ACK: [PATCH 2/2] fwts-test: sync up with _ALx control method
ivanhu
ivan.hu at canonical.com
Fri May 8 07:49:58 UTC 2020
On 5/5/20 8:19 AM, Alex Hung wrote:
> Signed-off-by: Alex Hung <alex.hung at canonical.com>
> ---
> fwts-test/method-0001/method-0001.log | 688 ++++++++++++++------------
> 1 file changed, 360 insertions(+), 328 deletions(-)
>
> diff --git a/fwts-test/method-0001/method-0001.log b/fwts-test/method-0001/method-0001.log
> index 5d8b4f0a..5374f863 100644
> --- a/fwts-test/method-0001/method-0001.log
> +++ b/fwts-test/method-0001/method-0001.log
> @@ -1,41 +1,41 @@
> method method: ACPI DSDT Method Semantic tests.
> method ----------------------------------------------------------
> -method Test 1 of 200: Test Method Names.
> +method Test 1 of 201: Test Method Names.
> method Found 1061 Objects
> method PASSED: Test 1, Method names contain legal characters.
> method
> -method Test 2 of 200: Test _AEI.
> +method Test 2 of 201: Test _AEI.
> method SKIPPED: Test 2, Skipping test for non-existent object
> method _AEI.
> method
> -method Test 3 of 200: Test _EVT (Event Method).
> +method Test 3 of 201: Test _EVT (Event Method).
> method SKIPPED: Test 3, Skipping test for non-existent object
> method _EVT.
> method
> -method Test 4 of 200: Test _DLM (Device Lock Mutex).
> +method Test 4 of 201: Test _DLM (Device Lock Mutex).
> method SKIPPED: Test 4, Skipping test for non-existent object
> method _DLM.
> method
> -method Test 5 of 200: Test _PIC (Inform AML of Interrupt Model).
> +method Test 5 of 201: Test _PIC (Inform AML of Interrupt Model).
> method PASSED: Test 5, \_PIC returned no values as expected.
> method PASSED: Test 5, \_PIC returned no values as expected.
> method PASSED: Test 5, \_PIC returned no values as expected.
> method
> -method Test 6 of 200: Test _CID (Compatible ID).
> +method Test 6 of 201: Test _CID (Compatible ID).
> method PASSED: Test 6, \_SB_.PCI0._CID returned an integer
> method 0x030ad041 (EISA ID PNP0A03).
> method PASSED: Test 6, \_SB_.PCI0.LPCB.HPET._CID returned an
> method integer 0x010cd041 (EISA ID PNP0C01).
> method
> -method Test 7 of 200: Test _CLS (Class Code).
> +method Test 7 of 201: Test _CLS (Class Code).
> method SKIPPED: Test 7, Skipping test for non-existent object
> method _CLS.
> method
> -method Test 8 of 200: Test _DDN (DOS Device Name).
> +method Test 8 of 201: Test _DDN (DOS Device Name).
> method SKIPPED: Test 8, Skipping test for non-existent object
> method _DDN.
> method
> -method Test 9 of 200: Test _HID (Hardware ID).
> +method Test 9 of 201: Test _HID (Hardware ID).
> method PASSED: Test 9, \_SB_.AMW0._HID returned a string
> method 'PNP0C14' as expected.
> method PASSED: Test 9, \_SB_.LID0._HID returned an integer
> @@ -89,31 +89,31 @@ method integer 0x0303d041 (EISA ID PNP0303).
> method PASSED: Test 9, \_SB_.PCI0.LPCB.PS2M._HID returned an
> method integer 0x130fd041 (EISA ID PNP0F13).
> method
> -method Test 10 of 200: Test _HRV (Hardware Revision Number).
> +method Test 10 of 201: Test _HRV (Hardware Revision Number).
> method SKIPPED: Test 10, Skipping test for non-existent object
> method _HRV.
> method
> -method Test 11 of 200: Test _MLS (Multiple Language String).
> +method Test 11 of 201: Test _MLS (Multiple Language String).
> method SKIPPED: Test 11, Skipping test for non-existent object
> method _MLS.
> method
> -method Test 12 of 200: Test _PLD (Physical Device Location).
> +method Test 12 of 201: Test _PLD (Physical Device Location).
> method SKIPPED: Test 12, Skipping test for non-existent object
> method _PLD.
> method
> -method Test 13 of 200: Test _SUB (Subsystem ID).
> +method Test 13 of 201: Test _SUB (Subsystem ID).
> method SKIPPED: Test 13, Skipping test for non-existent object
> method _SUB.
> method
> -method Test 14 of 200: Test _SUN (Slot User Number).
> +method Test 14 of 201: Test _SUN (Slot User Number).
> method SKIPPED: Test 14, Skipping test for non-existent object
> method _SUN.
> method
> -method Test 15 of 200: Test _STR (String).
> +method Test 15 of 201: Test _STR (String).
> method SKIPPED: Test 15, Skipping test for non-existent object
> method _STR.
> method
> -method Test 16 of 200: Test _UID (Unique ID).
> +method Test 16 of 201: Test _UID (Unique ID).
> method PASSED: Test 16, \_SB_.AMW0._UID correctly returned sane
> method looking value 0x00000000.
> method PASSED: Test 16, \_SB_.PCI0.PDRC._UID correctly returned
> @@ -139,11 +139,11 @@ method returned sane looking value 0x00000002.
> method PASSED: Test 16, \_SB_.PCI0.LPCB.BAT1._UID correctly
> method returned sane looking value 0x00000001.
> method
> -method Test 17 of 200: Test _CDM (Clock Domain).
> +method Test 17 of 201: Test _CDM (Clock Domain).
> method SKIPPED: Test 17, Skipping test for non-existent object
> method _CDM.
> method
> -method Test 18 of 200: Test _CRS (Current Resource Settings).
> +method Test 18 of 201: Test _CRS (Current Resource Settings).
> method PASSED: Test 18, \_SB_.PCI0._CRS (WORD Address Space
> method Descriptor) looks sane.
> method PASSED: Test 18, \_SB_.PCI0.PDRC._CRS (32-bit Fixed
> @@ -187,11 +187,11 @@ method Descriptor) looks sane.
> method PASSED: Test 18, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ
> method Descriptor) looks sane.
> method
> -method Test 19 of 200: Test _DSD (Device Specific Data).
> +method Test 19 of 201: Test _DSD (Device Specific Data).
> method SKIPPED: Test 19, Skipping test for non-existent object
> method _DSD.
> method
> -method Test 20 of 200: Test _DIS (Disable).
> +method Test 20 of 201: Test _DIS (Disable).
> method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKA._DIS returned no
> method values as expected.
> method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKB._DIS returned no
> @@ -209,24 +209,24 @@ method values as expected.
> method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKH._DIS returned no
> method values as expected.
> method
> -method Test 21 of 200: Test _DMA (Direct Memory Access).
> +method Test 21 of 201: Test _DMA (Direct Memory Access).
> method SKIPPED: Test 21, Skipping test for non-existent object
> method _DMA.
> method
> -method Test 22 of 200: Test _FIX (Fixed Register Resource
> +method Test 22 of 201: Test _FIX (Fixed Register Resource
> method Provider).
> method SKIPPED: Test 22, Skipping test for non-existent object
> method _FIX.
> method
> -method Test 23 of 200: Test _GSB (Global System Interrupt Base).
> +method Test 23 of 201: Test _GSB (Global System Interrupt Base).
> method SKIPPED: Test 23, Skipping test for non-existent object
> method _GSB.
> method
> -method Test 24 of 200: Test _HPP (Hot Plug Parameters).
> +method Test 24 of 201: Test _HPP (Hot Plug Parameters).
> method SKIPPED: Test 24, Skipping test for non-existent object
> method _HPP.
> method
> -method Test 25 of 200: Test _PRS (Possible Resource Settings).
> +method Test 25 of 201: Test _PRS (Possible Resource Settings).
> method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ
> method Descriptor) looks sane.
> method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ
> @@ -244,7 +244,7 @@ method Descriptor) looks sane.
> method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ
> method Descriptor) looks sane.
> method
> -method Test 26 of 200: Test _PRT (PCI Routing Table).
> +method Test 26 of 201: Test _PRT (PCI Routing Table).
> method PASSED: Test 26, \_SB_.PCI0._PRT correctly returned a sane
> method looking package.
> method PASSED: Test 26, \_SB_.PCI0.PEGP._PRT correctly returned a
> @@ -264,51 +264,51 @@ method sane looking package.
> method PASSED: Test 26, \_SB_.PCI0.PCIB._PRT correctly returned a
> method sane looking package.
> method
> -method Test 27 of 200: Test _PXM (Proximity).
> +method Test 27 of 201: Test _PXM (Proximity).
> method SKIPPED: Test 27, Skipping test for non-existent object
> method _PXM.
> method
> -method Test 28 of 200: Test _CCA (Cache Coherency Attribute).
> +method Test 28 of 201: Test _CCA (Cache Coherency Attribute).
> method SKIPPED: Test 28, Skipping test for non-existent object
> method _CCA.
> method
> -method Test 29 of 200: Test _EDL (Eject Device List).
> +method Test 29 of 201: Test _EDL (Eject Device List).
> method SKIPPED: Test 29, Skipping test for non-existent object
> method _EDL.
> method
> -method Test 30 of 200: Test _EJD (Ejection Dependent Device).
> +method Test 30 of 201: Test _EJD (Ejection Dependent Device).
> method SKIPPED: Test 30, Skipping test for non-existent object
> method _EJD.
> method
> -method Test 31 of 200: Test _EJ0 (Eject).
> +method Test 31 of 201: Test _EJ0 (Eject).
> method SKIPPED: Test 31, Skipping test for non-existent object
> method _EJ0.
> method
> -method Test 32 of 200: Test _EJ1 (Eject).
> +method Test 32 of 201: Test _EJ1 (Eject).
> method SKIPPED: Test 32, Skipping test for non-existent object
> method _EJ1.
> method
> -method Test 33 of 200: Test _EJ2 (Eject).
> +method Test 33 of 201: Test _EJ2 (Eject).
> method SKIPPED: Test 33, Skipping test for non-existent object
> method _EJ2.
> method
> -method Test 34 of 200: Test _EJ3 (Eject).
> +method Test 34 of 201: Test _EJ3 (Eject).
> method SKIPPED: Test 34, Skipping test for non-existent object
> method _EJ3.
> method
> -method Test 35 of 200: Test _EJ4 (Eject).
> +method Test 35 of 201: Test _EJ4 (Eject).
> method SKIPPED: Test 35, Skipping test for non-existent object
> method _EJ4.
> method
> -method Test 36 of 200: Test _LCK (Lock).
> +method Test 36 of 201: Test _LCK (Lock).
> method SKIPPED: Test 36, Skipping test for non-existent object
> method _LCK.
> method
> -method Test 37 of 200: Test _RMV (Remove).
> +method Test 37 of 201: Test _RMV (Remove).
> method PASSED: Test 37, \_SB_.PCI0.RP03.PXSX._RMV correctly
> method returned sane looking value 0x00000001.
> method
> -method Test 38 of 200: Test _STA (Status).
> +method Test 38 of 201: Test _STA (Status).
> method PASSED: Test 38, \_SB_.PCI0.PEGP.VGA_._STA correctly
> method returned sane looking value 0x0000000f.
> method PASSED: Test 38, \_SB_.PCI0.LPCB.LNKA._STA correctly
> @@ -332,81 +332,81 @@ method returned sane looking value 0x00000000.
> method PASSED: Test 38, \_SB_.PCI0.LPCB.BAT1._STA correctly
> method returned sane looking value 0x0000001f.
> method
> -method Test 39 of 200: Test _DEP (Operational Region
> +method Test 39 of 201: Test _DEP (Operational Region
> method Dependencies).
> method SKIPPED: Test 39, Skipping test for non-existent object
> method _DEP.
> method
> -method Test 40 of 200: Test _FIT (Firmware Interface Table).
> +method Test 40 of 201: Test _FIT (Firmware Interface Table).
> method SKIPPED: Test 40, Skipping test for non-existent object
> method _FIT.
> method
> -method Test 41 of 200: Test _BDN (BIOS Dock Name).
> +method Test 41 of 201: Test _BDN (BIOS Dock Name).
> method SKIPPED: Test 41, Skipping test for non-existent object
> method _BDN.
> method
> -method Test 42 of 200: Test _BBN (Base Bus Number).
> +method Test 42 of 201: Test _BBN (Base Bus Number).
> method SKIPPED: Test 42, Skipping test for non-existent object
> method _BBN.
> method
> -method Test 43 of 200: Test _DCK (Dock).
> +method Test 43 of 201: Test _DCK (Dock).
> method SKIPPED: Test 43, Skipping test for non-existent object
> method _DCK.
> method
> -method Test 44 of 200: Test _INI (Initialize).
> +method Test 44 of 201: Test _INI (Initialize).
> method PASSED: Test 44, \_SB_._INI returned no values as
> method expected.
> method
> -method Test 45 of 200: Test _GLK (Global Lock).
> +method Test 45 of 201: Test _GLK (Global Lock).
> method SKIPPED: Test 45, Skipping test for non-existent object
> method _GLK.
> method
> -method Test 46 of 200: Test _SEG (Segment).
> +method Test 46 of 201: Test _SEG (Segment).
> method SKIPPED: Test 46, Skipping test for non-existent object
> method _SEG.
> method
> -method Test 47 of 200: Test _LSI (Label Storage Information).
> +method Test 47 of 201: Test _LSI (Label Storage Information).
> method SKIPPED: Test 47, Skipping test for non-existent object
> method _LSI.
> method
> -method Test 48 of 200: Test _OFF (Set resource off).
> +method Test 48 of 201: Test _OFF (Set resource off).
> method SKIPPED: Test 48, Skipping test for non-existent object
> method _OFF.
> method
> -method Test 49 of 200: Test _ON_ (Set resource on).
> +method Test 49 of 201: Test _ON_ (Set resource on).
> method SKIPPED: Test 49, Skipping test for non-existent object
> method _ON_.
> method
> -method Test 50 of 200: Test _DSW (Device Sleep Wake).
> +method Test 50 of 201: Test _DSW (Device Sleep Wake).
> method SKIPPED: Test 50, Skipping test for non-existent object
> method _DSW.
> method
> -method Test 51 of 200: Test _IRC (In Rush Current).
> +method Test 51 of 201: Test _IRC (In Rush Current).
> method SKIPPED: Test 51, Skipping test for non-existent object
> method _IRC.
> method
> -method Test 52 of 200: Test _PRE (Power Resources for
> +method Test 52 of 201: Test _PRE (Power Resources for
> method Enumeration).
> method SKIPPED: Test 52, Skipping test for non-existent object
> method _PRE.
> method
> -method Test 53 of 200: Test _PR0 (Power Resources for D0).
> +method Test 53 of 201: Test _PR0 (Power Resources for D0).
> method SKIPPED: Test 53, Skipping test for non-existent object
> method _PR0.
> method
> -method Test 54 of 200: Test _PR1 (Power Resources for D1).
> +method Test 54 of 201: Test _PR1 (Power Resources for D1).
> method SKIPPED: Test 54, Skipping test for non-existent object
> method _PR1.
> method
> -method Test 55 of 200: Test _PR2 (Power Resources for D2).
> +method Test 55 of 201: Test _PR2 (Power Resources for D2).
> method SKIPPED: Test 55, Skipping test for non-existent object
> method _PR2.
> method
> -method Test 56 of 200: Test _PR3 (Power Resources for D3).
> +method Test 56 of 201: Test _PR3 (Power Resources for D3).
> method SKIPPED: Test 56, Skipping test for non-existent object
> method _PR3.
> method
> -method Test 57 of 200: Test _PRW (Power Resources for Wake).
> +method Test 57 of 201: Test _PRW (Power Resources for Wake).
> method PASSED: Test 57, \_SB_.PCI0.HDEF._PRW correctly returned a
> method sane looking package.
> method PASSED: Test 57, \_SB_.PCI0.RP03.PXSX._PRW correctly
> @@ -426,34 +426,34 @@ method sane looking package.
> method PASSED: Test 57, \_SB_.PCI0.EHC2._PRW correctly returned a
> method sane looking package.
> method
> -method Test 58 of 200: Test _PS0 (Power State 0).
> +method Test 58 of 201: Test _PS0 (Power State 0).
> method PASSED: Test 58, \_SB_.PCI0.PEGP.VGA_._PS0 returned no
> method values as expected.
> method PASSED: Test 58, \_PS0 returned no values as expected.
> method
> -method Test 59 of 200: Test _PS1 (Power State 1).
> +method Test 59 of 201: Test _PS1 (Power State 1).
> method PASSED: Test 59, \_SB_.PCI0.PEGP.VGA_._PS1 returned no
> method values as expected.
> method
> -method Test 60 of 200: Test _PS2 (Power State 2).
> +method Test 60 of 201: Test _PS2 (Power State 2).
> method SKIPPED: Test 60, Skipping test for non-existent object
> method _PS2.
> method
> -method Test 61 of 200: Test _PS3 (Power State 3).
> +method Test 61 of 201: Test _PS3 (Power State 3).
> method PASSED: Test 61, \_SB_.PCI0.PEGP.VGA_._PS3 returned no
> method values as expected.
> method PASSED: Test 61, \_PS3 returned no values as expected.
> method
> -method Test 62 of 200: Test _PSC (Power State Current).
> +method Test 62 of 201: Test _PSC (Power State Current).
> method PASSED: Test 62, \_SB_.PCI0.PEGP.VGA_._PSC correctly
> method returned an integer.
> method PASSED: Test 62, \_PSC correctly returned an integer.
> method
> -method Test 63 of 200: Test _PSE (Power State for Enumeration).
> +method Test 63 of 201: Test _PSE (Power State for Enumeration).
> method SKIPPED: Test 63, Skipping test for non-existent object
> method _PSE.
> method
> -method Test 64 of 200: Test _PSW (Power State Wake).
> +method Test 64 of 201: Test _PSW (Power State Wake).
> method PASSED: Test 64, \_SB_.PCI0.USB1._PSW returned no values
> method as expected.
> method PASSED: Test 64, \_SB_.PCI0.USB2._PSW returned no values
> @@ -465,15 +465,15 @@ method as expected.
> method PASSED: Test 64, \_SB_.PCI0.USB5._PSW returned no values
> method as expected.
> method
> -method Test 65 of 200: Test _S1D (S1 Device State).
> +method Test 65 of 201: Test _S1D (S1 Device State).
> method SKIPPED: Test 65, Skipping test for non-existent object
> method _S1D.
> method
> -method Test 66 of 200: Test _S2D (S2 Device State).
> +method Test 66 of 201: Test _S2D (S2 Device State).
> method SKIPPED: Test 66, Skipping test for non-existent object
> method _S2D.
> method
> -method Test 67 of 200: Test _S3D (S3 Device State).
> +method Test 67 of 201: Test _S3D (S3 Device State).
> method PASSED: Test 67, \_SB_.PCI0._S3D correctly returned an
> method integer.
> method PASSED: Test 67, \_SB_.PCI0.USB1._S3D correctly returned
> @@ -491,7 +491,7 @@ method an integer.
> method PASSED: Test 67, \_SB_.PCI0.EHC2._S3D correctly returned
> method an integer.
> method
> -method Test 68 of 200: Test _S4D (S4 Device State).
> +method Test 68 of 201: Test _S4D (S4 Device State).
> method PASSED: Test 68, \_SB_.PCI0._S4D correctly returned an
> method integer.
> method PASSED: Test 68, \_SB_.PCI0.USB1._S4D correctly returned
> @@ -509,132 +509,132 @@ method an integer.
> method PASSED: Test 68, \_SB_.PCI0.EHC2._S4D correctly returned
> method an integer.
> method
> -method Test 69 of 200: Test _S0W (S0 Device Wake State).
> +method Test 69 of 201: Test _S0W (S0 Device Wake State).
> method SKIPPED: Test 69, Skipping test for non-existent object
> method _S0W.
> method
> -method Test 70 of 200: Test _S1W (S1 Device Wake State).
> +method Test 70 of 201: Test _S1W (S1 Device Wake State).
> method SKIPPED: Test 70, Skipping test for non-existent object
> method _S1W.
> method
> -method Test 71 of 200: Test _S2W (S2 Device Wake State).
> +method Test 71 of 201: Test _S2W (S2 Device Wake State).
> method SKIPPED: Test 71, Skipping test for non-existent object
> method _S2W.
> method
> -method Test 72 of 200: Test _S3W (S3 Device Wake State).
> +method Test 72 of 201: Test _S3W (S3 Device Wake State).
> method SKIPPED: Test 72, Skipping test for non-existent object
> method _S3W.
> method
> -method Test 73 of 200: Test _S4W (S4 Device Wake State).
> +method Test 73 of 201: Test _S4W (S4 Device Wake State).
> method SKIPPED: Test 73, Skipping test for non-existent object
> method _S4W.
> method
> -method Test 74 of 200: Test _RST (Device Reset).
> +method Test 74 of 201: Test _RST (Device Reset).
> method SKIPPED: Test 74, Skipping test for non-existent object
> method _RST.
> method
> -method Test 75 of 200: Test _PRR (Power Resource for Reset).
> +method Test 75 of 201: Test _PRR (Power Resource for Reset).
> method SKIPPED: Test 75, Skipping test for non-existent object
> method _PRR.
> method
> -method Test 76 of 200: Test _S0_ (S0 System State).
> +method Test 76 of 201: Test _S0_ (S0 System State).
> method \_S0_ PM1a_CNT.SLP_TYP value: 0x00000000
> method \_S0_ PM1b_CNT.SLP_TYP value: 0x00000000
> method PASSED: Test 76, \_S0_ correctly returned a sane looking
> method package.
> method
> -method Test 77 of 200: Test _S1_ (S1 System State).
> +method Test 77 of 201: Test _S1_ (S1 System State).
> method SKIPPED: Test 77, Skipping test for non-existent object
> method _S1_.
> method
> -method Test 78 of 200: Test _S2_ (S2 System State).
> +method Test 78 of 201: Test _S2_ (S2 System State).
> method SKIPPED: Test 78, Skipping test for non-existent object
> method _S2_.
> method
> -method Test 79 of 200: Test _S3_ (S3 System State).
> +method Test 79 of 201: Test _S3_ (S3 System State).
> method \_S3_ PM1a_CNT.SLP_TYP value: 0x00000005
> method \_S3_ PM1b_CNT.SLP_TYP value: 0x00000005
> method PASSED: Test 79, \_S3_ correctly returned a sane looking
> method package.
> method
> -method Test 80 of 200: Test _S4_ (S4 System State).
> +method Test 80 of 201: Test _S4_ (S4 System State).
> method \_S4_ PM1a_CNT.SLP_TYP value: 0x00000006
> method \_S4_ PM1b_CNT.SLP_TYP value: 0x00000006
> method PASSED: Test 80, \_S4_ correctly returned a sane looking
> method package.
> method
> -method Test 81 of 200: Test _S5_ (S5 System State).
> +method Test 81 of 201: Test _S5_ (S5 System State).
> method \_S5_ PM1a_CNT.SLP_TYP value: 0x00000007
> method \_S5_ PM1b_CNT.SLP_TYP value: 0x00000007
> method PASSED: Test 81, \_S5_ correctly returned a sane looking
> method package.
> method
> -method Test 82 of 200: Test _SWS (System Wake Source).
> +method Test 82 of 201: Test _SWS (System Wake Source).
> method SKIPPED: Test 82, Skipping test for non-existent object
> method _SWS.
> method
> -method Test 83 of 200: Test _PSS (Performance Supported States).
> +method Test 83 of 201: Test _PSS (Performance Supported States).
> method SKIPPED: Test 83, Skipping test for non-existent object
> method _PSS.
> method
> -method Test 84 of 200: Test _CPC (Continuous Performance
> +method Test 84 of 201: Test _CPC (Continuous Performance
> method Control).
> method SKIPPED: Test 84, Skipping test for non-existent object
> method _CPC.
> method
> -method Test 85 of 200: Test _CSD (C State Dependencies).
> +method Test 85 of 201: Test _CSD (C State Dependencies).
> method SKIPPED: Test 85, Skipping test for non-existent object
> method _CSD.
> method
> -method Test 86 of 200: Test _CST (C States).
> +method Test 86 of 201: Test _CST (C States).
> method SKIPPED: Test 86, Skipping test for non-existent object
> method _CST.
> method
> -method Test 87 of 200: Test _PCT (Performance Control).
> +method Test 87 of 201: Test _PCT (Performance Control).
> method SKIPPED: Test 87, Skipping test for non-existent object
> method _PCT.
> method
> -method Test 88 of 200: Test _PDL (P-State Depth Limit).
> +method Test 88 of 201: Test _PDL (P-State Depth Limit).
> method SKIPPED: Test 88, Skipping test for non-existent object
> method _PDL.
> method
> -method Test 89 of 200: Test _PPC (Performance Present
> +method Test 89 of 201: Test _PPC (Performance Present
> method Capabilities).
> method SKIPPED: Test 89, Skipping test for non-existent object
> method _PPC.
> method
> -method Test 90 of 200: Test _PPE (Polling for Platform Error).
> +method Test 90 of 201: Test _PPE (Polling for Platform Error).
> method SKIPPED: Test 90, Skipping test for non-existent object
> method _PPE.
> method
> -method Test 91 of 200: Test _PSD (Power State Dependencies).
> +method Test 91 of 201: Test _PSD (Power State Dependencies).
> method SKIPPED: Test 91, Skipping test for non-existent object
> method _PSD.
> method
> -method Test 92 of 200: Test _PTC (Processor Throttling Control).
> +method Test 92 of 201: Test _PTC (Processor Throttling Control).
> method PASSED: Test 92, \_PR_.CPU0._PTC correctly returned a sane
> method looking package.
> method PASSED: Test 92, \_PR_.CPU1._PTC correctly returned a sane
> method looking package.
> method
> -method Test 93 of 200: Test _TDL (T-State Depth Limit).
> +method Test 93 of 201: Test _TDL (T-State Depth Limit).
> method SKIPPED: Test 93, Skipping test for non-existent object
> method _TDL.
> method
> -method Test 94 of 200: Test _TPC (Throttling Present
> +method Test 94 of 201: Test _TPC (Throttling Present
> method Capabilities).
> method PASSED: Test 94, \_PR_.CPU0._TPC correctly returned an
> method integer.
> method PASSED: Test 94, \_PR_.CPU1._TPC correctly returned an
> method integer.
> method
> -method Test 95 of 200: Test _TSD (Throttling State Dependencies).
> +method Test 95 of 201: Test _TSD (Throttling State Dependencies).
> method PASSED: Test 95, \_PR_.CPU0._TSD correctly returned a sane
> method looking package.
> method PASSED: Test 95, \_PR_.CPU1._TSD correctly returned a sane
> method looking package.
> method
> -method Test 96 of 200: Test _TSS (Throttling Supported States).
> +method Test 96 of 201: Test _TSS (Throttling Supported States).
> method \_PR_.CPU0._TSS values:
> method T-State CPU Power Latency Control Status
> method Freq (mW) (usecs)
> @@ -662,53 +662,53 @@ method 7 13% 125 0 09 00
> method PASSED: Test 96, \_PR_.CPU1._TSS correctly returned a sane
> method looking package.
> method
> -method Test 97 of 200: Test _LPI (Low Power Idle States).
> +method Test 97 of 201: Test _LPI (Low Power Idle States).
> method SKIPPED: Test 97, Skipping test for non-existent object
> method _LPI.
> method
> -method Test 98 of 200: Test _RDI (Resource Dependencies for
> +method Test 98 of 201: Test _RDI (Resource Dependencies for
> method Idle).
> method SKIPPED: Test 98, Skipping test for non-existent object
> method _RDI.
> method
> -method Test 99 of 200: Test _PUR (Processor Utilization Request).
> +method Test 99 of 201: Test _PUR (Processor Utilization Request).
> method SKIPPED: Test 99, Skipping test for non-existent object
> method _PUR.
> method
> -method Test 100 of 200: Test _MSG (Message).
> +method Test 100 of 201: Test _MSG (Message).
> method SKIPPED: Test 100, Skipping test for non-existent object
> method _MSG.
> method
> -method Test 101 of 200: Test _SST (System Status).
> +method Test 101 of 201: Test _SST (System Status).
> method SKIPPED: Test 101, Skipping test for non-existent object
> method _SST.
> method
> -method Test 102 of 200: Test _ALC (Ambient Light Colour
> +method Test 102 of 201: Test _ALC (Ambient Light Colour
> method Chromaticity).
> method SKIPPED: Test 102, Skipping test for non-existent object
> method _ALC.
> method
> -method Test 103 of 200: Test _ALI (Ambient Light Illuminance).
> +method Test 103 of 201: Test _ALI (Ambient Light Illuminance).
> method SKIPPED: Test 103, Skipping test for non-existent object
> method _ALI.
> method
> -method Test 104 of 200: Test _ALT (Ambient Light Temperature).
> +method Test 104 of 201: Test _ALT (Ambient Light Temperature).
> method SKIPPED: Test 104, Skipping test for non-existent object
> method _ALT.
> method
> -method Test 105 of 200: Test _ALP (Ambient Light Polling).
> +method Test 105 of 201: Test _ALP (Ambient Light Polling).
> method SKIPPED: Test 105, Skipping test for non-existent object
> method _ALP.
> method
> -method Test 106 of 200: Test _ALR (Ambient Light Response).
> +method Test 106 of 201: Test _ALR (Ambient Light Response).
> method SKIPPED: Test 106, Skipping test for non-existent object
> method _ALR.
> method
> -method Test 107 of 200: Test _LID (Lid Status).
> +method Test 107 of 201: Test _LID (Lid Status).
> method PASSED: Test 107, \_SB_.LID0._LID correctly returned sane
> method looking value 0x00000000.
> method
> -method Test 108 of 200: Test _GTF (Get Task File).
> +method Test 108 of 201: Test _GTF (Get Task File).
> method PASSED: Test 108, \_SB_.PCI0.PATA.PRID.P_D0._GTF correctly
> method returned a sane looking buffer.
> method PASSED: Test 108, \_SB_.PCI0.PATA.PRID.P_D1._GTF correctly
> @@ -720,201 +720,201 @@ method returned a sane looking buffer.
> method PASSED: Test 108, \_SB_.PCI0.SATA.PRT2._GTF correctly
> method returned a sane looking buffer.
> method
> -method Test 109 of 200: Test _GTM (Get Timing Mode).
> +method Test 109 of 201: Test _GTM (Get Timing Mode).
> method PASSED: Test 109, \_SB_.PCI0.PATA.PRID._GTM correctly
> method returned a sane looking buffer.
> method
> -method Test 110 of 200: Test _MBM (Memory Bandwidth Monitoring
> +method Test 110 of 201: Test _MBM (Memory Bandwidth Monitoring
> method Data).
> method SKIPPED: Test 110, Skipping test for non-existent object
> method _MBM.
> method
> -method Test 111 of 200: Test _UPC (USB Port Capabilities).
> +method Test 111 of 201: Test _UPC (USB Port Capabilities).
> method SKIPPED: Test 111, Skipping test for non-existent object
> method _UPC.
> method
> -method Test 112 of 200: Test _UPD (User Presence Detect).
> +method Test 112 of 201: Test _UPD (User Presence Detect).
> method SKIPPED: Test 112, Skipping test for non-existent object
> method _UPD.
> method
> -method Test 113 of 200: Test _UPP (User Presence Polling).
> +method Test 113 of 201: Test _UPP (User Presence Polling).
> method SKIPPED: Test 113, Skipping test for non-existent object
> method _UPP.
> method
> -method Test 114 of 200: Test _GCP (Get Capabilities).
> +method Test 114 of 201: Test _GCP (Get Capabilities).
> method SKIPPED: Test 114, Skipping test for non-existent object
> method _GCP.
> method
> -method Test 115 of 200: Test _GRT (Get Real Time).
> +method Test 115 of 201: Test _GRT (Get Real Time).
> method SKIPPED: Test 115, Skipping test for non-existent object
> method _GRT.
> method
> -method Test 116 of 200: Test _GWS (Get Wake Status).
> +method Test 116 of 201: Test _GWS (Get Wake Status).
> method SKIPPED: Test 116, Skipping test for non-existent object
> method _GWS.
> method
> -method Test 117 of 200: Test _CWS (Clear Wake Status).
> +method Test 117 of 201: Test _CWS (Clear Wake Status).
> method SKIPPED: Test 117, Skipping test for non-existent object
> method _CWS.
> method
> -method Test 118 of 200: Test _SRT (Set Real Time).
> +method Test 118 of 201: Test _SRT (Set Real Time).
> method SKIPPED: Test 118, Skipping test for non-existent object
> method _SRT.
> method
> -method Test 119 of 200: Test _STP (Set Expired Timer Wake
> +method Test 119 of 201: Test _STP (Set Expired Timer Wake
> method Policy).
> method SKIPPED: Test 119, Skipping test for non-existent object
> method _STP.
> method
> -method Test 120 of 200: Test _STV (Set Timer Value).
> +method Test 120 of 201: Test _STV (Set Timer Value).
> method SKIPPED: Test 120, Skipping test for non-existent object
> method _STV.
> method
> -method Test 121 of 200: Test _TIP (Expired Timer Wake Policy).
> +method Test 121 of 201: Test _TIP (Expired Timer Wake Policy).
> method SKIPPED: Test 121, Skipping test for non-existent object
> method _TIP.
> method
> -method Test 122 of 200: Test _TIV (Timer Values).
> +method Test 122 of 201: Test _TIV (Timer Values).
> method SKIPPED: Test 122, Skipping test for non-existent object
> method _TIV.
> method
> -method Test 123 of 200: Test _NBS (NVDIMM Boot Status).
> +method Test 123 of 201: Test _NBS (NVDIMM Boot Status).
> method SKIPPED: Test 123, Skipping test for non-existent object
> method _NBS.
> method
> -method Test 124 of 200: Test _NCH (NVDIMM Current Health
> +method Test 124 of 201: Test _NCH (NVDIMM Current Health
> method Information).
> method SKIPPED: Test 124, Skipping test for non-existent object
> method _NCH.
> method
> -method Test 125 of 200: Test _NIC (NVDIMM Health Error Injection
> +method Test 125 of 201: Test _NIC (NVDIMM Health Error Injection
> method Capabilities).
> method SKIPPED: Test 125, Skipping test for non-existent object
> method _NIC.
> method
> -method Test 126 of 200: Test _NIH (NVDIMM Inject/Clear Health
> +method Test 126 of 201: Test _NIH (NVDIMM Inject/Clear Health
> method Errors).
> method SKIPPED: Test 126, Skipping test for non-existent object
> method _NIH.
> method
> -method Test 127 of 200: Test _NIG (NVDIMM Inject Health Error
> +method Test 127 of 201: Test _NIG (NVDIMM Inject Health Error
> method Status).
> method SKIPPED: Test 127, Skipping test for non-existent object
> method _NIG.
> method
> -method Test 128 of 200: Test _SBS (Smart Battery Subsystem).
> +method Test 128 of 201: Test _SBS (Smart Battery Subsystem).
> method SKIPPED: Test 128, Skipping test for non-existent object
> method _SBS.
> method
> -method Test 129 of 200: Test _BCT (Battery Charge Time).
> +method Test 129 of 201: Test _BCT (Battery Charge Time).
> method SKIPPED: Test 129, Skipping test for non-existent object
> method _BCT.
> method
> -method Test 130 of 200: Test _BIF (Battery Information).
> +method Test 130 of 201: Test _BIF (Battery Information).
> method PASSED: Test 130, \_SB_.PCI0.LPCB.BAT1._BIF correctly
> method returned a sane looking package.
> method
> -method Test 131 of 200: Test _BIX (Battery Information Extended).
> +method Test 131 of 201: Test _BIX (Battery Information Extended).
> method SKIPPED: Test 131, Skipping test for non-existent object
> method _BIX.
> method
> -method Test 132 of 200: Test _BMA (Battery Measurement
> +method Test 132 of 201: Test _BMA (Battery Measurement
> method Averaging).
> method SKIPPED: Test 132, Skipping test for non-existent object
> method _BMA.
> method
> -method Test 133 of 200: Test _BMC (Battery Maintenance Control).
> +method Test 133 of 201: Test _BMC (Battery Maintenance Control).
> method SKIPPED: Test 133, Skipping test for non-existent object
> method _BMC.
> method
> -method Test 134 of 200: Test _BMD (Battery Maintenance Data).
> +method Test 134 of 201: Test _BMD (Battery Maintenance Data).
> method SKIPPED: Test 134, Skipping test for non-existent object
> method _BMD.
> method
> -method Test 135 of 200: Test _BMS (Battery Measurement Sampling
> +method Test 135 of 201: Test _BMS (Battery Measurement Sampling
> method Time).
> method SKIPPED: Test 135, Skipping test for non-existent object
> method _BMS.
> method
> -method Test 136 of 200: Test _BST (Battery Status).
> +method Test 136 of 201: Test _BST (Battery Status).
> method PASSED: Test 136, \_SB_.PCI0.LPCB.BAT1._BST correctly
> method returned a sane looking package.
> method
> -method Test 137 of 200: Test _BTP (Battery Trip Point).
> +method Test 137 of 201: Test _BTP (Battery Trip Point).
> method SKIPPED: Test 137, Skipping test for non-existent object
> method _BTP.
> method
> -method Test 138 of 200: Test _BTH (Battery Throttle Limit).
> +method Test 138 of 201: Test _BTH (Battery Throttle Limit).
> method SKIPPED: Test 138, Skipping test for non-existent object
> method _BTH.
> method
> -method Test 139 of 200: Test _BTM (Battery Time).
> +method Test 139 of 201: Test _BTM (Battery Time).
> method SKIPPED: Test 139, Skipping test for non-existent object
> method _BTM.
> method
> -method Test 140 of 200: Test _PCL (Power Consumer List).
> +method Test 140 of 201: Test _PCL (Power Consumer List).
> method PASSED: Test 140, \_SB_.PCI0.LPCB.ACAD._PCL returned a
> method sane package of 1 references.
> method PASSED: Test 140, \_SB_.PCI0.LPCB.BAT1._PCL returned a
> method sane package of 1 references.
> method
> -method Test 141 of 200: Test _PIF (Power Source Information).
> +method Test 141 of 201: Test _PIF (Power Source Information).
> method SKIPPED: Test 141, Skipping test for non-existent object
> method _PIF.
> method
> -method Test 142 of 200: Test _PRL (Power Source Redundancy List).
> +method Test 142 of 201: Test _PRL (Power Source Redundancy List).
> method SKIPPED: Test 142, Skipping test for non-existent object
> method _PRL.
> method
> -method Test 143 of 200: Test _PSR (Power Source).
> +method Test 143 of 201: Test _PSR (Power Source).
> method PASSED: Test 143, \_SB_.PCI0.LPCB.ACAD._PSR correctly
> method returned sane looking value 0x00000000.
> method
> -method Test 144 of 200: Test _GAI (Get Averaging Level).
> +method Test 144 of 201: Test _GAI (Get Averaging Level).
> method SKIPPED: Test 144, Skipping test for non-existent object
> method _GAI.
> method
> -method Test 145 of 200: Test _GHL (Get Harware Limit).
> +method Test 145 of 201: Test _GHL (Get Harware Limit).
> method SKIPPED: Test 145, Skipping test for non-existent object
> method _GHL.
> method
> -method Test 146 of 200: Test _PMC (Power Meter Capabilities).
> +method Test 146 of 201: Test _PMC (Power Meter Capabilities).
> method SKIPPED: Test 146, Skipping test for non-existent object
> method _PMC.
> method
> -method Test 147 of 200: Test _PMD (Power Meter Devices).
> +method Test 147 of 201: Test _PMD (Power Meter Devices).
> method SKIPPED: Test 147, Skipping test for non-existent object
> method _PMD.
> method
> -method Test 148 of 200: Test _PMM (Power Meter Measurement).
> +method Test 148 of 201: Test _PMM (Power Meter Measurement).
> method SKIPPED: Test 148, Skipping test for non-existent object
> method _PMM.
> method
> -method Test 149 of 200: Test _WPC (Wireless Power Calibration).
> +method Test 149 of 201: Test _WPC (Wireless Power Calibration).
> method SKIPPED: Test 149, Skipping test for non-existent object
> method _WPC.
> method
> -method Test 150 of 200: Test _WPP (Wireless Power Polling).
> +method Test 150 of 201: Test _WPP (Wireless Power Polling).
> method SKIPPED: Test 150, Skipping test for non-existent object
> method _WPP.
> method
> -method Test 151 of 200: Test _FIF (Fan Information).
> +method Test 151 of 201: Test _FIF (Fan Information).
> method SKIPPED: Test 151, Skipping test for non-existent object
> method _FIF.
> method
> -method Test 152 of 200: Test _FPS (Fan Performance States).
> +method Test 152 of 201: Test _FPS (Fan Performance States).
> method SKIPPED: Test 152, Skipping test for non-existent object
> method _FPS.
> method
> -method Test 153 of 200: Test _FSL (Fan Set Level).
> +method Test 153 of 201: Test _FSL (Fan Set Level).
> method SKIPPED: Test 153, Skipping test for non-existent object
> method _FSL.
> method
> -method Test 154 of 200: Test _FST (Fan Status).
> +method Test 154 of 201: Test _FST (Fan Status).
> method SKIPPED: Test 154, Skipping test for non-existent object
> method _FST.
> method
> -method Test 155 of 200: Test _ACx (Active Cooling).
> +method Test 155 of 201: Test _ACx (Active Cooling).
> method SKIPPED: Test 155, Skipping test for non-existent object
> method _AC0.
> method
> @@ -946,338 +946,370 @@ method SKIPPED: Test 155, Skipping test for non-existent object
> method _AC9.
> method
> method
> -method Test 156 of 200: Test _ART (Active Cooling Relationship
> +method Test 156 of 201: Test _ART (Active Cooling Relationship
> method Table).
> method SKIPPED: Test 156, Skipping test for non-existent object
> method _ART.
> method
> -method Test 157 of 200: Test _CRT (Critical Trip Point).
> +method Test 157 of 201: Test _ALx (Active List).
> method SKIPPED: Test 157, Skipping test for non-existent object
> -method _CRT.
> +method _AL0.
> +method
> +method SKIPPED: Test 157, Skipping test for non-existent object
> +method _AL1.
> +method
> +method SKIPPED: Test 157, Skipping test for non-existent object
> +method _AL2.
> +method
> +method SKIPPED: Test 157, Skipping test for non-existent object
> +method _AL3.
> +method
> +method SKIPPED: Test 157, Skipping test for non-existent object
> +method _AL4.
> +method
> +method SKIPPED: Test 157, Skipping test for non-existent object
> +method _AL5.
> +method
> +method SKIPPED: Test 157, Skipping test for non-existent object
> +method _AL6.
> +method
> +method SKIPPED: Test 157, Skipping test for non-existent object
> +method _AL7.
> +method
> +method SKIPPED: Test 157, Skipping test for non-existent object
> +method _AL8.
> +method
> +method SKIPPED: Test 157, Skipping test for non-existent object
> +method _AL9.
> method
> -method Test 158 of 200: Test _CR3 (Warm/Standby Temperature).
> +method
> +method Test 158 of 201: Test _CRT (Critical Trip Point).
> method SKIPPED: Test 158, Skipping test for non-existent object
> +method _CRT.
> +method
> +method Test 159 of 201: Test _CR3 (Warm/Standby Temperature).
> +method SKIPPED: Test 159, Skipping test for non-existent object
> method _CR3.
> method
> -method Test 159 of 200: Test _DTI (Device Temperature
> +method Test 160 of 201: Test _DTI (Device Temperature
> method Indication).
> -method SKIPPED: Test 159, Skipping test for non-existent object
> +method SKIPPED: Test 160, Skipping test for non-existent object
> method _DTI.
> method
> -method Test 160 of 200: Test _HOT (Hot Temperature).
> -method SKIPPED: Test 160, Skipping test for non-existent object
> +method Test 161 of 201: Test _HOT (Hot Temperature).
> +method SKIPPED: Test 161, Skipping test for non-existent object
> method _HOT.
> method
> -method Test 161 of 200: Test _MTL (Minimum Throttle Limit).
> -method SKIPPED: Test 161, Skipping test for non-existent object
> +method Test 162 of 201: Test _MTL (Minimum Throttle Limit).
> +method SKIPPED: Test 162, Skipping test for non-existent object
> method _MTL.
> method
> -method Test 162 of 200: Test _NTT (Notification Temp Threshold).
> -method SKIPPED: Test 162, Skipping test for non-existent object
> +method Test 163 of 201: Test _NTT (Notification Temp Threshold).
> +method SKIPPED: Test 163, Skipping test for non-existent object
> method _NTT.
> method
> -method Test 163 of 200: Test _PSL (Passive List).
> -method SKIPPED: Test 163, Skipping test for non-existent object
> +method Test 164 of 201: Test _PSL (Passive List).
> +method SKIPPED: Test 164, Skipping test for non-existent object
> method _PSL.
> method
> -method Test 164 of 200: Test _PSV (Passive Temp).
> -method SKIPPED: Test 164, Skipping test for non-existent object
> +method Test 165 of 201: Test _PSV (Passive Temp).
> +method SKIPPED: Test 165, Skipping test for non-existent object
> method _PSV.
> method
> -method Test 165 of 200: Test _RTV (Relative Temp Values).
> -method SKIPPED: Test 165, Skipping test for non-existent object
> +method Test 166 of 201: Test _RTV (Relative Temp Values).
> +method SKIPPED: Test 166, Skipping test for non-existent object
> method _RTV.
> method
> -method Test 166 of 200: Test _SCP (Set Cooling Policy).
> -method SKIPPED: Test 166, Skipping test for non-existent object
> +method Test 167 of 201: Test _SCP (Set Cooling Policy).
> +method SKIPPED: Test 167, Skipping test for non-existent object
> method _DTI.
> method
> -method Test 167 of 200: Test _TC1 (Thermal Constant 1).
> -method SKIPPED: Test 167, Skipping test for non-existent object
> +method Test 168 of 201: Test _TC1 (Thermal Constant 1).
> +method SKIPPED: Test 168, Skipping test for non-existent object
> method _TC1.
> method
> -method Test 168 of 200: Test _TC2 (Thermal Constant 2).
> -method SKIPPED: Test 168, Skipping test for non-existent object
> +method Test 169 of 201: Test _TC2 (Thermal Constant 2).
> +method SKIPPED: Test 169, Skipping test for non-existent object
> method _TC2.
> method
> -method Test 169 of 200: Test _TFP (Thermal fast Sampling Period).
> -method SKIPPED: Test 169, Skipping test for non-existent object
> +method Test 170 of 201: Test _TFP (Thermal fast Sampling Period).
> +method SKIPPED: Test 170, Skipping test for non-existent object
> method _TFP.
> method
> -method Test 170 of 200: Test _TMP (Thermal Zone Current Temp).
> -method SKIPPED: Test 170, Skipping test for non-existent object
> +method Test 171 of 201: Test _TMP (Thermal Zone Current Temp).
> +method SKIPPED: Test 171, Skipping test for non-existent object
> method _TMP.
> method
> -method Test 171 of 200: Test _TPT (Trip Point Temperature).
> -method SKIPPED: Test 171, Skipping test for non-existent object
> +method Test 172 of 201: Test _TPT (Trip Point Temperature).
> +method SKIPPED: Test 172, Skipping test for non-existent object
> method _TPT.
> method
> -method Test 172 of 200: Test _TRT (Thermal Relationship Table).
> -method SKIPPED: Test 172, Skipping test for non-existent object
> +method Test 173 of 201: Test _TRT (Thermal Relationship Table).
> +method SKIPPED: Test 173, Skipping test for non-existent object
> method _TRT.
> method
> -method Test 173 of 200: Test _TSN (Thermal Sensor Device).
> -method SKIPPED: Test 173, Skipping test for non-existent object
> +method Test 174 of 201: Test _TSN (Thermal Sensor Device).
> +method SKIPPED: Test 174, Skipping test for non-existent object
> method _TSN.
> method
> -method Test 174 of 200: Test _TSP (Thermal Sampling Period).
> -method SKIPPED: Test 174, Skipping test for non-existent object
> +method Test 175 of 201: Test _TSP (Thermal Sampling Period).
> +method SKIPPED: Test 175, Skipping test for non-existent object
> method _TSP.
> method
> -method Test 175 of 200: Test _TST (Temperature Sensor Threshold).
> -method SKIPPED: Test 175, Skipping test for non-existent object
> +method Test 176 of 201: Test _TST (Temperature Sensor Threshold).
> +method SKIPPED: Test 176, Skipping test for non-existent object
> method _TST.
> method
> -method Test 176 of 200: Test _TZD (Thermal Zone Devices).
> -method SKIPPED: Test 176, Skipping test for non-existent object
> +method Test 177 of 201: Test _TZD (Thermal Zone Devices).
> +method SKIPPED: Test 177, Skipping test for non-existent object
> method _TZD.
> method
> -method Test 177 of 200: Test _TZM (Thermal Zone member).
> -method SKIPPED: Test 177, Skipping test for non-existent object
> +method Test 178 of 201: Test _TZM (Thermal Zone member).
> +method SKIPPED: Test 178, Skipping test for non-existent object
> method _TZM.
> method
> -method Test 178 of 200: Test _TZP (Thermal Zone Polling).
> -method SKIPPED: Test 178, Skipping test for non-existent object
> +method Test 179 of 201: Test _TZP (Thermal Zone Polling).
> +method SKIPPED: Test 179, Skipping test for non-existent object
> method _TZP.
> method
> -method Test 179 of 200: Test _GPE (General Purpose Events).
> -method PASSED: Test 179, \_SB_.PCI0.LPCB.EC0_._GPE returned an
> +method Test 180 of 201: Test _GPE (General Purpose Events).
> +method PASSED: Test 180, \_SB_.PCI0.LPCB.EC0_._GPE returned an
> method integer 0x0000001c
> method
> -method Test 180 of 200: Test _EC_ (EC Offset Query).
> -method SKIPPED: Test 180, Skipping test for non-existent object
> +method Test 181 of 201: Test _EC_ (EC Offset Query).
> +method SKIPPED: Test 181, Skipping test for non-existent object
> method _EC_.
> method
> -method Test 181 of 200: Test _PTS (Prepare to Sleep).
> +method Test 182 of 201: Test _PTS (Prepare to Sleep).
> method Test _PTS(3).
> -method PASSED: Test 181, \_PTS returned no values as expected.
> +method PASSED: Test 182, \_PTS returned no values as expected.
> method
> method Test _PTS(4).
> -method PASSED: Test 181, \_PTS returned no values as expected.
> +method PASSED: Test 182, \_PTS returned no values as expected.
> method
> method Test _PTS(5).
> -method PASSED: Test 181, \_PTS returned no values as expected.
> +method PASSED: Test 182, \_PTS returned no values as expected.
> method
> method
> -method Test 182 of 200: Test _TTS (Transition to State).
> -method SKIPPED: Test 182, Optional control method _TTS does not
> +method Test 183 of 201: Test _TTS (Transition to State).
> +method SKIPPED: Test 183, Optional control method _TTS does not
> method exist.
> method
> -method Test 183 of 200: Test _WAK (System Wake).
> +method Test 184 of 201: Test _WAK (System Wake).
> method Test _WAK(3) System Wake, State S3.
> -method PASSED: Test 183, \_WAK correctly returned a sane looking
> +method PASSED: Test 184, \_WAK correctly returned a sane looking
> method package.
> method
> method Test _WAK(4) System Wake, State S4.
> -method PASSED: Test 183, \_WAK correctly returned a sane looking
> +method PASSED: Test 184, \_WAK correctly returned a sane looking
> method package.
> method
> method Test _WAK(5) System Wake, State S5.
> -method PASSED: Test 183, \_WAK correctly returned a sane looking
> +method PASSED: Test 184, \_WAK correctly returned a sane looking
> method package.
> method
> method
> -method Test 184 of 200: Test _ADR (Return Unique ID for Device).
> -method PASSED: Test 184, \_SB_.PCI0.MCHC._ADR correctly returned
> +method Test 185 of 201: Test _ADR (Return Unique ID for Device).
> +method PASSED: Test 185, \_SB_.PCI0.MCHC._ADR correctly returned
> method an integer.
> -method PASSED: Test 184, \_SB_.PCI0.PEGP._ADR correctly returned
> +method PASSED: Test 185, \_SB_.PCI0.PEGP._ADR correctly returned
> method an integer.
> -method PASSED: Test 184, \_SB_.PCI0.PEGP.VGA_._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.GFX0._ADR correctly returned
> +method PASSED: Test 185, \_SB_.PCI0.GFX0._ADR correctly returned
> method an integer.
> -method PASSED: Test 184, \_SB_.PCI0.GFX0.DD01._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.GFX0.DD01._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.GFX0.DD02._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.GFX0.DD02._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.GFX0.DD03._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.GFX0.DD03._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.GFX0.DD04._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.GFX0.DD04._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.GFX0.DD05._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.GFX0.DD05._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.HDEF._ADR correctly returned
> +method PASSED: Test 185, \_SB_.PCI0.HDEF._ADR correctly returned
> method an integer.
> -method PASSED: Test 184, \_SB_.PCI0.RP01._ADR correctly returned
> +method PASSED: Test 185, \_SB_.PCI0.RP01._ADR correctly returned
> method an integer.
> -method PASSED: Test 184, \_SB_.PCI0.RP01.PXSX._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.RP01.PXSX._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.RP02._ADR correctly returned
> +method PASSED: Test 185, \_SB_.PCI0.RP02._ADR correctly returned
> method an integer.
> -method PASSED: Test 184, \_SB_.PCI0.RP02.PXSX._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.RP02.PXSX._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.RP03._ADR correctly returned
> +method PASSED: Test 185, \_SB_.PCI0.RP03._ADR correctly returned
> method an integer.
> -method PASSED: Test 184, \_SB_.PCI0.RP03.PXSX._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.RP03.PXSX._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.RP04._ADR correctly returned
> +method PASSED: Test 185, \_SB_.PCI0.RP04._ADR correctly returned
> method an integer.
> -method PASSED: Test 184, \_SB_.PCI0.RP04.PXSX._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.RP04.PXSX._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.RP05._ADR correctly returned
> +method PASSED: Test 185, \_SB_.PCI0.RP05._ADR correctly returned
> method an integer.
> -method PASSED: Test 184, \_SB_.PCI0.RP05.PXSX._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.RP05.PXSX._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.RP06._ADR correctly returned
> +method PASSED: Test 185, \_SB_.PCI0.RP06._ADR correctly returned
> method an integer.
> -method PASSED: Test 184, \_SB_.PCI0.RP06.PXSX._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.RP06.PXSX._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.USB1._ADR correctly returned
> +method PASSED: Test 185, \_SB_.PCI0.USB1._ADR correctly returned
> method an integer.
> -method PASSED: Test 184, \_SB_.PCI0.USB2._ADR correctly returned
> +method PASSED: Test 185, \_SB_.PCI0.USB2._ADR correctly returned
> method an integer.
> -method PASSED: Test 184, \_SB_.PCI0.USB3._ADR correctly returned
> +method PASSED: Test 185, \_SB_.PCI0.USB3._ADR correctly returned
> method an integer.
> -method PASSED: Test 184, \_SB_.PCI0.USB4._ADR correctly returned
> +method PASSED: Test 185, \_SB_.PCI0.USB4._ADR correctly returned
> method an integer.
> -method PASSED: Test 184, \_SB_.PCI0.USB5._ADR correctly returned
> +method PASSED: Test 185, \_SB_.PCI0.USB5._ADR correctly returned
> method an integer.
> -method PASSED: Test 184, \_SB_.PCI0.EHC1._ADR correctly returned
> +method PASSED: Test 185, \_SB_.PCI0.EHC1._ADR correctly returned
> method an integer.
> -method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.EHC1.HUB7._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.EHC2._ADR correctly returned
> +method PASSED: Test 185, \_SB_.PCI0.EHC2._ADR correctly returned
> method an integer.
> -method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.EHC2.HUB7._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.PCIB._ADR correctly returned
> +method PASSED: Test 185, \_SB_.PCI0.PCIB._ADR correctly returned
> method an integer.
> -method PASSED: Test 184, \_SB_.PCI0.LPCB._ADR correctly returned
> +method PASSED: Test 185, \_SB_.PCI0.LPCB._ADR correctly returned
> method an integer.
> -method PASSED: Test 184, \_SB_.PCI0.PATA._ADR correctly returned
> +method PASSED: Test 185, \_SB_.PCI0.PATA._ADR correctly returned
> method an integer.
> -method PASSED: Test 184, \_SB_.PCI0.PATA.PRID._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.PATA.PRID._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.SATA._ADR correctly returned
> +method PASSED: Test 185, \_SB_.PCI0.SATA._ADR correctly returned
> method an integer.
> -method PASSED: Test 184, \_SB_.PCI0.SATA.PRT0._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.SATA.PRT0._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.SATA.PRT1._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.SATA.PRT1._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.SATA.PRT2._ADR correctly
> +method PASSED: Test 185, \_SB_.PCI0.SATA.PRT2._ADR correctly
> method returned an integer.
> -method PASSED: Test 184, \_SB_.PCI0.SBUS._ADR correctly returned
> +method PASSED: Test 185, \_SB_.PCI0.SBUS._ADR correctly returned
> method an integer.
> method
> -method Test 185 of 200: Test _BCL (Query List of Brightness
> +method Test 186 of 201: Test _BCL (Query List of Brightness
> method Control Levels Supported).
> method Brightness levels for \_SB_.PCI0.PEGP.VGA_.LCD_._BCL:
> method Level on full power : 70
> method Level on battery power: 40
> method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70
> -method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned
> +method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned
> method a sane package of 10 integers.
> method Brightness levels for \_SB_.PCI0.GFX0.DD03._BCL:
> method Level on full power : 70
> method Level on battery power: 40
> method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70
> -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD03._BCL returned a
> +method PASSED: Test 186, \_SB_.PCI0.GFX0.DD03._BCL returned a
> method sane package of 10 integers.
> method
> -method Test 186 of 200: Test _BCM (Set Brightness Level).
> -method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned
> +method Test 187 of 201: Test _BCM (Set Brightness Level).
> +method PASSED: Test 187, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned
> method no values as expected.
> -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD03._BCM returned no
> +method PASSED: Test 187, \_SB_.PCI0.GFX0.DD03._BCM returned no
> method values as expected.
> method
> -method Test 187 of 200: Test _BQC (Brightness Query Current
> +method Test 188 of 201: Test _BQC (Brightness Query Current
> method Level).
> -method PASSED: Test 187, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly
> +method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly
> method returned an integer.
> -method PASSED: Test 187, \_SB_.PCI0.GFX0.DD03._BQC correctly
> +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD03._BQC correctly
> method returned an integer.
> method
> -method Test 188 of 200: Test _DCS (Return the Status of Output
> +method Test 189 of 201: Test _DCS (Return the Status of Output
> method Device).
> -method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly
> +method PASSED: Test 189, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly
> method returned an integer.
> -method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly
> +method PASSED: Test 189, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly
> method returned an integer.
> -method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly
> +method PASSED: Test 189, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly
> method returned an integer.
> -method PASSED: Test 188, \_SB_.PCI0.GFX0.DD01._DCS correctly
> +method PASSED: Test 189, \_SB_.PCI0.GFX0.DD01._DCS correctly
> method returned an integer.
> -method PASSED: Test 188, \_SB_.PCI0.GFX0.DD02._DCS correctly
> +method PASSED: Test 189, \_SB_.PCI0.GFX0.DD02._DCS correctly
> method returned an integer.
> -method PASSED: Test 188, \_SB_.PCI0.GFX0.DD03._DCS correctly
> +method PASSED: Test 189, \_SB_.PCI0.GFX0.DD03._DCS correctly
> method returned an integer.
> -method PASSED: Test 188, \_SB_.PCI0.GFX0.DD04._DCS correctly
> +method PASSED: Test 189, \_SB_.PCI0.GFX0.DD04._DCS correctly
> method returned an integer.
> -method PASSED: Test 188, \_SB_.PCI0.GFX0.DD05._DCS correctly
> +method PASSED: Test 189, \_SB_.PCI0.GFX0.DD05._DCS correctly
> method returned an integer.
> method
> -method Test 189 of 200: Test _DDC (Return the EDID for this
> +method Test 190 of 201: Test _DDC (Return the EDID for this
> method Device).
> -method SKIPPED: Test 189, Skipping test for non-existent object
> +method SKIPPED: Test 190, Skipping test for non-existent object
> method _DDC.
> method
> -method Test 190 of 200: Test _DSS (Device Set State).
> -method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned
> +method Test 191 of 201: Test _DSS (Device Set State).
> +method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned
> method no values as expected.
> -method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned
> +method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned
> method no values as expected.
> -method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned
> +method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned
> method no values as expected.
> -method PASSED: Test 190, \_SB_.PCI0.GFX0.DD01._DSS returned no
> +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD01._DSS returned no
> method values as expected.
> -method PASSED: Test 190, \_SB_.PCI0.GFX0.DD02._DSS returned no
> +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD02._DSS returned no
> method values as expected.
> -method PASSED: Test 190, \_SB_.PCI0.GFX0.DD03._DSS returned no
> +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD03._DSS returned no
> method values as expected.
> -method PASSED: Test 190, \_SB_.PCI0.GFX0.DD04._DSS returned no
> +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD04._DSS returned no
> method values as expected.
> -method PASSED: Test 190, \_SB_.PCI0.GFX0.DD05._DSS returned no
> +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD05._DSS returned no
> method values as expected.
> method
> -method Test 191 of 200: Test _DGS (Query Graphics State).
> -method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly
> +method Test 192 of 201: Test _DGS (Query Graphics State).
> +method PASSED: Test 192, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly
> method returned an integer.
> -method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly
> +method PASSED: Test 192, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly
> method returned an integer.
> -method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly
> +method PASSED: Test 192, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly
> method returned an integer.
> -method PASSED: Test 191, \_SB_.PCI0.GFX0.DD01._DGS correctly
> +method PASSED: Test 192, \_SB_.PCI0.GFX0.DD01._DGS correctly
> method returned an integer.
> -method PASSED: Test 191, \_SB_.PCI0.GFX0.DD02._DGS correctly
> +method PASSED: Test 192, \_SB_.PCI0.GFX0.DD02._DGS correctly
> method returned an integer.
> -method PASSED: Test 191, \_SB_.PCI0.GFX0.DD03._DGS correctly
> +method PASSED: Test 192, \_SB_.PCI0.GFX0.DD03._DGS correctly
> method returned an integer.
> -method PASSED: Test 191, \_SB_.PCI0.GFX0.DD04._DGS correctly
> +method PASSED: Test 192, \_SB_.PCI0.GFX0.DD04._DGS correctly
> method returned an integer.
> -method PASSED: Test 191, \_SB_.PCI0.GFX0.DD05._DGS correctly
> +method PASSED: Test 192, \_SB_.PCI0.GFX0.DD05._DGS correctly
> method returned an integer.
> method
> -method Test 192 of 200: Test _DOD (Enumerate All Devices Attached
> +method Test 193 of 201: Test _DOD (Enumerate All Devices Attached
> method to Display Adapter).
> method Device 0:
> method Instance: 0
> @@ -1300,7 +1332,7 @@ method Type of display: 2 (TV/HDTV or other Analog-Video Moni
> method BIOS can detect device: 0
> method Non-VGA device: 0
> method Head or pipe ID: 0
> -method PASSED: Test 192, \_SB_.PCI0.PEGP.VGA_._DOD correctly
> +method PASSED: Test 193, \_SB_.PCI0.PEGP.VGA_._DOD correctly
> method returned a sane looking package.
> method Device 0:
> method Instance: 0
> @@ -1337,45 +1369,45 @@ method Type of display: 0 (Other)
> method BIOS can detect device: 1
> method Non-VGA device: 0
> method Head or pipe ID: 0
> -method PASSED: Test 192, \_SB_.PCI0.GFX0._DOD correctly returned
> +method PASSED: Test 193, \_SB_.PCI0.GFX0._DOD correctly returned
> method a sane looking package.
> method
> -method Test 193 of 200: Test _DOS (Enable/Disable Output
> +method Test 194 of 201: Test _DOS (Enable/Disable Output
> method Switching).
> -method PASSED: Test 193, \_SB_.PCI0.PEGP.VGA_._DOS returned no
> +method PASSED: Test 194, \_SB_.PCI0.PEGP.VGA_._DOS returned no
> method values as expected.
> -method PASSED: Test 193, \_SB_.PCI0.GFX0._DOS returned no values
> +method PASSED: Test 194, \_SB_.PCI0.GFX0._DOS returned no values
> method as expected.
> method
> -method Test 194 of 200: Test _GPD (Get POST Device).
> -method SKIPPED: Test 194, Skipping test for non-existent object
> +method Test 195 of 201: Test _GPD (Get POST Device).
> +method SKIPPED: Test 195, Skipping test for non-existent object
> method _GPD.
> method
> -method Test 195 of 200: Test _ROM (Get ROM Data).
> -method SKIPPED: Test 195, Skipping test for non-existent object
> +method Test 196 of 201: Test _ROM (Get ROM Data).
> +method SKIPPED: Test 196, Skipping test for non-existent object
> method _ROM.
> method
> -method Test 196 of 200: Test _SPD (Set POST Device).
> -method SKIPPED: Test 196, Skipping test for non-existent object
> +method Test 197 of 201: Test _SPD (Set POST Device).
> +method SKIPPED: Test 197, Skipping test for non-existent object
> method _SPD.
> method
> -method Test 197 of 200: Test _VPO (Video POST Options).
> -method SKIPPED: Test 197, Skipping test for non-existent object
> +method Test 198 of 201: Test _VPO (Video POST Options).
> +method SKIPPED: Test 198, Skipping test for non-existent object
> method _VPO.
> method
> -method Test 198 of 200: Test _CBA (Configuration Base Address).
> -method SKIPPED: Test 198, Skipping test for non-existent object
> +method Test 199 of 201: Test _CBA (Configuration Base Address).
> +method SKIPPED: Test 199, Skipping test for non-existent object
> method _CBA.
> method
> -method Test 199 of 200: Test _IFT (IPMI Interface Type).
> -method SKIPPED: Test 199, Skipping test for non-existent object
> +method Test 200 of 201: Test _IFT (IPMI Interface Type).
> +method SKIPPED: Test 200, Skipping test for non-existent object
> method _IFT.
> method
> -method Test 200 of 200: Test _SRV (IPMI Interface Revision).
> -method SKIPPED: Test 200, Skipping test for non-existent object
> +method Test 201 of 201: Test _SRV (IPMI Interface Revision).
> +method SKIPPED: Test 201, Skipping test for non-existent object
> method _SRV.
> method
> method ==========================================================
> -method 260 passed, 0 failed, 0 warning, 0 aborted, 162 skipped, 0
> +method 260 passed, 0 failed, 0 warning, 0 aborted, 172 skipped, 0
> method info only.
> method ==========================================================
>
Acked-by: Ivan Hu <ivan.hu at canonical.com>
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