[PATCH] acpi: sbbr: sync up with new SBBR tests
Alex Hung
alex.hung at canonical.com
Thu Aug 24 22:13:25 UTC 2017
Signed-off-by: Alex Hung <alex.hung at canonical.com>
---
fwts-test/dbg2-0001/dbg2-0001.log | 4 +-
fwts-test/dbg2-0001/dbg2-0002.log | 4 +-
fwts-test/method-0001/method-0001.log | 308 +++++++++++++++++-----------------
fwts-test/spcr-0001/spcr-0001.log | 6 +-
fwts-test/spcr-0001/spcr-0002.log | 6 +-
5 files changed, 170 insertions(+), 158 deletions(-)
diff --git a/fwts-test/dbg2-0001/dbg2-0001.log b/fwts-test/dbg2-0001/dbg2-0001.log
index 3e77c2c..dea2a17 100644
--- a/fwts-test/dbg2-0001/dbg2-0001.log
+++ b/fwts-test/dbg2-0001/dbg2-0001.log
@@ -1,6 +1,6 @@
dbg2 dbg2: DBG2 (Debug Port Table 2) test.
dbg2 ----------------------------------------------------------
-dbg2 Test 1 of 1: DBG2 (Debug Port Table 2) test.
+dbg2 Test 1 of 2: DBG2 (Debug Port Table 2) test.
dbg2 DBG2 Table:
dbg2 Info Offset: 0x0000002c
dbg2 Info Count: 0x00000001
@@ -28,6 +28,8 @@ dbg2 Address 0x00000000f18190a0
dbg2
dbg2 PASSED: Test 1, No issues found in DBG2 table.
dbg2
+dbg2 Test 2 of 2: DBG2 ARM SBSA Generic UART test,
+dbg2
dbg2 ==========================================================
dbg2 1 passed, 0 failed, 0 warning, 0 aborted, 0 skipped, 0
dbg2 info only.
diff --git a/fwts-test/dbg2-0001/dbg2-0002.log b/fwts-test/dbg2-0001/dbg2-0002.log
index 68be687..1907dc8 100644
--- a/fwts-test/dbg2-0001/dbg2-0002.log
+++ b/fwts-test/dbg2-0001/dbg2-0002.log
@@ -1,6 +1,6 @@
dbg2 dbg2: DBG2 (Debug Port Table 2) test.
dbg2 ----------------------------------------------------------
-dbg2 Test 1 of 1: DBG2 (Debug Port Table 2) test.
+dbg2 Test 1 of 2: DBG2 (Debug Port Table 2) test.
dbg2 DBG2 Table:
dbg2 Info Offset: 0x0000002c
dbg2 Info Count: 0x00000001
@@ -43,6 +43,8 @@ dbg2 FAILED [HIGH] DBG2TooShort: Test 1, DBG2 table too short,
dbg2 expecting 12394 bytes, instead got 107 bytes for a DBG2
dbg2 table and DBG2 Info Structure Address Size End
dbg2
+dbg2 Test 2 of 2: DBG2 ARM SBSA Generic UART test,
+dbg2
dbg2 ==========================================================
dbg2 0 passed, 8 failed, 0 warning, 0 aborted, 0 skipped, 0
dbg2 info only.
diff --git a/fwts-test/method-0001/method-0001.log b/fwts-test/method-0001/method-0001.log
index ae15b1a..99b4dd4 100644
--- a/fwts-test/method-0001/method-0001.log
+++ b/fwts-test/method-0001/method-0001.log
@@ -5,15 +5,15 @@ method Found 1061 Objects
method PASSED: Test 1, Method names contain legal characters.
method
method Test 2 of 193: Test _AEI.
-method SKIPPED: Test 2, Skipping test for non-existant object
+method SKIPPED: Test 2, Skipping test for non-existent object
method _AEI.
method
method Test 3 of 193: Test _EVT (Event Method).
-method SKIPPED: Test 3, Skipping test for non-existant object
+method SKIPPED: Test 3, Skipping test for non-existent object
method _EVT.
method
method Test 4 of 193: Test _DLM (Device Lock Mutex).
-method SKIPPED: Test 4, Skipping test for non-existant object
+method SKIPPED: Test 4, Skipping test for non-existent object
method _DLM.
method
method Test 5 of 193: Test _PIC (Inform AML of Interrupt Model).
@@ -28,7 +28,7 @@ method PASSED: Test 6, \_SB_.PCI0.LPCB.HPET._CID returned an
method integer 0x010cd041 (EISA ID PNP0C01).
method
method Test 7 of 193: Test _DDN (DOS Device Name).
-method SKIPPED: Test 7, Skipping test for non-existant object
+method SKIPPED: Test 7, Skipping test for non-existent object
method _DDN.
method
method Test 8 of 193: Test _HID (Hardware ID).
@@ -86,27 +86,27 @@ method PASSED: Test 8, \_SB_.PCI0.LPCB.PS2M._HID returned an
method integer 0x130fd041 (EISA ID PNP0F13).
method
method Test 9 of 193: Test _HRV (Hardware Revision Number).
-method SKIPPED: Test 9, Skipping test for non-existant object
+method SKIPPED: Test 9, Skipping test for non-existent object
method _HRV.
method
method Test 10 of 193: Test _MLS (Multiple Language String).
-method SKIPPED: Test 10, Skipping test for non-existant object
+method SKIPPED: Test 10, Skipping test for non-existent object
method _MLS.
method
method Test 11 of 193: Test _PLD (Physical Device Location).
-method SKIPPED: Test 11, Skipping test for non-existant object
+method SKIPPED: Test 11, Skipping test for non-existent object
method _PLD.
method
method Test 12 of 193: Test _SUB (Subsystem ID).
-method SKIPPED: Test 12, Skipping test for non-existant object
+method SKIPPED: Test 12, Skipping test for non-existent object
method _SUB.
method
method Test 13 of 193: Test _SUN (Slot User Number).
-method SKIPPED: Test 13, Skipping test for non-existant object
+method SKIPPED: Test 13, Skipping test for non-existent object
method _SUN.
method
method Test 14 of 193: Test _STR (String).
-method SKIPPED: Test 14, Skipping test for non-existant object
+method SKIPPED: Test 14, Skipping test for non-existent object
method _STR.
method
method Test 15 of 193: Test _UID (Unique ID).
@@ -136,7 +136,7 @@ method PASSED: Test 15, \_SB_.PCI0.LPCB.BAT1._UID correctly
method returned sane looking value 0x00000001.
method
method Test 16 of 193: Test _CDM (Clock Domain).
-method SKIPPED: Test 16, Skipping test for non-existant object
+method SKIPPED: Test 16, Skipping test for non-existent object
method _CDM.
method
method Test 17 of 193: Test _CRS (Current Resource Settings).
@@ -184,7 +184,7 @@ method PASSED: Test 17, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ
method Descriptor) looks sane.
method
method Test 18 of 193: Test _DSD (Device Specific Data).
-method SKIPPED: Test 18, Skipping test for non-existant object
+method SKIPPED: Test 18, Skipping test for non-existent object
method _DSD.
method
method Test 19 of 193: Test _DIS (Disable).
@@ -206,20 +206,20 @@ method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKH._DIS returned no
method values as expected.
method
method Test 20 of 193: Test _DMA (Direct Memory Access).
-method SKIPPED: Test 20, Skipping test for non-existant object
+method SKIPPED: Test 20, Skipping test for non-existent object
method _DMA.
method
method Test 21 of 193: Test _FIX (Fixed Register Resource
method Provider).
-method SKIPPED: Test 21, Skipping test for non-existant object
+method SKIPPED: Test 21, Skipping test for non-existent object
method _FIX.
method
method Test 22 of 193: Test _GSB (Global System Interrupt Base).
-method SKIPPED: Test 22, Skipping test for non-existant object
+method SKIPPED: Test 22, Skipping test for non-existent object
method _GSB.
method
method Test 23 of 193: Test _HPP (Hot Plug Parameters).
-method SKIPPED: Test 23, Skipping test for non-existant object
+method SKIPPED: Test 23, Skipping test for non-existent object
method _HPP.
method
method Test 24 of 193: Test _PRS (Possible Resource Settings).
@@ -261,43 +261,43 @@ method PASSED: Test 25, \_SB_.PCI0.PCIB._PRT correctly returned a
method sane looking package.
method
method Test 26 of 193: Test _PXM (Proximity).
-method SKIPPED: Test 26, Skipping test for non-existant object
+method SKIPPED: Test 26, Skipping test for non-existent object
method _PXM.
method
method Test 27 of 193: Test _CCA (Cache Coherency Attribute).
-method SKIPPED: Test 27, Skipping test for non-existant object
+method SKIPPED: Test 27, Skipping test for non-existent object
method _CCA.
method
method Test 28 of 193: Test _EDL (Eject Device List).
-method SKIPPED: Test 28, Skipping test for non-existant object
+method SKIPPED: Test 28, Skipping test for non-existent object
method _EDL.
method
method Test 29 of 193: Test _EJD (Ejection Dependent Device).
-method SKIPPED: Test 29, Skipping test for non-existant object
+method SKIPPED: Test 29, Skipping test for non-existent object
method _EJD.
method
method Test 30 of 193: Test _EJ0 (Eject).
-method SKIPPED: Test 30, Skipping test for non-existant object
+method SKIPPED: Test 30, Skipping test for non-existent object
method _EJ0.
method
method Test 31 of 193: Test _EJ1 (Eject).
-method SKIPPED: Test 31, Skipping test for non-existant object
+method SKIPPED: Test 31, Skipping test for non-existent object
method _EJ1.
method
method Test 32 of 193: Test _EJ2 (Eject).
-method SKIPPED: Test 32, Skipping test for non-existant object
+method SKIPPED: Test 32, Skipping test for non-existent object
method _EJ2.
method
method Test 33 of 193: Test _EJ3 (Eject).
-method SKIPPED: Test 33, Skipping test for non-existant object
+method SKIPPED: Test 33, Skipping test for non-existent object
method _EJ3.
method
method Test 34 of 193: Test _EJ4 (Eject).
-method SKIPPED: Test 34, Skipping test for non-existant object
+method SKIPPED: Test 34, Skipping test for non-existent object
method _EJ4.
method
method Test 35 of 193: Test _LCK (Lock).
-method SKIPPED: Test 35, Skipping test for non-existant object
+method SKIPPED: Test 35, Skipping test for non-existent object
method _LCK.
method
method Test 36 of 193: Test _RMV (Remove).
@@ -330,23 +330,23 @@ method returned sane looking value 0x0000001f.
method
method Test 38 of 193: Test _DEP (Operational Region
method Dependencies).
-method SKIPPED: Test 38, Skipping test for non-existant object
+method SKIPPED: Test 38, Skipping test for non-existent object
method _DEP.
method
method Test 39 of 193: Test _FIT (Firmware Interface Table).
-method SKIPPED: Test 39, Skipping test for non-existant object
+method SKIPPED: Test 39, Skipping test for non-existent object
method _FIT.
method
method Test 40 of 193: Test _BDN (BIOS Dock Name).
-method SKIPPED: Test 40, Skipping test for non-existant object
+method SKIPPED: Test 40, Skipping test for non-existent object
method _BDN.
method
method Test 41 of 193: Test _BBN (Base Bus Number).
-method SKIPPED: Test 41, Skipping test for non-existant object
+method SKIPPED: Test 41, Skipping test for non-existent object
method _BBN.
method
method Test 42 of 193: Test _DCK (Dock).
-method SKIPPED: Test 42, Skipping test for non-existant object
+method SKIPPED: Test 42, Skipping test for non-existent object
method _DCK.
method
method Test 43 of 193: Test _INI (Initialize).
@@ -354,52 +354,52 @@ method PASSED: Test 43, \_SB_._INI returned no values as
method expected.
method
method Test 44 of 193: Test _GLK (Global Lock).
-method SKIPPED: Test 44, Skipping test for non-existant object
+method SKIPPED: Test 44, Skipping test for non-existent object
method _GLK.
method
method Test 45 of 193: Test _SEG (Segment).
-method SKIPPED: Test 45, Skipping test for non-existant object
+method SKIPPED: Test 45, Skipping test for non-existent object
method _SEG.
method
method Test 46 of 193: Test _LSI (Label Storage Information).
-method SKIPPED: Test 46, Skipping test for non-existant object
+method SKIPPED: Test 46, Skipping test for non-existent object
method _LSI.
method
method Test 47 of 193: Test _OFF (Set resource off).
-method SKIPPED: Test 47, Skipping test for non-existant object
+method SKIPPED: Test 47, Skipping test for non-existent object
method _OFF.
method
method Test 48 of 193: Test _ON_ (Set resource on).
-method SKIPPED: Test 48, Skipping test for non-existant object
+method SKIPPED: Test 48, Skipping test for non-existent object
method _ON_.
method
method Test 49 of 193: Test _DSW (Device Sleep Wake).
-method SKIPPED: Test 49, Skipping test for non-existant object
+method SKIPPED: Test 49, Skipping test for non-existent object
method _DSW.
method
method Test 50 of 193: Test _IRC (In Rush Current).
-method SKIPPED: Test 50, Skipping test for non-existant object
+method SKIPPED: Test 50, Skipping test for non-existent object
method _IRC.
method
method Test 51 of 193: Test _PRE (Power Resources for
method Enumeration).
-method SKIPPED: Test 51, Skipping test for non-existant object
+method SKIPPED: Test 51, Skipping test for non-existent object
method _PRE.
method
method Test 52 of 193: Test _PR0 (Power Resources for D0).
-method SKIPPED: Test 52, Skipping test for non-existant object
+method SKIPPED: Test 52, Skipping test for non-existent object
method _PR0.
method
method Test 53 of 193: Test _PR1 (Power Resources for D1).
-method SKIPPED: Test 53, Skipping test for non-existant object
+method SKIPPED: Test 53, Skipping test for non-existent object
method _PR1.
method
method Test 54 of 193: Test _PR2 (Power Resources for D2).
-method SKIPPED: Test 54, Skipping test for non-existant object
+method SKIPPED: Test 54, Skipping test for non-existent object
method _PR2.
method
method Test 55 of 193: Test _PR3 (Power Resources for D3).
-method SKIPPED: Test 55, Skipping test for non-existant object
+method SKIPPED: Test 55, Skipping test for non-existent object
method _PR3.
method
method Test 56 of 193: Test _PRW (Power Resources for Wake).
@@ -432,7 +432,7 @@ method PASSED: Test 58, \_SB_.PCI0.PEGP.VGA_._PS1 returned no
method values as expected.
method
method Test 59 of 193: Test _PS2 (Power State 2).
-method SKIPPED: Test 59, Skipping test for non-existant object
+method SKIPPED: Test 59, Skipping test for non-existent object
method _PS2.
method
method Test 60 of 193: Test _PS3 (Power State 3).
@@ -446,7 +446,7 @@ method returned an integer.
method PASSED: Test 61, \_PSC correctly returned an integer.
method
method Test 62 of 193: Test _PSE (Power State for Enumeration).
-method SKIPPED: Test 62, Skipping test for non-existant object
+method SKIPPED: Test 62, Skipping test for non-existent object
method _PSE.
method
method Test 63 of 193: Test _PSW (Power State Wake).
@@ -462,11 +462,11 @@ method PASSED: Test 63, \_SB_.PCI0.USB5._PSW returned no values
method as expected.
method
method Test 64 of 193: Test _S1D (S1 Device State).
-method SKIPPED: Test 64, Skipping test for non-existant object
+method SKIPPED: Test 64, Skipping test for non-existent object
method _S1D.
method
method Test 65 of 193: Test _S2D (S2 Device State).
-method SKIPPED: Test 65, Skipping test for non-existant object
+method SKIPPED: Test 65, Skipping test for non-existent object
method _S2D.
method
method Test 66 of 193: Test _S3D (S3 Device State).
@@ -506,31 +506,31 @@ method PASSED: Test 67, \_SB_.PCI0.EHC2._S4D correctly returned
method an integer.
method
method Test 68 of 193: Test _S0W (S0 Device Wake State).
-method SKIPPED: Test 68, Skipping test for non-existant object
+method SKIPPED: Test 68, Skipping test for non-existent object
method _S0W.
method
method Test 69 of 193: Test _S1W (S1 Device Wake State).
-method SKIPPED: Test 69, Skipping test for non-existant object
+method SKIPPED: Test 69, Skipping test for non-existent object
method _S1W.
method
method Test 70 of 193: Test _S2W (S2 Device Wake State).
-method SKIPPED: Test 70, Skipping test for non-existant object
+method SKIPPED: Test 70, Skipping test for non-existent object
method _S2W.
method
method Test 71 of 193: Test _S3W (S3 Device Wake State).
-method SKIPPED: Test 71, Skipping test for non-existant object
+method SKIPPED: Test 71, Skipping test for non-existent object
method _S3W.
method
method Test 72 of 193: Test _S4W (S4 Device Wake State).
-method SKIPPED: Test 72, Skipping test for non-existant object
+method SKIPPED: Test 72, Skipping test for non-existent object
method _S4W.
method
method Test 73 of 193: Test _RST (Device Reset).
-method SKIPPED: Test 73, Skipping test for non-existant object
+method SKIPPED: Test 73, Skipping test for non-existent object
method _RST.
method
method Test 74 of 193: Test _PRR (Power Resource for Reset).
-method SKIPPED: Test 74, Skipping test for non-existant object
+method SKIPPED: Test 74, Skipping test for non-existent object
method _PRR.
method
method Test 75 of 193: Test _S0_ (S0 System State).
@@ -540,11 +540,11 @@ method PASSED: Test 75, \_S0_ correctly returned a sane looking
method package.
method
method Test 76 of 193: Test _S1_ (S1 System State).
-method SKIPPED: Test 76, Skipping test for non-existant object
+method SKIPPED: Test 76, Skipping test for non-existent object
method _S1_.
method
method Test 77 of 193: Test _S2_ (S2 System State).
-method SKIPPED: Test 77, Skipping test for non-existant object
+method SKIPPED: Test 77, Skipping test for non-existent object
method _S2_.
method
method Test 78 of 193: Test _S3_ (S3 System State).
@@ -566,45 +566,45 @@ method PASSED: Test 80, \_S5_ correctly returned a sane looking
method package.
method
method Test 81 of 193: Test _SWS (System Wake Source).
-method SKIPPED: Test 81, Skipping test for non-existant object
+method SKIPPED: Test 81, Skipping test for non-existent object
method _SWS.
method
method Test 82 of 193: Test _PSS (Performance Supported States).
-method SKIPPED: Test 82, Skipping test for non-existant object
+method SKIPPED: Test 82, Skipping test for non-existent object
method _PSS.
method
method Test 83 of 193: Test _CPC (Continuous Performance
method Control).
-method SKIPPED: Test 83, Skipping test for non-existant object
+method SKIPPED: Test 83, Skipping test for non-existent object
method _CPC.
method
method Test 84 of 193: Test _CSD (C State Dependencies).
-method SKIPPED: Test 84, Skipping test for non-existant object
+method SKIPPED: Test 84, Skipping test for non-existent object
method _CSD.
method
method Test 85 of 193: Test _CST (C States).
-method SKIPPED: Test 85, Skipping test for non-existant object
+method SKIPPED: Test 85, Skipping test for non-existent object
method _CST.
method
method Test 86 of 193: Test _PCT (Performance Control).
-method SKIPPED: Test 86, Skipping test for non-existant object
+method SKIPPED: Test 86, Skipping test for non-existent object
method _PCT.
method
method Test 87 of 193: Test _PDL (P-State Depth Limit).
-method SKIPPED: Test 87, Skipping test for non-existant object
+method SKIPPED: Test 87, Skipping test for non-existent object
method _PDL.
method
method Test 88 of 193: Test _PPC (Performance Present
method Capabilities).
-method SKIPPED: Test 88, Skipping test for non-existant object
+method SKIPPED: Test 88, Skipping test for non-existent object
method _PPC.
method
method Test 89 of 193: Test _PPE (Polling for Platform Error).
-method SKIPPED: Test 89, Skipping test for non-existant object
+method SKIPPED: Test 89, Skipping test for non-existent object
method _PPE.
method
method Test 90 of 193: Test _PSD (Power State Dependencies).
-method SKIPPED: Test 90, Skipping test for non-existant object
+method SKIPPED: Test 90, Skipping test for non-existent object
method _PSD.
method
method Test 91 of 193: Test _PTC (Processor Throttling Control).
@@ -614,7 +614,7 @@ method PASSED: Test 91, \_PR_.CPU1._PTC correctly returned a sane
method looking package.
method
method Test 92 of 193: Test _TDL (T-State Depth Limit).
-method SKIPPED: Test 92, Skipping test for non-existant object
+method SKIPPED: Test 92, Skipping test for non-existent object
method _TDL.
method
method Test 93 of 193: Test _TPC (Throttling Present
@@ -659,45 +659,45 @@ method PASSED: Test 95, \_PR_.CPU1._TSS correctly returned a sane
method looking package.
method
method Test 96 of 193: Test _LPI (Low Power Idle States).
-method SKIPPED: Test 96, Skipping test for non-existant object
+method SKIPPED: Test 96, Skipping test for non-existent object
method _LPI.
method
method Test 97 of 193: Test _RDI (Resource Dependencies for
method Idle).
-method SKIPPED: Test 97, Skipping test for non-existant object
+method SKIPPED: Test 97, Skipping test for non-existent object
method _RDI.
method
method Test 98 of 193: Test _PUR (Processor Utilization Request).
-method SKIPPED: Test 98, Skipping test for non-existant object
+method SKIPPED: Test 98, Skipping test for non-existent object
method _PUR.
method
method Test 99 of 193: Test _MSG (Message).
-method SKIPPED: Test 99, Skipping test for non-existant object
+method SKIPPED: Test 99, Skipping test for non-existent object
method _MSG.
method
method Test 100 of 193: Test _SST (System Status).
-method SKIPPED: Test 100, Skipping test for non-existant object
+method SKIPPED: Test 100, Skipping test for non-existent object
method _SST.
method
method Test 101 of 193: Test _ALC (Ambient Light Colour
method Chromaticity).
-method SKIPPED: Test 101, Skipping test for non-existant object
+method SKIPPED: Test 101, Skipping test for non-existent object
method _ALC.
method
method Test 102 of 193: Test _ALI (Ambient Light Illuminance).
-method SKIPPED: Test 102, Skipping test for non-existant object
+method SKIPPED: Test 102, Skipping test for non-existent object
method _ALI.
method
method Test 103 of 193: Test _ALT (Ambient Light Temperature).
-method SKIPPED: Test 103, Skipping test for non-existant object
+method SKIPPED: Test 103, Skipping test for non-existent object
method _ALT.
method
method Test 104 of 193: Test _ALP (Ambient Light Polling).
-method SKIPPED: Test 104, Skipping test for non-existant object
+method SKIPPED: Test 104, Skipping test for non-existent object
method _ALP.
method
method Test 105 of 193: Test _ALR (Ambient Light Response).
-method SKIPPED: Test 105, Skipping test for non-existant object
+method SKIPPED: Test 105, Skipping test for non-existent object
method _ALR.
method
method Test 106 of 193: Test _LID (Lid Status).
@@ -722,60 +722,60 @@ method returned a sane looking buffer.
method
method Test 109 of 193: Test _MBM (Memory Bandwidth Monitoring
method Data).
-method SKIPPED: Test 109, Skipping test for non-existant object
+method SKIPPED: Test 109, Skipping test for non-existent object
method _MBM.
method
method Test 110 of 193: Test _UPC (USB Port Capabilities).
-method SKIPPED: Test 110, Skipping test for non-existant object
+method SKIPPED: Test 110, Skipping test for non-existent object
method _UPC.
method
method Test 111 of 193: Test _UPD (User Presence Detect).
-method SKIPPED: Test 111, Skipping test for non-existant object
+method SKIPPED: Test 111, Skipping test for non-existent object
method _UPD.
method
method Test 112 of 193: Test _UPP (User Presence Polling).
-method SKIPPED: Test 112, Skipping test for non-existant object
+method SKIPPED: Test 112, Skipping test for non-existent object
method _UPP.
method
method Test 113 of 193: Test _GCP (Get Capabilities).
-method SKIPPED: Test 113, Skipping test for non-existant object
+method SKIPPED: Test 113, Skipping test for non-existent object
method _GCP.
method
method Test 114 of 193: Test _GRT (Get Real Time).
-method SKIPPED: Test 114, Skipping test for non-existant object
+method SKIPPED: Test 114, Skipping test for non-existent object
method _GRT.
method
method Test 115 of 193: Test _GWS (Get Wake Status).
-method SKIPPED: Test 115, Skipping test for non-existant object
+method SKIPPED: Test 115, Skipping test for non-existent object
method _GWS.
method
method Test 116 of 193: Test _CWS (Clear Wake Status).
-method SKIPPED: Test 116, Skipping test for non-existant object
+method SKIPPED: Test 116, Skipping test for non-existent object
method _CWS.
method
method Test 117 of 193: Test _STP (Set Expired Timer Wake
method Policy).
-method SKIPPED: Test 117, Skipping test for non-existant object
+method SKIPPED: Test 117, Skipping test for non-existent object
method _STP.
method
method Test 118 of 193: Test _STV (Set Timer Value).
-method SKIPPED: Test 118, Skipping test for non-existant object
+method SKIPPED: Test 118, Skipping test for non-existent object
method _STV.
method
method Test 119 of 193: Test _TIP (Expired Timer Wake Policy).
-method SKIPPED: Test 119, Skipping test for non-existant object
+method SKIPPED: Test 119, Skipping test for non-existent object
method _TIP.
method
method Test 120 of 193: Test _TIV (Timer Values).
-method SKIPPED: Test 120, Skipping test for non-existant object
+method SKIPPED: Test 120, Skipping test for non-existent object
method _TIV.
method
method Test 121 of 193: Test _SBS (Smart Battery Subsystem).
-method SKIPPED: Test 121, Skipping test for non-existant object
+method SKIPPED: Test 121, Skipping test for non-existent object
method _SBS.
method
method Test 122 of 193: Test _BCT (Battery Charge Time).
-method SKIPPED: Test 122, Skipping test for non-existant object
+method SKIPPED: Test 122, Skipping test for non-existent object
method _BCT.
method
method Test 123 of 193: Test _BIF (Battery Information).
@@ -783,25 +783,25 @@ method PASSED: Test 123, \_SB_.PCI0.LPCB.BAT1._BIF correctly
method returned a sane looking package.
method
method Test 124 of 193: Test _BIX (Battery Information Extended).
-method SKIPPED: Test 124, Skipping test for non-existant object
+method SKIPPED: Test 124, Skipping test for non-existent object
method _BIX.
method
method Test 125 of 193: Test _BMA (Battery Measurement
method Averaging).
-method SKIPPED: Test 125, Skipping test for non-existant object
+method SKIPPED: Test 125, Skipping test for non-existent object
method _BMA.
method
method Test 126 of 193: Test _BMC (Battery Maintenance Control).
-method SKIPPED: Test 126, Skipping test for non-existant object
+method SKIPPED: Test 126, Skipping test for non-existent object
method _BMC.
method
method Test 127 of 193: Test _BMD (Battery Maintenance Data).
-method SKIPPED: Test 127, Skipping test for non-existant object
+method SKIPPED: Test 127, Skipping test for non-existent object
method _BMD.
method
method Test 128 of 193: Test _BMS (Battery Measurement Sampling
method Time).
-method SKIPPED: Test 128, Skipping test for non-existant object
+method SKIPPED: Test 128, Skipping test for non-existent object
method _BMS.
method
method Test 129 of 193: Test _BST (Battery Status).
@@ -809,15 +809,15 @@ method PASSED: Test 129, \_SB_.PCI0.LPCB.BAT1._BST correctly
method returned a sane looking package.
method
method Test 130 of 193: Test _BTP (Battery Trip Point).
-method SKIPPED: Test 130, Skipping test for non-existant object
+method SKIPPED: Test 130, Skipping test for non-existent object
method _BTP.
method
method Test 131 of 193: Test _BTH (Battery Throttle Limit).
-method SKIPPED: Test 131, Skipping test for non-existant object
+method SKIPPED: Test 131, Skipping test for non-existent object
method _BTH.
method
method Test 132 of 193: Test _BTM (Battery Time).
-method SKIPPED: Test 132, Skipping test for non-existant object
+method SKIPPED: Test 132, Skipping test for non-existent object
method _BTM.
method
method Test 133 of 193: Test _PCL (Power Consumer List).
@@ -827,11 +827,11 @@ method PASSED: Test 133, \_SB_.PCI0.LPCB.BAT1._PCL returned a
method sane package of 1 references.
method
method Test 134 of 193: Test _PIF (Power Source Information).
-method SKIPPED: Test 134, Skipping test for non-existant object
+method SKIPPED: Test 134, Skipping test for non-existent object
method _PIF.
method
method Test 135 of 193: Test _PRL (Power Source Redundancy List).
-method SKIPPED: Test 135, Skipping test for non-existant object
+method SKIPPED: Test 135, Skipping test for non-existent object
method _PRL.
method
method Test 136 of 193: Test _PSR (Power Source).
@@ -839,173 +839,173 @@ method PASSED: Test 136, \_SB_.PCI0.LPCB.ACAD._PSR correctly
method returned sane looking value 0x00000000.
method
method Test 137 of 193: Test _GAI (Get Averaging Level).
-method SKIPPED: Test 137, Skipping test for non-existant object
+method SKIPPED: Test 137, Skipping test for non-existent object
method _GAI.
method
method Test 138 of 193: Test _GHL (Get Harware Limit).
-method SKIPPED: Test 138, Skipping test for non-existant object
+method SKIPPED: Test 138, Skipping test for non-existent object
method _GHL.
method
method Test 139 of 193: Test _PMC (Power Meter Capabilities).
-method SKIPPED: Test 139, Skipping test for non-existant object
+method SKIPPED: Test 139, Skipping test for non-existent object
method _PMC.
method
method Test 140 of 193: Test _PMD (Power Meter Devices).
-method SKIPPED: Test 140, Skipping test for non-existant object
+method SKIPPED: Test 140, Skipping test for non-existent object
method _PMD.
method
method Test 141 of 193: Test _PMM (Power Meter Measurement).
-method SKIPPED: Test 141, Skipping test for non-existant object
+method SKIPPED: Test 141, Skipping test for non-existent object
method _PMM.
method
method Test 142 of 193: Test _WPC (Wireless Power Calibration).
-method SKIPPED: Test 142, Skipping test for non-existant object
+method SKIPPED: Test 142, Skipping test for non-existent object
method _WPC.
method
method Test 143 of 193: Test _WPP (Wireless Power Polling).
-method SKIPPED: Test 143, Skipping test for non-existant object
+method SKIPPED: Test 143, Skipping test for non-existent object
method _WPP.
method
method Test 144 of 193: Test _FIF (Fan Information).
-method SKIPPED: Test 144, Skipping test for non-existant object
+method SKIPPED: Test 144, Skipping test for non-existent object
method _FIF.
method
method Test 145 of 193: Test _FPS (Fan Performance States).
-method SKIPPED: Test 145, Skipping test for non-existant object
+method SKIPPED: Test 145, Skipping test for non-existent object
method _FPS.
method
method Test 146 of 193: Test _FSL (Fan Set Level).
-method SKIPPED: Test 146, Skipping test for non-existant object
+method SKIPPED: Test 146, Skipping test for non-existent object
method _FSL.
method
method Test 147 of 193: Test _FST (Fan Status).
-method SKIPPED: Test 147, Skipping test for non-existant object
+method SKIPPED: Test 147, Skipping test for non-existent object
method _FST.
method
method Test 148 of 193: Test _ACx (Active Cooling).
-method SKIPPED: Test 148, Skipping test for non-existant object
+method SKIPPED: Test 148, Skipping test for non-existent object
method _AC0.
method
-method SKIPPED: Test 148, Skipping test for non-existant object
+method SKIPPED: Test 148, Skipping test for non-existent object
method _AC1.
method
-method SKIPPED: Test 148, Skipping test for non-existant object
+method SKIPPED: Test 148, Skipping test for non-existent object
method _AC2.
method
-method SKIPPED: Test 148, Skipping test for non-existant object
+method SKIPPED: Test 148, Skipping test for non-existent object
method _AC3.
method
-method SKIPPED: Test 148, Skipping test for non-existant object
+method SKIPPED: Test 148, Skipping test for non-existent object
method _AC4.
method
-method SKIPPED: Test 148, Skipping test for non-existant object
+method SKIPPED: Test 148, Skipping test for non-existent object
method _AC5.
method
-method SKIPPED: Test 148, Skipping test for non-existant object
+method SKIPPED: Test 148, Skipping test for non-existent object
method _AC6.
method
-method SKIPPED: Test 148, Skipping test for non-existant object
+method SKIPPED: Test 148, Skipping test for non-existent object
method _AC7.
method
-method SKIPPED: Test 148, Skipping test for non-existant object
+method SKIPPED: Test 148, Skipping test for non-existent object
method _AC8.
method
-method SKIPPED: Test 148, Skipping test for non-existant object
+method SKIPPED: Test 148, Skipping test for non-existent object
method _AC9.
method
method
method Test 149 of 193: Test _ART (Active Cooling Relationship
method Table).
-method SKIPPED: Test 149, Skipping test for non-existant object
+method SKIPPED: Test 149, Skipping test for non-existent object
method _ART.
method
method Test 150 of 193: Test _CRT (Critical Trip Point).
-method SKIPPED: Test 150, Skipping test for non-existant object
+method SKIPPED: Test 150, Skipping test for non-existent object
method _CRT.
method
method Test 151 of 193: Test _CR3 (Warm/Standby Temperature).
-method SKIPPED: Test 151, Skipping test for non-existant object
+method SKIPPED: Test 151, Skipping test for non-existent object
method _CR3.
method
method Test 152 of 193: Test _DTI (Device Temperature
method Indication).
-method SKIPPED: Test 152, Skipping test for non-existant object
+method SKIPPED: Test 152, Skipping test for non-existent object
method _DTI.
method
method Test 153 of 193: Test _HOT (Hot Temperature).
-method SKIPPED: Test 153, Skipping test for non-existant object
+method SKIPPED: Test 153, Skipping test for non-existent object
method _HOT.
method
method Test 154 of 193: Test _MTL (Minimum Throttle Limit).
-method SKIPPED: Test 154, Skipping test for non-existant object
+method SKIPPED: Test 154, Skipping test for non-existent object
method _MTL.
method
method Test 155 of 193: Test _NTT (Notification Temp Threshold).
-method SKIPPED: Test 155, Skipping test for non-existant object
+method SKIPPED: Test 155, Skipping test for non-existent object
method _NTT.
method
method Test 156 of 193: Test _PSL (Passive List).
-method SKIPPED: Test 156, Skipping test for non-existant object
+method SKIPPED: Test 156, Skipping test for non-existent object
method _PSL.
method
method Test 157 of 193: Test _PSV (Passive Temp).
-method SKIPPED: Test 157, Skipping test for non-existant object
+method SKIPPED: Test 157, Skipping test for non-existent object
method _PSV.
method
method Test 158 of 193: Test _RTV (Relative Temp Values).
-method SKIPPED: Test 158, Skipping test for non-existant object
+method SKIPPED: Test 158, Skipping test for non-existent object
method _RTV.
method
method Test 159 of 193: Test _SCP (Set Cooling Policy).
-method SKIPPED: Test 159, Skipping test for non-existant object
+method SKIPPED: Test 159, Skipping test for non-existent object
method _DTI.
method
method Test 160 of 193: Test _TC1 (Thermal Constant 1).
-method SKIPPED: Test 160, Skipping test for non-existant object
+method SKIPPED: Test 160, Skipping test for non-existent object
method _TC1.
method
method Test 161 of 193: Test _TC2 (Thermal Constant 2).
-method SKIPPED: Test 161, Skipping test for non-existant object
+method SKIPPED: Test 161, Skipping test for non-existent object
method _TC2.
method
method Test 162 of 193: Test _TFP (Thermal fast Sampling Period).
-method SKIPPED: Test 162, Skipping test for non-existant object
+method SKIPPED: Test 162, Skipping test for non-existent object
method _TFP.
method
method Test 163 of 193: Test _TMP (Thermal Zone Current Temp).
-method SKIPPED: Test 163, Skipping test for non-existant object
+method SKIPPED: Test 163, Skipping test for non-existent object
method _TMP.
method
method Test 164 of 193: Test _TPT (Trip Point Temperature).
-method SKIPPED: Test 164, Skipping test for non-existant object
+method SKIPPED: Test 164, Skipping test for non-existent object
method _TPT.
method
method Test 165 of 193: Test _TRT (Thermal Relationship Table).
-method SKIPPED: Test 165, Skipping test for non-existant object
+method SKIPPED: Test 165, Skipping test for non-existent object
method _TRT.
method
method Test 166 of 193: Test _TSN (Thermal Sensor Device).
-method SKIPPED: Test 166, Skipping test for non-existant object
+method SKIPPED: Test 166, Skipping test for non-existent object
method _TSN.
method
method Test 167 of 193: Test _TSP (Thermal Sampling Period).
-method SKIPPED: Test 167, Skipping test for non-existant object
+method SKIPPED: Test 167, Skipping test for non-existent object
method _TSP.
method
method Test 168 of 193: Test _TST (Temperature Sensor Threshold).
-method SKIPPED: Test 168, Skipping test for non-existant object
+method SKIPPED: Test 168, Skipping test for non-existent object
method _TST.
method
method Test 169 of 193: Test _TZD (Thermal Zone Devices).
-method SKIPPED: Test 169, Skipping test for non-existant object
+method SKIPPED: Test 169, Skipping test for non-existent object
method _TZD.
method
method Test 170 of 193: Test _TZM (Thermal Zone member).
-method SKIPPED: Test 170, Skipping test for non-existant object
+method SKIPPED: Test 170, Skipping test for non-existent object
method _TZM.
method
method Test 171 of 193: Test _TZP (Thermal Zone Polling).
-method SKIPPED: Test 171, Skipping test for non-existant object
+method SKIPPED: Test 171, Skipping test for non-existent object
method _TZP.
method
method Test 172 of 193: Test _GPE (General Purpose Events).
@@ -1013,7 +1013,7 @@ method PASSED: Test 172, \_SB_.PCI0.LPCB.EC0_._GPE returned an
method integer 0x0000001c
method
method Test 173 of 193: Test _EC_ (EC Offset Query).
-method SKIPPED: Test 173, Skipping test for non-existant object
+method SKIPPED: Test 173, Skipping test for non-existent object
method _EC_.
method
method Test 174 of 193: Test _PTS (Prepare to Sleep).
@@ -1206,7 +1206,7 @@ method returned an integer.
method
method Test 182 of 193: Test _DDC (Return the EDID for this
method Device).
-method SKIPPED: Test 182, Skipping test for non-existant object
+method SKIPPED: Test 182, Skipping test for non-existent object
method _DDC.
method
method Test 183 of 193: Test _DSS (Device Set State).
@@ -1316,31 +1316,31 @@ method PASSED: Test 186, \_SB_.PCI0.GFX0._DOS returned no values
method as expected.
method
method Test 187 of 193: Test _GPD (Get POST Device).
-method SKIPPED: Test 187, Skipping test for non-existant object
+method SKIPPED: Test 187, Skipping test for non-existent object
method _GPD.
method
method Test 188 of 193: Test _ROM (Get ROM Data).
-method SKIPPED: Test 188, Skipping test for non-existant object
+method SKIPPED: Test 188, Skipping test for non-existent object
method _ROM.
method
method Test 189 of 193: Test _SPD (Set POST Device).
-method SKIPPED: Test 189, Skipping test for non-existant object
+method SKIPPED: Test 189, Skipping test for non-existent object
method _SPD.
method
method Test 190 of 193: Test _VPO (Video POST Options).
-method SKIPPED: Test 190, Skipping test for non-existant object
+method SKIPPED: Test 190, Skipping test for non-existent object
method _VPO.
method
method Test 191 of 193: Test _CBA (Configuration Base Address).
-method SKIPPED: Test 191, Skipping test for non-existant object
+method SKIPPED: Test 191, Skipping test for non-existent object
method _CBA.
method
method Test 192 of 193: Test _IFT (IPMI Interface Type).
-method SKIPPED: Test 192, Skipping test for non-existant object
+method SKIPPED: Test 192, Skipping test for non-existent object
method _IFT.
method
method Test 193 of 193: Test _SRV (IPMI Interface Revision).
-method SKIPPED: Test 193, Skipping test for non-existant object
+method SKIPPED: Test 193, Skipping test for non-existent object
method _SRV.
method
method ==========================================================
diff --git a/fwts-test/spcr-0001/spcr-0001.log b/fwts-test/spcr-0001/spcr-0001.log
index 9bc5d03..5dca60d 100644
--- a/fwts-test/spcr-0001/spcr-0001.log
+++ b/fwts-test/spcr-0001/spcr-0001.log
@@ -1,12 +1,16 @@
spcr spcr: SPCR Serial Port Console Redirection Table test.
spcr ----------------------------------------------------------
-spcr Test 1 of 1: SPCR Serial Port Console Redirection Table
+spcr Test 1 of 3: SPCR Serial Port Console Redirection Table
spcr test.
spcr Serial Interface: 16550 compatible
spcr Baud Rate: 9600
spcr Terminal Type: ANSI
spcr PASSED: Test 1, No issues found in SPCR table.
spcr
+spcr Test 2 of 3: SPCR Revision Test.
+spcr
+spcr Test 3 of 3: SPCR GSIV Interrupt Test.
+spcr
spcr ==========================================================
spcr 1 passed, 0 failed, 0 warning, 0 aborted, 0 skipped, 0
spcr info only.
diff --git a/fwts-test/spcr-0001/spcr-0002.log b/fwts-test/spcr-0001/spcr-0002.log
index ea2ebe1..437a4f9 100644
--- a/fwts-test/spcr-0001/spcr-0002.log
+++ b/fwts-test/spcr-0001/spcr-0002.log
@@ -1,6 +1,6 @@
spcr spcr: SPCR Serial Port Console Redirection Table test.
spcr ----------------------------------------------------------
-spcr Test 1 of 1: SPCR Serial Port Console Redirection Table
+spcr Test 1 of 3: SPCR Serial Port Console Redirection Table
spcr test.
spcr Serial Interface: Reserved (Do not Use)
spcr FAILED [HIGH] SPCRInterfaceReserved: Test 1, SPCR Serial
@@ -18,6 +18,10 @@ spcr is 0xffff, expecting non-0xffff for non-PCI device
spcr FAILED [HIGH] SPCRPciFlagsBit0: Test 1, SPCR PCI flags
spcr compatibility bit 0 is 0, expecting 1 for PCI device
spcr
+spcr Test 2 of 3: SPCR Revision Test.
+spcr
+spcr Test 3 of 3: SPCR GSIV Interrupt Test.
+spcr
spcr ==========================================================
spcr 0 passed, 6 failed, 0 warning, 0 aborted, 0 skipped, 0
spcr info only.
--
2.7.4
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