ACK: [PATCH] fwts-test: add dt_sysinfo to show-tests* regression tests

ivanhu ivan.hu at canonical.com
Fri Apr 29 08:52:46 UTC 2016



On 04/27/2016 05:13 PM, Colin King wrote:
> From: Colin Ian King <colin.king at canonical.com>
>
> Sync fwts tests now that we've introduced device tree tests with
> commit b9a13c4e1b789d1964faf1b99d2c5c1e32fb3d99
> ("devicetree/dt_sysinfo: Add device tree system information tests")
>
> Signed-off-by: Colin Ian King <colin.king at canonical.com>
> ---
>   fwts-test/arg-show-tests-0001/arg-show-tests-0001.log           | 1 +
>   fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log | 3 +++
>   2 files changed, 4 insertions(+)
>
> diff --git a/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log b/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
> index 6033cf0..0168202 100644
> --- a/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
> +++ b/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
> @@ -75,6 +75,7 @@ Batch tests:
>    dbgp            DBGP (Debug Port) Table test.
>    dmar            DMA Remapping (VT-d) test.
>    dmicheck        DMI/SMBIOS table tests.
> + dt_sysinfo      Device tree system information test
>    ebda            Test EBDA region is mapped and reserved in memory map table.
>    ecdt            ECDT Embedded Controller Boot Resources Table test.
>    einj            EINJ Error Injection Table test.
> diff --git a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log b/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> index ae41c80..8c9cd10 100644
> --- a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> +++ b/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> @@ -364,6 +364,9 @@ Batch tests:
>     Find and test SMBIOS Table Entry Points.
>     Test DMI/SMBIOS tables for errors.
>     Test DMI/SMBIOS3 tables for errors.
> + dt_sysinfo      (2 tests):
> +  Check model property
> +  Check system-id property
>    ebda            (1 test):
>     Test EBDA is reserved in E820 table.
>    ecdt            (1 test):
Acked-by: Ivan Hu <ivan.hu at canonical.com>



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