ACK: [PATCH] fwts-test: remove arg-show-tests and arg-show-tests-full
ivanhu
ivan.hu at canonical.com
Thu Jul 7 02:38:24 UTC 2016
On 2016年07月06日 15:51, Colin King wrote:
> From: Colin Ian King <colin.king at canonical.com>
>
> These tests don't really add much test coverage, plus they are a pain to
> maintain because of the various different build configurations have different
> fwts tests enabled/disabled, so the output is different per configuration.
>
> I'm going to take the pragmatic easy path and remove these tests, especially
> since these tests have never found a regressions and are a maintenance
> overhead.
>
> Signed-off-by: Colin Ian King <colin.king at canonical.com>
> ---
> Makefile.am | 3 -
> .../arg-show-tests-0001/arg-show-tests-0001.log | 187 -----
> fwts-test/arg-show-tests-0001/test-0001.sh | 39 -
> fwts-test/arg-show-tests-0001/test-0002.sh | 39 -
> .../arg-show-tests-full-0001.log | 930 ---------------------
> fwts-test/arg-show-tests-full-0001/test-0001.sh | 27 -
> 6 files changed, 1225 deletions(-)
> delete mode 100644 fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
> delete mode 100755 fwts-test/arg-show-tests-0001/test-0001.sh
> delete mode 100755 fwts-test/arg-show-tests-0001/test-0002.sh
> delete mode 100644 fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> delete mode 100755 fwts-test/arg-show-tests-full-0001/test-0001.sh
>
> diff --git a/Makefile.am b/Makefile.am
> index 86146da..bda44d7 100644
> --- a/Makefile.am
> +++ b/Makefile.am
> @@ -36,9 +36,6 @@ TESTS = fwts-test/acpidump-0001/test-0001.sh \
> fwts-test/arg-results-no-separators-0001/test-0001.sh \
> fwts-test/arg-show-progress-dialog-0001/test-0001.sh \
> fwts-test/arg-show-progress-dialog-0001/test-0002.sh \
> - fwts-test/arg-show-tests-0001/test-0001.sh \
> - fwts-test/arg-show-tests-0001/test-0002.sh \
> - fwts-test/arg-show-tests-full-0001/test-0001.sh \
> fwts-test/arg-table-path-0001/test-0001.sh \
> fwts-test/arg-table-path-0001/test-0002.sh \
> fwts-test/arg-width-0001/test-0001.sh \
> diff --git a/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log b/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
> deleted file mode 100644
> index 1a76b9d..0000000
> --- a/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
> +++ /dev/null
> @@ -1,187 +0,0 @@
> -ACPI tests:
> - acpiinfo General ACPI information test.
> - acpitables ACPI table headers sanity tests.
> - apicinstance Test for single instance of APIC/MADT table.
> - asf ASF! Alert Standard Format Table test.
> - aspt ASPT Table test.
> - bert BERT Boot Error Record Table test.
> - bgrt BGRT Boot Graphics Resource Table test.
> - boot BOOT Table test.
> - checksum ACPI table checksum test.
> - cpep CPEP Corrected Platform Error Polling Table test.
> - csrt CSRT Core System Resource Table test.
> - cstates Processor C state support test.
> - dbg2 DBG2 (Debug Port Table 2) test.
> - dbgp DBGP (Debug Port) Table test.
> - dmar DMA Remapping (VT-d) test.
> - ecdt ECDT Embedded Controller Boot Resources Table test.
> - einj EINJ Error Injection Table test.
> - erst ERST Error Record Serialization Table test.
> - facs FACS Firmware ACPI Control Structure test.
> - fadt FADT Fixed ACPI Description Table tests.
> - fpdt FPDT Firmware Performance Data Table test.
> - gtdt GTDT Generic Timer Description Table test.
> - hest HEST Hardware Error Source Table test.
> - hpet HPET IA-PC High Precision Event Timer Table tests.
> - iort IORT IO Remapping Table test.
> - lpit LPIT Low Power Idle Table test.
> - madt MADT Multiple APIC Description Table (spec compliant).
> - mcfg MCFG PCI Express* memory mapped config space test.
> - mchi MCHI Management Controller Host Interface Table test.
> - method ACPI DSDT Method Semantic tests.
> - msct MSCT Maximum System Characteristics Table test.
> - msdm MSDM Microsoft Data Management Table test.
> - pcc Processor Clocking Control (PCC) test.
> - rsdp RSDP Root System Description Pointer test.
> - rsdt RSDT Root System Description Table test.
> - sbst SBST Smart Battery Specification Table test.
> - slic SLIC Software Licensing Description Table test.
> - slit SLIT System Locality Distance Information test.
> - spcr SPCR Serial Port Console Redirection Table test.
> - spmi SPMI Service Processor Management Interface Description Table test.
> - srat SRAT System Resource Affinity Table test.
> - stao STAO Status Override Table test.
> - tcpa TCPA Trusted Computing Platform Alliance Capabilities Table test.
> - tpm2 TPM2 Trusted Platform Module 2 test.
> - uefi UEFI Data Table test.
> - waet WAET Windows ACPI Emulated Devices Table test.
> - wdat WDAT Microsoft Hardware Watchdog Action Table test.
> - wmi Extract and analyse Windows Management Instrumentation (WMI).
> - xenv XENV Xen Environment Table tests.
> - xsdt XSDT Extended System Description Table test.
> -
> -Batch tests:
> - acpiinfo General ACPI information test.
> - acpitables ACPI table headers sanity tests.
> - apicedge APIC edge/level test.
> - apicinstance Test for single instance of APIC/MADT table.
> - asf ASF! Alert Standard Format Table test.
> - aspm PCIe ASPM test.
> - aspt ASPT Table test.
> - autobrightness Automated LCD brightness test.
> - bert BERT Boot Error Record Table test.
> - bgrt BGRT Boot Graphics Resource Table test.
> - bios32 BIOS32 Service Directory test.
> - bios_info Gather BIOS DMI information.
> - bmc_info BMC Info
> - boot BOOT Table test.
> - checksum ACPI table checksum test.
> - cpep CPEP Corrected Platform Error Polling Table test.
> - cpufreq CPU frequency scaling tests.
> - crs Test PCI host bridge configuration using _CRS.
> - csm UEFI Compatibility Support Module test.
> - csrt CSRT Core System Resource Table test.
> - cstates Processor C state support test.
> - dbg2 DBG2 (Debug Port Table 2) test.
> - dbgp DBGP (Debug Port) Table test.
> - dmar DMA Remapping (VT-d) test.
> - dmicheck DMI/SMBIOS table tests.
> - dt_base Base device tree validity check
> - dt_sysinfo Device tree system information test
> - ebda Test EBDA region is mapped and reserved in memory map table.
> - ecdt ECDT Embedded Controller Boot Resources Table test.
> - einj EINJ Error Injection Table test.
> - erst ERST Error Record Serialization Table test.
> - facs FACS Firmware ACPI Control Structure test.
> - fadt FADT Fixed ACPI Description Table tests.
> - fan Simple fan tests.
> - fpdt FPDT Firmware Performance Data Table test.
> - gtdt GTDT Generic Timer Description Table test.
> - hda_audio HDA Audio Pin Configuration test.
> - hest HEST Hardware Error Source Table test.
> - hpet HPET IA-PC High Precision Event Timer Table tests.
> - iort IORT IO Remapping Table test.
> - klog Scan kernel log for errors and warnings.
> - lpit LPIT Low Power Idle Table test.
> - madt MADT Multiple APIC Description Table (spec compliant).
> - maxfreq Test max CPU frequencies against max scaling frequency.
> - maxreadreq Test firmware has set PCI Express MaxReadReq to a higher value on non-motherboard devices.
> - mcfg MCFG PCI Express* memory mapped config space test.
> - mchi MCHI Management Controller Host Interface Table test.
> - method ACPI DSDT Method Semantic tests.
> - microcode Test if system is using latest microcode.
> - mpcheck MultiProcessor Tables tests.
> - msct MSCT Maximum System Characteristics Table test.
> - msdm MSDM Microsoft Data Management Table test.
> - msr MSR register tests.
> - mtrr MTRR tests.
> - nx Test if CPU NX is disabled by the BIOS.
> - olog Run OLOG scan and analysis checks.
> - oops Scan kernel log for Oopses.
> - osilinux Disassemble DSDT to check for _OSI("Linux").
> - pcc Processor Clocking Control (PCC) test.
> - pciirq PCI IRQ Routing Table test.
> - pnp BIOS Support Installation structure test.
> - prd_info OPAL Processor Recovery Diagnostics Info
> - rsdp RSDP Root System Description Pointer test.
> - rsdt RSDT Root System Description Table test.
> - sbst SBST Smart Battery Specification Table test.
> - securebootcert UEFI secure boot test.
> - slic SLIC Software Licensing Description Table test.
> - slit SLIT System Locality Distance Information test.
> - spcr SPCR Serial Port Console Redirection Table test.
> - spmi SPMI Service Processor Management Interface Description Table test.
> - srat SRAT System Resource Affinity Table test.
> - stao STAO Status Override Table test.
> - syntaxcheck Re-assemble DSDT and SSDTs to find syntax errors and warnings.
> - tcpa TCPA Trusted Computing Platform Alliance Capabilities Table test.
> - tpm2 TPM2 Trusted Platform Module 2 test.
> - uefi UEFI Data Table test.
> - uefibootpath Sanity check for UEFI Boot Path Boot####.
> - version Gather kernel system information.
> - virt CPU Virtualisation Configuration test.
> - waet WAET Windows ACPI Emulated Devices Table test.
> - wakealarm ACPI Wakealarm tests.
> - wdat WDAT Microsoft Hardware Watchdog Action Table test.
> - wmi Extract and analyse Windows Management Instrumentation (WMI).
> - xenv XENV Xen Environment Table tests.
> - xsdt XSDT Extended System Description Table test.
> -
> -Interactive tests:
> - ac_adapter Interactive ac_adapter power test.
> - battery Battery tests.
> - brightness Interactive LCD brightness test.
> - hotkey Hotkey scan code tests.
> - lid Interactive lid button test.
> - power_button Interactive power_button button test.
> -
> -Power States tests:
> - s3 S3 suspend/resume test.
> - s3power S3 power loss during suspend test (takes minimum of 10 minutes to run).
> - s4 S4 hibernate/resume test.
> -
> -Utilities:
> - acpidump Dump ACPI tables.
> - cmosdump Dump CMOS Memory.
> - crsdump Dump ACPI _CRS resources.
> - ebdadump Dump EBDA region.
> - esrtdump Dump ESRT table.
> - gpedump Dump GPEs.
> - memmapdump Dump system memory map.
> - mpdump Dump MultiProcessor Data.
> - plddump Dump ACPI _PLD (Physical Device Location).
> - prsdump Dump ACPI _PRS resources.
> - romdump Dump ROM data.
> - uefidump Dump UEFI variables.
> - uefivarinfo UEFI variable info query.
> -
> -Unsafe tests:
> - uefirtauthvar Authenticated variable tests.
> - uefirtmisc UEFI miscellaneous runtime service interface tests.
> - uefirttime UEFI Runtime service time interface tests.
> - uefirtvariable UEFI Runtime service variable interface tests.
> -
> -UEFI tests:
> - csm UEFI Compatibility Support Module test.
> - esrt Sanity check UEFI ESRT Table.
> - securebootcert UEFI secure boot test.
> - uefibootpath Sanity check for UEFI Boot Path Boot####.
> - uefirtauthvar Authenticated variable tests.
> - uefirtmisc UEFI miscellaneous runtime service interface tests.
> - uefirttime UEFI Runtime service time interface tests.
> - uefirtvariable UEFI Runtime service variable interface tests.
> -
> -ACPI Spec Compliance tests:
> - fadt FADT Fixed ACPI Description Table tests.
> - madt MADT Multiple APIC Description Table (spec compliant).
> - rsdp RSDP Root System Description Pointer test.
> diff --git a/fwts-test/arg-show-tests-0001/test-0001.sh b/fwts-test/arg-show-tests-0001/test-0001.sh
> deleted file mode 100755
> index a62071c..0000000
> --- a/fwts-test/arg-show-tests-0001/test-0001.sh
> +++ /dev/null
> @@ -1,39 +0,0 @@
> -#!/bin/bash
> -#
> -TEST="Test -s option"
> -NAME=test-0001.sh
> -TMPLOG=$TMP/arg-show-tests.log.$$
> -
> -#
> -# Non-x86 tests don't have WMI so skip this test
> -#
> -$FWTS --show-tests | grep wmi > /dev/null
> -if [ $? -eq 1 ]; then
> - echo SKIP: $TEST, $NAME
> - exit 77
> -fi
> -
> -cols=$(stty -a | tr ';' '\n' | grep "columns" | cut -d' ' -f3) 2> /dev/null
> -#
> -# If we can't set the tty then we can't test
> -#
> -stty cols 80 2> /dev/null
> -if [ $? -eq 1 ]; then
> - tset 2> /dev/null
> - echo SKIP: $TEST, $NAME
> - exit 77
> -fi
> -$FWTS -s > $TMPLOG
> -diff $TMPLOG $FWTSTESTDIR/arg-show-tests-0001/arg-show-tests-0001.log >> $FAILURE_LOG
> -ret=$?
> -if [ $ret -eq 0 ]; then
> - echo PASSED: $TEST, $NAME
> -else
> - echo FAILED: $TEST, $NAME
> -fi
> -
> -stty cols 80 2> /dev/null
> -tset 2> /dev/null
> -
> -rm $TMPLOG
> -exit $ret
> diff --git a/fwts-test/arg-show-tests-0001/test-0002.sh b/fwts-test/arg-show-tests-0001/test-0002.sh
> deleted file mode 100755
> index f92fd8f..0000000
> --- a/fwts-test/arg-show-tests-0001/test-0002.sh
> +++ /dev/null
> @@ -1,39 +0,0 @@
> -#!/bin/bash
> -#
> -TEST="Test --show-tests option"
> -NAME=test-0002.sh
> -TMPLOG=$TMP/arg-show-tests.log.$$
> -
> -#
> -# Non-x86 tests don't have WMI so skip this test
> -#
> -$FWTS --show-tests | grep wmi > /dev/null
> -if [ $? -eq 1 ]; then
> - echo SKIP: $TEST, $NAME
> - exit 77
> -fi
> -
> -cols=$(stty -a | tr ';' '\n' | grep "columns" | cut -d' ' -f3) 2> /dev/null
> -#
> -# If we can't set the tty then we can't test
> -#
> -stty cols 80 2> /dev/null
> -if [ $? -eq 1 ]; then
> - tset 2> /dev/null
> - echo SKIP: $TEST, $NAME
> - exit 77
> -fi
> -$FWTS -s > $TMPLOG
> -diff $TMPLOG $FWTSTESTDIR/arg-show-tests-0001/arg-show-tests-0001.log >> $FAILURE_LOG
> -ret=$?
> -if [ $ret -eq 0 ]; then
> - echo PASSED: $TEST, $NAME
> -else
> - echo FAILED: $TEST, $NAME
> -fi
> -
> -stty cols 80 2> /dev/null
> -tset 2> /dev/null
> -
> -rm $TMPLOG
> -exit $ret
> diff --git a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log b/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> deleted file mode 100644
> index 3eb5e3e..0000000
> --- a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> +++ /dev/null
> @@ -1,930 +0,0 @@
> -ACPI tests:
> - acpiinfo (3 tests):
> - Determine Kernel ACPI version.
> - Determine machine's ACPI version.
> - Determine AML compiler.
> - acpitables (1 test):
> - Test ACPI headers.
> - apicinstance (1 test):
> - Test for single instance of APIC/MADT table.
> - asf (1 test):
> - ASF! Alert Standard Format Table test.
> - aspt (1 test):
> - ASPT Table test.
> - bert (1 test):
> - BERT Boot Error Record Table test.
> - bgrt (1 test):
> - BGRT Boot Graphics Resource Table test.
> - boot (1 test):
> - BOOT Table test.
> - checksum (1 test):
> - ACPI table checksum test.
> - cpep (1 test):
> - CPEP Corrected Platform Error Polling Table test.
> - csrt (1 test):
> - CSRT Core System Resource Table test.
> - cstates (1 test):
> - Test all CPUs C-states.
> - dbg2 (1 test):
> - DBG2 (Debug Port Table 2) test.
> - dbgp (1 test):
> - DBGP (Debug Port) Table test.
> - dmar (1 test):
> - DMA Remapping test.
> - ecdt (1 test):
> - ECDT Embedded Controller Boot Resources Table test.
> - einj (1 test):
> - EINJ Error Injection Table test.
> - erst (1 test):
> - ERST Error Record Serialization Table test.
> - facs (1 test):
> - FACS Firmware ACPI Control Structure test.
> - fadt (6 tests):
> - ACPI FADT Description Table flag info.
> - FADT checksum test.
> - FADT revision test.
> - ACPI FADT Description Table tests.
> - Test FADT SCI_EN bit is enabled.
> - Test FADT reset register.
> - fpdt (1 test):
> - FPDT Firmware Performance Data Table test.
> - gtdt (1 test):
> - GTDT Generic Timer Description Table test.
> - hest (1 test):
> - HEST Hardware Error Source Table test.
> - hpet (4 tests):
> - Test HPET base in kernel log.
> - Test HPET base in HPET table.
> - Test HPET base in DSDT and/or SSDT.
> - Test HPET configuration.
> - iort (1 test):
> - IORT IO Remapping Table test.
> - lpit (1 test):
> - LPIT Low Power Idle Table test.
> - madt (5 tests):
> - MADT checksum test.
> - MADT revision test.
> - MADT architecture minimum revision test.
> - MADT flags field reserved bits test.
> - MADT subtable tests.
> - mcfg (2 tests):
> - Validate MCFG table.
> - Validate MCFG PCI config space.
> - mchi (1 test):
> - MCHI Management Controller Host Interface Table test.
> - method (191 tests):
> - Test Method Names.
> - Test _AEI.
> - Test _EVT (Event Method).
> - Test _DLM (Device Lock Mutex).
> - Test _PIC (Inform AML of Interrupt Model).
> - Test _CID (Compatible ID).
> - Test _DDN (DOS Device Name).
> - Test _HID (Hardware ID).
> - Test _HRV (Hardware Revision Number).
> - Test _MLS (Multiple Language String).
> - Test _PLD (Physical Device Location).
> - Test _SUB (Subsystem ID).
> - Test _SUN (Slot User Number).
> - Test _STR (String).
> - Test _UID (Unique ID).
> - Test _CDM (Clock Domain).
> - Test _CRS (Current Resource Settings).
> - Test _DSD (Device Specific Data).
> - Test _DIS (Disable).
> - Test _DMA (Direct Memory Access).
> - Test _FIX (Fixed Register Resource Provider).
> - Test _GSB (Global System Interrupt Base).
> - Test _HPP (Hot Plug Parameters).
> - Test _PRS (Possible Resource Settings).
> - Test _PRT (PCI Routing Table).
> - Test _PXM (Proximity).
> - Test _CCA (Cache Coherency Attribute).
> - Test _EDL (Eject Device List).
> - Test _EJD (Ejection Dependent Device).
> - Test _EJ0 (Eject).
> - Test _EJ1 (Eject).
> - Test _EJ2 (Eject).
> - Test _EJ3 (Eject).
> - Test _EJ4 (Eject).
> - Test _LCK (Lock).
> - Test _RMV (Remove).
> - Test _STA (Status).
> - Test _DEP (Operational Region Dependencies).
> - Test _BDN (BIOS Dock Name).
> - Test _BBN (Base Bus Number).
> - Test _DCK (Dock).
> - Test _INI (Initialize).
> - Test _GLK (Global Lock).
> - Test _SEG (Segment).
> - Test _OFF (Set resource off).
> - Test _ON_ (Set resource on).
> - Test _DSW (Device Sleep Wake).
> - Test _IRC (In Rush Current).
> - Test _PRE (Power Resources for Enumeration).
> - Test _PR0 (Power Resources for D0).
> - Test _PR1 (Power Resources for D1).
> - Test _PR2 (Power Resources for D2).
> - Test _PR3 (Power Resources for D3).
> - Test _PRW (Power Resources for Wake).
> - Test _PS0 (Power State 0).
> - Test _PS1 (Power State 1).
> - Test _PS2 (Power State 2).
> - Test _PS3 (Power State 3).
> - Test _PSC (Power State Current).
> - Test _PSE (Power State for Enumeration).
> - Test _PSW (Power State Wake).
> - Test _S1D (S1 Device State).
> - Test _S2D (S2 Device State).
> - Test _S3D (S3 Device State).
> - Test _S4D (S4 Device State).
> - Test _S0W (S0 Device Wake State).
> - Test _S1W (S1 Device Wake State).
> - Test _S2W (S2 Device Wake State).
> - Test _S3W (S3 Device Wake State).
> - Test _S4W (S4 Device Wake State).
> - Test _RST (Device Reset).
> - Test _PRR (Power Resource for Reset).
> - Test _S0_ (S0 System State).
> - Test _S1_ (S1 System State).
> - Test _S2_ (S2 System State).
> - Test _S3_ (S3 System State).
> - Test _S4_ (S4 System State).
> - Test _S5_ (S5 System State).
> - Test _SWS (System Wake Source).
> - Test _PSS (Performance Supported States).
> - Test _CPC (Continuous Performance Control).
> - Test _CSD (C State Dependencies).
> - Test _CST (C States).
> - Test _PCT (Performance Control).
> - Test _PDL (P-State Depth Limit).
> - Test _PPC (Performance Present Capabilities).
> - Test _PPE (Polling for Platform Error).
> - Test _PSD (Power State Dependencies).
> - Test _PTC (Processor Throttling Control).
> - Test _TDL (T-State Depth Limit).
> - Test _TPC (Throttling Present Capabilities).
> - Test _TSD (Throttling State Dependencies).
> - Test _TSS (Throttling Supported States).
> - Test _LPI (Low Power Idle States).
> - Test _RDI (Resource Dependencies for Idle).
> - Test _PUR (Processor Utilization Request).
> - Test _MSG (Message).
> - Test _SST (System Status).
> - Test _ALC (Ambient Light Colour Chromaticity).
> - Test _ALI (Ambient Light Illuminance).
> - Test _ALT (Ambient Light Temperature).
> - Test _ALP (Ambient Light Polling).
> - Test _ALR (Ambient Light Response).
> - Test _LID (Lid Status).
> - Test _GTF (Get Task File).
> - Test _GTM (Get Timing Mode).
> - Test _MBM (Memory Bandwidth Monitoring Data).
> - Test _UPC (USB Port Capabilities).
> - Test _UPD (User Presence Detect).
> - Test _UPP (User Presence Polling).
> - Test _GCP (Get Capabilities).
> - Test _GRT (Get Real Time).
> - Test _GWS (Get Wake Status).
> - Test _CWS (Clear Wake Status).
> - Test _STP (Set Expired Timer Wake Policy).
> - Test _STV (Set Timer Value).
> - Test _TIP (Expired Timer Wake Policy).
> - Test _TIV (Timer Values).
> - Test _SBS (Smart Battery Subsystem).
> - Test _BCT (Battery Charge Time).
> - Test _BIF (Battery Information).
> - Test _BIX (Battery Information Extended).
> - Test _BMA (Battery Measurement Averaging).
> - Test _BMC (Battery Maintenance Control).
> - Test _BMD (Battery Maintenance Data).
> - Test _BMS (Battery Measurement Sampling Time).
> - Test _BST (Battery Status).
> - Test _BTP (Battery Trip Point).
> - Test _BTH (Battery Throttle Limit).
> - Test _BTM (Battery Time).
> - Test _PCL (Power Consumer List).
> - Test _PIF (Power Source Information).
> - Test _PRL (Power Source Redundancy List).
> - Test _PSR (Power Source).
> - Test _GAI (Get Averaging Level).
> - Test _GHL (Get Harware Limit).
> - Test _PMC (Power Meter Capabilities).
> - Test _PMD (Power Meter Devices).
> - Test _PMM (Power Meter Measurement).
> - Test _WPC (Wireless Power Calibration).
> - Test _WPP (Wireless Power Polling).
> - Test _FIF (Fan Information).
> - Test _FPS (Fan Performance States).
> - Test _FSL (Fan Set Level).
> - Test _FST (Fan Status).
> - Test _ACx (Active Cooling).
> - Test _ART (Active Cooling Relationship Table).
> - Test _CRT (Critical Trip Point).
> - Test _CR3 (Warm/Standby Temperature).
> - Test _DTI (Device Temperature Indication).
> - Test _HOT (Hot Temperature).
> - Test _MTL (Minimum Throttle Limit).
> - Test _NTT (Notification Temp Threshold).
> - Test _PSL (Passive List).
> - Test _PSV (Passive Temp).
> - Test _RTV (Relative Temp Values).
> - Test _SCP (Set Cooling Policy).
> - Test _TC1 (Thermal Constant 1).
> - Test _TC2 (Thermal Constant 2).
> - Test _TFP (Thermal fast Sampling Period).
> - Test _TMP (Thermal Zone Current Temp).
> - Test _TPT (Trip Point Temperature).
> - Test _TRT (Thermal Relationship Table).
> - Test _TSN (Thermal Sensor Device).
> - Test _TSP (Thermal Sampling Period).
> - Test _TST (Temperature Sensor Threshold).
> - Test _TZD (Thermal Zone Devices).
> - Test _TZM (Thermal Zone member).
> - Test _TZP (Thermal Zone Polling).
> - Test _GPE (General Purpose Events).
> - Test _EC_ (EC Offset Query).
> - Test _PTS (Prepare to Sleep).
> - Test _TTS (Transition to State).
> - Test _WAK (System Wake).
> - Test _ADR (Return Unique ID for Device).
> - Test _BCL (Query List of Brightness Control Levels Supported).
> - Test _BCM (Set Brightness Level).
> - Test _BQC (Brightness Query Current Level).
> - Test _DCS (Return the Status of Output Device).
> - Test _DDC (Return the EDID for this Device).
> - Test _DSS (Device Set State).
> - Test _DGS (Query Graphics State).
> - Test _DOD (Enumerate All Devices Attached to Display Adapter).
> - Test _DOS (Enable/Disable Output Switching).
> - Test _GPD (Get POST Device).
> - Test _ROM (Get ROM Data).
> - Test _SPD (Set POST Device).
> - Test _VPO (Video POST Options).
> - Test _CBA (Configuration Base Address).
> - Test _IFT (IPMI Interface Type).
> - Test _SRV (IPMI Interface Revision).
> - msct (1 test):
> - MSCT Maximum System Characteristics Table test.
> - msdm (1 test):
> - MSDM Microsoft Data Management Table test.
> - pcc (1 test):
> - Processor Clocking Control (PCC) test.
> - rsdp (1 test):
> - RSDP Root System Description Pointer test.
> - rsdt (1 test):
> - RSDT Root System Description Table test.
> - sbst (1 test):
> - SBST Smart Battery Specificiation Table test.
> - slic (1 test):
> - SLIC Software Licensing Description Table test.
> - slit (1 test):
> - SLIT System Locality Distance Information test.
> - spcr (1 test):
> - SPCR Serial Port Console Redirection Table test.
> - spmi (1 test):
> - SPMI Service Processor Management Interface Description Table test.
> - srat (1 test):
> - SRAT System Resource Affinity Table test.
> - stao (1 test):
> - STAO Status Override Table test.
> - tcpa (1 test):
> - Validate TCPA table.
> - tpm2 (1 test):
> - Validate TPM2 table.
> - uefi (1 test):
> - UEFI Data Table test.
> - waet (1 test):
> - Windows ACPI Emulated Devices Table test.
> - wdat (1 test):
> - WDAT Microsoft Hardware Watchdog Action Table test.
> - wmi (1 test):
> - Windows Management Instrumentation test.
> - xenv (1 test):
> - Validate XENV table.
> - xsdt (1 test):
> - XSDT Extended System Description Table test.
> -
> -Batch tests:
> - acpiinfo (3 tests):
> - Determine Kernel ACPI version.
> - Determine machine's ACPI version.
> - Determine AML compiler.
> - acpitables (1 test):
> - Test ACPI headers.
> - apicedge (1 test):
> - Legacy and PCI Interrupt Edge/Level trigger tests.
> - apicinstance (1 test):
> - Test for single instance of APIC/MADT table.
> - asf (1 test):
> - ASF! Alert Standard Format Table test.
> - aspm (2 tests):
> - PCIe ASPM ACPI test.
> - PCIe ASPM registers test.
> - aspt (1 test):
> - ASPT Table test.
> - autobrightness (2 tests):
> - Test for maximum and actual brightness.
> - Change actual brightness.
> - bert (1 test):
> - BERT Boot Error Record Table test.
> - bgrt (1 test):
> - BGRT Boot Graphics Resource Table test.
> - bios32 (1 test):
> - BIOS32 Service Directory test.
> - bios_info (1 test):
> - Gather BIOS DMI information
> - bmc_info (1 test):
> - BMC Info
> - boot (1 test):
> - BOOT Table test.
> - checksum (1 test):
> - ACPI table checksum test.
> - cpep (1 test):
> - CPEP Corrected Platform Error Polling Table test.
> - cpufreq (7 tests):
> - CPU frequency table consistency
> - CPU frequency table duplicates
> - CPU frequency firmware limits
> - CPU frequency claimed maximum
> - CPU frequency SW_ANY control
> - CPU frequency SW_ALL control
> - CPU frequency performance tests.
> - crs (1 test):
> - Test PCI host bridge configuration using _CRS.
> - csm (1 test):
> - UEFI Compatibility Support Module test.
> - csrt (1 test):
> - CSRT Core System Resource Table test.
> - cstates (1 test):
> - Test all CPUs C-states.
> - dbg2 (1 test):
> - DBG2 (Debug Port Table 2) test.
> - dbgp (1 test):
> - DBGP (Debug Port) Table test.
> - dmar (1 test):
> - DMA Remapping test.
> - dmicheck (3 tests):
> - Find and test SMBIOS Table Entry Points.
> - Test DMI/SMBIOS tables for errors.
> - Test DMI/SMBIOS3 tables for errors.
> - dt_base (3 tests):
> - Check device tree presence
> - Check device tree baseline validity
> - Check device tree warnings
> - dt_sysinfo (3 tests):
> - Check model property
> - Check system-id property
> - Check OpenPOWER Reference compatible
> - ebda (1 test):
> - Test EBDA is reserved in E820 table.
> - ecdt (1 test):
> - ECDT Embedded Controller Boot Resources Table test.
> - einj (1 test):
> - EINJ Error Injection Table test.
> - erst (1 test):
> - ERST Error Record Serialization Table test.
> - facs (1 test):
> - FACS Firmware ACPI Control Structure test.
> - fadt (6 tests):
> - ACPI FADT Description Table flag info.
> - FADT checksum test.
> - FADT revision test.
> - ACPI FADT Description Table tests.
> - Test FADT SCI_EN bit is enabled.
> - Test FADT reset register.
> - fan (2 tests):
> - Test fan status.
> - Load system, check CPU fan status.
> - fpdt (1 test):
> - FPDT Firmware Performance Data Table test.
> - gtdt (1 test):
> - GTDT Generic Timer Description Table test.
> - hda_audio (1 test):
> - HDA Audio Pin Configuration test.
> - hest (1 test):
> - HEST Hardware Error Source Table test.
> - hpet (4 tests):
> - Test HPET base in kernel log.
> - Test HPET base in HPET table.
> - Test HPET base in DSDT and/or SSDT.
> - Test HPET configuration.
> - iort (1 test):
> - IORT IO Remapping Table test.
> - klog (1 test):
> - Kernel log error check.
> - lpit (1 test):
> - LPIT Low Power Idle Table test.
> - madt (5 tests):
> - MADT checksum test.
> - MADT revision test.
> - MADT architecture minimum revision test.
> - MADT flags field reserved bits test.
> - MADT subtable tests.
> - maxfreq (1 test):
> - Maximum CPU frequency test.
> - maxreadreq (1 test):
> - Test firmware settings MaxReadReq for PCI Express devices.
> - mcfg (2 tests):
> - Validate MCFG table.
> - Validate MCFG PCI config space.
> - mchi (1 test):
> - MCHI Management Controller Host Interface Table test.
> - method (191 tests):
> - Test Method Names.
> - Test _AEI.
> - Test _EVT (Event Method).
> - Test _DLM (Device Lock Mutex).
> - Test _PIC (Inform AML of Interrupt Model).
> - Test _CID (Compatible ID).
> - Test _DDN (DOS Device Name).
> - Test _HID (Hardware ID).
> - Test _HRV (Hardware Revision Number).
> - Test _MLS (Multiple Language String).
> - Test _PLD (Physical Device Location).
> - Test _SUB (Subsystem ID).
> - Test _SUN (Slot User Number).
> - Test _STR (String).
> - Test _UID (Unique ID).
> - Test _CDM (Clock Domain).
> - Test _CRS (Current Resource Settings).
> - Test _DSD (Device Specific Data).
> - Test _DIS (Disable).
> - Test _DMA (Direct Memory Access).
> - Test _FIX (Fixed Register Resource Provider).
> - Test _GSB (Global System Interrupt Base).
> - Test _HPP (Hot Plug Parameters).
> - Test _PRS (Possible Resource Settings).
> - Test _PRT (PCI Routing Table).
> - Test _PXM (Proximity).
> - Test _CCA (Cache Coherency Attribute).
> - Test _EDL (Eject Device List).
> - Test _EJD (Ejection Dependent Device).
> - Test _EJ0 (Eject).
> - Test _EJ1 (Eject).
> - Test _EJ2 (Eject).
> - Test _EJ3 (Eject).
> - Test _EJ4 (Eject).
> - Test _LCK (Lock).
> - Test _RMV (Remove).
> - Test _STA (Status).
> - Test _DEP (Operational Region Dependencies).
> - Test _BDN (BIOS Dock Name).
> - Test _BBN (Base Bus Number).
> - Test _DCK (Dock).
> - Test _INI (Initialize).
> - Test _GLK (Global Lock).
> - Test _SEG (Segment).
> - Test _OFF (Set resource off).
> - Test _ON_ (Set resource on).
> - Test _DSW (Device Sleep Wake).
> - Test _IRC (In Rush Current).
> - Test _PRE (Power Resources for Enumeration).
> - Test _PR0 (Power Resources for D0).
> - Test _PR1 (Power Resources for D1).
> - Test _PR2 (Power Resources for D2).
> - Test _PR3 (Power Resources for D3).
> - Test _PRW (Power Resources for Wake).
> - Test _PS0 (Power State 0).
> - Test _PS1 (Power State 1).
> - Test _PS2 (Power State 2).
> - Test _PS3 (Power State 3).
> - Test _PSC (Power State Current).
> - Test _PSE (Power State for Enumeration).
> - Test _PSW (Power State Wake).
> - Test _S1D (S1 Device State).
> - Test _S2D (S2 Device State).
> - Test _S3D (S3 Device State).
> - Test _S4D (S4 Device State).
> - Test _S0W (S0 Device Wake State).
> - Test _S1W (S1 Device Wake State).
> - Test _S2W (S2 Device Wake State).
> - Test _S3W (S3 Device Wake State).
> - Test _S4W (S4 Device Wake State).
> - Test _RST (Device Reset).
> - Test _PRR (Power Resource for Reset).
> - Test _S0_ (S0 System State).
> - Test _S1_ (S1 System State).
> - Test _S2_ (S2 System State).
> - Test _S3_ (S3 System State).
> - Test _S4_ (S4 System State).
> - Test _S5_ (S5 System State).
> - Test _SWS (System Wake Source).
> - Test _PSS (Performance Supported States).
> - Test _CPC (Continuous Performance Control).
> - Test _CSD (C State Dependencies).
> - Test _CST (C States).
> - Test _PCT (Performance Control).
> - Test _PDL (P-State Depth Limit).
> - Test _PPC (Performance Present Capabilities).
> - Test _PPE (Polling for Platform Error).
> - Test _PSD (Power State Dependencies).
> - Test _PTC (Processor Throttling Control).
> - Test _TDL (T-State Depth Limit).
> - Test _TPC (Throttling Present Capabilities).
> - Test _TSD (Throttling State Dependencies).
> - Test _TSS (Throttling Supported States).
> - Test _LPI (Low Power Idle States).
> - Test _RDI (Resource Dependencies for Idle).
> - Test _PUR (Processor Utilization Request).
> - Test _MSG (Message).
> - Test _SST (System Status).
> - Test _ALC (Ambient Light Colour Chromaticity).
> - Test _ALI (Ambient Light Illuminance).
> - Test _ALT (Ambient Light Temperature).
> - Test _ALP (Ambient Light Polling).
> - Test _ALR (Ambient Light Response).
> - Test _LID (Lid Status).
> - Test _GTF (Get Task File).
> - Test _GTM (Get Timing Mode).
> - Test _MBM (Memory Bandwidth Monitoring Data).
> - Test _UPC (USB Port Capabilities).
> - Test _UPD (User Presence Detect).
> - Test _UPP (User Presence Polling).
> - Test _GCP (Get Capabilities).
> - Test _GRT (Get Real Time).
> - Test _GWS (Get Wake Status).
> - Test _CWS (Clear Wake Status).
> - Test _STP (Set Expired Timer Wake Policy).
> - Test _STV (Set Timer Value).
> - Test _TIP (Expired Timer Wake Policy).
> - Test _TIV (Timer Values).
> - Test _SBS (Smart Battery Subsystem).
> - Test _BCT (Battery Charge Time).
> - Test _BIF (Battery Information).
> - Test _BIX (Battery Information Extended).
> - Test _BMA (Battery Measurement Averaging).
> - Test _BMC (Battery Maintenance Control).
> - Test _BMD (Battery Maintenance Data).
> - Test _BMS (Battery Measurement Sampling Time).
> - Test _BST (Battery Status).
> - Test _BTP (Battery Trip Point).
> - Test _BTH (Battery Throttle Limit).
> - Test _BTM (Battery Time).
> - Test _PCL (Power Consumer List).
> - Test _PIF (Power Source Information).
> - Test _PRL (Power Source Redundancy List).
> - Test _PSR (Power Source).
> - Test _GAI (Get Averaging Level).
> - Test _GHL (Get Harware Limit).
> - Test _PMC (Power Meter Capabilities).
> - Test _PMD (Power Meter Devices).
> - Test _PMM (Power Meter Measurement).
> - Test _WPC (Wireless Power Calibration).
> - Test _WPP (Wireless Power Polling).
> - Test _FIF (Fan Information).
> - Test _FPS (Fan Performance States).
> - Test _FSL (Fan Set Level).
> - Test _FST (Fan Status).
> - Test _ACx (Active Cooling).
> - Test _ART (Active Cooling Relationship Table).
> - Test _CRT (Critical Trip Point).
> - Test _CR3 (Warm/Standby Temperature).
> - Test _DTI (Device Temperature Indication).
> - Test _HOT (Hot Temperature).
> - Test _MTL (Minimum Throttle Limit).
> - Test _NTT (Notification Temp Threshold).
> - Test _PSL (Passive List).
> - Test _PSV (Passive Temp).
> - Test _RTV (Relative Temp Values).
> - Test _SCP (Set Cooling Policy).
> - Test _TC1 (Thermal Constant 1).
> - Test _TC2 (Thermal Constant 2).
> - Test _TFP (Thermal fast Sampling Period).
> - Test _TMP (Thermal Zone Current Temp).
> - Test _TPT (Trip Point Temperature).
> - Test _TRT (Thermal Relationship Table).
> - Test _TSN (Thermal Sensor Device).
> - Test _TSP (Thermal Sampling Period).
> - Test _TST (Temperature Sensor Threshold).
> - Test _TZD (Thermal Zone Devices).
> - Test _TZM (Thermal Zone member).
> - Test _TZP (Thermal Zone Polling).
> - Test _GPE (General Purpose Events).
> - Test _EC_ (EC Offset Query).
> - Test _PTS (Prepare to Sleep).
> - Test _TTS (Transition to State).
> - Test _WAK (System Wake).
> - Test _ADR (Return Unique ID for Device).
> - Test _BCL (Query List of Brightness Control Levels Supported).
> - Test _BCM (Set Brightness Level).
> - Test _BQC (Brightness Query Current Level).
> - Test _DCS (Return the Status of Output Device).
> - Test _DDC (Return the EDID for this Device).
> - Test _DSS (Device Set State).
> - Test _DGS (Query Graphics State).
> - Test _DOD (Enumerate All Devices Attached to Display Adapter).
> - Test _DOS (Enable/Disable Output Switching).
> - Test _GPD (Get POST Device).
> - Test _ROM (Get ROM Data).
> - Test _SPD (Set POST Device).
> - Test _VPO (Video POST Options).
> - Test _CBA (Configuration Base Address).
> - Test _IFT (IPMI Interface Type).
> - Test _SRV (IPMI Interface Revision).
> - microcode (1 test):
> - Test for most recent microcode being loaded.
> - mpcheck (9 tests):
> - Test MP header.
> - Test MP CPU entries.
> - Test MP Bus entries.
> - Test MP IO APIC entries.
> - Test MP IO Interrupt entries.
> - Test MP Local Interrupt entries.
> - Test MP System Address entries.
> - Test MP Bus Hierarchy entries.
> - Test MP Compatible Bus Address Space entries.
> - msct (1 test):
> - MSCT Maximum System Characteristics Table test.
> - msdm (1 test):
> - MSDM Microsoft Data Management Table test.
> - msr (5 tests):
> - Test CPU generic MSRs.
> - Test CPU specific model MSRs.
> - Test all P State Ratios.
> - Test C1 and C3 autodemotion.
> - Test SMRR MSR registers.
> - mtrr (3 tests):
> - Validate the kernel MTRR IOMEM setup.
> - Validate the MTRR setup across all processors.
> - Test for AMD MtrrFixDramModEn being cleared by the BIOS.
> - nx (3 tests):
> - Test CPU NX capability.
> - Test all CPUs have same BIOS set NX flag.
> - Test all CPUs have same msr setting in MSR 0x1a0.
> - olog (1 test):
> - OLOG scan and analysis checks results.
> - oops (1 test):
> - Kernel log oops check.
> - osilinux (1 test):
> - Disassemble DSDT to check for _OSI("Linux").
> - pcc (1 test):
> - Processor Clocking Control (PCC) test.
> - pciirq (1 test):
> - PCI IRQ Routing Table test.
> - pnp (1 test):
> - PnP BIOS Support Installation structure test.
> - prd_info (1 test):
> - OPAL Processor Recovery Diagnostics Info
> - rsdp (1 test):
> - RSDP Root System Description Pointer test.
> - rsdt (1 test):
> - RSDT Root System Description Table test.
> - sbst (1 test):
> - SBST Smart Battery Specificiation Table test.
> - securebootcert (1 test):
> - UEFI secure boot test.
> - slic (1 test):
> - SLIC Software Licensing Description Table test.
> - slit (1 test):
> - SLIT System Locality Distance Information test.
> - spcr (1 test):
> - SPCR Serial Port Console Redirection Table test.
> - spmi (1 test):
> - SPMI Service Processor Management Interface Description Table test.
> - srat (1 test):
> - SRAT System Resource Affinity Table test.
> - stao (1 test):
> - STAO Status Override Table test.
> - syntaxcheck (1 test):
> - Disassemble and reassemble DSDT and SSDTs.
> - tcpa (1 test):
> - Validate TCPA table.
> - tpm2 (1 test):
> - Validate TPM2 table.
> - uefi (1 test):
> - UEFI Data Table test.
> - uefibootpath (1 test):
> - Test UEFI Boot Path Boot####.
> - version (4 tests):
> - Gather kernel signature.
> - Gather kernel system information.
> - Gather kernel boot command line.
> - Gather ACPI driver version.
> - virt (1 test):
> - CPU Virtualisation Configuration test.
> - waet (1 test):
> - Windows ACPI Emulated Devices Table test.
> - wakealarm (5 tests):
> - Test existence of RTC with alarm interface.
> - Trigger wakealarm for 1 seconds in the future.
> - Test if wakealarm is fired.
> - Multiple wakealarm firing tests.
> - Reset wakealarm time.
> - wdat (1 test):
> - WDAT Microsoft Hardware Watchdog Action Table test.
> - wmi (1 test):
> - Windows Management Instrumentation test.
> - xenv (1 test):
> - Validate XENV table.
> - xsdt (1 test):
> - XSDT Extended System Description Table test.
> -
> -Interactive tests:
> - ac_adapter (3 tests):
> - Test ACPI ac_adapter state.
> - Test ac_adapter initial on-line state.
> - Test ac_adapter state changes.
> - battery (1 test):
> - Battery test.
> - brightness (3 tests):
> - Observe all brightness changes.
> - Observe min, max brightness changes.
> - Test brightness hotkeys.
> - hotkey (1 test):
> - Hotkey keypress checks.
> - lid (3 tests):
> - Test LID buttons report open correctly.
> - Test LID buttons on a single open/close.
> - Test LID buttons on multiple open/close events.
> - power_button (1 test):
> - Test press of power button and ACPI event.
> -
> -Power States tests:
> - s3 (1 test):
> - S3 suspend/resume test.
> - s3power (1 test):
> - S3 power loss during suspend test.
> - s4 (1 test):
> - S4 hibernate/resume test.
> -
> -Utilities:
> - acpidump (1 test):
> - Dump ACPI tables.
> - cmosdump (1 test):
> - Dump CMOS Memory.
> - crsdump (1 test):
> - Dump ACPI _CRS (Current Resource Settings).
> - ebdadump (1 test):
> - Dump EBDA region.
> - esrtdump (1 test):
> - Dump ESRT Table.
> - gpedump (1 test):
> - Dump GPEs.
> - memmapdump (1 test):
> - Dump system memory map.
> - mpdump (1 test):
> - Dump Multi Processor Data.
> - plddump (1 test):
> - Dump ACPI _PLD (Physical Device Location).
> - prsdump (1 test):
> - Dump ACPI _PRS (Possible Resource Settings).
> - romdump (1 test):
> - Dump ROM data.
> - uefidump (1 test):
> - Dump UEFI Variables.
> - uefivarinfo (1 test):
> - UEFI variable info query.
> -
> -Unsafe tests:
> - uefirtauthvar (12 tests):
> - Create authenticated variable test.
> - Authenticated variable test with the same authenticated variable.
> - Authenticated variable test with another valid authenticated variable.
> - Append authenticated variable test.
> - Update authenticated variable test.
> - Authenticated variable test with old authenticated variable.
> - Delete authenticated variable test.
> - Authenticated variable test with invalid modified data.
> - Authenticated variable test with invalid modified timestamp.
> - Authenticated variable test with different guid.
> - Authenticated variable test with invalid attributes.
> - Set and delete authenticated variable created by different key test.
> - uefirtmisc (3 tests):
> - Test for UEFI miscellaneous runtime service interfaces.
> - Stress test for UEFI miscellaneous runtime service interfaces.
> - Test GetNextHighMonotonicCount with invalid NULL parameter.
> - uefirttime (35 tests):
> - Test UEFI RT service get time interface.
> - Test UEFI RT service get time interface, NULL time parameter.
> - Test UEFI RT service get time interface, NULL time and NULL capabilties parameters.
> - Test UEFI RT service set time interface.
> - Test UEFI RT service set time interface, invalid year 1899.
> - Test UEFI RT service set time interface, invalid year 10000.
> - Test UEFI RT service set time interface, invalid month 0.
> - Test UEFI RT service set time interface, invalid month 13.
> - Test UEFI RT service set time interface, invalid day 0.
> - Test UEFI RT service set time interface, invalid day 32.
> - Test UEFI RT service set time interface, invalid hour 24.
> - Test UEFI RT service set time interface, invalid minute 60.
> - Test UEFI RT service set time interface, invalid second 60.
> - Test UEFI RT service set time interface, invalid nanosecond 1000000000.
> - Test UEFI RT service set time interface, invalid timezone -1441.
> - Test UEFI RT service set time interface, invalid timezone 1441.
> - Test UEFI RT service get wakeup time interface.
> - Test UEFI RT service get wakeup time interface, NULL enabled parameter.
> - Test UEFI RT service get wakeup time interface, NULL pending parameter.
> - Test UEFI RT service get wakeup time interface, NULL time parameter.
> - Test UEFI RT service get wakeup time interface, NULL enabled, pending and time parameters.
> - Test UEFI RT service set wakeup time interface.
> - Test UEFI RT service set wakeup time interface, NULL time parameter.
> - Test UEFI RT service set wakeup time interface, invalid year 1899.
> - Test UEFI RT service set wakeup time interface, invalid year 10000.
> - Test UEFI RT service set wakeup time interface, invalid month 0.
> - Test UEFI RT service set wakeup time interface, invalid month 13.
> - Test UEFI RT service set wakeup time interface, invalid day 0.
> - Test UEFI RT service set wakeup time interface, invalid day 32.
> - Test UEFI RT service set wakeup time interface, invalid hour 24.
> - Test UEFI RT service set wakeup time interface, invalid minute 60.
> - Test UEFI RT service set wakeup time interface, invalid second 60.
> - Test UEFI RT service set wakeup time interface, invalid nanosecond 1000000000.
> - Test UEFI RT service set wakeup time interface, invalid timezone -1441.
> - Test UEFI RT service set wakeup time interface, invalid timezone 1441.
> - uefirtvariable (8 tests):
> - Test UEFI RT service get variable interface.
> - Test UEFI RT service get next variable name interface.
> - Test UEFI RT service set variable interface.
> - Test UEFI RT service query variable info interface.
> - Test UEFI RT service variable interface stress test.
> - Test UEFI RT service set variable interface stress test.
> - Test UEFI RT service query variable info interface stress test.
> - Test UEFI RT service get variable interface, invalid parameters.
> -
> -UEFI tests:
> - csm (1 test):
> - UEFI Compatibility Support Module test.
> - esrt (1 test):
> - Sanity check UEFI ESRT Table.
> - securebootcert (1 test):
> - UEFI secure boot test.
> - uefibootpath (1 test):
> - Test UEFI Boot Path Boot####.
> - uefirtauthvar (12 tests):
> - Create authenticated variable test.
> - Authenticated variable test with the same authenticated variable.
> - Authenticated variable test with another valid authenticated variable.
> - Append authenticated variable test.
> - Update authenticated variable test.
> - Authenticated variable test with old authenticated variable.
> - Delete authenticated variable test.
> - Authenticated variable test with invalid modified data.
> - Authenticated variable test with invalid modified timestamp.
> - Authenticated variable test with different guid.
> - Authenticated variable test with invalid attributes.
> - Set and delete authenticated variable created by different key test.
> - uefirtmisc (3 tests):
> - Test for UEFI miscellaneous runtime service interfaces.
> - Stress test for UEFI miscellaneous runtime service interfaces.
> - Test GetNextHighMonotonicCount with invalid NULL parameter.
> - uefirttime (35 tests):
> - Test UEFI RT service get time interface.
> - Test UEFI RT service get time interface, NULL time parameter.
> - Test UEFI RT service get time interface, NULL time and NULL capabilties parameters.
> - Test UEFI RT service set time interface.
> - Test UEFI RT service set time interface, invalid year 1899.
> - Test UEFI RT service set time interface, invalid year 10000.
> - Test UEFI RT service set time interface, invalid month 0.
> - Test UEFI RT service set time interface, invalid month 13.
> - Test UEFI RT service set time interface, invalid day 0.
> - Test UEFI RT service set time interface, invalid day 32.
> - Test UEFI RT service set time interface, invalid hour 24.
> - Test UEFI RT service set time interface, invalid minute 60.
> - Test UEFI RT service set time interface, invalid second 60.
> - Test UEFI RT service set time interface, invalid nanosecond 1000000000.
> - Test UEFI RT service set time interface, invalid timezone -1441.
> - Test UEFI RT service set time interface, invalid timezone 1441.
> - Test UEFI RT service get wakeup time interface.
> - Test UEFI RT service get wakeup time interface, NULL enabled parameter.
> - Test UEFI RT service get wakeup time interface, NULL pending parameter.
> - Test UEFI RT service get wakeup time interface, NULL time parameter.
> - Test UEFI RT service get wakeup time interface, NULL enabled, pending and time parameters.
> - Test UEFI RT service set wakeup time interface.
> - Test UEFI RT service set wakeup time interface, NULL time parameter.
> - Test UEFI RT service set wakeup time interface, invalid year 1899.
> - Test UEFI RT service set wakeup time interface, invalid year 10000.
> - Test UEFI RT service set wakeup time interface, invalid month 0.
> - Test UEFI RT service set wakeup time interface, invalid month 13.
> - Test UEFI RT service set wakeup time interface, invalid day 0.
> - Test UEFI RT service set wakeup time interface, invalid day 32.
> - Test UEFI RT service set wakeup time interface, invalid hour 24.
> - Test UEFI RT service set wakeup time interface, invalid minute 60.
> - Test UEFI RT service set wakeup time interface, invalid second 60.
> - Test UEFI RT service set wakeup time interface, invalid nanosecond 1000000000.
> - Test UEFI RT service set wakeup time interface, invalid timezone -1441.
> - Test UEFI RT service set wakeup time interface, invalid timezone 1441.
> - uefirtvariable (8 tests):
> - Test UEFI RT service get variable interface.
> - Test UEFI RT service get next variable name interface.
> - Test UEFI RT service set variable interface.
> - Test UEFI RT service query variable info interface.
> - Test UEFI RT service variable interface stress test.
> - Test UEFI RT service set variable interface stress test.
> - Test UEFI RT service query variable info interface stress test.
> - Test UEFI RT service get variable interface, invalid parameters.
> -
> -ACPI Spec Compliance tests:
> - fadt (6 tests):
> - ACPI FADT Description Table flag info.
> - FADT checksum test.
> - FADT revision test.
> - ACPI FADT Description Table tests.
> - Test FADT SCI_EN bit is enabled.
> - Test FADT reset register.
> - madt (5 tests):
> - MADT checksum test.
> - MADT revision test.
> - MADT architecture minimum revision test.
> - MADT flags field reserved bits test.
> - MADT subtable tests.
> - rsdp (1 test):
> - RSDP Root System Description Pointer test.
> diff --git a/fwts-test/arg-show-tests-full-0001/test-0001.sh b/fwts-test/arg-show-tests-full-0001/test-0001.sh
> deleted file mode 100755
> index b4e74f7..0000000
> --- a/fwts-test/arg-show-tests-full-0001/test-0001.sh
> +++ /dev/null
> @@ -1,27 +0,0 @@
> -#!/bin/bash
> -#
> -TEST="Test --show-tests-full option"
> -NAME=test-0001.sh
> -TMPLOG=$TMP/arg-show-tests-full.log.$$
> -
> -#
> -# Non-x86 tests don't have WMI so skip this test
> -#
> -$FWTS --show-tests | grep wmi > /dev/null
> -if [ $? -eq 1 ]; then
> - echo SKIP: $TEST, $NAME
> - exit 77
> -fi
> -
> -stty cols 80
> -$FWTS --show-tests-full > $TMPLOG
> -diff $TMPLOG $FWTSTESTDIR/arg-show-tests-full-0001/arg-show-tests-full-0001.log >> $FAILURE_LOG
> -ret=$?
> -if [ $ret -eq 0 ]; then
> - echo PASSED: $TEST, $NAME
> -else
> - echo FAILED: $TEST, $NAME
> -fi
> -
> -rm $TMPLOG
> -exit $ret
>
Acked-by: Ivan Hu <ivan.hu at canonical.com>
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