method values as expected.
method PASSED: Test 63, \_PS3 returned no values as expected.
method
-method Test 64 of 203: Test _PSC (Power State Current).
+method Test 64 of 206: Test _PSC (Power State Current).
method PASSED: Test 64, \_SB_.PCI0.PEGP.VGA_._PSC correctly
method returned an integer.
method PASSED: Test 64, \_PSC correctly returned an integer.
method
-method Test 65 of 203: Test _PSE (Power State for Enumeration).
+method Test 65 of 206: Test _PSE (Power State for Enumeration).
method SKIPPED: Test 65, Skipping test for non-existent object
method _PSE.
method
-method Test 66 of 203: Test _PSW (Power State Wake).
+method Test 66 of 206: Test _PSW (Power State Wake).
method PASSED: Test 66, \_SB_.PCI0.USB1._PSW returned no values
method as expected.
method PASSED: Test 66, \_SB_.PCI0.USB2._PSW returned no values
@@ -473,15 +473,15 @@ method as expected.
method PASSED: Test 66, \_SB_.PCI0.USB5._PSW returned no values
method as expected.
method
-method Test 67 of 203: Test _S1D (S1 Device State).
+method Test 67 of 206: Test _S1D (S1 Device State).
method SKIPPED: Test 67, Skipping test for non-existent object
method _S1D.
method
-method Test 68 of 203: Test _S2D (S2 Device State).
+method Test 68 of 206: Test _S2D (S2 Device State).
method SKIPPED: Test 68, Skipping test for non-existent object
method _S2D.
method
-method Test 69 of 203: Test _S3D (S3 Device State).
+method Test 69 of 206: Test _S3D (S3 Device State).
method PASSED: Test 69, \_SB_.PCI0._S3D correctly returned an
method integer.
method PASSED: Test 69, \_SB_.PCI0.USB1._S3D correctly returned
@@ -499,7 +499,7 @@ method an integer.
method PASSED: Test 69, \_SB_.PCI0.EHC2._S3D correctly returned
method an integer.
method
-method Test 70 of 203: Test _S4D (S4 Device State).
+method Test 70 of 206: Test _S4D (S4 Device State).
method PASSED: Test 70, \_SB_.PCI0._S4D correctly returned an
method integer.
method PASSED: Test 70, \_SB_.PCI0.USB1._S4D correctly returned
@@ -517,132 +517,132 @@ method an integer.
method PASSED: Test 70, \_SB_.PCI0.EHC2._S4D correctly returned
method an integer.
method
-method Test 71 of 203: Test _S0W (S0 Device Wake State).
+method Test 71 of 206: Test _S0W (S0 Device Wake State).
method SKIPPED: Test 71, Skipping test for non-existent object
method _S0W.
method
-method Test 72 of 203: Test _S1W (S1 Device Wake State).
+method Test 72 of 206: Test _S1W (S1 Device Wake State).
method SKIPPED: Test 72, Skipping test for non-existent object
method _S1W.
method
-method Test 73 of 203: Test _S2W (S2 Device Wake State).
+method Test 73 of 206: Test _S2W (S2 Device Wake State).
method SKIPPED: Test 73, Skipping test for non-existent object
method _S2W.
method
-method Test 74 of 203: Test _S3W (S3 Device Wake State).
+method Test 74 of 206: Test _S3W (S3 Device Wake State).
method SKIPPED: Test 74, Skipping test for non-existent object
method _S3W.
method
-method Test 75 of 203: Test _S4W (S4 Device Wake State).
+method Test 75 of 206: Test _S4W (S4 Device Wake State).
method SKIPPED: Test 75, Skipping test for non-existent object
method _S4W.
method
-method Test 76 of 203: Test _RST (Device Reset).
+method Test 76 of 206: Test _RST (Device Reset).
method SKIPPED: Test 76, Skipping test for non-existent object
method _RST.
method
-method Test 77 of 203: Test _PRR (Power Resource for Reset).
+method Test 77 of 206: Test _PRR (Power Resource for Reset).
method SKIPPED: Test 77, Skipping test for non-existent object
method _PRR.
method
-method Test 78 of 203: Test _S0_ (S0 System State).
+method Test 78 of 206: Test _S0_ (S0 System State).
method \_S0_ PM1a_CNT.SLP_TYP value: 0x00000000
method \_S0_ PM1b_CNT.SLP_TYP value: 0x00000000
method PASSED: Test 78, \_S0_ correctly returned a sane looking
method package.
method
-method Test 79 of 203: Test _S1_ (S1 System State).
+method Test 79 of 206: Test _S1_ (S1 System State).
method SKIPPED: Test 79, Skipping test for non-existent object
method _S1_.
method
-method Test 80 of 203: Test _S2_ (S2 System State).
+method Test 80 of 206: Test _S2_ (S2 System State).
method SKIPPED: Test 80, Skipping test for non-existent object
method _S2_.
method
-method Test 81 of 203: Test _S3_ (S3 System State).
+method Test 81 of 206: Test _S3_ (S3 System State).
method \_S3_ PM1a_CNT.SLP_TYP value: 0x00000005
method \_S3_ PM1b_CNT.SLP_TYP value: 0x00000005
method PASSED: Test 81, \_S3_ correctly returned a sane looking
method package.
method
-method Test 82 of 203: Test _S4_ (S4 System State).
+method Test 82 of 206: Test _S4_ (S4 System State).
method \_S4_ PM1a_CNT.SLP_TYP value: 0x00000006
method \_S4_ PM1b_CNT.SLP_TYP value: 0x00000006
method PASSED: Test 82, \_S4_ correctly returned a sane looking
method package.
method
-method Test 83 of 203: Test _S5_ (S5 System State).
+method Test 83 of 206: Test _S5_ (S5 System State).
method \_S5_ PM1a_CNT.SLP_TYP value: 0x00000007
method \_S5_ PM1b_CNT.SLP_TYP value: 0x00000007
method PASSED: Test 83, \_S5_ correctly returned a sane looking
method package.
method
-method Test 84 of 203: Test _SWS (System Wake Source).
+method Test 84 of 206: Test _SWS (System Wake Source).
method SKIPPED: Test 84, Skipping test for non-existent object
method _SWS.
method
-method Test 85 of 203: Test _PSS (Performance Supported States).
+method Test 85 of 206: Test _PSS (Performance Supported States).
method SKIPPED: Test 85, Skipping test for non-existent object
method _PSS.
method
-method Test 86 of 203: Test _CPC (Continuous Performance
+method Test 86 of 206: Test _CPC (Continuous Performance
method Control).
method SKIPPED: Test 86, Skipping test for non-existent object
method _CPC.
method
-method Test 87 of 203: Test _CSD (C State Dependencies).
+method Test 87 of 206: Test _CSD (C State Dependencies).
method SKIPPED: Test 87, Skipping test for non-existent object
method _CSD.
method
-method Test 88 of 203: Test _CST (C States).
+method Test 88 of 206: Test _CST (C States).
method SKIPPED: Test 88, Skipping test for non-existent object
method _CST.
method
-method Test 89 of 203: Test _PCT (Performance Control).
+method Test 89 of 206: Test _PCT (Performance Control).
method SKIPPED: Test 89, Skipping test for non-existent object
method _PCT.
method
-method Test 90 of 203: Test _PDL (P-State Depth Limit).
+method Test 90 of 206: Test _PDL (P-State Depth Limit).
method SKIPPED: Test 90, Skipping test for non-existent object
method _PDL.
method
-method Test 91 of 203: Test _PPC (Performance Present
+method Test 91 of 206: Test _PPC (Performance Present
method Capabilities).
method SKIPPED: Test 91, Skipping test for non-existent object
method _PPC.
method
-method Test 92 of 203: Test _PPE (Polling for Platform Error).
+method Test 92 of 206: Test _PPE (Polling for Platform Error).
method SKIPPED: Test 92, Skipping test for non-existent object
method _PPE.
method
-method Test 93 of 203: Test _PSD (Power State Dependencies).
+method Test 93 of 206: Test _PSD (Power State Dependencies).
method SKIPPED: Test 93, Skipping test for non-existent object
method _PSD.
method
-method Test 94 of 203: Test _PTC (Processor Throttling Control).
+method Test 94 of 206: Test _PTC (Processor Throttling Control).
method PASSED: Test 94, \_PR_.CPU0._PTC correctly returned a sane
method looking package.
method PASSED: Test 94, \_PR_.CPU1._PTC correctly returned a sane
method looking package.
method
-method Test 95 of 203: Test _TDL (T-State Depth Limit).
+method Test 95 of 206: Test _TDL (T-State Depth Limit).
method SKIPPED: Test 95, Skipping test for non-existent object
method _TDL.
method
-method Test 96 of 203: Test _TPC (Throttling Present
+method Test 96 of 206: Test _TPC (Throttling Present
method Capabilities).
method PASSED: Test 96, \_PR_.CPU0._TPC correctly returned an
method integer.
method PASSED: Test 96, \_PR_.CPU1._TPC correctly returned an
method integer.
method
-method Test 97 of 203: Test _TSD (Throttling State Dependencies).
+method Test 97 of 206: Test _TSD (Throttling State Dependencies).
method PASSED: Test 97, \_PR_.CPU0._TSD correctly returned a sane
method looking package.
method PASSED: Test 97, \_PR_.CPU1._TSD correctly returned a sane
method looking package.
method
-method Test 98 of 203: Test _TSS (Throttling Supported States).
+method Test 98 of 206: Test _TSS (Throttling Supported States).
method \_PR_.CPU0._TSS values:
method T-State CPU Power Latency Control Status
method Freq (mW) (usecs)
@@ -670,54 +670,54 @@ method 7 13% 125 0 09 00
method PASSED: Test 98, \_PR_.CPU1._TSS correctly returned a sane
method looking package.
method
-method Test 99 of 203: Test _LPI (Low Power Idle States).
+method Test 99 of 206: Test _LPI (Low Power Idle States).
method SKIPPED: Test 99, Skipping test for non-existent object
method _LPI.
method
-method Test 100 of 203: Test _RDI (Resource Dependencies for
+method Test 100 of 206: Test _RDI (Resource Dependencies for
method Idle).
method SKIPPED: Test 100, Skipping test for non-existent object
method _RDI.
method
-method Test 101 of 203: Test _PUR (Processor Utilization
+method Test 101 of 206: Test _PUR (Processor Utilization
method Request).
method SKIPPED: Test 101, Skipping test for non-existent object
method _PUR.
method
-method Test 102 of 203: Test _MSG (Message).
+method Test 102 of 206: Test _MSG (Message).
method SKIPPED: Test 102, Skipping test for non-existent object
method _MSG.
method
-method Test 103 of 203: Test _SST (System Status).
+method Test 103 of 206: Test _SST (System Status).
method SKIPPED: Test 103, Skipping test for non-existent object
method _SST.
method
-method Test 104 of 203: Test _ALC (Ambient Light Colour
+method Test 104 of 206: Test _ALC (Ambient Light Colour
method Chromaticity).
method SKIPPED: Test 104, Skipping test for non-existent object
method _ALC.
method
-method Test 105 of 203: Test _ALI (Ambient Light Illuminance).
+method Test 105 of 206: Test _ALI (Ambient Light Illuminance).
method SKIPPED: Test 105, Skipping test for non-existent object
method _ALI.
method
-method Test 106 of 203: Test _ALT (Ambient Light Temperature).
+method Test 106 of 206: Test _ALT (Ambient Light Temperature).
method SKIPPED: Test 106, Skipping test for non-existent object
method _ALT.
method
-method Test 107 of 203: Test _ALP (Ambient Light Polling).
+method Test 107 of 206: Test _ALP (Ambient Light Polling).
method SKIPPED: Test 107, Skipping test for non-existent object
method _ALP.
method
-method Test 108 of 203: Test _ALR (Ambient Light Response).
+method Test 108 of 206: Test _ALR (Ambient Light Response).
method SKIPPED: Test 108, Skipping test for non-existent object
method _ALR.
method
-method Test 109 of 203: Test _LID (Lid Status).
+method Test 109 of 206: Test _LID (Lid Status).
method PASSED: Test 109, \_SB_.LID0._LID correctly returned an
method integer.
method
-method Test 110 of 203: Test _GTF (Get Task File).
+method Test 110 of 206: Test _GTF (Get Task File).
method PASSED: Test 110, \_SB_.PCI0.PATA.PRID.P_D0._GTF correctly
method returned a sane looking buffer.
method PASSED: Test 110, \_SB_.PCI0.PATA.PRID.P_D1._GTF correctly
@@ -729,596 +729,609 @@ method returned a sane looking buffer.
method PASSED: Test 110, \_SB_.PCI0.SATA.PRT2._GTF correctly
method returned a sane looking buffer.
method
-method Test 111 of 203: Test _GTM (Get Timing Mode).
+method Test 111 of 206: Test _GTM (Get Timing Mode).
method PASSED: Test 111, \_SB_.PCI0.PATA.PRID._GTM correctly
method returned a sane looking buffer.
method
-method Test 112 of 203: Test _MBM (Memory Bandwidth Monitoring
+method Test 112 of 206: Test _MBM (Memory Bandwidth Monitoring
method Data).
method SKIPPED: Test 112, Skipping test for non-existent object
method _MBM.
method
-method Test 113 of 203: Test _UPC (USB Port Capabilities).
+method Test 113 of 206: Test _UPC (USB Port Capabilities).
method SKIPPED: Test 113, Skipping test for non-existent object
method _UPC.
method
-method Test 114 of 203: Test _UPD (User Presence Detect).
+method Test 114 of 206: Test _UPD (User Presence Detect).
method SKIPPED: Test 114, Skipping test for non-existent object
method _UPD.
method
-method Test 115 of 203: Test _UPP (User Presence Polling).
+method Test 115 of 206: Test _UPP (User Presence Polling).
method SKIPPED: Test 115, Skipping test for non-existent object
method _UPP.
method
-method Test 116 of 203: Test _GCP (Get Capabilities).
+method Test 116 of 206: Test _GCP (Get Capabilities).
method SKIPPED: Test 116, Skipping test for non-existent object
method _GCP.
method
-method Test 117 of 203: Test _GRT (Get Real Time).
+method Test 117 of 206: Test _GRT (Get Real Time).
method SKIPPED: Test 117, Skipping test for non-existent object
method _GRT.
method
-method Test 118 of 203: Test _GWS (Get Wake Status).
+method Test 118 of 206: Test _GWS (Get Wake Status).
method SKIPPED: Test 118, Skipping test for non-existent object
method _GWS.
method
-method Test 119 of 203: Test _CWS (Clear Wake Status).
+method Test 119 of 206: Test _CWS (Clear Wake Status).
method SKIPPED: Test 119, Skipping test for non-existent object
method _CWS.
method
-method Test 120 of 203: Test _SRT (Set Real Time).
+method Test 120 of 206: Test _SRT (Set Real Time).
method SKIPPED: Test 120, Skipping test for non-existent object
method _SRT.
method
-method Test 121 of 203: Test _STP (Set Expired Timer Wake
+method Test 121 of 206: Test _STP (Set Expired Timer Wake
method Policy).
method SKIPPED: Test 121, Skipping test for non-existent object
method _STP.
method
-method Test 122 of 203: Test _STV (Set Timer Value).
+method Test 122 of 206: Test _STV (Set Timer Value).
method SKIPPED: Test 122, Skipping test for non-existent object
method _STV.
method
-method Test 123 of 203: Test _TIP (Expired Timer Wake Policy).
+method Test 123 of 206: Test _TIP (Expired Timer Wake Policy).
method SKIPPED: Test 123, Skipping test for non-existent object
method _TIP.
method
-method Test 124 of 203: Test _TIV (Timer Values).
+method Test 124 of 206: Test _TIV (Timer Values).
method SKIPPED: Test 124, Skipping test for non-existent object
method _TIV.
method
-method Test 125 of 203: Test _NBS (NVDIMM Boot Status).
+method Test 125 of 206: Test _NBS (NVDIMM Boot Status).
method SKIPPED: Test 125, Skipping test for non-existent object
method _NBS.
method
-method Test 126 of 203: Test _NCH (NVDIMM Current Health
+method Test 126 of 206: Test _NCH (NVDIMM Current Health
method Information).
method SKIPPED: Test 126, Skipping test for non-existent object
method _NCH.
method
-method Test 127 of 203: Test _NIC (NVDIMM Health Error Injection
+method Test 127 of 206: Test _NIC (NVDIMM Health Error Injection
method Capabilities).
method SKIPPED: Test 127, Skipping test for non-existent object
method _NIC.
method
-method Test 128 of 203: Test _NIH (NVDIMM Inject/Clear Health
+method Test 128 of 206: Test _NIH (NVDIMM Inject/Clear Health
method Errors).
method SKIPPED: Test 128, Skipping test for non-existent object
method _NIH.
method
-method Test 129 of 203: Test _NIG (NVDIMM Inject Health Error
+method Test 129 of 206: Test _NIG (NVDIMM Inject Health Error
method Status).
method SKIPPED: Test 129, Skipping test for non-existent object
method _NIG.
method
-method Test 130 of 203: Test _SBS (Smart Battery Subsystem).
+method Test 130 of 206: Test _SBS (Smart Battery Subsystem).
method SKIPPED: Test 130, Skipping test for non-existent object
method _SBS.
method
-method Test 131 of 203: Test _BCT (Battery Charge Time).
+method Test 131 of 206: Test _BCT (Battery Charge Time).
method SKIPPED: Test 131, Skipping test for non-existent object
method _BCT.
method
-method Test 132 of 203: Test _BIF (Battery Information).
+method Test 132 of 206: Test _BIF (Battery Information).
method PASSED: Test 132, \_SB_.PCI0.LPCB.BAT1._BIF correctly
method returned a sane looking package.
method
-method Test 133 of 203: Test _BIX (Battery Information Extended).
+method Test 133 of 206: Test _BIX (Battery Information Extended).
method SKIPPED: Test 133, Skipping test for non-existent object
method _BIX.
method
-method Test 134 of 203: Test _BMA (Battery Measurement
+method Test 134 of 206: Test _BMA (Battery Measurement
method Averaging).
method SKIPPED: Test 134, Skipping test for non-existent object
method _BMA.
method
-method Test 135 of 203: Test _BMC (Battery Maintenance Control).
+method Test 135 of 206: Test _BMC (Battery Maintenance Control).
method SKIPPED: Test 135, Skipping test for non-existent object
method _BMC.
method
-method Test 136 of 203: Test _BMD (Battery Maintenance Data).
+method Test 136 of 206: Test _BMD (Battery Maintenance Data).
method SKIPPED: Test 136, Skipping test for non-existent object
method _BMD.
method
-method Test 137 of 203: Test _BMS (Battery Measurement Sampling
+method Test 137 of 206: Test _BMS (Battery Measurement Sampling
method Time).
method SKIPPED: Test 137, Skipping test for non-existent object
method _BMS.
method
-method Test 138 of 203: Test _BST (Battery Status).
-method PASSED: Test 138, \_SB_.PCI0.LPCB.BAT1._BST correctly
-method returned a sane looking package.
+method Test 138 of 206: Test _BPC (Battery Power
+method Characteristics).
+method SKIPPED: Test 138, Skipping test for non-existent object
+method _BPC.
method
-method Test 139 of 203: Test _BTP (Battery Trip Point).
+method Test 139 of 206: Test _BPS (Battery Power State).
method SKIPPED: Test 139, Skipping test for non-existent object
-method _BTP.
+method _BPS.
method
-method Test 140 of 203: Test _BTH (Battery Throttle Limit).
+method Test 140 of 206: Test _BPT (Battery Power Threshold).
method SKIPPED: Test 140, Skipping test for non-existent object
+method _BPT.
+method
+method Test 141 of 206: Test _BST (Battery Status).
+method PASSED: Test 141, \_SB_.PCI0.LPCB.BAT1._BST correctly
+method returned a sane looking package.
+method
+method Test 142 of 206: Test _BTP (Battery Trip Point).
+method SKIPPED: Test 142, Skipping test for non-existent object
+method _BTP.
+method
+method Test 143 of 206: Test _BTH (Battery Throttle Limit).
+method SKIPPED: Test 143, Skipping test for non-existent object
method _BTH.
method
-method Test 141 of 203: Test _BTM (Battery Time).
-method SKIPPED: Test 141, Skipping test for non-existent object
+method Test 144 of 206: Test _BTM (Battery Time).
+method SKIPPED: Test 144, Skipping test for non-existent object
method _BTM.
method
-method Test 142 of 203: Test _PCL (Power Consumer List).
-method PASSED: Test 142, \_SB_.PCI0.LPCB.ACAD._PCL returned a
+method Test 145 of 206: Test _PCL (Power Consumer List).
+method PASSED: Test 145, \_SB_.PCI0.LPCB.ACAD._PCL returned a
method sane package of 1 references.
-method PASSED: Test 142, \_SB_.PCI0.LPCB.BAT1._PCL returned a
+method PASSED: Test 145, \_SB_.PCI0.LPCB.BAT1._PCL returned a
method sane package of 1 references.
method
-method Test 143 of 203: Test _PIF (Power Source Information).
-method SKIPPED: Test 143, Skipping test for non-existent object
+method Test 146 of 206: Test _PIF (Power Source Information).
+method SKIPPED: Test 146, Skipping test for non-existent object
method _PIF.
method
-method Test 144 of 203: Test _PRL (Power Source Redundancy List).
-method SKIPPED: Test 144, Skipping test for non-existent object
+method Test 147 of 206: Test _PRL (Power Source Redundancy List).
+method SKIPPED: Test 147, Skipping test for non-existent object
method _PRL.
method
-method Test 145 of 203: Test _PSR (Power Source).
-method PASSED: Test 145, \_SB_.PCI0.LPCB.ACAD._PSR correctly
+method Test 148 of 206: Test _PSR (Power Source).
+method PASSED: Test 148, \_SB_.PCI0.LPCB.ACAD._PSR correctly
method returned sane looking value 0x00000000.
method
-method Test 146 of 203: Test _GAI (Get Averaging Level).
-method SKIPPED: Test 146, Skipping test for non-existent object
+method Test 149 of 206: Test _GAI (Get Averaging Level).
+method SKIPPED: Test 149, Skipping test for non-existent object
method _GAI.
method
-method Test 147 of 203: Test _GHL (Get Harware Limit).
-method SKIPPED: Test 147, Skipping test for non-existent object
+method Test 150 of 206: Test _GHL (Get Harware Limit).
+method SKIPPED: Test 150, Skipping test for non-existent object
method _GHL.
method
-method Test 148 of 203: Test _PMC (Power Meter Capabilities).
-method SKIPPED: Test 148, Skipping test for non-existent object
+method Test 151 of 206: Test _PMC (Power Meter Capabilities).
+method SKIPPED: Test 151, Skipping test for non-existent object
method _PMC.
method
-method Test 149 of 203: Test _PMD (Power Meter Devices).
-method SKIPPED: Test 149, Skipping test for non-existent object
+method Test 152 of 206: Test _PMD (Power Meter Devices).
+method SKIPPED: Test 152, Skipping test for non-existent object
method _PMD.
method
-method Test 150 of 203: Test _PMM (Power Meter Measurement).
-method SKIPPED: Test 150, Skipping test for non-existent object
+method Test 153 of 206: Test _PMM (Power Meter Measurement).
+method SKIPPED: Test 153, Skipping test for non-existent object
method _PMM.
method
-method Test 151 of 203: Test _WPC (Wireless Power Calibration).
-method SKIPPED: Test 151, Skipping test for non-existent object
+method Test 154 of 206: Test _WPC (Wireless Power Calibration).
+method SKIPPED: Test 154, Skipping test for non-existent object
method _WPC.
method
-method Test 152 of 203: Test _WPP (Wireless Power Polling).
-method SKIPPED: Test 152, Skipping test for non-existent object
+method Test 155 of 206: Test _WPP (Wireless Power Polling).
+method SKIPPED: Test 155, Skipping test for non-existent object
method _WPP.
method
-method Test 153 of 203: Test _FIF (Fan Information).
-method SKIPPED: Test 153, Skipping test for non-existent object
+method Test 156 of 206: Test _FIF (Fan Information).
+method SKIPPED: Test 156, Skipping test for non-existent object
method _FIF.
method
-method Test 154 of 203: Test _FPS (Fan Performance States).
-method SKIPPED: Test 154, Skipping test for non-existent object
+method Test 157 of 206: Test _FPS (Fan Performance States).
+method SKIPPED: Test 157, Skipping test for non-existent object
method _FPS.
method
-method Test 155 of 203: Test _FSL (Fan Set Level).
-method SKIPPED: Test 155, Skipping test for non-existent object
+method Test 158 of 206: Test _FSL (Fan Set Level).
+method SKIPPED: Test 158, Skipping test for non-existent object
method _FSL.
method
-method Test 156 of 203: Test _FST (Fan Status).
-method SKIPPED: Test 156, Skipping test for non-existent object
+method Test 159 of 206: Test _FST (Fan Status).
+method SKIPPED: Test 159, Skipping test for non-existent object
method _FST.
method
-method Test 157 of 203: Test _ACx (Active Cooling).
-method SKIPPED: Test 157, Skipping test for non-existent object
+method Test 160 of 206: Test _ACx (Active Cooling).
+method SKIPPED: Test 160, Skipping test for non-existent object
method _AC0.
method
-method SKIPPED: Test 157, Skipping test for non-existent object
+method SKIPPED: Test 160, Skipping test for non-existent object
method _AC1.
method
-method SKIPPED: Test 157, Skipping test for non-existent object
+method SKIPPED: Test 160, Skipping test for non-existent object
method _AC2.
method
-method SKIPPED: Test 157, Skipping test for non-existent object
+method SKIPPED: Test 160, Skipping test for non-existent object
method _AC3.
method
-method SKIPPED: Test 157, Skipping test for non-existent object
+method SKIPPED: Test 160, Skipping test for non-existent object
method _AC4.
method
-method SKIPPED: Test 157, Skipping test for non-existent object
+method SKIPPED: Test 160, Skipping test for non-existent object
method _AC5.
method
-method SKIPPED: Test 157, Skipping test for non-existent object
+method SKIPPED: Test 160, Skipping test for non-existent object
method _AC6.
method
-method SKIPPED: Test 157, Skipping test for non-existent object
+method SKIPPED: Test 160, Skipping test for non-existent object
method _AC7.
method
-method SKIPPED: Test 157, Skipping test for non-existent object
+method SKIPPED: Test 160, Skipping test for non-existent object
method _AC8.
method
-method SKIPPED: Test 157, Skipping test for non-existent object
+method SKIPPED: Test 160, Skipping test for non-existent object
method _AC9.
method
method
-method Test 158 of 203: Test _ART (Active Cooling Relationship
+method Test 161 of 206: Test _ART (Active Cooling Relationship
method Table).
-method SKIPPED: Test 158, Skipping test for non-existent object
+method SKIPPED: Test 161, Skipping test for non-existent object
method _ART.
method
-method Test 159 of 203: Test _ALx (Active List).
-method SKIPPED: Test 159, Skipping test for non-existent object
+method Test 162 of 206: Test _ALx (Active List).
+method SKIPPED: Test 162, Skipping test for non-existent object
method _AL0.
method
-method SKIPPED: Test 159, Skipping test for non-existent object
+method SKIPPED: Test 162, Skipping test for non-existent object
method _AL1.
method
-method SKIPPED: Test 159, Skipping test for non-existent object
+method SKIPPED: Test 162, Skipping test for non-existent object
method _AL2.
method
-method SKIPPED: Test 159, Skipping test for non-existent object
+method SKIPPED: Test 162, Skipping test for non-existent object
method _AL3.
method
-method SKIPPED: Test 159, Skipping test for non-existent object
+method SKIPPED: Test 162, Skipping test for non-existent object
method _AL4.
method
-method SKIPPED: Test 159, Skipping test for non-existent object
+method SKIPPED: Test 162, Skipping test for non-existent object
method _AL5.
method
-method SKIPPED: Test 159, Skipping test for non-existent object
+method SKIPPED: Test 162, Skipping test for non-existent object
method _AL6.
method
-method SKIPPED: Test 159, Skipping test for non-existent object
+method SKIPPED: Test 162, Skipping test for non-existent object
method _AL7.
method
-method SKIPPED: Test 159, Skipping test for non-existent object
+method SKIPPED: Test 162, Skipping test for non-existent object
method _AL8.
method
-method SKIPPED: Test 159, Skipping test for non-existent object
+method SKIPPED: Test 162, Skipping test for non-existent object
method _AL9.
method
method
-method Test 160 of 203: Test _CRT (Critical Trip Point).
-method SKIPPED: Test 160, Skipping test for non-existent object
+method Test 163 of 206: Test _CRT (Critical Trip Point).
+method SKIPPED: Test 163, Skipping test for non-existent object
method _CRT.
method
-method Test 161 of 203: Test _CR3 (Warm/Standby Temperature).
-method SKIPPED: Test 161, Skipping test for non-existent object
+method Test 164 of 206: Test _CR3 (Warm/Standby Temperature).
+method SKIPPED: Test 164, Skipping test for non-existent object
method _CR3.
method
-method Test 162 of 203: Test _DTI (Device Temperature
+method Test 165 of 206: Test _DTI (Device Temperature
method Indication).
-method SKIPPED: Test 162, Skipping test for non-existent object
+method SKIPPED: Test 165, Skipping test for non-existent object
method _DTI.
method
-method Test 163 of 203: Test _HOT (Hot Temperature).
-method SKIPPED: Test 163, Skipping test for non-existent object
+method Test 166 of 206: Test _HOT (Hot Temperature).
+method SKIPPED: Test 166, Skipping test for non-existent object
method _HOT.
method
-method Test 164 of 203: Test _MTL (Minimum Throttle Limit).
-method SKIPPED: Test 164, Skipping test for non-existent object
+method Test 167 of 206: Test _MTL (Minimum Throttle Limit).
+method SKIPPED: Test 167, Skipping test for non-existent object
method _MTL.
method
-method Test 165 of 203: Test _NTT (Notification Temp Threshold).
-method SKIPPED: Test 165, Skipping test for non-existent object
+method Test 168 of 206: Test _NTT (Notification Temp Threshold).
+method SKIPPED: Test 168, Skipping test for non-existent object
method _NTT.
method
-method Test 166 of 203: Test _PSL (Passive List).
-method SKIPPED: Test 166, Skipping test for non-existent object
+method Test 169 of 206: Test _PSL (Passive List).
+method SKIPPED: Test 169, Skipping test for non-existent object
method _PSL.
method
-method Test 167 of 203: Test _PSV (Passive Temp).
-method SKIPPED: Test 167, Skipping test for non-existent object
+method Test 170 of 206: Test _PSV (Passive Temp).
+method SKIPPED: Test 170, Skipping test for non-existent object
method _PSV.
method
-method Test 168 of 203: Test _RTV (Relative Temp Values).
-method SKIPPED: Test 168, Skipping test for non-existent object
+method Test 171 of 206: Test _RTV (Relative Temp Values).
+method SKIPPED: Test 171, Skipping test for non-existent object
method _RTV.
method
-method Test 169 of 203: Test _SCP (Set Cooling Policy).
-method SKIPPED: Test 169, Skipping test for non-existent object
+method Test 172 of 206: Test _SCP (Set Cooling Policy).
+method SKIPPED: Test 172, Skipping test for non-existent object
method _DTI.
method
-method Test 170 of 203: Test _TC1 (Thermal Constant 1).
-method SKIPPED: Test 170, Skipping test for non-existent object
+method Test 173 of 206: Test _TC1 (Thermal Constant 1).
+method SKIPPED: Test 173, Skipping test for non-existent object
method _TC1.
method
-method Test 171 of 203: Test _TC2 (Thermal Constant 2).
-method SKIPPED: Test 171, Skipping test for non-existent object
+method Test 174 of 206: Test _TC2 (Thermal Constant 2).
+method SKIPPED: Test 174, Skipping test for non-existent object
method _TC2.
method
-method Test 172 of 203: Test _TFP (Thermal fast Sampling Period).
-method SKIPPED: Test 172, Skipping test for non-existent object
+method Test 175 of 206: Test _TFP (Thermal fast Sampling Period).
+method SKIPPED: Test 175, Skipping test for non-existent object
method _TFP.
method
-method Test 173 of 203: Test _TMP (Thermal Zone Current Temp).
-method SKIPPED: Test 173, Skipping test for non-existent object
+method Test 176 of 206: Test _TMP (Thermal Zone Current Temp).
+method SKIPPED: Test 176, Skipping test for non-existent object
method _TMP.
method
-method Test 174 of 203: Test _TPT (Trip Point Temperature).
-method SKIPPED: Test 174, Skipping test for non-existent object
+method Test 177 of 206: Test _TPT (Trip Point Temperature).
+method SKIPPED: Test 177, Skipping test for non-existent object
method _TPT.
method
-method Test 175 of 203: Test _TRT (Thermal Relationship Table).
-method SKIPPED: Test 175, Skipping test for non-existent object
+method Test 178 of 206: Test _TRT (Thermal Relationship Table).
+method SKIPPED: Test 178, Skipping test for non-existent object
method _TRT.
method
-method Test 176 of 203: Test _TSN (Thermal Sensor Device).
-method SKIPPED: Test 176, Skipping test for non-existent object
+method Test 179 of 206: Test _TSN (Thermal Sensor Device).
+method SKIPPED: Test 179, Skipping test for non-existent object
method _TSN.
method
-method Test 177 of 203: Test _TSP (Thermal Sampling Period).
-method SKIPPED: Test 177, Skipping test for non-existent object
+method Test 180 of 206: Test _TSP (Thermal Sampling Period).
+method SKIPPED: Test 180, Skipping test for non-existent object
method _TSP.
method
-method Test 178 of 203: Test _TST (Temperature Sensor Threshold).
-method SKIPPED: Test 178, Skipping test for non-existent object
+method Test 181 of 206: Test _TST (Temperature Sensor Threshold).
+method SKIPPED: Test 181, Skipping test for non-existent object
method _TST.
method
-method Test 179 of 203: Test _TZD (Thermal Zone Devices).
-method SKIPPED: Test 179, Skipping test for non-existent object
+method Test 182 of 206: Test _TZD (Thermal Zone Devices).
+method SKIPPED: Test 182, Skipping test for non-existent object
method _TZD.
method
-method Test 180 of 203: Test _TZM (Thermal Zone member).
-method SKIPPED: Test 180, Skipping test for non-existent object
+method Test 183 of 206: Test _TZM (Thermal Zone member).
+method SKIPPED: Test 183, Skipping test for non-existent object
method _TZM.
method
-method Test 181 of 203: Test _TZP (Thermal Zone Polling).
-method SKIPPED: Test 181, Skipping test for non-existent object
+method Test 184 of 206: Test _TZP (Thermal Zone Polling).
+method SKIPPED: Test 184, Skipping test for non-existent object
method _TZP.
method
-method Test 182 of 203: Test _GPE (General Purpose Events).
-method PASSED: Test 182, \_SB_.PCI0.LPCB.EC0_._GPE returned an
+method Test 185 of 206: Test _GPE (General Purpose Events).
+method PASSED: Test 185, \_SB_.PCI0.LPCB.EC0_._GPE returned an
method integer 0x0000001c
method
-method Test 183 of 203: Test _EC_ (EC Offset Query).
-method SKIPPED: Test 183, Skipping test for non-existent object
+method Test 186 of 206: Test _EC_ (EC Offset Query).
+method SKIPPED: Test 186, Skipping test for non-existent object
method _EC_.
method
-method Test 184 of 203: Test _PTS (Prepare to Sleep).
+method Test 187 of 206: Test _PTS (Prepare to Sleep).
method Test _PTS(3).
-method PASSED: Test 184, \_PTS returned no values as expected.
+method PASSED: Test 187, \_PTS returned no values as expected.
method
method Test _PTS(4).
-method PASSED: Test 184, \_PTS returned no values as expected.
+method PASSED: Test 187, \_PTS returned no values as expected.
method
method Test _PTS(5).
-method PASSED: Test 184, \_PTS returned no values as expected.
+method PASSED: Test 187, \_PTS returned no values as expected.
method
method
-method Test 185 of 203: Test _TTS (Transition to State).
-method SKIPPED: Test 185, Optional control method _TTS does not
+method Test 188 of 206: Test _TTS (Transition to State).
+method SKIPPED: Test 188, Optional control method _TTS does not
method exist.
method
-method Test 186 of 203: Test _WAK (System Wake).
+method Test 189 of 206: Test _WAK (System Wake).
method Test _WAK(3) System Wake, State S3.
-method PASSED: Test 186, \_WAK correctly returned a sane looking
+method PASSED: Test 189, \_WAK correctly returned a sane looking
method package.
method
method Test _WAK(4) System Wake, State S4.
-method PASSED: Test 186, \_WAK correctly returned a sane looking
+method PASSED: Test 189, \_WAK correctly returned a sane looking
method package.
method
method Test _WAK(5) System Wake, State S5.
-method PASSED: Test 186, \_WAK correctly returned a sane looking
+method PASSED: Test 189, \_WAK correctly returned a sane looking
method package.
method
method
-method Test 187 of 203: Test _ADR (Return Unique ID for Device).
-method PASSED: Test 187, \_SB_.PCI0.MCHC._ADR correctly returned
+method Test 190 of 206: Test _ADR (Return Unique ID for Device).
+method PASSED: Test 190, \_SB_.PCI0.MCHC._ADR correctly returned
method an integer.
-method PASSED: Test 187, \_SB_.PCI0.PEGP._ADR correctly returned
+method PASSED: Test 190, \_SB_.PCI0.PEGP._ADR correctly returned
method an integer.
-method PASSED: Test 187, \_SB_.PCI0.PEGP.VGA_._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.GFX0._ADR correctly returned
+method PASSED: Test 190, \_SB_.PCI0.GFX0._ADR correctly returned
method an integer.
-method PASSED: Test 187, \_SB_.PCI0.GFX0.DD01._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.GFX0.DD01._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.GFX0.DD02._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.GFX0.DD02._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.GFX0.DD03._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.GFX0.DD03._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.GFX0.DD04._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.GFX0.DD04._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.GFX0.DD05._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.GFX0.DD05._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.HDEF._ADR correctly returned
+method PASSED: Test 190, \_SB_.PCI0.HDEF._ADR correctly returned
method an integer.
-method PASSED: Test 187, \_SB_.PCI0.RP01._ADR correctly returned
+method PASSED: Test 190, \_SB_.PCI0.RP01._ADR correctly returned
method an integer.
-method PASSED: Test 187, \_SB_.PCI0.RP01.PXSX._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.RP01.PXSX._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.RP02._ADR correctly returned
+method PASSED: Test 190, \_SB_.PCI0.RP02._ADR correctly returned
method an integer.
-method PASSED: Test 187, \_SB_.PCI0.RP02.PXSX._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.RP02.PXSX._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.RP03._ADR correctly returned
+method PASSED: Test 190, \_SB_.PCI0.RP03._ADR correctly returned
method an integer.
-method PASSED: Test 187, \_SB_.PCI0.RP03.PXSX._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.RP03.PXSX._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.RP04._ADR correctly returned
+method PASSED: Test 190, \_SB_.PCI0.RP04._ADR correctly returned
method an integer.
-method PASSED: Test 187, \_SB_.PCI0.RP04.PXSX._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.RP04.PXSX._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.RP05._ADR correctly returned
+method PASSED: Test 190, \_SB_.PCI0.RP05._ADR correctly returned
method an integer.
-method PASSED: Test 187, \_SB_.PCI0.RP05.PXSX._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.RP05.PXSX._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.RP06._ADR correctly returned
+method PASSED: Test 190, \_SB_.PCI0.RP06._ADR correctly returned
method an integer.
-method PASSED: Test 187, \_SB_.PCI0.RP06.PXSX._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.RP06.PXSX._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.USB1._ADR correctly returned
+method PASSED: Test 190, \_SB_.PCI0.USB1._ADR correctly returned
method an integer.
-method PASSED: Test 187, \_SB_.PCI0.USB2._ADR correctly returned
+method PASSED: Test 190, \_SB_.PCI0.USB2._ADR correctly returned
method an integer.
-method PASSED: Test 187, \_SB_.PCI0.USB3._ADR correctly returned
+method PASSED: Test 190, \_SB_.PCI0.USB3._ADR correctly returned
method an integer.
-method PASSED: Test 187, \_SB_.PCI0.USB4._ADR correctly returned
+method PASSED: Test 190, \_SB_.PCI0.USB4._ADR correctly returned
method an integer.
-method PASSED: Test 187, \_SB_.PCI0.USB5._ADR correctly returned
+method PASSED: Test 190, \_SB_.PCI0.USB5._ADR correctly returned
method an integer.
-method PASSED: Test 187, \_SB_.PCI0.EHC1._ADR correctly returned
+method PASSED: Test 190, \_SB_.PCI0.EHC1._ADR correctly returned
method an integer.
-method PASSED: Test 187, \_SB_.PCI0.EHC1.HUB7._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.EHC1.HUB7._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.EHC2._ADR correctly returned
+method PASSED: Test 190, \_SB_.PCI0.EHC2._ADR correctly returned
method an integer.
-method PASSED: Test 187, \_SB_.PCI0.EHC2.HUB7._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.EHC2.HUB7._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.PCIB._ADR correctly returned
+method PASSED: Test 190, \_SB_.PCI0.PCIB._ADR correctly returned
method an integer.
-method PASSED: Test 187, \_SB_.PCI0.LPCB._ADR correctly returned
+method PASSED: Test 190, \_SB_.PCI0.LPCB._ADR correctly returned
method an integer.
-method PASSED: Test 187, \_SB_.PCI0.PATA._ADR correctly returned
+method PASSED: Test 190, \_SB_.PCI0.PATA._ADR correctly returned
method an integer.
-method PASSED: Test 187, \_SB_.PCI0.PATA.PRID._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.PATA.PRID._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.SATA._ADR correctly returned
+method PASSED: Test 190, \_SB_.PCI0.SATA._ADR correctly returned
method an integer.
-method PASSED: Test 187, \_SB_.PCI0.SATA.PRT0._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.SATA.PRT0._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.SATA.PRT1._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.SATA.PRT1._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.SATA.PRT2._ADR correctly
+method PASSED: Test 190, \_SB_.PCI0.SATA.PRT2._ADR correctly
method returned an integer.
-method PASSED: Test 187, \_SB_.PCI0.SBUS._ADR correctly returned
+method PASSED: Test 190, \_SB_.PCI0.SBUS._ADR correctly returned
method an integer.
method
-method Test 188 of 203: Test _BCL (Query List of Brightness
+method Test 191 of 206: Test _BCL (Query List of Brightness
method Control Levels Supported).
method Brightness levels for \_SB_.PCI0.PEGP.VGA_.LCD_._BCL:
method Level on full power : 70
method Level on battery power: 40
method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70
-method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned
+method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned
method a sane package of 10 integers.
method Brightness levels for \_SB_.PCI0.GFX0.DD03._BCL:
method Level on full power : 70
method Level on battery power: 40
method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70
-method PASSED: Test 188, \_SB_.PCI0.GFX0.DD03._BCL returned a
+method PASSED: Test 191, \_SB_.PCI0.GFX0.DD03._BCL returned a
method sane package of 10 integers.
method
-method Test 189 of 203: Test _BCM (Set Brightness Level).
-method PASSED: Test 189, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned
+method Test 192 of 206: Test _BCM (Set Brightness Level).
+method PASSED: Test 192, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned
method no values as expected.
-method PASSED: Test 189, \_SB_.PCI0.GFX0.DD03._BCM returned no
+method PASSED: Test 192, \_SB_.PCI0.GFX0.DD03._BCM returned no
method values as expected.
method
-method Test 190 of 203: Test _BQC (Brightness Query Current
+method Test 193 of 206: Test _BQC (Brightness Query Current
method Level).
-method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly
+method PASSED: Test 193, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly
method returned an integer.
-method PASSED: Test 190, \_SB_.PCI0.GFX0.DD03._BQC correctly
+method PASSED: Test 193, \_SB_.PCI0.GFX0.DD03._BQC correctly
method returned an integer.
method
-method Test 191 of 203: Test _DCS (Return the Status of Output
+method Test 194 of 206: Test _DCS (Return the Status of Output
method Device).
-method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly
+method PASSED: Test 194, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly
method returned an integer.
-method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly
+method PASSED: Test 194, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly
method returned an integer.
-method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly
+method PASSED: Test 194, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly
method returned an integer.
-method PASSED: Test 191, \_SB_.PCI0.GFX0.DD01._DCS correctly
+method PASSED: Test 194, \_SB_.PCI0.GFX0.DD01._DCS correctly
method returned an integer.
-method PASSED: Test 191, \_SB_.PCI0.GFX0.DD02._DCS correctly
+method PASSED: Test 194, \_SB_.PCI0.GFX0.DD02._DCS correctly
method returned an integer.
-method PASSED: Test 191, \_SB_.PCI0.GFX0.DD03._DCS correctly
+method PASSED: Test 194, \_SB_.PCI0.GFX0.DD03._DCS correctly
method returned an integer.
-method PASSED: Test 191, \_SB_.PCI0.GFX0.DD04._DCS correctly
+method PASSED: Test 194, \_SB_.PCI0.GFX0.DD04._DCS correctly
method returned an integer.
-method PASSED: Test 191, \_SB_.PCI0.GFX0.DD05._DCS correctly
+method PASSED: Test 194, \_SB_.PCI0.GFX0.DD05._DCS correctly
method returned an integer.
method
-method Test 192 of 203: Test _DDC (Return the EDID for this
+method Test 195 of 206: Test _DDC (Return the EDID for this
method Device).
-method SKIPPED: Test 192, Skipping test for non-existent object
+method SKIPPED: Test 195, Skipping test for non-existent object
method _DDC.
method
-method Test 193 of 203: Test _DSS (Device Set State).
-method PASSED: Test 193, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned
+method Test 196 of 206: Test _DSS (Device Set State).
+method PASSED: Test 196, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned
method no values as expected.
-method PASSED: Test 193, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned
+method PASSED: Test 196, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned
method no values as expected.
-method PASSED: Test 193, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned
+method PASSED: Test 196, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned
method no values as expected.
-method PASSED: Test 193, \_SB_.PCI0.GFX0.DD01._DSS returned no
+method PASSED: Test 196, \_SB_.PCI0.GFX0.DD01._DSS returned no
method values as expected.
-method PASSED: Test 193, \_SB_.PCI0.GFX0.DD02._DSS returned no
+method PASSED: Test 196, \_SB_.PCI0.GFX0.DD02._DSS returned no
method values as expected.
-method PASSED: Test 193, \_SB_.PCI0.GFX0.DD03._DSS returned no
+method PASSED: Test 196, \_SB_.PCI0.GFX0.DD03._DSS returned no
method values as expected.
-method PASSED: Test 193, \_SB_.PCI0.GFX0.DD04._DSS returned no
+method PASSED: Test 196, \_SB_.PCI0.GFX0.DD04._DSS returned no
method values as expected.
-method PASSED: Test 193, \_SB_.PCI0.GFX0.DD05._DSS returned no
+method PASSED: Test 196, \_SB_.PCI0.GFX0.DD05._DSS returned no
method values as expected.
method
-method Test 194 of 203: Test _DGS (Query Graphics State).
-method PASSED: Test 194, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly
+method Test 197 of 206: Test _DGS (Query Graphics State).
+method PASSED: Test 197, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly
method returned an integer.
-method PASSED: Test 194, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly
+method PASSED: Test 197, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly
method returned an integer.
-method PASSED: Test 194, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly
+method PASSED: Test 197, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly
method returned an integer.
-method PASSED: Test 194, \_SB_.PCI0.GFX0.DD01._DGS correctly
+method PASSED: Test 197, \_SB_.PCI0.GFX0.DD01._DGS correctly
method returned an integer.
-method PASSED: Test 194, \_SB_.PCI0.GFX0.DD02._DGS correctly
+method PASSED: Test 197, \_SB_.PCI0.GFX0.DD02._DGS correctly
method returned an integer.
-method PASSED: Test 194, \_SB_.PCI0.GFX0.DD03._DGS correctly
+method PASSED: Test 197, \_SB_.PCI0.GFX0.DD03._DGS correctly
method returned an integer.
-method PASSED: Test 194, \_SB_.PCI0.GFX0.DD04._DGS correctly
+method PASSED: Test 197, \_SB_.PCI0.GFX0.DD04._DGS correctly
method returned an integer.
-method PASSED: Test 194, \_SB_.PCI0.GFX0.DD05._DGS correctly
+method PASSED: Test 197, \_SB_.PCI0.GFX0.DD05._DGS correctly
method returned an integer.
method
-method Test 195 of 203: Test _DOD (Enumerate All Devices Attached
+method Test 198 of 206: Test _DOD (Enumerate All Devices Attached
method to Display Adapter).
method Device 0:
method Instance: 0
@@ -1341,7 +1354,7 @@ method Type of display: 2 (TV/HDTV or other Analog-Video Moni
method BIOS can detect device: 0
method Non-VGA device: 0
method Head or pipe ID: 0
-method PASSED: Test 195, \_SB_.PCI0.PEGP.VGA_._DOD correctly
+method PASSED: Test 198, \_SB_.PCI0.PEGP.VGA_._DOD correctly
method returned a sane looking package.
method Device 0:
method Instance: 0
@@ -1378,45 +1391,45 @@ method Type of display: 0 (Other)
method BIOS can detect device: 1
method Non-VGA device: 0
method Head or pipe ID: 0
-method PASSED: Test 195, \_SB_.PCI0.GFX0._DOD correctly returned
+method PASSED: Test 198, \_SB_.PCI0.GFX0._DOD correctly returned
method a sane looking package.
method
-method Test 196 of 203: Test _DOS (Enable/Disable Output
+method Test 199 of 206: Test _DOS (Enable/Disable Output
method Switching).
-method PASSED: Test 196, \_SB_.PCI0.PEGP.VGA_._DOS returned no
+method PASSED: Test 199, \_SB_.PCI0.PEGP.VGA_._DOS returned no
method values as expected.
-method PASSED: Test 196, \_SB_.PCI0.GFX0._DOS returned no values
+method PASSED: Test 199, \_SB_.PCI0.GFX0._DOS returned no values
method as expected.
method
-method Test 197 of 203: Test _GPD (Get POST Device).
-method SKIPPED: Test 197, Skipping test for non-existent object
+method Test 200 of 206: Test _GPD (Get POST Device).
+method SKIPPED: Test 200, Skipping test for non-existent object
method _GPD.
method
-method Test 198 of 203: Test _ROM (Get ROM Data).
-method SKIPPED: Test 198, Skipping test for non-existent object
+method Test 201 of 206: Test _ROM (Get ROM Data).
+method SKIPPED: Test 201, Skipping test for non-existent object
method _ROM.
method
-method Test 199 of 203: Test _SPD (Set POST Device).
-method SKIPPED: Test 199, Skipping test for non-existent object
+method Test 202 of 206: Test _SPD (Set POST Device).
+method SKIPPED: Test 202, Skipping test for non-existent object
method _SPD.
method
-method Test 200 of 203: Test _VPO (Video POST Options).
-method SKIPPED: Test 200, Skipping test for non-existent object
+method Test 203 of 206: Test _VPO (Video POST Options).
+method SKIPPED: Test 203, Skipping test for non-existent object
method _VPO.
method
-method Test 201 of 203: Test _CBA (Configuration Base Address).
-method SKIPPED: Test 201, Skipping test for non-existent object
+method Test 204 of 206: Test _CBA (Configuration Base Address).
+method SKIPPED: Test 204, Skipping test for non-existent object
method _CBA.
method
-method Test 202 of 203: Test _IFT (IPMI Interface Type).
-method SKIPPED: Test 202, Skipping test for non-existent object
+method Test 205 of 206: Test _IFT (IPMI Interface Type).
+method SKIPPED: Test 205, Skipping test for non-existent object
method _IFT.
method
-method Test 203 of 203: Test _SRV (IPMI Interface Revision).
-method SKIPPED: Test 203, Skipping test for non-existent object
+method Test 206 of 206: Test _SRV (IPMI Interface Revision).
+method SKIPPED: Test 206, Skipping test for non-existent object
method _SRV.
method
method ==========================================================
-method 260 passed, 0 failed, 0 warning, 0 aborted, 174 skipped, 0
+method 260 passed, 0 failed, 0 warning, 0 aborted, 177 skipped, 0
method info only.
method ==========================================================
diff --git a/fwts-test/nfit-0001/acpidump-0002.log b/fwts-test/nfit-0001/acpidump-0002.log
index 3bfce2ce..8c656f69 100644
--- a/fwts-test/nfit-0001/acpidump-0002.log
+++ b/fwts-test/nfit-0001/acpidump-0002.log
@@ -26,7 +26,7 @@ FACP @ 0x00000000
NFIT @ 0x00000000
0000: 4e 46 49 54 70 01 00 00 01 33 49 4e 54 45 4c 20 NFITp....3INTEL
0010: 54 65 6d 70 6c 61 74 65 01 00 00 00 49 4e 54 4c Template....INTL
- 0020: 27 05 16 20 00 00 00 05 00 00 38 00 00 00 05 00 '.. ......8.....
+ 0020: 27 05 16 20 00 00 00 05 00 00 38 00 00 00 09 00 '.. ......8.....
0030: 0F 00 00 00 00 00 00 00 30 05 af 91 86 5d 0e 47 ........0....].G
0040: a6 b0 0a 2d b9 40 82 49 00 00 00 7c 03 00 00 00 ...-. at .I...|....
0050: 00 00 00 0c 00 00 00 00 FF 00 00 00 00 00 00 00 ................
diff --git a/fwts-test/nfit-0001/nfit-0002.log b/fwts-test/nfit-0001/nfit-0002.log
index 15d75144..287d8993 100644
--- a/fwts-test/nfit-0001/nfit-0002.log
+++ b/fwts-test/nfit-0001/nfit-0002.log
@@ -10,7 +10,7 @@ nfit NFIT Subtable:
nfit Type: 0x0000
nfit Length: 0x0038
nfit SPA Range Structure Index: 0x0000
-nfit Flags: 0x0005
+nfit Flags: 0x0009
nfit Reserved: 0x0000000f
nfit Proximity Domain: 0x00000000
nfit Address Range Type GUID: 91AF0530-5D86-470E-A6B0-0A2DB9408249
@@ -20,7 +20,7 @@ nfit Address Range Memory Mapping Attribute: 0x00000000000000ff
nfit FAILED [HIGH] NFITBadRangeIndexZero: Test 1, NFIT SPA
nfit Range Structure Index must not be zero
nfit FAILED [HIGH] NFITReservedBitsNonZero: Test 1, NFIT Flags
-nfit Bits [15..2] must be zero, got 0x0005 instead
+nfit Bits [15..3] must be zero, got 0x0009 instead
nfit FAILED [HIGH] NFITBadMemoryMappingAttribute: Test 1, NFIT
nfit Memory Mapping Attribute must meet UEFI Spec, got
nfit 0x00000000000000ff instead
--
2.25.1
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