ACK: [PATCH] fwts-test: Update tests with new acpi category
Colin Ian King
colin.king at canonical.com
Sat May 30 07:55:02 UTC 2015
On 30/05/15 07:31, Alex Hung wrote:
> Signed-off-by: Alex Hung <alex.hung at canonical.com>
> ---
> fwts-test/arg-help-0001/arg-help-0001.log | 1 +
> fwts-test/arg-help-0001/arg-help-0002.log | 1 +
> fwts-test/arg-help-0001/test-0001.sh | 2 +-
> .../arg-show-tests-0001/arg-show-tests-0001.log | 15 ++
> .../arg-show-tests-full-0001.log | 217 ++++++++++++++++++++-
> 5 files changed, 234 insertions(+), 2 deletions(-)
>
> diff --git a/fwts-test/arg-help-0001/arg-help-0001.log b/fwts-test/arg-help-0001/arg-help-0001.log
> index 6773a6c..3b79179 100644
> --- a/fwts-test/arg-help-0001/arg-help-0001.log
> +++ b/fwts-test/arg-help-0001/arg-help-0001.log
> @@ -1,3 +1,4 @@
> +--acpi Run ACPI tests.
> --acpica Enable ACPICA run
> time options.
> --acpica-debug Enable ACPICA debug
> diff --git a/fwts-test/arg-help-0001/arg-help-0002.log b/fwts-test/arg-help-0001/arg-help-0002.log
> index 6773a6c..3b79179 100644
> --- a/fwts-test/arg-help-0001/arg-help-0002.log
> +++ b/fwts-test/arg-help-0001/arg-help-0002.log
> @@ -1,3 +1,4 @@
> +--acpi Run ACPI tests.
> --acpica Enable ACPICA run
> time options.
> --acpica-debug Enable ACPICA debug
> diff --git a/fwts-test/arg-help-0001/test-0001.sh b/fwts-test/arg-help-0001/test-0001.sh
> index 38b3dbb..b06383f 100755
> --- a/fwts-test/arg-help-0001/test-0001.sh
> +++ b/fwts-test/arg-help-0001/test-0001.sh
> @@ -35,5 +35,5 @@ fi
> stty cols 80 2> /dev/null
> tset 2> /dev/null
>
> -#rm $TMPLOG
> +rm $TMPLOG
> exit $ret
> diff --git a/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log b/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
> index e34af88..8d9b691 100644
> --- a/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
> +++ b/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
> @@ -1,3 +1,18 @@
> +ACPI tests:
> + acpiinfo General ACPI information test.
> + acpitables ACPI table settings sanity tests.
> + apicinstance Test for single instance of APIC/MADT table.
> + checksum ACPI table checksum test.
> + cstates Processor C state support test.
> + dmar DMA Remapping (VT-d) test.
> + fadt FADT SCI_EN enabled tests.
> + hpet_check HPET configuration tests.
> + mcfg MCFG PCI Express* memory mapped config space test.
> + method ACPI DSDT Method Semantic tests.
> + pcc Processor Clocking Control (PCC) test.
> + spcr SPCR Serial Port Console Redirection Table test.
> + wmi Extract and analyse Windows Management Instrumentation (WMI).
> +
> Batch tests:
> acpiinfo General ACPI information test.
> acpitables ACPI table settings sanity tests.
> diff --git a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log b/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> index b72ee5b..b32cf2e 100644
> --- a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> +++ b/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> @@ -1,3 +1,218 @@
> +ACPI tests:
> + acpiinfo (3 tests):
> + Determine Kernel ACPI version.
> + Determine machine's ACPI version.
> + Determine AML compiler.
> + acpitables (2 tests):
> + Test ACPI tables.
> + Test ACPI headers.
> + apicinstance (1 test):
> + Test for single instance of APIC/MADT table.
> + checksum (1 test):
> + ACPI table checksum test.
> + cstates (1 test):
> + Test all CPUs C-states.
> + dmar (1 test):
> + DMA Remapping test.
> + fadt (2 tests):
> + Test FADT SCI_EN bit is enabled.
> + Test FADT reset register.
> + hpet_check (4 tests):
> + Test HPET base in kernel log.
> + Test HPET base in HPET table.
> + Test HPET base in DSDT and/or SSDT.
> + Test HPET configuration.
> + mcfg (2 tests):
> + Validate MCFG table.
> + Validate MCFG PCI config space.
> + method (180 tests):
> + Test Method Names.
> + Test _AEI.
> + Test _EVT (Event Method).
> + Test _DLM (Device Lock Mutex).
> + Test _PIC (Inform AML of Interrupt Model).
> + Test _CID (Compatible ID).
> + Test _DDN (DOS Device Name).
> + Test _HID (Hardware ID).
> + Test _HRV (Hardware Revision Number).
> + Test _MLS (Multiple Language String).
> + Test _PLD (Physical Device Location).
> + Test _SUB (Subsystem ID).
> + Test _SUN (Slot User Number).
> + Test _STR (String).
> + Test _UID (Unique ID).
> + Test _CDM (Clock Domain).
> + Test _CRS (Current Resource Settings).
> + Test _DSD (Device Specific Data).
> + Test _DIS (Disable).
> + Test _DMA (Direct Memory Access).
> + Test _FIX (Fixed Register Resource Provider).
> + Test _GSB (Global System Interrupt Base).
> + Test _HPP (Hot Plug Parameters).
> + Test _PRS (Possible Resource Settings).
> + Test _PXM (Proximity).
> + Test _CCA (Cache Coherency Attribute).
> + Test _EDL (Eject Device List).
> + Test _EJD (Ejection Dependent Device).
> + Test _EJ0 (Eject).
> + Test _EJ1 (Eject).
> + Test _EJ2 (Eject).
> + Test _EJ3 (Eject).
> + Test _EJ4 (Eject).
> + Test _LCK (Lock).
> + Test _RMV (Remove).
> + Test _STA (Status).
> + Test _DEP (Operational Region Dependencies).
> + Test _BDN (BIOS Dock Name).
> + Test _BBN (Base Bus Number).
> + Test _DCK (Dock).
> + Test _INI (Initialize).
> + Test _GLK (Global Lock).
> + Test _SEG (Segment).
> + Test _OFF (Set resource off).
> + Test _ON (Set resource on).
> + Test _DSW (Device Sleep Wake).
> + Test _IRC (In Rush Current).
> + Test _PRE (Power Resources for Enumeration).
> + Test _PR0 (Power Resources for D0).
> + Test _PR1 (Power Resources for D1).
> + Test _PR2 (Power Resources for D2).
> + Test _PR3 (Power Resources for D3).
> + Test _PRW (Power Resources for Wake).
> + Test _PS0 (Power State 0).
> + Test _PS1 (Power State 1).
> + Test _PS2 (Power State 2).
> + Test _PS3 (Power State 3).
> + Test _PSC (Power State Current).
> + Test _PSE (Power State for Enumeration).
> + Test _PSW (Power State Wake).
> + Test _S1D (S1 Device State).
> + Test _S2D (S2 Device State).
> + Test _S3D (S3 Device State).
> + Test _S4D (S4 Device State).
> + Test _S0W (S0 Device Wake State).
> + Test _S1W (S1 Device Wake State).
> + Test _S2W (S2 Device Wake State).
> + Test _S3W (S3 Device Wake State).
> + Test _S4W (S4 Device Wake State).
> + Test _S0_ (S0 System State).
> + Test _S1_ (S1 System State).
> + Test _S2_ (S2 System State).
> + Test _S3_ (S3 System State).
> + Test _S4_ (S4 System State).
> + Test _S5_ (S5 System State).
> + Test _SWS (System Wake Source).
> + Test _PSS (Performance Supported States).
> + Test _CPC (Continuous Performance Control).
> + Test _CSD (C State Dependencies).
> + Test _CST (C States).
> + Test _PCT (Performance Control).
> + Test _PDL (P-State Depth Limit).
> + Test _PPC (Performance Present Capabilities).
> + Test _PPE (Polling for Platform Error).
> + Test _PSD (Power State Dependencies).
> + Test _TDL (T-State Depth Limit).
> + Test _TPC (Throttling Present Capabilities).
> + Test _TSD (Throttling State Dependencies).
> + Test _TSS (Throttling Supported States).
> + Test _PUR (Processor Utilization Request).
> + Test _MSG (Message).
> + Test _SST (System Status).
> + Test _ALC (Ambient Light Colour Chromaticity).
> + Test _ALI (Ambient Light Illuminance).
> + Test _ALT (Ambient Light Temperature).
> + Test _ALP (Ambient Light Polling).
> + Test _ALR (Ambient Light Response).
> + Test _LID (Lid Status).
> + Test _GTF (Get Task File).
> + Test _GTM (Get Timing Mode).
> + Test _MBM (Memory Bandwidth Monitoring Data).
> + Test _UPC (USB Port Capabilities).
> + Test _UPD (User Presence Detect).
> + Test _UPP (User Presence Polling).
> + Test _GCP (Get Capabilities).
> + Test _GRT (Get Real Time).
> + Test _GWS (Get Wake Status).
> + Test _STP (Set Expired Timer Wake Policy).
> + Test _STV (Set Timer Value).
> + Test _TIP (Expired Timer Wake Policy).
> + Test _TIV (Timer Values).
> + Test _SBS (Smart Battery Subsystem).
> + Test _BCT (Battery Charge Time).
> + Test _BIF (Battery Information).
> + Test _BIX (Battery Information Extended).
> + Test _BMA (Battery Measurement Averaging).
> + Test _BMC (Battery Maintenance Control).
> + Test _BMD (Battery Maintenance Data).
> + Test _BMS (Battery Measurement Sampling Time).
> + Test _BST (Battery Status).
> + Test _BTP (Battery Trip Point).
> + Test _BTM (Battery Time).
> + Test _PCL (Power Consumer List).
> + Test _PIF (Power Source Information).
> + Test _PRL (Power Source Redundancy List).
> + Test _PSR (Power Source).
> + Test _GAI (Get Averaging Level).
> + Test _GHL (Get Harware Limit).
> + Test _PMD (Power Meter Devices).
> + Test _PMM (Power Meter Measurement).
> + Test _FIF (Fan Information).
> + Test _FPS (Fan Performance States).
> + Test _FSL (Fan Set Level).
> + Test _FST (Fan Status).
> + Test _ACx (Active Cooling).
> + Test _ART (Active Cooling Relationship Table).
> + Test _CRT (Critical Trip Point).
> + Test _DTI (Device Temperature Indication).
> + Test _HOT (Hot Temperature).
> + Test _NTT (Notification Temp Threshold).
> + Test _PSL (Passive List).
> + Test _PSV (Passive Temp).
> + Test _RTV (Relative Temp Values).
> + Test _SCP (Set Cooling Policy).
> + Test _TC1 (Thermal Constant 1).
> + Test _TC2 (Thermal Constant 2).
> + Test _TMP (Thermal Zone Current Temp).
> + Test _TPT (Trip Point Temperature).
> + Test _TRT (Thermal Relationship Table).
> + Test _TSP (Thermal Sampling Period).
> + Test _TST (Temperature Sensor Threshold).
> + Test _TZD (Thermal Zone Devices).
> + Test _TZM (Thermal Zone member).
> + Test _TZP (Thermal Zone Polling).
> + Test _PTS (Prepare to Sleep).
> + Test _TTS (Transition to State).
> + Test _S0 (System S0 State).
> + Test _S1 (System S1 State).
> + Test _S2 (System S2 State).
> + Test _S3 (System S3 State).
> + Test _S4 (System S4 State).
> + Test _S5 (System S5 State).
> + Test _WAK (System Wake).
> + Test _ADR (Return Unique ID for Device).
> + Test _BCL (Query List of Brightness Control Levels Supported).
> + Test _BCM (Set Brightness Level).
> + Test _BQC (Brightness Query Current Level)..
> + Test _DCS (Return the Status of Output Device).
> + Test _DDC (Return the EDID for this Device).
> + Test _DSS (Device Set State).
> + Test _DGS (Query Graphics State).
> + Test _DOD (Enumerate All Devices Attached to Display Adapter).
> + Test _DOS (Enable/Disable Output Switching).
> + Test _GPD (Get POST Device).
> + Test _ROM (Get ROM Data).
> + Test _SPD (Set POST Device).
> + Test _VPO (Video POST Options).
> + Test _CBA (Configuration Base Address).
> + Test _IFT (IPMI Interface Type).
> + Test _SRV (IPMI Interface Revision).
> + pcc (1 test):
> + Processor Clocking Control (PCC) test.
> + spcr (1 test):
> + SPCR Serial Port Console Redirection Table test.
> + wmi (1 test):
> + Windows Management Instrumentation test.
> +
> Batch tests:
> acpiinfo (3 tests):
> Determine Kernel ACPI version.
> @@ -489,4 +704,4 @@ UEFI tests:
> Test UEFI RT service query variable info interface stress test.
> Test UEFI RT service get variable interface, invalid parameters.
>
> -Total of 403 tests
> +Total of 603 tests
>
Acked-by: Colin Ian King <colin.king at canonical.com>
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