[PATCH] fwts-test: remove arg-show-tests and arg-show-tests-full
Colin King
colin.king at canonical.com
Wed Jul 6 07:51:43 UTC 2016
From: Colin Ian King <colin.king at canonical.com>
These tests don't really add much test coverage, plus they are a pain to
maintain because of the various different build configurations have different
fwts tests enabled/disabled, so the output is different per configuration.
I'm going to take the pragmatic easy path and remove these tests, especially
since these tests have never found a regressions and are a maintenance
overhead.
Signed-off-by: Colin Ian King <colin.king at canonical.com>
---
Makefile.am | 3 -
.../arg-show-tests-0001/arg-show-tests-0001.log | 187 -----
fwts-test/arg-show-tests-0001/test-0001.sh | 39 -
fwts-test/arg-show-tests-0001/test-0002.sh | 39 -
.../arg-show-tests-full-0001.log | 930 ---------------------
fwts-test/arg-show-tests-full-0001/test-0001.sh | 27 -
6 files changed, 1225 deletions(-)
delete mode 100644 fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
delete mode 100755 fwts-test/arg-show-tests-0001/test-0001.sh
delete mode 100755 fwts-test/arg-show-tests-0001/test-0002.sh
delete mode 100644 fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
delete mode 100755 fwts-test/arg-show-tests-full-0001/test-0001.sh
diff --git a/Makefile.am b/Makefile.am
index 86146da..bda44d7 100644
--- a/Makefile.am
+++ b/Makefile.am
@@ -36,9 +36,6 @@ TESTS = fwts-test/acpidump-0001/test-0001.sh \
fwts-test/arg-results-no-separators-0001/test-0001.sh \
fwts-test/arg-show-progress-dialog-0001/test-0001.sh \
fwts-test/arg-show-progress-dialog-0001/test-0002.sh \
- fwts-test/arg-show-tests-0001/test-0001.sh \
- fwts-test/arg-show-tests-0001/test-0002.sh \
- fwts-test/arg-show-tests-full-0001/test-0001.sh \
fwts-test/arg-table-path-0001/test-0001.sh \
fwts-test/arg-table-path-0001/test-0002.sh \
fwts-test/arg-width-0001/test-0001.sh \
diff --git a/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log b/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
deleted file mode 100644
index 1a76b9d..0000000
--- a/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
+++ /dev/null
@@ -1,187 +0,0 @@
-ACPI tests:
- acpiinfo General ACPI information test.
- acpitables ACPI table headers sanity tests.
- apicinstance Test for single instance of APIC/MADT table.
- asf ASF! Alert Standard Format Table test.
- aspt ASPT Table test.
- bert BERT Boot Error Record Table test.
- bgrt BGRT Boot Graphics Resource Table test.
- boot BOOT Table test.
- checksum ACPI table checksum test.
- cpep CPEP Corrected Platform Error Polling Table test.
- csrt CSRT Core System Resource Table test.
- cstates Processor C state support test.
- dbg2 DBG2 (Debug Port Table 2) test.
- dbgp DBGP (Debug Port) Table test.
- dmar DMA Remapping (VT-d) test.
- ecdt ECDT Embedded Controller Boot Resources Table test.
- einj EINJ Error Injection Table test.
- erst ERST Error Record Serialization Table test.
- facs FACS Firmware ACPI Control Structure test.
- fadt FADT Fixed ACPI Description Table tests.
- fpdt FPDT Firmware Performance Data Table test.
- gtdt GTDT Generic Timer Description Table test.
- hest HEST Hardware Error Source Table test.
- hpet HPET IA-PC High Precision Event Timer Table tests.
- iort IORT IO Remapping Table test.
- lpit LPIT Low Power Idle Table test.
- madt MADT Multiple APIC Description Table (spec compliant).
- mcfg MCFG PCI Express* memory mapped config space test.
- mchi MCHI Management Controller Host Interface Table test.
- method ACPI DSDT Method Semantic tests.
- msct MSCT Maximum System Characteristics Table test.
- msdm MSDM Microsoft Data Management Table test.
- pcc Processor Clocking Control (PCC) test.
- rsdp RSDP Root System Description Pointer test.
- rsdt RSDT Root System Description Table test.
- sbst SBST Smart Battery Specification Table test.
- slic SLIC Software Licensing Description Table test.
- slit SLIT System Locality Distance Information test.
- spcr SPCR Serial Port Console Redirection Table test.
- spmi SPMI Service Processor Management Interface Description Table test.
- srat SRAT System Resource Affinity Table test.
- stao STAO Status Override Table test.
- tcpa TCPA Trusted Computing Platform Alliance Capabilities Table test.
- tpm2 TPM2 Trusted Platform Module 2 test.
- uefi UEFI Data Table test.
- waet WAET Windows ACPI Emulated Devices Table test.
- wdat WDAT Microsoft Hardware Watchdog Action Table test.
- wmi Extract and analyse Windows Management Instrumentation (WMI).
- xenv XENV Xen Environment Table tests.
- xsdt XSDT Extended System Description Table test.
-
-Batch tests:
- acpiinfo General ACPI information test.
- acpitables ACPI table headers sanity tests.
- apicedge APIC edge/level test.
- apicinstance Test for single instance of APIC/MADT table.
- asf ASF! Alert Standard Format Table test.
- aspm PCIe ASPM test.
- aspt ASPT Table test.
- autobrightness Automated LCD brightness test.
- bert BERT Boot Error Record Table test.
- bgrt BGRT Boot Graphics Resource Table test.
- bios32 BIOS32 Service Directory test.
- bios_info Gather BIOS DMI information.
- bmc_info BMC Info
- boot BOOT Table test.
- checksum ACPI table checksum test.
- cpep CPEP Corrected Platform Error Polling Table test.
- cpufreq CPU frequency scaling tests.
- crs Test PCI host bridge configuration using _CRS.
- csm UEFI Compatibility Support Module test.
- csrt CSRT Core System Resource Table test.
- cstates Processor C state support test.
- dbg2 DBG2 (Debug Port Table 2) test.
- dbgp DBGP (Debug Port) Table test.
- dmar DMA Remapping (VT-d) test.
- dmicheck DMI/SMBIOS table tests.
- dt_base Base device tree validity check
- dt_sysinfo Device tree system information test
- ebda Test EBDA region is mapped and reserved in memory map table.
- ecdt ECDT Embedded Controller Boot Resources Table test.
- einj EINJ Error Injection Table test.
- erst ERST Error Record Serialization Table test.
- facs FACS Firmware ACPI Control Structure test.
- fadt FADT Fixed ACPI Description Table tests.
- fan Simple fan tests.
- fpdt FPDT Firmware Performance Data Table test.
- gtdt GTDT Generic Timer Description Table test.
- hda_audio HDA Audio Pin Configuration test.
- hest HEST Hardware Error Source Table test.
- hpet HPET IA-PC High Precision Event Timer Table tests.
- iort IORT IO Remapping Table test.
- klog Scan kernel log for errors and warnings.
- lpit LPIT Low Power Idle Table test.
- madt MADT Multiple APIC Description Table (spec compliant).
- maxfreq Test max CPU frequencies against max scaling frequency.
- maxreadreq Test firmware has set PCI Express MaxReadReq to a higher value on non-motherboard devices.
- mcfg MCFG PCI Express* memory mapped config space test.
- mchi MCHI Management Controller Host Interface Table test.
- method ACPI DSDT Method Semantic tests.
- microcode Test if system is using latest microcode.
- mpcheck MultiProcessor Tables tests.
- msct MSCT Maximum System Characteristics Table test.
- msdm MSDM Microsoft Data Management Table test.
- msr MSR register tests.
- mtrr MTRR tests.
- nx Test if CPU NX is disabled by the BIOS.
- olog Run OLOG scan and analysis checks.
- oops Scan kernel log for Oopses.
- osilinux Disassemble DSDT to check for _OSI("Linux").
- pcc Processor Clocking Control (PCC) test.
- pciirq PCI IRQ Routing Table test.
- pnp BIOS Support Installation structure test.
- prd_info OPAL Processor Recovery Diagnostics Info
- rsdp RSDP Root System Description Pointer test.
- rsdt RSDT Root System Description Table test.
- sbst SBST Smart Battery Specification Table test.
- securebootcert UEFI secure boot test.
- slic SLIC Software Licensing Description Table test.
- slit SLIT System Locality Distance Information test.
- spcr SPCR Serial Port Console Redirection Table test.
- spmi SPMI Service Processor Management Interface Description Table test.
- srat SRAT System Resource Affinity Table test.
- stao STAO Status Override Table test.
- syntaxcheck Re-assemble DSDT and SSDTs to find syntax errors and warnings.
- tcpa TCPA Trusted Computing Platform Alliance Capabilities Table test.
- tpm2 TPM2 Trusted Platform Module 2 test.
- uefi UEFI Data Table test.
- uefibootpath Sanity check for UEFI Boot Path Boot####.
- version Gather kernel system information.
- virt CPU Virtualisation Configuration test.
- waet WAET Windows ACPI Emulated Devices Table test.
- wakealarm ACPI Wakealarm tests.
- wdat WDAT Microsoft Hardware Watchdog Action Table test.
- wmi Extract and analyse Windows Management Instrumentation (WMI).
- xenv XENV Xen Environment Table tests.
- xsdt XSDT Extended System Description Table test.
-
-Interactive tests:
- ac_adapter Interactive ac_adapter power test.
- battery Battery tests.
- brightness Interactive LCD brightness test.
- hotkey Hotkey scan code tests.
- lid Interactive lid button test.
- power_button Interactive power_button button test.
-
-Power States tests:
- s3 S3 suspend/resume test.
- s3power S3 power loss during suspend test (takes minimum of 10 minutes to run).
- s4 S4 hibernate/resume test.
-
-Utilities:
- acpidump Dump ACPI tables.
- cmosdump Dump CMOS Memory.
- crsdump Dump ACPI _CRS resources.
- ebdadump Dump EBDA region.
- esrtdump Dump ESRT table.
- gpedump Dump GPEs.
- memmapdump Dump system memory map.
- mpdump Dump MultiProcessor Data.
- plddump Dump ACPI _PLD (Physical Device Location).
- prsdump Dump ACPI _PRS resources.
- romdump Dump ROM data.
- uefidump Dump UEFI variables.
- uefivarinfo UEFI variable info query.
-
-Unsafe tests:
- uefirtauthvar Authenticated variable tests.
- uefirtmisc UEFI miscellaneous runtime service interface tests.
- uefirttime UEFI Runtime service time interface tests.
- uefirtvariable UEFI Runtime service variable interface tests.
-
-UEFI tests:
- csm UEFI Compatibility Support Module test.
- esrt Sanity check UEFI ESRT Table.
- securebootcert UEFI secure boot test.
- uefibootpath Sanity check for UEFI Boot Path Boot####.
- uefirtauthvar Authenticated variable tests.
- uefirtmisc UEFI miscellaneous runtime service interface tests.
- uefirttime UEFI Runtime service time interface tests.
- uefirtvariable UEFI Runtime service variable interface tests.
-
-ACPI Spec Compliance tests:
- fadt FADT Fixed ACPI Description Table tests.
- madt MADT Multiple APIC Description Table (spec compliant).
- rsdp RSDP Root System Description Pointer test.
diff --git a/fwts-test/arg-show-tests-0001/test-0001.sh b/fwts-test/arg-show-tests-0001/test-0001.sh
deleted file mode 100755
index a62071c..0000000
--- a/fwts-test/arg-show-tests-0001/test-0001.sh
+++ /dev/null
@@ -1,39 +0,0 @@
-#!/bin/bash
-#
-TEST="Test -s option"
-NAME=test-0001.sh
-TMPLOG=$TMP/arg-show-tests.log.$$
-
-#
-# Non-x86 tests don't have WMI so skip this test
-#
-$FWTS --show-tests | grep wmi > /dev/null
-if [ $? -eq 1 ]; then
- echo SKIP: $TEST, $NAME
- exit 77
-fi
-
-cols=$(stty -a | tr ';' '\n' | grep "columns" | cut -d' ' -f3) 2> /dev/null
-#
-# If we can't set the tty then we can't test
-#
-stty cols 80 2> /dev/null
-if [ $? -eq 1 ]; then
- tset 2> /dev/null
- echo SKIP: $TEST, $NAME
- exit 77
-fi
-$FWTS -s > $TMPLOG
-diff $TMPLOG $FWTSTESTDIR/arg-show-tests-0001/arg-show-tests-0001.log >> $FAILURE_LOG
-ret=$?
-if [ $ret -eq 0 ]; then
- echo PASSED: $TEST, $NAME
-else
- echo FAILED: $TEST, $NAME
-fi
-
-stty cols 80 2> /dev/null
-tset 2> /dev/null
-
-rm $TMPLOG
-exit $ret
diff --git a/fwts-test/arg-show-tests-0001/test-0002.sh b/fwts-test/arg-show-tests-0001/test-0002.sh
deleted file mode 100755
index f92fd8f..0000000
--- a/fwts-test/arg-show-tests-0001/test-0002.sh
+++ /dev/null
@@ -1,39 +0,0 @@
-#!/bin/bash
-#
-TEST="Test --show-tests option"
-NAME=test-0002.sh
-TMPLOG=$TMP/arg-show-tests.log.$$
-
-#
-# Non-x86 tests don't have WMI so skip this test
-#
-$FWTS --show-tests | grep wmi > /dev/null
-if [ $? -eq 1 ]; then
- echo SKIP: $TEST, $NAME
- exit 77
-fi
-
-cols=$(stty -a | tr ';' '\n' | grep "columns" | cut -d' ' -f3) 2> /dev/null
-#
-# If we can't set the tty then we can't test
-#
-stty cols 80 2> /dev/null
-if [ $? -eq 1 ]; then
- tset 2> /dev/null
- echo SKIP: $TEST, $NAME
- exit 77
-fi
-$FWTS -s > $TMPLOG
-diff $TMPLOG $FWTSTESTDIR/arg-show-tests-0001/arg-show-tests-0001.log >> $FAILURE_LOG
-ret=$?
-if [ $ret -eq 0 ]; then
- echo PASSED: $TEST, $NAME
-else
- echo FAILED: $TEST, $NAME
-fi
-
-stty cols 80 2> /dev/null
-tset 2> /dev/null
-
-rm $TMPLOG
-exit $ret
diff --git a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log b/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
deleted file mode 100644
index 3eb5e3e..0000000
--- a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
+++ /dev/null
@@ -1,930 +0,0 @@
-ACPI tests:
- acpiinfo (3 tests):
- Determine Kernel ACPI version.
- Determine machine's ACPI version.
- Determine AML compiler.
- acpitables (1 test):
- Test ACPI headers.
- apicinstance (1 test):
- Test for single instance of APIC/MADT table.
- asf (1 test):
- ASF! Alert Standard Format Table test.
- aspt (1 test):
- ASPT Table test.
- bert (1 test):
- BERT Boot Error Record Table test.
- bgrt (1 test):
- BGRT Boot Graphics Resource Table test.
- boot (1 test):
- BOOT Table test.
- checksum (1 test):
- ACPI table checksum test.
- cpep (1 test):
- CPEP Corrected Platform Error Polling Table test.
- csrt (1 test):
- CSRT Core System Resource Table test.
- cstates (1 test):
- Test all CPUs C-states.
- dbg2 (1 test):
- DBG2 (Debug Port Table 2) test.
- dbgp (1 test):
- DBGP (Debug Port) Table test.
- dmar (1 test):
- DMA Remapping test.
- ecdt (1 test):
- ECDT Embedded Controller Boot Resources Table test.
- einj (1 test):
- EINJ Error Injection Table test.
- erst (1 test):
- ERST Error Record Serialization Table test.
- facs (1 test):
- FACS Firmware ACPI Control Structure test.
- fadt (6 tests):
- ACPI FADT Description Table flag info.
- FADT checksum test.
- FADT revision test.
- ACPI FADT Description Table tests.
- Test FADT SCI_EN bit is enabled.
- Test FADT reset register.
- fpdt (1 test):
- FPDT Firmware Performance Data Table test.
- gtdt (1 test):
- GTDT Generic Timer Description Table test.
- hest (1 test):
- HEST Hardware Error Source Table test.
- hpet (4 tests):
- Test HPET base in kernel log.
- Test HPET base in HPET table.
- Test HPET base in DSDT and/or SSDT.
- Test HPET configuration.
- iort (1 test):
- IORT IO Remapping Table test.
- lpit (1 test):
- LPIT Low Power Idle Table test.
- madt (5 tests):
- MADT checksum test.
- MADT revision test.
- MADT architecture minimum revision test.
- MADT flags field reserved bits test.
- MADT subtable tests.
- mcfg (2 tests):
- Validate MCFG table.
- Validate MCFG PCI config space.
- mchi (1 test):
- MCHI Management Controller Host Interface Table test.
- method (191 tests):
- Test Method Names.
- Test _AEI.
- Test _EVT (Event Method).
- Test _DLM (Device Lock Mutex).
- Test _PIC (Inform AML of Interrupt Model).
- Test _CID (Compatible ID).
- Test _DDN (DOS Device Name).
- Test _HID (Hardware ID).
- Test _HRV (Hardware Revision Number).
- Test _MLS (Multiple Language String).
- Test _PLD (Physical Device Location).
- Test _SUB (Subsystem ID).
- Test _SUN (Slot User Number).
- Test _STR (String).
- Test _UID (Unique ID).
- Test _CDM (Clock Domain).
- Test _CRS (Current Resource Settings).
- Test _DSD (Device Specific Data).
- Test _DIS (Disable).
- Test _DMA (Direct Memory Access).
- Test _FIX (Fixed Register Resource Provider).
- Test _GSB (Global System Interrupt Base).
- Test _HPP (Hot Plug Parameters).
- Test _PRS (Possible Resource Settings).
- Test _PRT (PCI Routing Table).
- Test _PXM (Proximity).
- Test _CCA (Cache Coherency Attribute).
- Test _EDL (Eject Device List).
- Test _EJD (Ejection Dependent Device).
- Test _EJ0 (Eject).
- Test _EJ1 (Eject).
- Test _EJ2 (Eject).
- Test _EJ3 (Eject).
- Test _EJ4 (Eject).
- Test _LCK (Lock).
- Test _RMV (Remove).
- Test _STA (Status).
- Test _DEP (Operational Region Dependencies).
- Test _BDN (BIOS Dock Name).
- Test _BBN (Base Bus Number).
- Test _DCK (Dock).
- Test _INI (Initialize).
- Test _GLK (Global Lock).
- Test _SEG (Segment).
- Test _OFF (Set resource off).
- Test _ON_ (Set resource on).
- Test _DSW (Device Sleep Wake).
- Test _IRC (In Rush Current).
- Test _PRE (Power Resources for Enumeration).
- Test _PR0 (Power Resources for D0).
- Test _PR1 (Power Resources for D1).
- Test _PR2 (Power Resources for D2).
- Test _PR3 (Power Resources for D3).
- Test _PRW (Power Resources for Wake).
- Test _PS0 (Power State 0).
- Test _PS1 (Power State 1).
- Test _PS2 (Power State 2).
- Test _PS3 (Power State 3).
- Test _PSC (Power State Current).
- Test _PSE (Power State for Enumeration).
- Test _PSW (Power State Wake).
- Test _S1D (S1 Device State).
- Test _S2D (S2 Device State).
- Test _S3D (S3 Device State).
- Test _S4D (S4 Device State).
- Test _S0W (S0 Device Wake State).
- Test _S1W (S1 Device Wake State).
- Test _S2W (S2 Device Wake State).
- Test _S3W (S3 Device Wake State).
- Test _S4W (S4 Device Wake State).
- Test _RST (Device Reset).
- Test _PRR (Power Resource for Reset).
- Test _S0_ (S0 System State).
- Test _S1_ (S1 System State).
- Test _S2_ (S2 System State).
- Test _S3_ (S3 System State).
- Test _S4_ (S4 System State).
- Test _S5_ (S5 System State).
- Test _SWS (System Wake Source).
- Test _PSS (Performance Supported States).
- Test _CPC (Continuous Performance Control).
- Test _CSD (C State Dependencies).
- Test _CST (C States).
- Test _PCT (Performance Control).
- Test _PDL (P-State Depth Limit).
- Test _PPC (Performance Present Capabilities).
- Test _PPE (Polling for Platform Error).
- Test _PSD (Power State Dependencies).
- Test _PTC (Processor Throttling Control).
- Test _TDL (T-State Depth Limit).
- Test _TPC (Throttling Present Capabilities).
- Test _TSD (Throttling State Dependencies).
- Test _TSS (Throttling Supported States).
- Test _LPI (Low Power Idle States).
- Test _RDI (Resource Dependencies for Idle).
- Test _PUR (Processor Utilization Request).
- Test _MSG (Message).
- Test _SST (System Status).
- Test _ALC (Ambient Light Colour Chromaticity).
- Test _ALI (Ambient Light Illuminance).
- Test _ALT (Ambient Light Temperature).
- Test _ALP (Ambient Light Polling).
- Test _ALR (Ambient Light Response).
- Test _LID (Lid Status).
- Test _GTF (Get Task File).
- Test _GTM (Get Timing Mode).
- Test _MBM (Memory Bandwidth Monitoring Data).
- Test _UPC (USB Port Capabilities).
- Test _UPD (User Presence Detect).
- Test _UPP (User Presence Polling).
- Test _GCP (Get Capabilities).
- Test _GRT (Get Real Time).
- Test _GWS (Get Wake Status).
- Test _CWS (Clear Wake Status).
- Test _STP (Set Expired Timer Wake Policy).
- Test _STV (Set Timer Value).
- Test _TIP (Expired Timer Wake Policy).
- Test _TIV (Timer Values).
- Test _SBS (Smart Battery Subsystem).
- Test _BCT (Battery Charge Time).
- Test _BIF (Battery Information).
- Test _BIX (Battery Information Extended).
- Test _BMA (Battery Measurement Averaging).
- Test _BMC (Battery Maintenance Control).
- Test _BMD (Battery Maintenance Data).
- Test _BMS (Battery Measurement Sampling Time).
- Test _BST (Battery Status).
- Test _BTP (Battery Trip Point).
- Test _BTH (Battery Throttle Limit).
- Test _BTM (Battery Time).
- Test _PCL (Power Consumer List).
- Test _PIF (Power Source Information).
- Test _PRL (Power Source Redundancy List).
- Test _PSR (Power Source).
- Test _GAI (Get Averaging Level).
- Test _GHL (Get Harware Limit).
- Test _PMC (Power Meter Capabilities).
- Test _PMD (Power Meter Devices).
- Test _PMM (Power Meter Measurement).
- Test _WPC (Wireless Power Calibration).
- Test _WPP (Wireless Power Polling).
- Test _FIF (Fan Information).
- Test _FPS (Fan Performance States).
- Test _FSL (Fan Set Level).
- Test _FST (Fan Status).
- Test _ACx (Active Cooling).
- Test _ART (Active Cooling Relationship Table).
- Test _CRT (Critical Trip Point).
- Test _CR3 (Warm/Standby Temperature).
- Test _DTI (Device Temperature Indication).
- Test _HOT (Hot Temperature).
- Test _MTL (Minimum Throttle Limit).
- Test _NTT (Notification Temp Threshold).
- Test _PSL (Passive List).
- Test _PSV (Passive Temp).
- Test _RTV (Relative Temp Values).
- Test _SCP (Set Cooling Policy).
- Test _TC1 (Thermal Constant 1).
- Test _TC2 (Thermal Constant 2).
- Test _TFP (Thermal fast Sampling Period).
- Test _TMP (Thermal Zone Current Temp).
- Test _TPT (Trip Point Temperature).
- Test _TRT (Thermal Relationship Table).
- Test _TSN (Thermal Sensor Device).
- Test _TSP (Thermal Sampling Period).
- Test _TST (Temperature Sensor Threshold).
- Test _TZD (Thermal Zone Devices).
- Test _TZM (Thermal Zone member).
- Test _TZP (Thermal Zone Polling).
- Test _GPE (General Purpose Events).
- Test _EC_ (EC Offset Query).
- Test _PTS (Prepare to Sleep).
- Test _TTS (Transition to State).
- Test _WAK (System Wake).
- Test _ADR (Return Unique ID for Device).
- Test _BCL (Query List of Brightness Control Levels Supported).
- Test _BCM (Set Brightness Level).
- Test _BQC (Brightness Query Current Level).
- Test _DCS (Return the Status of Output Device).
- Test _DDC (Return the EDID for this Device).
- Test _DSS (Device Set State).
- Test _DGS (Query Graphics State).
- Test _DOD (Enumerate All Devices Attached to Display Adapter).
- Test _DOS (Enable/Disable Output Switching).
- Test _GPD (Get POST Device).
- Test _ROM (Get ROM Data).
- Test _SPD (Set POST Device).
- Test _VPO (Video POST Options).
- Test _CBA (Configuration Base Address).
- Test _IFT (IPMI Interface Type).
- Test _SRV (IPMI Interface Revision).
- msct (1 test):
- MSCT Maximum System Characteristics Table test.
- msdm (1 test):
- MSDM Microsoft Data Management Table test.
- pcc (1 test):
- Processor Clocking Control (PCC) test.
- rsdp (1 test):
- RSDP Root System Description Pointer test.
- rsdt (1 test):
- RSDT Root System Description Table test.
- sbst (1 test):
- SBST Smart Battery Specificiation Table test.
- slic (1 test):
- SLIC Software Licensing Description Table test.
- slit (1 test):
- SLIT System Locality Distance Information test.
- spcr (1 test):
- SPCR Serial Port Console Redirection Table test.
- spmi (1 test):
- SPMI Service Processor Management Interface Description Table test.
- srat (1 test):
- SRAT System Resource Affinity Table test.
- stao (1 test):
- STAO Status Override Table test.
- tcpa (1 test):
- Validate TCPA table.
- tpm2 (1 test):
- Validate TPM2 table.
- uefi (1 test):
- UEFI Data Table test.
- waet (1 test):
- Windows ACPI Emulated Devices Table test.
- wdat (1 test):
- WDAT Microsoft Hardware Watchdog Action Table test.
- wmi (1 test):
- Windows Management Instrumentation test.
- xenv (1 test):
- Validate XENV table.
- xsdt (1 test):
- XSDT Extended System Description Table test.
-
-Batch tests:
- acpiinfo (3 tests):
- Determine Kernel ACPI version.
- Determine machine's ACPI version.
- Determine AML compiler.
- acpitables (1 test):
- Test ACPI headers.
- apicedge (1 test):
- Legacy and PCI Interrupt Edge/Level trigger tests.
- apicinstance (1 test):
- Test for single instance of APIC/MADT table.
- asf (1 test):
- ASF! Alert Standard Format Table test.
- aspm (2 tests):
- PCIe ASPM ACPI test.
- PCIe ASPM registers test.
- aspt (1 test):
- ASPT Table test.
- autobrightness (2 tests):
- Test for maximum and actual brightness.
- Change actual brightness.
- bert (1 test):
- BERT Boot Error Record Table test.
- bgrt (1 test):
- BGRT Boot Graphics Resource Table test.
- bios32 (1 test):
- BIOS32 Service Directory test.
- bios_info (1 test):
- Gather BIOS DMI information
- bmc_info (1 test):
- BMC Info
- boot (1 test):
- BOOT Table test.
- checksum (1 test):
- ACPI table checksum test.
- cpep (1 test):
- CPEP Corrected Platform Error Polling Table test.
- cpufreq (7 tests):
- CPU frequency table consistency
- CPU frequency table duplicates
- CPU frequency firmware limits
- CPU frequency claimed maximum
- CPU frequency SW_ANY control
- CPU frequency SW_ALL control
- CPU frequency performance tests.
- crs (1 test):
- Test PCI host bridge configuration using _CRS.
- csm (1 test):
- UEFI Compatibility Support Module test.
- csrt (1 test):
- CSRT Core System Resource Table test.
- cstates (1 test):
- Test all CPUs C-states.
- dbg2 (1 test):
- DBG2 (Debug Port Table 2) test.
- dbgp (1 test):
- DBGP (Debug Port) Table test.
- dmar (1 test):
- DMA Remapping test.
- dmicheck (3 tests):
- Find and test SMBIOS Table Entry Points.
- Test DMI/SMBIOS tables for errors.
- Test DMI/SMBIOS3 tables for errors.
- dt_base (3 tests):
- Check device tree presence
- Check device tree baseline validity
- Check device tree warnings
- dt_sysinfo (3 tests):
- Check model property
- Check system-id property
- Check OpenPOWER Reference compatible
- ebda (1 test):
- Test EBDA is reserved in E820 table.
- ecdt (1 test):
- ECDT Embedded Controller Boot Resources Table test.
- einj (1 test):
- EINJ Error Injection Table test.
- erst (1 test):
- ERST Error Record Serialization Table test.
- facs (1 test):
- FACS Firmware ACPI Control Structure test.
- fadt (6 tests):
- ACPI FADT Description Table flag info.
- FADT checksum test.
- FADT revision test.
- ACPI FADT Description Table tests.
- Test FADT SCI_EN bit is enabled.
- Test FADT reset register.
- fan (2 tests):
- Test fan status.
- Load system, check CPU fan status.
- fpdt (1 test):
- FPDT Firmware Performance Data Table test.
- gtdt (1 test):
- GTDT Generic Timer Description Table test.
- hda_audio (1 test):
- HDA Audio Pin Configuration test.
- hest (1 test):
- HEST Hardware Error Source Table test.
- hpet (4 tests):
- Test HPET base in kernel log.
- Test HPET base in HPET table.
- Test HPET base in DSDT and/or SSDT.
- Test HPET configuration.
- iort (1 test):
- IORT IO Remapping Table test.
- klog (1 test):
- Kernel log error check.
- lpit (1 test):
- LPIT Low Power Idle Table test.
- madt (5 tests):
- MADT checksum test.
- MADT revision test.
- MADT architecture minimum revision test.
- MADT flags field reserved bits test.
- MADT subtable tests.
- maxfreq (1 test):
- Maximum CPU frequency test.
- maxreadreq (1 test):
- Test firmware settings MaxReadReq for PCI Express devices.
- mcfg (2 tests):
- Validate MCFG table.
- Validate MCFG PCI config space.
- mchi (1 test):
- MCHI Management Controller Host Interface Table test.
- method (191 tests):
- Test Method Names.
- Test _AEI.
- Test _EVT (Event Method).
- Test _DLM (Device Lock Mutex).
- Test _PIC (Inform AML of Interrupt Model).
- Test _CID (Compatible ID).
- Test _DDN (DOS Device Name).
- Test _HID (Hardware ID).
- Test _HRV (Hardware Revision Number).
- Test _MLS (Multiple Language String).
- Test _PLD (Physical Device Location).
- Test _SUB (Subsystem ID).
- Test _SUN (Slot User Number).
- Test _STR (String).
- Test _UID (Unique ID).
- Test _CDM (Clock Domain).
- Test _CRS (Current Resource Settings).
- Test _DSD (Device Specific Data).
- Test _DIS (Disable).
- Test _DMA (Direct Memory Access).
- Test _FIX (Fixed Register Resource Provider).
- Test _GSB (Global System Interrupt Base).
- Test _HPP (Hot Plug Parameters).
- Test _PRS (Possible Resource Settings).
- Test _PRT (PCI Routing Table).
- Test _PXM (Proximity).
- Test _CCA (Cache Coherency Attribute).
- Test _EDL (Eject Device List).
- Test _EJD (Ejection Dependent Device).
- Test _EJ0 (Eject).
- Test _EJ1 (Eject).
- Test _EJ2 (Eject).
- Test _EJ3 (Eject).
- Test _EJ4 (Eject).
- Test _LCK (Lock).
- Test _RMV (Remove).
- Test _STA (Status).
- Test _DEP (Operational Region Dependencies).
- Test _BDN (BIOS Dock Name).
- Test _BBN (Base Bus Number).
- Test _DCK (Dock).
- Test _INI (Initialize).
- Test _GLK (Global Lock).
- Test _SEG (Segment).
- Test _OFF (Set resource off).
- Test _ON_ (Set resource on).
- Test _DSW (Device Sleep Wake).
- Test _IRC (In Rush Current).
- Test _PRE (Power Resources for Enumeration).
- Test _PR0 (Power Resources for D0).
- Test _PR1 (Power Resources for D1).
- Test _PR2 (Power Resources for D2).
- Test _PR3 (Power Resources for D3).
- Test _PRW (Power Resources for Wake).
- Test _PS0 (Power State 0).
- Test _PS1 (Power State 1).
- Test _PS2 (Power State 2).
- Test _PS3 (Power State 3).
- Test _PSC (Power State Current).
- Test _PSE (Power State for Enumeration).
- Test _PSW (Power State Wake).
- Test _S1D (S1 Device State).
- Test _S2D (S2 Device State).
- Test _S3D (S3 Device State).
- Test _S4D (S4 Device State).
- Test _S0W (S0 Device Wake State).
- Test _S1W (S1 Device Wake State).
- Test _S2W (S2 Device Wake State).
- Test _S3W (S3 Device Wake State).
- Test _S4W (S4 Device Wake State).
- Test _RST (Device Reset).
- Test _PRR (Power Resource for Reset).
- Test _S0_ (S0 System State).
- Test _S1_ (S1 System State).
- Test _S2_ (S2 System State).
- Test _S3_ (S3 System State).
- Test _S4_ (S4 System State).
- Test _S5_ (S5 System State).
- Test _SWS (System Wake Source).
- Test _PSS (Performance Supported States).
- Test _CPC (Continuous Performance Control).
- Test _CSD (C State Dependencies).
- Test _CST (C States).
- Test _PCT (Performance Control).
- Test _PDL (P-State Depth Limit).
- Test _PPC (Performance Present Capabilities).
- Test _PPE (Polling for Platform Error).
- Test _PSD (Power State Dependencies).
- Test _PTC (Processor Throttling Control).
- Test _TDL (T-State Depth Limit).
- Test _TPC (Throttling Present Capabilities).
- Test _TSD (Throttling State Dependencies).
- Test _TSS (Throttling Supported States).
- Test _LPI (Low Power Idle States).
- Test _RDI (Resource Dependencies for Idle).
- Test _PUR (Processor Utilization Request).
- Test _MSG (Message).
- Test _SST (System Status).
- Test _ALC (Ambient Light Colour Chromaticity).
- Test _ALI (Ambient Light Illuminance).
- Test _ALT (Ambient Light Temperature).
- Test _ALP (Ambient Light Polling).
- Test _ALR (Ambient Light Response).
- Test _LID (Lid Status).
- Test _GTF (Get Task File).
- Test _GTM (Get Timing Mode).
- Test _MBM (Memory Bandwidth Monitoring Data).
- Test _UPC (USB Port Capabilities).
- Test _UPD (User Presence Detect).
- Test _UPP (User Presence Polling).
- Test _GCP (Get Capabilities).
- Test _GRT (Get Real Time).
- Test _GWS (Get Wake Status).
- Test _CWS (Clear Wake Status).
- Test _STP (Set Expired Timer Wake Policy).
- Test _STV (Set Timer Value).
- Test _TIP (Expired Timer Wake Policy).
- Test _TIV (Timer Values).
- Test _SBS (Smart Battery Subsystem).
- Test _BCT (Battery Charge Time).
- Test _BIF (Battery Information).
- Test _BIX (Battery Information Extended).
- Test _BMA (Battery Measurement Averaging).
- Test _BMC (Battery Maintenance Control).
- Test _BMD (Battery Maintenance Data).
- Test _BMS (Battery Measurement Sampling Time).
- Test _BST (Battery Status).
- Test _BTP (Battery Trip Point).
- Test _BTH (Battery Throttle Limit).
- Test _BTM (Battery Time).
- Test _PCL (Power Consumer List).
- Test _PIF (Power Source Information).
- Test _PRL (Power Source Redundancy List).
- Test _PSR (Power Source).
- Test _GAI (Get Averaging Level).
- Test _GHL (Get Harware Limit).
- Test _PMC (Power Meter Capabilities).
- Test _PMD (Power Meter Devices).
- Test _PMM (Power Meter Measurement).
- Test _WPC (Wireless Power Calibration).
- Test _WPP (Wireless Power Polling).
- Test _FIF (Fan Information).
- Test _FPS (Fan Performance States).
- Test _FSL (Fan Set Level).
- Test _FST (Fan Status).
- Test _ACx (Active Cooling).
- Test _ART (Active Cooling Relationship Table).
- Test _CRT (Critical Trip Point).
- Test _CR3 (Warm/Standby Temperature).
- Test _DTI (Device Temperature Indication).
- Test _HOT (Hot Temperature).
- Test _MTL (Minimum Throttle Limit).
- Test _NTT (Notification Temp Threshold).
- Test _PSL (Passive List).
- Test _PSV (Passive Temp).
- Test _RTV (Relative Temp Values).
- Test _SCP (Set Cooling Policy).
- Test _TC1 (Thermal Constant 1).
- Test _TC2 (Thermal Constant 2).
- Test _TFP (Thermal fast Sampling Period).
- Test _TMP (Thermal Zone Current Temp).
- Test _TPT (Trip Point Temperature).
- Test _TRT (Thermal Relationship Table).
- Test _TSN (Thermal Sensor Device).
- Test _TSP (Thermal Sampling Period).
- Test _TST (Temperature Sensor Threshold).
- Test _TZD (Thermal Zone Devices).
- Test _TZM (Thermal Zone member).
- Test _TZP (Thermal Zone Polling).
- Test _GPE (General Purpose Events).
- Test _EC_ (EC Offset Query).
- Test _PTS (Prepare to Sleep).
- Test _TTS (Transition to State).
- Test _WAK (System Wake).
- Test _ADR (Return Unique ID for Device).
- Test _BCL (Query List of Brightness Control Levels Supported).
- Test _BCM (Set Brightness Level).
- Test _BQC (Brightness Query Current Level).
- Test _DCS (Return the Status of Output Device).
- Test _DDC (Return the EDID for this Device).
- Test _DSS (Device Set State).
- Test _DGS (Query Graphics State).
- Test _DOD (Enumerate All Devices Attached to Display Adapter).
- Test _DOS (Enable/Disable Output Switching).
- Test _GPD (Get POST Device).
- Test _ROM (Get ROM Data).
- Test _SPD (Set POST Device).
- Test _VPO (Video POST Options).
- Test _CBA (Configuration Base Address).
- Test _IFT (IPMI Interface Type).
- Test _SRV (IPMI Interface Revision).
- microcode (1 test):
- Test for most recent microcode being loaded.
- mpcheck (9 tests):
- Test MP header.
- Test MP CPU entries.
- Test MP Bus entries.
- Test MP IO APIC entries.
- Test MP IO Interrupt entries.
- Test MP Local Interrupt entries.
- Test MP System Address entries.
- Test MP Bus Hierarchy entries.
- Test MP Compatible Bus Address Space entries.
- msct (1 test):
- MSCT Maximum System Characteristics Table test.
- msdm (1 test):
- MSDM Microsoft Data Management Table test.
- msr (5 tests):
- Test CPU generic MSRs.
- Test CPU specific model MSRs.
- Test all P State Ratios.
- Test C1 and C3 autodemotion.
- Test SMRR MSR registers.
- mtrr (3 tests):
- Validate the kernel MTRR IOMEM setup.
- Validate the MTRR setup across all processors.
- Test for AMD MtrrFixDramModEn being cleared by the BIOS.
- nx (3 tests):
- Test CPU NX capability.
- Test all CPUs have same BIOS set NX flag.
- Test all CPUs have same msr setting in MSR 0x1a0.
- olog (1 test):
- OLOG scan and analysis checks results.
- oops (1 test):
- Kernel log oops check.
- osilinux (1 test):
- Disassemble DSDT to check for _OSI("Linux").
- pcc (1 test):
- Processor Clocking Control (PCC) test.
- pciirq (1 test):
- PCI IRQ Routing Table test.
- pnp (1 test):
- PnP BIOS Support Installation structure test.
- prd_info (1 test):
- OPAL Processor Recovery Diagnostics Info
- rsdp (1 test):
- RSDP Root System Description Pointer test.
- rsdt (1 test):
- RSDT Root System Description Table test.
- sbst (1 test):
- SBST Smart Battery Specificiation Table test.
- securebootcert (1 test):
- UEFI secure boot test.
- slic (1 test):
- SLIC Software Licensing Description Table test.
- slit (1 test):
- SLIT System Locality Distance Information test.
- spcr (1 test):
- SPCR Serial Port Console Redirection Table test.
- spmi (1 test):
- SPMI Service Processor Management Interface Description Table test.
- srat (1 test):
- SRAT System Resource Affinity Table test.
- stao (1 test):
- STAO Status Override Table test.
- syntaxcheck (1 test):
- Disassemble and reassemble DSDT and SSDTs.
- tcpa (1 test):
- Validate TCPA table.
- tpm2 (1 test):
- Validate TPM2 table.
- uefi (1 test):
- UEFI Data Table test.
- uefibootpath (1 test):
- Test UEFI Boot Path Boot####.
- version (4 tests):
- Gather kernel signature.
- Gather kernel system information.
- Gather kernel boot command line.
- Gather ACPI driver version.
- virt (1 test):
- CPU Virtualisation Configuration test.
- waet (1 test):
- Windows ACPI Emulated Devices Table test.
- wakealarm (5 tests):
- Test existence of RTC with alarm interface.
- Trigger wakealarm for 1 seconds in the future.
- Test if wakealarm is fired.
- Multiple wakealarm firing tests.
- Reset wakealarm time.
- wdat (1 test):
- WDAT Microsoft Hardware Watchdog Action Table test.
- wmi (1 test):
- Windows Management Instrumentation test.
- xenv (1 test):
- Validate XENV table.
- xsdt (1 test):
- XSDT Extended System Description Table test.
-
-Interactive tests:
- ac_adapter (3 tests):
- Test ACPI ac_adapter state.
- Test ac_adapter initial on-line state.
- Test ac_adapter state changes.
- battery (1 test):
- Battery test.
- brightness (3 tests):
- Observe all brightness changes.
- Observe min, max brightness changes.
- Test brightness hotkeys.
- hotkey (1 test):
- Hotkey keypress checks.
- lid (3 tests):
- Test LID buttons report open correctly.
- Test LID buttons on a single open/close.
- Test LID buttons on multiple open/close events.
- power_button (1 test):
- Test press of power button and ACPI event.
-
-Power States tests:
- s3 (1 test):
- S3 suspend/resume test.
- s3power (1 test):
- S3 power loss during suspend test.
- s4 (1 test):
- S4 hibernate/resume test.
-
-Utilities:
- acpidump (1 test):
- Dump ACPI tables.
- cmosdump (1 test):
- Dump CMOS Memory.
- crsdump (1 test):
- Dump ACPI _CRS (Current Resource Settings).
- ebdadump (1 test):
- Dump EBDA region.
- esrtdump (1 test):
- Dump ESRT Table.
- gpedump (1 test):
- Dump GPEs.
- memmapdump (1 test):
- Dump system memory map.
- mpdump (1 test):
- Dump Multi Processor Data.
- plddump (1 test):
- Dump ACPI _PLD (Physical Device Location).
- prsdump (1 test):
- Dump ACPI _PRS (Possible Resource Settings).
- romdump (1 test):
- Dump ROM data.
- uefidump (1 test):
- Dump UEFI Variables.
- uefivarinfo (1 test):
- UEFI variable info query.
-
-Unsafe tests:
- uefirtauthvar (12 tests):
- Create authenticated variable test.
- Authenticated variable test with the same authenticated variable.
- Authenticated variable test with another valid authenticated variable.
- Append authenticated variable test.
- Update authenticated variable test.
- Authenticated variable test with old authenticated variable.
- Delete authenticated variable test.
- Authenticated variable test with invalid modified data.
- Authenticated variable test with invalid modified timestamp.
- Authenticated variable test with different guid.
- Authenticated variable test with invalid attributes.
- Set and delete authenticated variable created by different key test.
- uefirtmisc (3 tests):
- Test for UEFI miscellaneous runtime service interfaces.
- Stress test for UEFI miscellaneous runtime service interfaces.
- Test GetNextHighMonotonicCount with invalid NULL parameter.
- uefirttime (35 tests):
- Test UEFI RT service get time interface.
- Test UEFI RT service get time interface, NULL time parameter.
- Test UEFI RT service get time interface, NULL time and NULL capabilties parameters.
- Test UEFI RT service set time interface.
- Test UEFI RT service set time interface, invalid year 1899.
- Test UEFI RT service set time interface, invalid year 10000.
- Test UEFI RT service set time interface, invalid month 0.
- Test UEFI RT service set time interface, invalid month 13.
- Test UEFI RT service set time interface, invalid day 0.
- Test UEFI RT service set time interface, invalid day 32.
- Test UEFI RT service set time interface, invalid hour 24.
- Test UEFI RT service set time interface, invalid minute 60.
- Test UEFI RT service set time interface, invalid second 60.
- Test UEFI RT service set time interface, invalid nanosecond 1000000000.
- Test UEFI RT service set time interface, invalid timezone -1441.
- Test UEFI RT service set time interface, invalid timezone 1441.
- Test UEFI RT service get wakeup time interface.
- Test UEFI RT service get wakeup time interface, NULL enabled parameter.
- Test UEFI RT service get wakeup time interface, NULL pending parameter.
- Test UEFI RT service get wakeup time interface, NULL time parameter.
- Test UEFI RT service get wakeup time interface, NULL enabled, pending and time parameters.
- Test UEFI RT service set wakeup time interface.
- Test UEFI RT service set wakeup time interface, NULL time parameter.
- Test UEFI RT service set wakeup time interface, invalid year 1899.
- Test UEFI RT service set wakeup time interface, invalid year 10000.
- Test UEFI RT service set wakeup time interface, invalid month 0.
- Test UEFI RT service set wakeup time interface, invalid month 13.
- Test UEFI RT service set wakeup time interface, invalid day 0.
- Test UEFI RT service set wakeup time interface, invalid day 32.
- Test UEFI RT service set wakeup time interface, invalid hour 24.
- Test UEFI RT service set wakeup time interface, invalid minute 60.
- Test UEFI RT service set wakeup time interface, invalid second 60.
- Test UEFI RT service set wakeup time interface, invalid nanosecond 1000000000.
- Test UEFI RT service set wakeup time interface, invalid timezone -1441.
- Test UEFI RT service set wakeup time interface, invalid timezone 1441.
- uefirtvariable (8 tests):
- Test UEFI RT service get variable interface.
- Test UEFI RT service get next variable name interface.
- Test UEFI RT service set variable interface.
- Test UEFI RT service query variable info interface.
- Test UEFI RT service variable interface stress test.
- Test UEFI RT service set variable interface stress test.
- Test UEFI RT service query variable info interface stress test.
- Test UEFI RT service get variable interface, invalid parameters.
-
-UEFI tests:
- csm (1 test):
- UEFI Compatibility Support Module test.
- esrt (1 test):
- Sanity check UEFI ESRT Table.
- securebootcert (1 test):
- UEFI secure boot test.
- uefibootpath (1 test):
- Test UEFI Boot Path Boot####.
- uefirtauthvar (12 tests):
- Create authenticated variable test.
- Authenticated variable test with the same authenticated variable.
- Authenticated variable test with another valid authenticated variable.
- Append authenticated variable test.
- Update authenticated variable test.
- Authenticated variable test with old authenticated variable.
- Delete authenticated variable test.
- Authenticated variable test with invalid modified data.
- Authenticated variable test with invalid modified timestamp.
- Authenticated variable test with different guid.
- Authenticated variable test with invalid attributes.
- Set and delete authenticated variable created by different key test.
- uefirtmisc (3 tests):
- Test for UEFI miscellaneous runtime service interfaces.
- Stress test for UEFI miscellaneous runtime service interfaces.
- Test GetNextHighMonotonicCount with invalid NULL parameter.
- uefirttime (35 tests):
- Test UEFI RT service get time interface.
- Test UEFI RT service get time interface, NULL time parameter.
- Test UEFI RT service get time interface, NULL time and NULL capabilties parameters.
- Test UEFI RT service set time interface.
- Test UEFI RT service set time interface, invalid year 1899.
- Test UEFI RT service set time interface, invalid year 10000.
- Test UEFI RT service set time interface, invalid month 0.
- Test UEFI RT service set time interface, invalid month 13.
- Test UEFI RT service set time interface, invalid day 0.
- Test UEFI RT service set time interface, invalid day 32.
- Test UEFI RT service set time interface, invalid hour 24.
- Test UEFI RT service set time interface, invalid minute 60.
- Test UEFI RT service set time interface, invalid second 60.
- Test UEFI RT service set time interface, invalid nanosecond 1000000000.
- Test UEFI RT service set time interface, invalid timezone -1441.
- Test UEFI RT service set time interface, invalid timezone 1441.
- Test UEFI RT service get wakeup time interface.
- Test UEFI RT service get wakeup time interface, NULL enabled parameter.
- Test UEFI RT service get wakeup time interface, NULL pending parameter.
- Test UEFI RT service get wakeup time interface, NULL time parameter.
- Test UEFI RT service get wakeup time interface, NULL enabled, pending and time parameters.
- Test UEFI RT service set wakeup time interface.
- Test UEFI RT service set wakeup time interface, NULL time parameter.
- Test UEFI RT service set wakeup time interface, invalid year 1899.
- Test UEFI RT service set wakeup time interface, invalid year 10000.
- Test UEFI RT service set wakeup time interface, invalid month 0.
- Test UEFI RT service set wakeup time interface, invalid month 13.
- Test UEFI RT service set wakeup time interface, invalid day 0.
- Test UEFI RT service set wakeup time interface, invalid day 32.
- Test UEFI RT service set wakeup time interface, invalid hour 24.
- Test UEFI RT service set wakeup time interface, invalid minute 60.
- Test UEFI RT service set wakeup time interface, invalid second 60.
- Test UEFI RT service set wakeup time interface, invalid nanosecond 1000000000.
- Test UEFI RT service set wakeup time interface, invalid timezone -1441.
- Test UEFI RT service set wakeup time interface, invalid timezone 1441.
- uefirtvariable (8 tests):
- Test UEFI RT service get variable interface.
- Test UEFI RT service get next variable name interface.
- Test UEFI RT service set variable interface.
- Test UEFI RT service query variable info interface.
- Test UEFI RT service variable interface stress test.
- Test UEFI RT service set variable interface stress test.
- Test UEFI RT service query variable info interface stress test.
- Test UEFI RT service get variable interface, invalid parameters.
-
-ACPI Spec Compliance tests:
- fadt (6 tests):
- ACPI FADT Description Table flag info.
- FADT checksum test.
- FADT revision test.
- ACPI FADT Description Table tests.
- Test FADT SCI_EN bit is enabled.
- Test FADT reset register.
- madt (5 tests):
- MADT checksum test.
- MADT revision test.
- MADT architecture minimum revision test.
- MADT flags field reserved bits test.
- MADT subtable tests.
- rsdp (1 test):
- RSDP Root System Description Pointer test.
diff --git a/fwts-test/arg-show-tests-full-0001/test-0001.sh b/fwts-test/arg-show-tests-full-0001/test-0001.sh
deleted file mode 100755
index b4e74f7..0000000
--- a/fwts-test/arg-show-tests-full-0001/test-0001.sh
+++ /dev/null
@@ -1,27 +0,0 @@
-#!/bin/bash
-#
-TEST="Test --show-tests-full option"
-NAME=test-0001.sh
-TMPLOG=$TMP/arg-show-tests-full.log.$$
-
-#
-# Non-x86 tests don't have WMI so skip this test
-#
-$FWTS --show-tests | grep wmi > /dev/null
-if [ $? -eq 1 ]; then
- echo SKIP: $TEST, $NAME
- exit 77
-fi
-
-stty cols 80
-$FWTS --show-tests-full > $TMPLOG
-diff $TMPLOG $FWTSTESTDIR/arg-show-tests-full-0001/arg-show-tests-full-0001.log >> $FAILURE_LOG
-ret=$?
-if [ $ret -eq 0 ]; then
- echo PASSED: $TEST, $NAME
-else
- echo FAILED: $TEST, $NAME
-fi
-
-rm $TMPLOG
-exit $ret
--
2.8.1
More information about the fwts-devel
mailing list