[PATCH] fwts-test: update tests for new acpi method tests
Alex Hung
alex.hung at canonical.com
Wed Sep 17 04:32:36 UTC 2014
Signed-off-by: Alex Hung <alex.hung at canonical.com>
---
.../arg-show-tests-full-0001.log | 16 +-
fwts-test/method-0001/method-0001.log | 1097 +++++++++++---------
2 files changed, 593 insertions(+), 520 deletions(-)
diff --git a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log b/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
index ea30281..13a9054 100644
--- a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
+++ b/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
@@ -59,9 +59,10 @@ Batch tests:
mcfg (2 tests):
Validate MCFG table.
Validate MCFG PCI config space.
- method (157 tests):
+ method (169 tests):
Test Method Names.
Test _AEI.
+ Test _EVT (Event Method).
Test _PIC (Inform AML of Interrupt Model).
Test _CID (Compatible ID).
Test _DDN (DOS Device Name).
@@ -97,6 +98,7 @@ Batch tests:
Test _BBN (Base Bus Number).
Test _DCK (Dock).
Test _INI (Initialize).
+ Test _GLK (Global Lock).
Test _SEG (Segment).
Test _OFF (Set resource off).
Test _ON (Set resource on).
@@ -142,12 +144,16 @@ Batch tests:
Test _TPC (Throttling Present Capabilities).
Test _TSD (Throttling State Dependencies).
Test _TSS (Throttling Supported States).
+ Test _PUR (Processor Utilization Request).
Test _MSG (Message).
+ Test _SST (System Status).
Test _ALC (Ambient Light Colour Chromaticity).
Test _ALI (Ambient Light Illuminance).
Test _ALT (Ambient Light Temperature).
Test _ALP (Ambient Light Polling).
Test _LID (Lid Status).
+ Test _GTF (Get Task File).
+ Test _GTM (Get Timing Mode).
Test _UPD (User Presence Detect).
Test _UPP (User Presence Polling).
Test _GCP (Get Capabilities).
@@ -172,15 +178,18 @@ Batch tests:
Test _PIF (Power Source Information).
Test _PSR (Power Source).
Test _GAI (Get Averaging Level).
+ Test _GHL (Get Harware Limit).
Test _PMM (Power Meter Measurement).
Test _FIF (Fan Information).
Test _FSL (Fan Set Level).
Test _FST (Fan Status).
Test _ACx (Active Cooling).
+ Test _ART (Active Cooling Relationship Table).
Test _CRT (Critical Trip Point).
Test _DTI (Device Temperature Indication).
Test _HOT (Hot Temperature).
Test _NTT (Notification Temp Threshold).
+ Test _PSL (Passive List).
Test _PSV (Passive Temp).
Test _RTV (Relative Temp Values).
Test _SCP (Set Cooling Policy).
@@ -188,8 +197,11 @@ Batch tests:
Test _TC2 (Thermal Constant 2).
Test _TMP (Thermal Zone Current Temp).
Test _TPT (Trip Point Temperature).
+ Test _TRT (Thermal Relationship Table).
Test _TSP (Thermal Sampling Period).
Test _TST (Temperature Sensor Threshold).
+ Test _TZD (Thermal Zone Devices).
+ Test _TZM (Thermal Zone member).
Test _TZP (Thermal Zone Polling).
Test _PTS (Prepare to Sleep).
Test _TTS (Transition to State).
@@ -372,4 +384,4 @@ UEFI tests:
Test UEFI RT service set variable interface stress test.
Test UEFI RT service query variable info interface stress test.
-Total of 289 tests
+Total of 301 tests
diff --git a/fwts-test/method-0001/method-0001.log b/fwts-test/method-0001/method-0001.log
index 8b64467..b63b4f6 100644
--- a/fwts-test/method-0001/method-0001.log
+++ b/fwts-test/method-0001/method-0001.log
@@ -1,549 +1,557 @@
method method: ACPI DSDT Method Semantic tests.
method ----------------------------------------------------------
-method Test 1 of 157: Test Method Names.
+method Test 1 of 169: Test Method Names.
method Found 1061 Objects
method PASSED: Test 1, Method names contain legal characters.
method
-method Test 2 of 157: Test _AEI.
+method Test 2 of 169: Test _AEI.
method SKIPPED: Test 2, Skipping test for non-existant object
method _AEI.
method
-method Test 3 of 157: Test _PIC (Inform AML of Interrupt Model).
-method PASSED: Test 3, \_PIC returned no values as expected.
-method PASSED: Test 3, \_PIC returned no values as expected.
-method PASSED: Test 3, \_PIC returned no values as expected.
+method Test 3 of 169: Test _EVT (Event Method).
+method SKIPPED: Test 3, Skipping test for non-existant object
+method _EVT.
method
-method Test 4 of 157: Test _CID (Compatible ID).
-method PASSED: Test 4, \_SB_.PCI0._CID returned an integer
+method Test 4 of 169: Test _PIC (Inform AML of Interrupt Model).
+method PASSED: Test 4, \_PIC returned no values as expected.
+method PASSED: Test 4, \_PIC returned no values as expected.
+method PASSED: Test 4, \_PIC returned no values as expected.
+method
+method Test 5 of 169: Test _CID (Compatible ID).
+method PASSED: Test 5, \_SB_.PCI0._CID returned an integer
method 0x030ad041 (EISA ID PNP0A03).
-method PASSED: Test 4, \_SB_.PCI0.LPCB.HPET._CID returned an
+method PASSED: Test 5, \_SB_.PCI0.LPCB.HPET._CID returned an
method integer 0x010cd041 (EISA ID PNP0C01).
method
-method Test 5 of 157: Test _DDN (DOS Device Name).
-method SKIPPED: Test 5, Skipping test for non-existant object
+method Test 6 of 169: Test _DDN (DOS Device Name).
+method SKIPPED: Test 6, Skipping test for non-existant object
method _DDN.
method
-method Test 6 of 157: Test _HID (Hardware ID).
-method PASSED: Test 6, \_SB_.AMW0._HID returned a string
+method Test 7 of 169: Test _HID (Hardware ID).
+method PASSED: Test 7, \_SB_.AMW0._HID returned a string
method 'PNP0C14' as expected.
-method PASSED: Test 6, \_SB_.LID0._HID returned an integer
+method PASSED: Test 7, \_SB_.LID0._HID returned an integer
method 0x0d0cd041 (EISA ID PNP0C0D).
-method PASSED: Test 6, \_SB_.PWRB._HID returned an integer
+method PASSED: Test 7, \_SB_.PWRB._HID returned an integer
method 0x0c0cd041 (EISA ID PNP0C0C).
-method PASSED: Test 6, \_SB_.PCI0._HID returned an integer
+method PASSED: Test 7, \_SB_.PCI0._HID returned an integer
method 0x080ad041 (EISA ID PNP0A08).
-method PASSED: Test 6, \_SB_.PCI0.PDRC._HID returned an integer
+method PASSED: Test 7, \_SB_.PCI0.PDRC._HID returned an integer
method 0x020cd041 (EISA ID PNP0C02).
-method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKA._HID returned an
+method PASSED: Test 7, \_SB_.PCI0.LPCB.LNKA._HID returned an
method integer 0x0f0cd041 (EISA ID PNP0C0F).
-method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKB._HID returned an
+method PASSED: Test 7, \_SB_.PCI0.LPCB.LNKB._HID returned an
method integer 0x0f0cd041 (EISA ID PNP0C0F).
-method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKC._HID returned an
+method PASSED: Test 7, \_SB_.PCI0.LPCB.LNKC._HID returned an
method integer 0x0f0cd041 (EISA ID PNP0C0F).
-method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKD._HID returned an
+method PASSED: Test 7, \_SB_.PCI0.LPCB.LNKD._HID returned an
method integer 0x0f0cd041 (EISA ID PNP0C0F).
-method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKE._HID returned an
+method PASSED: Test 7, \_SB_.PCI0.LPCB.LNKE._HID returned an
method integer 0x0f0cd041 (EISA ID PNP0C0F).
-method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKF._HID returned an
+method PASSED: Test 7, \_SB_.PCI0.LPCB.LNKF._HID returned an
method integer 0x0f0cd041 (EISA ID PNP0C0F).
-method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKG._HID returned an
+method PASSED: Test 7, \_SB_.PCI0.LPCB.LNKG._HID returned an
method integer 0x0f0cd041 (EISA ID PNP0C0F).
-method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKH._HID returned an
+method PASSED: Test 7, \_SB_.PCI0.LPCB.LNKH._HID returned an
method integer 0x0f0cd041 (EISA ID PNP0C0F).
-method PASSED: Test 6, \_SB_.PCI0.LPCB.DMAC._HID returned an
+method PASSED: Test 7, \_SB_.PCI0.LPCB.DMAC._HID returned an
method integer 0x0002d041 (EISA ID PNP0200).
-method PASSED: Test 6, \_SB_.PCI0.LPCB.FWHD._HID returned an
+method PASSED: Test 7, \_SB_.PCI0.LPCB.FWHD._HID returned an
method integer 0x0008d425 (EISA ID INT0800).
-method PASSED: Test 6, \_SB_.PCI0.LPCB.HPET._HID returned an
+method PASSED: Test 7, \_SB_.PCI0.LPCB.HPET._HID returned an
method integer 0x0301d041 (EISA ID PNP0103).
-method PASSED: Test 6, \_SB_.PCI0.LPCB.IPIC._HID returned an
+method PASSED: Test 7, \_SB_.PCI0.LPCB.IPIC._HID returned an
method integer 0x0000d041 (EISA ID PNP0000).
-method PASSED: Test 6, \_SB_.PCI0.LPCB.MATH._HID returned an
+method PASSED: Test 7, \_SB_.PCI0.LPCB.MATH._HID returned an
method integer 0x040cd041 (EISA ID PNP0C04).
-method PASSED: Test 6, \_SB_.PCI0.LPCB.LDRC._HID returned an
+method PASSED: Test 7, \_SB_.PCI0.LPCB.LDRC._HID returned an
method integer 0x020cd041 (EISA ID PNP0C02).
-method PASSED: Test 6, \_SB_.PCI0.LPCB.RTC_._HID returned an
+method PASSED: Test 7, \_SB_.PCI0.LPCB.RTC_._HID returned an
method integer 0x000bd041 (EISA ID PNP0B00).
-method PASSED: Test 6, \_SB_.PCI0.LPCB.TIMR._HID returned an
+method PASSED: Test 7, \_SB_.PCI0.LPCB.TIMR._HID returned an
method integer 0x0001d041 (EISA ID PNP0100).
-method PASSED: Test 6, \_SB_.PCI0.LPCB.ACAD._HID returned a
+method PASSED: Test 7, \_SB_.PCI0.LPCB.ACAD._HID returned a
method string 'ACPI0003' as expected.
-method PASSED: Test 6, \_SB_.PCI0.LPCB.EC0_._HID returned an
+method PASSED: Test 7, \_SB_.PCI0.LPCB.EC0_._HID returned an
method integer 0x090cd041 (EISA ID PNP0C09).
-method PASSED: Test 6, \_SB_.PCI0.LPCB.BAT1._HID returned an
+method PASSED: Test 7, \_SB_.PCI0.LPCB.BAT1._HID returned an
method integer 0x0a0cd041 (EISA ID PNP0C0A).
-method PASSED: Test 6, \_SB_.PCI0.LPCB.PS2K._HID returned an
+method PASSED: Test 7, \_SB_.PCI0.LPCB.PS2K._HID returned an
method integer 0x0303d041 (EISA ID PNP0303).
-method PASSED: Test 6, \_SB_.PCI0.LPCB.PS2M._HID returned an
+method PASSED: Test 7, \_SB_.PCI0.LPCB.PS2M._HID returned an
method integer 0x130fd041 (EISA ID PNP0F13).
method
-method Test 7 of 157: Test _HRV (Hardware Revision Number).
-method SKIPPED: Test 7, Skipping test for non-existant object
+method Test 8 of 169: Test _HRV (Hardware Revision Number).
+method SKIPPED: Test 8, Skipping test for non-existant object
method _HRV.
method
-method Test 8 of 157: Test _PLD (Physical Device Location).
-method SKIPPED: Test 8, Skipping test for non-existant object
+method Test 9 of 169: Test _PLD (Physical Device Location).
+method SKIPPED: Test 9, Skipping test for non-existant object
method _PLD.
method
-method Test 9 of 157: Test _SUB (Subsystem ID).
-method SKIPPED: Test 9, Skipping test for non-existant object
+method Test 10 of 169: Test _SUB (Subsystem ID).
+method SKIPPED: Test 10, Skipping test for non-existant object
method _SUB.
method
-method Test 10 of 157: Test _SUN (Slot User Number).
-method SKIPPED: Test 10, Skipping test for non-existant object
+method Test 11 of 169: Test _SUN (Slot User Number).
+method SKIPPED: Test 11, Skipping test for non-existant object
method _SUN.
method
-method Test 11 of 157: Test _STR (String).
-method SKIPPED: Test 11, Skipping test for non-existant object
+method Test 12 of 169: Test _STR (String).
+method SKIPPED: Test 12, Skipping test for non-existant object
method _STR.
method
-method Test 12 of 157: Test _UID (Unique ID).
-method PASSED: Test 12, \_SB_.AMW0._UID correctly returned sane
+method Test 13 of 169: Test _UID (Unique ID).
+method PASSED: Test 13, \_SB_.AMW0._UID correctly returned sane
method looking value 0x00000000.
-method PASSED: Test 12, \_SB_.PCI0.PDRC._UID correctly returned
+method PASSED: Test 13, \_SB_.PCI0.PDRC._UID correctly returned
method sane looking value 0x00000001.
-method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKA._UID correctly
+method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKA._UID correctly
method returned sane looking value 0x00000001.
-method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKB._UID correctly
+method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKB._UID correctly
method returned sane looking value 0x00000002.
-method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKC._UID correctly
+method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKC._UID correctly
method returned sane looking value 0x00000003.
-method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKD._UID correctly
+method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKD._UID correctly
method returned sane looking value 0x00000004.
-method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKE._UID correctly
+method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKE._UID correctly
method returned sane looking value 0x00000005.
-method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKF._UID correctly
+method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKF._UID correctly
method returned sane looking value 0x00000006.
-method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKG._UID correctly
+method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKG._UID correctly
method returned sane looking value 0x00000007.
-method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKH._UID correctly
+method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKH._UID correctly
method returned sane looking value 0x00000008.
-method PASSED: Test 12, \_SB_.PCI0.LPCB.LDRC._UID correctly
+method PASSED: Test 13, \_SB_.PCI0.LPCB.LDRC._UID correctly
method returned sane looking value 0x00000002.
-method PASSED: Test 12, \_SB_.PCI0.LPCB.BAT1._UID correctly
+method PASSED: Test 13, \_SB_.PCI0.LPCB.BAT1._UID correctly
method returned sane looking value 0x00000001.
method
-method Test 13 of 157: Test _CDM (Clock Domain).
-method SKIPPED: Test 13, Skipping test for non-existant object
+method Test 14 of 169: Test _CDM (Clock Domain).
+method SKIPPED: Test 14, Skipping test for non-existant object
method _CDM.
method
-method Test 14 of 157: Test _CRS (Current Resource Settings).
-method PASSED: Test 14, \_SB_.PCI0._CRS (WORD Address Space
+method Test 15 of 169: Test _CRS (Current Resource Settings).
+method PASSED: Test 15, \_SB_.PCI0._CRS (WORD Address Space
method Descriptor) looks sane.
-method PASSED: Test 14, \_SB_.PCI0.PDRC._CRS (32-bit Fixed
+method PASSED: Test 15, \_SB_.PCI0.PDRC._CRS (32-bit Fixed
method Location Memory Range Descriptor) looks sane.
-method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKA._CRS (IRQ
+method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKA._CRS (IRQ
method Descriptor) looks sane.
-method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKB._CRS (IRQ
+method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKB._CRS (IRQ
method Descriptor) looks sane.
-method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKC._CRS (IRQ
+method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKC._CRS (IRQ
method Descriptor) looks sane.
-method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKD._CRS (IRQ
+method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKD._CRS (IRQ
method Descriptor) looks sane.
-method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKE._CRS (IRQ
+method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKE._CRS (IRQ
method Descriptor) looks sane.
-method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKF._CRS (IRQ
+method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKF._CRS (IRQ
method Descriptor) looks sane.
-method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKG._CRS (IRQ
+method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKG._CRS (IRQ
method Descriptor) looks sane.
-method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKH._CRS (IRQ
+method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKH._CRS (IRQ
method Descriptor) looks sane.
-method PASSED: Test 14, \_SB_.PCI0.LPCB.DMAC._CRS (I/O Port
+method PASSED: Test 15, \_SB_.PCI0.LPCB.DMAC._CRS (I/O Port
method Descriptor) looks sane.
-method PASSED: Test 14, \_SB_.PCI0.LPCB.FWHD._CRS (32-bit Fixed
+method PASSED: Test 15, \_SB_.PCI0.LPCB.FWHD._CRS (32-bit Fixed
method Location Memory Range Descriptor) looks sane.
-method PASSED: Test 14, \_SB_.PCI0.LPCB.HPET._CRS (32-bit Fixed
+method PASSED: Test 15, \_SB_.PCI0.LPCB.HPET._CRS (32-bit Fixed
method Location Memory Range Descriptor) looks sane.
-method PASSED: Test 14, \_SB_.PCI0.LPCB.IPIC._CRS (I/O Port
+method PASSED: Test 15, \_SB_.PCI0.LPCB.IPIC._CRS (I/O Port
method Descriptor) looks sane.
-method PASSED: Test 14, \_SB_.PCI0.LPCB.MATH._CRS (I/O Port
+method PASSED: Test 15, \_SB_.PCI0.LPCB.MATH._CRS (I/O Port
method Descriptor) looks sane.
-method PASSED: Test 14, \_SB_.PCI0.LPCB.LDRC._CRS (I/O Port
+method PASSED: Test 15, \_SB_.PCI0.LPCB.LDRC._CRS (I/O Port
method Descriptor) looks sane.
-method PASSED: Test 14, \_SB_.PCI0.LPCB.RTC_._CRS (I/O Port
+method PASSED: Test 15, \_SB_.PCI0.LPCB.RTC_._CRS (I/O Port
method Descriptor) looks sane.
-method PASSED: Test 14, \_SB_.PCI0.LPCB.TIMR._CRS (I/O Port
+method PASSED: Test 15, \_SB_.PCI0.LPCB.TIMR._CRS (I/O Port
method Descriptor) looks sane.
-method PASSED: Test 14, \_SB_.PCI0.LPCB.EC0_._CRS (I/O Port
+method PASSED: Test 15, \_SB_.PCI0.LPCB.EC0_._CRS (I/O Port
method Descriptor) looks sane.
-method PASSED: Test 14, \_SB_.PCI0.LPCB.PS2K._CRS (I/O Port
+method PASSED: Test 15, \_SB_.PCI0.LPCB.PS2K._CRS (I/O Port
method Descriptor) looks sane.
-method PASSED: Test 14, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ
+method PASSED: Test 15, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ
method Descriptor) looks sane.
method
-method Test 15 of 157: Test _DSD (Device Specific Data).
-method SKIPPED: Test 15, Skipping test for non-existant object
+method Test 16 of 169: Test _DSD (Device Specific Data).
+method SKIPPED: Test 16, Skipping test for non-existant object
method _DSD.
method
-method Test 16 of 157: Test _DIS (Disable).
-method PASSED: Test 16, \_SB_.PCI0.LPCB.LNKA._DIS returned no
+method Test 17 of 169: Test _DIS (Disable).
+method PASSED: Test 17, \_SB_.PCI0.LPCB.LNKA._DIS returned no
method values as expected.
-method PASSED: Test 16, \_SB_.PCI0.LPCB.LNKB._DIS returned no
+method PASSED: Test 17, \_SB_.PCI0.LPCB.LNKB._DIS returned no
method values as expected.
-method PASSED: Test 16, \_SB_.PCI0.LPCB.LNKC._DIS returned no
+method PASSED: Test 17, \_SB_.PCI0.LPCB.LNKC._DIS returned no
method values as expected.
-method PASSED: Test 16, \_SB_.PCI0.LPCB.LNKD._DIS returned no
+method PASSED: Test 17, \_SB_.PCI0.LPCB.LNKD._DIS returned no
method values as expected.
-method PASSED: Test 16, \_SB_.PCI0.LPCB.LNKE._DIS returned no
+method PASSED: Test 17, \_SB_.PCI0.LPCB.LNKE._DIS returned no
method values as expected.
-method PASSED: Test 16, \_SB_.PCI0.LPCB.LNKF._DIS returned no
+method PASSED: Test 17, \_SB_.PCI0.LPCB.LNKF._DIS returned no
method values as expected.
-method PASSED: Test 16, \_SB_.PCI0.LPCB.LNKG._DIS returned no
+method PASSED: Test 17, \_SB_.PCI0.LPCB.LNKG._DIS returned no
method values as expected.
-method PASSED: Test 16, \_SB_.PCI0.LPCB.LNKH._DIS returned no
+method PASSED: Test 17, \_SB_.PCI0.LPCB.LNKH._DIS returned no
method values as expected.
method
-method Test 17 of 157: Test _DMA (Direct Memory Access).
-method SKIPPED: Test 17, Skipping test for non-existant object
+method Test 18 of 169: Test _DMA (Direct Memory Access).
+method SKIPPED: Test 18, Skipping test for non-existant object
method _DMA.
method
-method Test 18 of 157: Test _FIX (Fixed Register Resource
+method Test 19 of 169: Test _FIX (Fixed Register Resource
method Provider).
-method SKIPPED: Test 18, Skipping test for non-existant object
+method SKIPPED: Test 19, Skipping test for non-existant object
method _FIX.
method
-method Test 19 of 157: Test _GSB (Global System Interrupt Base).
-method SKIPPED: Test 19, Skipping test for non-existant object
+method Test 20 of 169: Test _GSB (Global System Interrupt Base).
+method SKIPPED: Test 20, Skipping test for non-existant object
method _GSB.
method
-method Test 20 of 157: Test _HPP (Hot Plug Parameters).
-method SKIPPED: Test 20, Skipping test for non-existant object
+method Test 21 of 169: Test _HPP (Hot Plug Parameters).
+method SKIPPED: Test 21, Skipping test for non-existant object
method _HPP.
method
-method Test 21 of 157: Test _PRS (Possible Resource Settings).
-method PASSED: Test 21, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ
+method Test 22 of 169: Test _PRS (Possible Resource Settings).
+method PASSED: Test 22, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ
method Descriptor) looks sane.
-method PASSED: Test 21, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ
+method PASSED: Test 22, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ
method Descriptor) looks sane.
-method PASSED: Test 21, \_SB_.PCI0.LPCB.LNKC._PRS (IRQ
+method PASSED: Test 22, \_SB_.PCI0.LPCB.LNKC._PRS (IRQ
method Descriptor) looks sane.
-method PASSED: Test 21, \_SB_.PCI0.LPCB.LNKD._PRS (IRQ
+method PASSED: Test 22, \_SB_.PCI0.LPCB.LNKD._PRS (IRQ
method Descriptor) looks sane.
-method PASSED: Test 21, \_SB_.PCI0.LPCB.LNKE._PRS (IRQ
+method PASSED: Test 22, \_SB_.PCI0.LPCB.LNKE._PRS (IRQ
method Descriptor) looks sane.
-method PASSED: Test 21, \_SB_.PCI0.LPCB.LNKF._PRS (IRQ
+method PASSED: Test 22, \_SB_.PCI0.LPCB.LNKF._PRS (IRQ
method Descriptor) looks sane.
-method PASSED: Test 21, \_SB_.PCI0.LPCB.LNKG._PRS (IRQ
+method PASSED: Test 22, \_SB_.PCI0.LPCB.LNKG._PRS (IRQ
method Descriptor) looks sane.
-method PASSED: Test 21, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ
+method PASSED: Test 22, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ
method Descriptor) looks sane.
method
-method Test 22 of 157: Test _PXM (Proximity).
-method SKIPPED: Test 22, Skipping test for non-existant object
+method Test 23 of 169: Test _PXM (Proximity).
+method SKIPPED: Test 23, Skipping test for non-existant object
method _PXM.
method
-method Test 23 of 157: Test _CCA (Cache Coherency Attribute).
-method SKIPPED: Test 23, Skipping test for non-existant object
+method Test 24 of 169: Test _CCA (Cache Coherency Attribute).
+method SKIPPED: Test 24, Skipping test for non-existant object
method _CCA.
method
-method Test 24 of 157: Test _EDL (Eject Device List).
-method SKIPPED: Test 24, Skipping test for non-existant object
+method Test 25 of 169: Test _EDL (Eject Device List).
+method SKIPPED: Test 25, Skipping test for non-existant object
method _EDL.
method
-method Test 25 of 157: Test _EJD (Ejection Dependent Device).
-method SKIPPED: Test 25, Skipping test for non-existant object
+method Test 26 of 169: Test _EJD (Ejection Dependent Device).
+method SKIPPED: Test 26, Skipping test for non-existant object
method _EJD.
method
-method Test 26 of 157: Test _EJ0 (Eject).
-method SKIPPED: Test 26, Skipping test for non-existant object
+method Test 27 of 169: Test _EJ0 (Eject).
+method SKIPPED: Test 27, Skipping test for non-existant object
method _EJ0.
method
-method Test 27 of 157: Test _EJ1 (Eject).
-method SKIPPED: Test 27, Skipping test for non-existant object
+method Test 28 of 169: Test _EJ1 (Eject).
+method SKIPPED: Test 28, Skipping test for non-existant object
method _EJ1.
method
-method Test 28 of 157: Test _EJ2 (Eject).
-method SKIPPED: Test 28, Skipping test for non-existant object
+method Test 29 of 169: Test _EJ2 (Eject).
+method SKIPPED: Test 29, Skipping test for non-existant object
method _EJ2.
method
-method Test 29 of 157: Test _EJ3 (Eject).
-method SKIPPED: Test 29, Skipping test for non-existant object
+method Test 30 of 169: Test _EJ3 (Eject).
+method SKIPPED: Test 30, Skipping test for non-existant object
method _EJ3.
method
-method Test 30 of 157: Test _EJ4 (Eject).
-method SKIPPED: Test 30, Skipping test for non-existant object
+method Test 31 of 169: Test _EJ4 (Eject).
+method SKIPPED: Test 31, Skipping test for non-existant object
method _EJ4.
method
-method Test 31 of 157: Test _LCK (Lock).
-method SKIPPED: Test 31, Skipping test for non-existant object
+method Test 32 of 169: Test _LCK (Lock).
+method SKIPPED: Test 32, Skipping test for non-existant object
method _LCK.
method
-method Test 32 of 157: Test _RMV (Remove).
-method PASSED: Test 32, \_SB_.PCI0.RP03.PXSX._RMV correctly
+method Test 33 of 169: Test _RMV (Remove).
+method PASSED: Test 33, \_SB_.PCI0.RP03.PXSX._RMV correctly
method returned sane looking value 0x00000001.
method
-method Test 33 of 157: Test _STA (Status).
-method PASSED: Test 33, \_SB_.PCI0.PEGP.VGA_._STA correctly
+method Test 34 of 169: Test _STA (Status).
+method PASSED: Test 34, \_SB_.PCI0.PEGP.VGA_._STA correctly
method returned sane looking value 0x0000000f.
-method PASSED: Test 33, \_SB_.PCI0.LPCB.LNKA._STA correctly
+method PASSED: Test 34, \_SB_.PCI0.LPCB.LNKA._STA correctly
method returned sane looking value 0x0000000b.
-method PASSED: Test 33, \_SB_.PCI0.LPCB.LNKB._STA correctly
+method PASSED: Test 34, \_SB_.PCI0.LPCB.LNKB._STA correctly
method returned sane looking value 0x0000000b.
-method PASSED: Test 33, \_SB_.PCI0.LPCB.LNKC._STA correctly
+method PASSED: Test 34, \_SB_.PCI0.LPCB.LNKC._STA correctly
method returned sane looking value 0x0000000b.
-method PASSED: Test 33, \_SB_.PCI0.LPCB.LNKD._STA correctly
+method PASSED: Test 34, \_SB_.PCI0.LPCB.LNKD._STA correctly
method returned sane looking value 0x0000000b.
-method PASSED: Test 33, \_SB_.PCI0.LPCB.LNKE._STA correctly
+method PASSED: Test 34, \_SB_.PCI0.LPCB.LNKE._STA correctly
method returned sane looking value 0x0000000b.
-method PASSED: Test 33, \_SB_.PCI0.LPCB.LNKF._STA correctly
+method PASSED: Test 34, \_SB_.PCI0.LPCB.LNKF._STA correctly
method returned sane looking value 0x0000000b.
-method PASSED: Test 33, \_SB_.PCI0.LPCB.LNKG._STA correctly
+method PASSED: Test 34, \_SB_.PCI0.LPCB.LNKG._STA correctly
method returned sane looking value 0x0000000b.
-method PASSED: Test 33, \_SB_.PCI0.LPCB.LNKH._STA correctly
+method PASSED: Test 34, \_SB_.PCI0.LPCB.LNKH._STA correctly
method returned sane looking value 0x0000000b.
-method PASSED: Test 33, \_SB_.PCI0.LPCB.HPET._STA correctly
+method PASSED: Test 34, \_SB_.PCI0.LPCB.HPET._STA correctly
method returned sane looking value 0x00000000.
-method PASSED: Test 33, \_SB_.PCI0.LPCB.BAT1._STA correctly
+method PASSED: Test 34, \_SB_.PCI0.LPCB.BAT1._STA correctly
method returned sane looking value 0x0000001f.
method
-method Test 34 of 157: Test _BDN (BIOS Dock Name).
-method SKIPPED: Test 34, Skipping test for non-existant object
+method Test 35 of 169: Test _BDN (BIOS Dock Name).
+method SKIPPED: Test 35, Skipping test for non-existant object
method _BDN.
method
-method Test 35 of 157: Test _BBN (Base Bus Number).
-method SKIPPED: Test 35, Skipping test for non-existant object
+method Test 36 of 169: Test _BBN (Base Bus Number).
+method SKIPPED: Test 36, Skipping test for non-existant object
method _BBN.
method
-method Test 36 of 157: Test _DCK (Dock).
-method SKIPPED: Test 36, Skipping test for non-existant object
+method Test 37 of 169: Test _DCK (Dock).
+method SKIPPED: Test 37, Skipping test for non-existant object
method _DCK.
method
-method Test 37 of 157: Test _INI (Initialize).
-method PASSED: Test 37, \_SB_._INI returned no values as
+method Test 38 of 169: Test _INI (Initialize).
+method PASSED: Test 38, \_SB_._INI returned no values as
method expected.
method
-method Test 38 of 157: Test _SEG (Segment).
-method SKIPPED: Test 38, Skipping test for non-existant object
+method Test 39 of 169: Test _GLK (Global Lock).
+method SKIPPED: Test 39, Skipping test for non-existant object
+method _GLK.
+method
+method Test 40 of 169: Test _SEG (Segment).
+method SKIPPED: Test 40, Skipping test for non-existant object
method _SEG.
method
-method Test 39 of 157: Test _OFF (Set resource off).
-method SKIPPED: Test 39, Skipping test for non-existant object
+method Test 41 of 169: Test _OFF (Set resource off).
+method SKIPPED: Test 41, Skipping test for non-existant object
method _OFF.
method
-method Test 40 of 157: Test _ON (Set resource on).
-method SKIPPED: Test 40, Skipping test for non-existant object
+method Test 42 of 169: Test _ON (Set resource on).
+method SKIPPED: Test 42, Skipping test for non-existant object
method _ON.
method
-method Test 41 of 157: Test _DSW (Device Sleep Wake).
-method SKIPPED: Test 41, Skipping test for non-existant object
+method Test 43 of 169: Test _DSW (Device Sleep Wake).
+method SKIPPED: Test 43, Skipping test for non-existant object
method _DSW.
method
-method Test 42 of 157: Test _IRC (In Rush Current).
-method SKIPPED: Test 42, Skipping test for non-existant object
+method Test 44 of 169: Test _IRC (In Rush Current).
+method SKIPPED: Test 44, Skipping test for non-existant object
method _IRC.
method
-method Test 43 of 157: Test _PRE (Power Resources for
+method Test 45 of 169: Test _PRE (Power Resources for
method Enumeration).
-method SKIPPED: Test 43, Skipping test for non-existant object
+method SKIPPED: Test 45, Skipping test for non-existant object
method _PRE.
method
-method Test 44 of 157: Test _PR0 (Power Resources for D0).
-method SKIPPED: Test 44, Skipping test for non-existant object
+method Test 46 of 169: Test _PR0 (Power Resources for D0).
+method SKIPPED: Test 46, Skipping test for non-existant object
method _PR0.
method
-method Test 45 of 157: Test _PR1 (Power Resources for D1).
-method SKIPPED: Test 45, Skipping test for non-existant object
+method Test 47 of 169: Test _PR1 (Power Resources for D1).
+method SKIPPED: Test 47, Skipping test for non-existant object
method _PR1.
method
-method Test 46 of 157: Test _PR2 (Power Resources for D2).
-method SKIPPED: Test 46, Skipping test for non-existant object
+method Test 48 of 169: Test _PR2 (Power Resources for D2).
+method SKIPPED: Test 48, Skipping test for non-existant object
method _PR2.
method
-method Test 47 of 157: Test _PR3 (Power Resources for D3).
-method SKIPPED: Test 47, Skipping test for non-existant object
+method Test 49 of 169: Test _PR3 (Power Resources for D3).
+method SKIPPED: Test 49, Skipping test for non-existant object
method _PR3.
method
-method Test 48 of 157: Test _PS0 (Power State 0).
-method PASSED: Test 48, \_SB_.PCI0.PEGP.VGA_._PS0 returned no
+method Test 50 of 169: Test _PS0 (Power State 0).
+method PASSED: Test 50, \_SB_.PCI0.PEGP.VGA_._PS0 returned no
method values as expected.
-method PASSED: Test 48, \_PS0 returned no values as expected.
+method PASSED: Test 50, \_PS0 returned no values as expected.
method
-method Test 49 of 157: Test _PS1 (Power State 1).
-method PASSED: Test 49, \_SB_.PCI0.PEGP.VGA_._PS1 returned no
+method Test 51 of 169: Test _PS1 (Power State 1).
+method PASSED: Test 51, \_SB_.PCI0.PEGP.VGA_._PS1 returned no
method values as expected.
method
-method Test 50 of 157: Test _PS2 (Power State 2).
-method SKIPPED: Test 50, Skipping test for non-existant object
+method Test 52 of 169: Test _PS2 (Power State 2).
+method SKIPPED: Test 52, Skipping test for non-existant object
method _PS2.
method
-method Test 51 of 157: Test _PS3 (Power State 3).
-method PASSED: Test 51, \_SB_.PCI0.PEGP.VGA_._PS3 returned no
+method Test 53 of 169: Test _PS3 (Power State 3).
+method PASSED: Test 53, \_SB_.PCI0.PEGP.VGA_._PS3 returned no
method values as expected.
-method PASSED: Test 51, \_PS3 returned no values as expected.
+method PASSED: Test 53, \_PS3 returned no values as expected.
method
-method Test 52 of 157: Test _PSC (Power State Current).
-method PASSED: Test 52, \_SB_.PCI0.PEGP.VGA_._PSC correctly
+method Test 54 of 169: Test _PSC (Power State Current).
+method PASSED: Test 54, \_SB_.PCI0.PEGP.VGA_._PSC correctly
method returned an integer.
-method PASSED: Test 52, \_PSC correctly returned an integer.
+method PASSED: Test 54, \_PSC correctly returned an integer.
method
-method Test 53 of 157: Test _PSE (Power State for Enumeration).
-method SKIPPED: Test 53, Skipping test for non-existant object
+method Test 55 of 169: Test _PSE (Power State for Enumeration).
+method SKIPPED: Test 55, Skipping test for non-existant object
method _PSE.
method
-method Test 54 of 157: Test _PSW (Power State Wake).
-method PASSED: Test 54, \_SB_.PCI0.USB1._PSW returned no values
+method Test 56 of 169: Test _PSW (Power State Wake).
+method PASSED: Test 56, \_SB_.PCI0.USB1._PSW returned no values
method as expected.
-method PASSED: Test 54, \_SB_.PCI0.USB2._PSW returned no values
+method PASSED: Test 56, \_SB_.PCI0.USB2._PSW returned no values
method as expected.
-method PASSED: Test 54, \_SB_.PCI0.USB3._PSW returned no values
+method PASSED: Test 56, \_SB_.PCI0.USB3._PSW returned no values
method as expected.
-method PASSED: Test 54, \_SB_.PCI0.USB4._PSW returned no values
+method PASSED: Test 56, \_SB_.PCI0.USB4._PSW returned no values
method as expected.
-method PASSED: Test 54, \_SB_.PCI0.USB5._PSW returned no values
+method PASSED: Test 56, \_SB_.PCI0.USB5._PSW returned no values
method as expected.
method
-method Test 55 of 157: Test _S1D (S1 Device State).
-method SKIPPED: Test 55, Skipping test for non-existant object
+method Test 57 of 169: Test _S1D (S1 Device State).
+method SKIPPED: Test 57, Skipping test for non-existant object
method _S1D.
method
-method Test 56 of 157: Test _S2D (S2 Device State).
-method SKIPPED: Test 56, Skipping test for non-existant object
+method Test 58 of 169: Test _S2D (S2 Device State).
+method SKIPPED: Test 58, Skipping test for non-existant object
method _S2D.
method
-method Test 57 of 157: Test _S3D (S3 Device State).
-method PASSED: Test 57, \_SB_.PCI0._S3D correctly returned an
+method Test 59 of 169: Test _S3D (S3 Device State).
+method PASSED: Test 59, \_SB_.PCI0._S3D correctly returned an
method integer.
-method PASSED: Test 57, \_SB_.PCI0.USB1._S3D correctly returned
+method PASSED: Test 59, \_SB_.PCI0.USB1._S3D correctly returned
method an integer.
-method PASSED: Test 57, \_SB_.PCI0.USB2._S3D correctly returned
+method PASSED: Test 59, \_SB_.PCI0.USB2._S3D correctly returned
method an integer.
-method PASSED: Test 57, \_SB_.PCI0.USB3._S3D correctly returned
+method PASSED: Test 59, \_SB_.PCI0.USB3._S3D correctly returned
method an integer.
-method PASSED: Test 57, \_SB_.PCI0.USB4._S3D correctly returned
+method PASSED: Test 59, \_SB_.PCI0.USB4._S3D correctly returned
method an integer.
-method PASSED: Test 57, \_SB_.PCI0.USB5._S3D correctly returned
+method PASSED: Test 59, \_SB_.PCI0.USB5._S3D correctly returned
method an integer.
-method PASSED: Test 57, \_SB_.PCI0.EHC1._S3D correctly returned
+method PASSED: Test 59, \_SB_.PCI0.EHC1._S3D correctly returned
method an integer.
-method PASSED: Test 57, \_SB_.PCI0.EHC2._S3D correctly returned
+method PASSED: Test 59, \_SB_.PCI0.EHC2._S3D correctly returned
method an integer.
method
-method Test 58 of 157: Test _S4D (S4 Device State).
-method PASSED: Test 58, \_SB_.PCI0._S4D correctly returned an
+method Test 60 of 169: Test _S4D (S4 Device State).
+method PASSED: Test 60, \_SB_.PCI0._S4D correctly returned an
method integer.
-method PASSED: Test 58, \_SB_.PCI0.USB1._S4D correctly returned
+method PASSED: Test 60, \_SB_.PCI0.USB1._S4D correctly returned
method an integer.
-method PASSED: Test 58, \_SB_.PCI0.USB2._S4D correctly returned
+method PASSED: Test 60, \_SB_.PCI0.USB2._S4D correctly returned
method an integer.
-method PASSED: Test 58, \_SB_.PCI0.USB3._S4D correctly returned
+method PASSED: Test 60, \_SB_.PCI0.USB3._S4D correctly returned
method an integer.
-method PASSED: Test 58, \_SB_.PCI0.USB4._S4D correctly returned
+method PASSED: Test 60, \_SB_.PCI0.USB4._S4D correctly returned
method an integer.
-method PASSED: Test 58, \_SB_.PCI0.USB5._S4D correctly returned
+method PASSED: Test 60, \_SB_.PCI0.USB5._S4D correctly returned
method an integer.
-method PASSED: Test 58, \_SB_.PCI0.EHC1._S4D correctly returned
+method PASSED: Test 60, \_SB_.PCI0.EHC1._S4D correctly returned
method an integer.
-method PASSED: Test 58, \_SB_.PCI0.EHC2._S4D correctly returned
+method PASSED: Test 60, \_SB_.PCI0.EHC2._S4D correctly returned
method an integer.
method
-method Test 59 of 157: Test _S0W (S0 Device Wake State).
-method SKIPPED: Test 59, Skipping test for non-existant object
+method Test 61 of 169: Test _S0W (S0 Device Wake State).
+method SKIPPED: Test 61, Skipping test for non-existant object
method _S0W.
method
-method Test 60 of 157: Test _S1W (S1 Device Wake State).
-method SKIPPED: Test 60, Skipping test for non-existant object
+method Test 62 of 169: Test _S1W (S1 Device Wake State).
+method SKIPPED: Test 62, Skipping test for non-existant object
method _S1W.
method
-method Test 61 of 157: Test _S2W (S2 Device Wake State).
-method SKIPPED: Test 61, Skipping test for non-existant object
+method Test 63 of 169: Test _S2W (S2 Device Wake State).
+method SKIPPED: Test 63, Skipping test for non-existant object
method _S2W.
method
-method Test 62 of 157: Test _S3W (S3 Device Wake State).
-method SKIPPED: Test 62, Skipping test for non-existant object
+method Test 64 of 169: Test _S3W (S3 Device Wake State).
+method SKIPPED: Test 64, Skipping test for non-existant object
method _S3W.
method
-method Test 63 of 157: Test _S4W (S4 Device Wake State).
-method SKIPPED: Test 63, Skipping test for non-existant object
+method Test 65 of 169: Test _S4W (S4 Device Wake State).
+method SKIPPED: Test 65, Skipping test for non-existant object
method _S4W.
method
-method Test 64 of 157: Test _S0_ (S0 System State).
+method Test 66 of 169: Test _S0_ (S0 System State).
method \_S0_ PM1a_CNT.SLP_TYP value: 0x00000000
method \_S0_ PM1b_CNT.SLP_TYP value: 0x00000000
-method PASSED: Test 64, \_S0_ correctly returned a sane looking
+method PASSED: Test 66, \_S0_ correctly returned a sane looking
method package.
method
-method Test 65 of 157: Test _S1_ (S1 System State).
-method SKIPPED: Test 65, Skipping test for non-existant object
+method Test 67 of 169: Test _S1_ (S1 System State).
+method SKIPPED: Test 67, Skipping test for non-existant object
method _S1_.
method
-method Test 66 of 157: Test _S2_ (S2 System State).
-method SKIPPED: Test 66, Skipping test for non-existant object
+method Test 68 of 169: Test _S2_ (S2 System State).
+method SKIPPED: Test 68, Skipping test for non-existant object
method _S2_.
method
-method Test 67 of 157: Test _S3_ (S3 System State).
+method Test 69 of 169: Test _S3_ (S3 System State).
method \_S3_ PM1a_CNT.SLP_TYP value: 0x00000005
method \_S3_ PM1b_CNT.SLP_TYP value: 0x00000005
-method PASSED: Test 67, \_S3_ correctly returned a sane looking
+method PASSED: Test 69, \_S3_ correctly returned a sane looking
method package.
method
-method Test 68 of 157: Test _S4_ (S4 System State).
+method Test 70 of 169: Test _S4_ (S4 System State).
method \_S4_ PM1a_CNT.SLP_TYP value: 0x00000006
method \_S4_ PM1b_CNT.SLP_TYP value: 0x00000006
-method PASSED: Test 68, \_S4_ correctly returned a sane looking
+method PASSED: Test 70, \_S4_ correctly returned a sane looking
method package.
method
-method Test 69 of 157: Test _S5_ (S5 System State).
+method Test 71 of 169: Test _S5_ (S5 System State).
method \_S5_ PM1a_CNT.SLP_TYP value: 0x00000007
method \_S5_ PM1b_CNT.SLP_TYP value: 0x00000007
-method PASSED: Test 69, \_S5_ correctly returned a sane looking
+method PASSED: Test 71, \_S5_ correctly returned a sane looking
method package.
method
-method Test 70 of 157: Test _SWS (System Wake Source).
-method SKIPPED: Test 70, Skipping test for non-existant object
+method Test 72 of 169: Test _SWS (System Wake Source).
+method SKIPPED: Test 72, Skipping test for non-existant object
method _SWS.
method
-method Test 71 of 157: Test _PSS (Performance Supported States).
-method SKIPPED: Test 71, Skipping test for non-existant object
+method Test 73 of 169: Test _PSS (Performance Supported States).
+method SKIPPED: Test 73, Skipping test for non-existant object
method _PSS.
method
-method Test 72 of 157: Test _CPC (Continuous Performance
+method Test 74 of 169: Test _CPC (Continuous Performance
method Control).
-method SKIPPED: Test 72, Skipping test for non-existant object
+method SKIPPED: Test 74, Skipping test for non-existant object
method _CPC.
method
-method Test 73 of 157: Test _CSD (C State Dependencies).
-method SKIPPED: Test 73, Skipping test for non-existant object
+method Test 75 of 169: Test _CSD (C State Dependencies).
+method SKIPPED: Test 75, Skipping test for non-existant object
method _CSD.
method
-method Test 74 of 157: Test _CST (C States).
-method SKIPPED: Test 74, Skipping test for non-existant object
+method Test 76 of 169: Test _CST (C States).
+method SKIPPED: Test 76, Skipping test for non-existant object
method _CST.
method
-method Test 75 of 157: Test _PCT (Performance Control).
-method SKIPPED: Test 75, Skipping test for non-existant object
+method Test 77 of 169: Test _PCT (Performance Control).
+method SKIPPED: Test 77, Skipping test for non-existant object
method _PCT.
method
-method Test 76 of 157: Test _PDL (P-State Depth Limit).
-method SKIPPED: Test 76, Skipping test for non-existant object
+method Test 78 of 169: Test _PDL (P-State Depth Limit).
+method SKIPPED: Test 78, Skipping test for non-existant object
method _PDL.
method
-method Test 77 of 157: Test _PPC (Performance Present
+method Test 79 of 169: Test _PPC (Performance Present
method Capabilities).
-method SKIPPED: Test 77, Skipping test for non-existant object
+method SKIPPED: Test 79, Skipping test for non-existant object
method _PPC.
method
-method Test 78 of 157: Test _PPE (Polling for Platform Error).
-method SKIPPED: Test 78, Skipping test for non-existant object
+method Test 80 of 169: Test _PPE (Polling for Platform Error).
+method SKIPPED: Test 80, Skipping test for non-existant object
method _PPE.
method
-method Test 79 of 157: Test _TDL (T-State Depth Limit).
-method SKIPPED: Test 79, Skipping test for non-existant object
+method Test 81 of 169: Test _TDL (T-State Depth Limit).
+method SKIPPED: Test 81, Skipping test for non-existant object
method _TDL.
method
-method Test 80 of 157: Test _TPC (Throttling Present
+method Test 82 of 169: Test _TPC (Throttling Present
method Capabilities).
-method PASSED: Test 80, \_PR_.CPU0._TPC correctly returned an
+method PASSED: Test 82, \_PR_.CPU0._TPC correctly returned an
method integer.
-method PASSED: Test 80, \_PR_.CPU1._TPC correctly returned an
+method PASSED: Test 82, \_PR_.CPU1._TPC correctly returned an
method integer.
method
-method Test 81 of 157: Test _TSD (Throttling State Dependencies).
-method PASSED: Test 81, \_PR_.CPU0._TSD correctly returned a sane
+method Test 83 of 169: Test _TSD (Throttling State Dependencies).
+method PASSED: Test 83, \_PR_.CPU0._TSD correctly returned a sane
method looking package.
-method PASSED: Test 81, \_PR_.CPU1._TSD correctly returned a sane
+method PASSED: Test 83, \_PR_.CPU1._TSD correctly returned a sane
method looking package.
method
-method Test 82 of 157: Test _TSS (Throttling Supported States).
+method Test 84 of 169: Test _TSS (Throttling Supported States).
method \_PR_.CPU0._TSS values:
method T-State CPU Power Latency Control Status
method Freq (mW) (usecs)
@@ -555,7 +563,7 @@ method 4 50% 500 0 0c 00
method 5 38% 375 0 0b 00
method 6 25% 250 0 0a 00
method 7 13% 125 0 09 00
-method PASSED: Test 82, \_PR_.CPU0._TSS correctly returned a sane
+method PASSED: Test 84, \_PR_.CPU0._TSS correctly returned a sane
method looking package.
method \_PR_.CPU1._TSS values:
method T-State CPU Power Latency Control Status
@@ -568,507 +576,560 @@ method 4 50% 500 0 0c 00
method 5 38% 375 0 0b 00
method 6 25% 250 0 0a 00
method 7 13% 125 0 09 00
-method PASSED: Test 82, \_PR_.CPU1._TSS correctly returned a sane
+method PASSED: Test 84, \_PR_.CPU1._TSS correctly returned a sane
method looking package.
method
-method Test 83 of 157: Test _MSG (Message).
-method SKIPPED: Test 83, Skipping test for non-existant object
+method Test 85 of 169: Test _PUR (Processor Utilization Request).
+method SKIPPED: Test 85, Skipping test for non-existant object
+method _PUR.
+method
+method Test 86 of 169: Test _MSG (Message).
+method SKIPPED: Test 86, Skipping test for non-existant object
method _MSG.
method
-method Test 84 of 157: Test _ALC (Ambient Light Colour
+method Test 87 of 169: Test _SST (System Status).
+method SKIPPED: Test 87, Skipping test for non-existant object
+method _SST.
+method
+method Test 88 of 169: Test _ALC (Ambient Light Colour
method Chromaticity).
-method SKIPPED: Test 84, Skipping test for non-existant object
+method SKIPPED: Test 88, Skipping test for non-existant object
method _ALC.
method
-method Test 85 of 157: Test _ALI (Ambient Light Illuminance).
-method SKIPPED: Test 85, Skipping test for non-existant object
+method Test 89 of 169: Test _ALI (Ambient Light Illuminance).
+method SKIPPED: Test 89, Skipping test for non-existant object
method _ALI.
method
-method Test 86 of 157: Test _ALT (Ambient Light Temperature).
-method SKIPPED: Test 86, Skipping test for non-existant object
+method Test 90 of 169: Test _ALT (Ambient Light Temperature).
+method SKIPPED: Test 90, Skipping test for non-existant object
method _ALT.
method
-method Test 87 of 157: Test _ALP (Ambient Light Polling).
-method SKIPPED: Test 87, Skipping test for non-existant object
+method Test 91 of 169: Test _ALP (Ambient Light Polling).
+method SKIPPED: Test 91, Skipping test for non-existant object
method _ALP.
method
-method Test 88 of 157: Test _LID (Lid Status).
-method PASSED: Test 88, \_SB_.LID0._LID correctly returned sane
+method Test 92 of 169: Test _LID (Lid Status).
+method PASSED: Test 92, \_SB_.LID0._LID correctly returned sane
method looking value 0x00000000.
method
-method Test 89 of 157: Test _UPD (User Presence Detect).
-method SKIPPED: Test 89, Skipping test for non-existant object
+method Test 93 of 169: Test _GTF (Get Task File).
+method PASSED: Test 93, \_SB_.PCI0.PATA.PRID.P_D0._GTF correctly
+method returned a sane looking buffer.
+method PASSED: Test 93, \_SB_.PCI0.PATA.PRID.P_D1._GTF correctly
+method returned a sane looking buffer.
+method FAILED [MEDIUM] Method_GTFBadBufferSize: Test 93,
+method \_SB_.PCI0.SATA.PRT0._GTF should return a buffer with size
+method of multiple of 7.
+method FAILED [MEDIUM] Method_GTFBadBufferSize: Test 93,
+method \_SB_.PCI0.SATA.PRT1._GTF should return a buffer with size
+method of multiple of 7.
+method FAILED [MEDIUM] Method_GTFBadBufferSize: Test 93,
+method \_SB_.PCI0.SATA.PRT2._GTF should return a buffer with size
+method of multiple of 7.
+method
+method Test 94 of 169: Test _GTM (Get Timing Mode).
+method PASSED: Test 94, \_SB_.PCI0.PATA.PRID._GTM correctly
+method returned a sane looking buffer.
+method
+method Test 95 of 169: Test _UPD (User Presence Detect).
+method SKIPPED: Test 95, Skipping test for non-existant object
method _UPD.
method
-method Test 90 of 157: Test _UPP (User Presence Polling).
-method SKIPPED: Test 90, Skipping test for non-existant object
+method Test 96 of 169: Test _UPP (User Presence Polling).
+method SKIPPED: Test 96, Skipping test for non-existant object
method _UPP.
method
-method Test 91 of 157: Test _GCP (Get Capabilities).
-method SKIPPED: Test 91, Skipping test for non-existant object
+method Test 97 of 169: Test _GCP (Get Capabilities).
+method SKIPPED: Test 97, Skipping test for non-existant object
method _GCP.
method
-method Test 92 of 157: Test _GRT (Get Real Time).
-method SKIPPED: Test 92, Skipping test for non-existant object
+method Test 98 of 169: Test _GRT (Get Real Time).
+method SKIPPED: Test 98, Skipping test for non-existant object
method _GRT.
method
-method Test 93 of 157: Test _GWS (Get Wake Status).
-method SKIPPED: Test 93, Skipping test for non-existant object
+method Test 99 of 169: Test _GWS (Get Wake Status).
+method SKIPPED: Test 99, Skipping test for non-existant object
method _GWS.
method
-method Test 94 of 157: Test _STP (Set Expired Timer Wake Policy).
-method SKIPPED: Test 94, Skipping test for non-existant object
+method Test 100 of 169: Test _STP (Set Expired Timer Wake
+method Policy).
+method SKIPPED: Test 100, Skipping test for non-existant object
method _STP.
method
-method Test 95 of 157: Test _STV (Set Timer Value).
-method SKIPPED: Test 95, Skipping test for non-existant object
+method Test 101 of 169: Test _STV (Set Timer Value).
+method SKIPPED: Test 101, Skipping test for non-existant object
method _STV.
method
-method Test 96 of 157: Test _TIP (Expired Timer Wake Policy).
-method SKIPPED: Test 96, Skipping test for non-existant object
+method Test 102 of 169: Test _TIP (Expired Timer Wake Policy).
+method SKIPPED: Test 102, Skipping test for non-existant object
method _TIP.
method
-method Test 97 of 157: Test _TIV (Timer Values).
-method SKIPPED: Test 97, Skipping test for non-existant object
+method Test 103 of 169: Test _TIV (Timer Values).
+method SKIPPED: Test 103, Skipping test for non-existant object
method _TIV.
method
-method Test 98 of 157: Test _SBS (Smart Battery Subsystem).
-method SKIPPED: Test 98, Skipping test for non-existant object
+method Test 104 of 169: Test _SBS (Smart Battery Subsystem).
+method SKIPPED: Test 104, Skipping test for non-existant object
method _SBS.
method
-method Test 99 of 157: Test _BCT (Battery Charge Time).
-method SKIPPED: Test 99, Skipping test for non-existant object
+method Test 105 of 169: Test _BCT (Battery Charge Time).
+method SKIPPED: Test 105, Skipping test for non-existant object
method _BCT.
method
-method Test 100 of 157: Test _BIF (Battery Information).
-method PASSED: Test 100, \_SB_.PCI0.LPCB.BAT1._BIF correctly
+method Test 106 of 169: Test _BIF (Battery Information).
+method PASSED: Test 106, \_SB_.PCI0.LPCB.BAT1._BIF correctly
method returned a sane looking package.
method
-method Test 101 of 157: Test _BIX (Battery Information Extended).
-method SKIPPED: Test 101, Skipping test for non-existant object
+method Test 107 of 169: Test _BIX (Battery Information Extended).
+method SKIPPED: Test 107, Skipping test for non-existant object
method _BIX.
method
-method Test 102 of 157: Test _BMA (Battery Measurement
+method Test 108 of 169: Test _BMA (Battery Measurement
method Averaging).
-method SKIPPED: Test 102, Skipping test for non-existant object
+method SKIPPED: Test 108, Skipping test for non-existant object
method _BMA.
method
-method Test 103 of 157: Test _BMC (Battery Maintenance Control).
-method SKIPPED: Test 103, Skipping test for non-existant object
+method Test 109 of 169: Test _BMC (Battery Maintenance Control).
+method SKIPPED: Test 109, Skipping test for non-existant object
method _BMC.
method
-method Test 104 of 157: Test _BMD (Battery Maintenance Data).
-method SKIPPED: Test 104, Skipping test for non-existant object
+method Test 110 of 169: Test _BMD (Battery Maintenance Data).
+method SKIPPED: Test 110, Skipping test for non-existant object
method _BMD.
method
-method Test 105 of 157: Test _BMS (Battery Measurement Sampling
+method Test 111 of 169: Test _BMS (Battery Measurement Sampling
method Time).
-method SKIPPED: Test 105, Skipping test for non-existant object
+method SKIPPED: Test 111, Skipping test for non-existant object
method _BMS.
method
-method Test 106 of 157: Test _BST (Battery Status).
-method PASSED: Test 106, \_SB_.PCI0.LPCB.BAT1._BST correctly
+method Test 112 of 169: Test _BST (Battery Status).
+method PASSED: Test 112, \_SB_.PCI0.LPCB.BAT1._BST correctly
method returned a sane looking package.
method
-method Test 107 of 157: Test _BTP (Battery Trip Point).
-method SKIPPED: Test 107, Skipping test for non-existant object
+method Test 113 of 169: Test _BTP (Battery Trip Point).
+method SKIPPED: Test 113, Skipping test for non-existant object
method _BTP.
method
-method Test 108 of 157: Test _BTM (Battery Time).
-method SKIPPED: Test 108, Skipping test for non-existant object
+method Test 114 of 169: Test _BTM (Battery Time).
+method SKIPPED: Test 114, Skipping test for non-existant object
method _BTM.
method
-method Test 109 of 157: Test _PCL (Power Consumer List).
-method PASSED: Test 109, \_SB_.PCI0.LPCB.ACAD._PCL returned a
+method Test 115 of 169: Test _PCL (Power Consumer List).
+method PASSED: Test 115, \_SB_.PCI0.LPCB.ACAD._PCL returned a
method sane package of 1 references.
-method PASSED: Test 109, \_SB_.PCI0.LPCB.BAT1._PCL returned a
+method PASSED: Test 115, \_SB_.PCI0.LPCB.BAT1._PCL returned a
method sane package of 1 references.
method
-method Test 110 of 157: Test _PIF (Power Source Information).
-method SKIPPED: Test 110, Skipping test for non-existant object
+method Test 116 of 169: Test _PIF (Power Source Information).
+method SKIPPED: Test 116, Skipping test for non-existant object
method _PIF.
method
-method Test 111 of 157: Test _PSR (Power Source).
-method PASSED: Test 111, \_SB_.PCI0.LPCB.ACAD._PSR correctly
+method Test 117 of 169: Test _PSR (Power Source).
+method PASSED: Test 117, \_SB_.PCI0.LPCB.ACAD._PSR correctly
method returned sane looking value 0x00000000.
method
-method Test 112 of 157: Test _GAI (Get Averaging Level).
-method SKIPPED: Test 112, Skipping test for non-existant object
+method Test 118 of 169: Test _GAI (Get Averaging Level).
+method SKIPPED: Test 118, Skipping test for non-existant object
method _GAI.
method
-method Test 113 of 157: Test _PMM (Power Meter Measurement).
-method SKIPPED: Test 113, Skipping test for non-existant object
+method Test 119 of 169: Test _GHL (Get Harware Limit).
+method SKIPPED: Test 119, Skipping test for non-existant object
+method _GHL.
+method
+method Test 120 of 169: Test _PMM (Power Meter Measurement).
+method SKIPPED: Test 120, Skipping test for non-existant object
method _PMM.
method
-method Test 114 of 157: Test _FIF (Fan Information).
-method SKIPPED: Test 114, Skipping test for non-existant object
+method Test 121 of 169: Test _FIF (Fan Information).
+method SKIPPED: Test 121, Skipping test for non-existant object
method _FIF.
method
-method Test 115 of 157: Test _FSL (Fan Set Level).
-method SKIPPED: Test 115, Skipping test for non-existant object
+method Test 122 of 169: Test _FSL (Fan Set Level).
+method SKIPPED: Test 122, Skipping test for non-existant object
method _FSL.
method
-method Test 116 of 157: Test _FST (Fan Status).
-method SKIPPED: Test 116, Skipping test for non-existant object
+method Test 123 of 169: Test _FST (Fan Status).
+method SKIPPED: Test 123, Skipping test for non-existant object
method _FST.
method
-method Test 117 of 157: Test _ACx (Active Cooling).
-method SKIPPED: Test 117, Skipping test for non-existant object
+method Test 124 of 169: Test _ACx (Active Cooling).
+method SKIPPED: Test 124, Skipping test for non-existant object
method _AC0.
method
-method SKIPPED: Test 117, Skipping test for non-existant object
+method SKIPPED: Test 124, Skipping test for non-existant object
method _AC1.
method
-method SKIPPED: Test 117, Skipping test for non-existant object
+method SKIPPED: Test 124, Skipping test for non-existant object
method _AC2.
method
-method SKIPPED: Test 117, Skipping test for non-existant object
+method SKIPPED: Test 124, Skipping test for non-existant object
method _AC3.
method
-method SKIPPED: Test 117, Skipping test for non-existant object
+method SKIPPED: Test 124, Skipping test for non-existant object
method _AC4.
method
-method SKIPPED: Test 117, Skipping test for non-existant object
+method SKIPPED: Test 124, Skipping test for non-existant object
method _AC5.
method
-method SKIPPED: Test 117, Skipping test for non-existant object
+method SKIPPED: Test 124, Skipping test for non-existant object
method _AC6.
method
-method SKIPPED: Test 117, Skipping test for non-existant object
+method SKIPPED: Test 124, Skipping test for non-existant object
method _AC7.
method
-method SKIPPED: Test 117, Skipping test for non-existant object
+method SKIPPED: Test 124, Skipping test for non-existant object
method _AC8.
method
-method SKIPPED: Test 117, Skipping test for non-existant object
+method SKIPPED: Test 124, Skipping test for non-existant object
method _AC9.
method
method
-method Test 118 of 157: Test _CRT (Critical Trip Point).
-method SKIPPED: Test 118, Skipping test for non-existant object
+method Test 125 of 169: Test _ART (Active Cooling Relationship
+method Table).
+method SKIPPED: Test 125, Skipping test for non-existant object
+method _ART.
+method
+method Test 126 of 169: Test _CRT (Critical Trip Point).
+method SKIPPED: Test 126, Skipping test for non-existant object
method _CRT.
method
-method Test 119 of 157: Test _DTI (Device Temperature
+method Test 127 of 169: Test _DTI (Device Temperature
method Indication).
-method SKIPPED: Test 119, Skipping test for non-existant object
+method SKIPPED: Test 127, Skipping test for non-existant object
method _DTI.
method
-method Test 120 of 157: Test _HOT (Hot Temperature).
-method SKIPPED: Test 120, Skipping test for non-existant object
+method Test 128 of 169: Test _HOT (Hot Temperature).
+method SKIPPED: Test 128, Skipping test for non-existant object
method _HOT.
method
-method Test 121 of 157: Test _NTT (Notification Temp Threshold).
-method SKIPPED: Test 121, Skipping test for non-existant object
+method Test 129 of 169: Test _NTT (Notification Temp Threshold).
+method SKIPPED: Test 129, Skipping test for non-existant object
method _NTT.
method
-method Test 122 of 157: Test _PSV (Passive Temp).
-method SKIPPED: Test 122, Skipping test for non-existant object
+method Test 130 of 169: Test _PSL (Passive List).
+method SKIPPED: Test 130, Skipping test for non-existant object
+method _PSL.
+method
+method Test 131 of 169: Test _PSV (Passive Temp).
+method SKIPPED: Test 131, Skipping test for non-existant object
method _PSV.
method
-method Test 123 of 157: Test _RTV (Relative Temp Values).
-method SKIPPED: Test 123, Skipping test for non-existant object
+method Test 132 of 169: Test _RTV (Relative Temp Values).
+method SKIPPED: Test 132, Skipping test for non-existant object
method _RTV.
method
-method Test 124 of 157: Test _SCP (Set Cooling Policy).
-method SKIPPED: Test 124, Skipping test for non-existant object
+method Test 133 of 169: Test _SCP (Set Cooling Policy).
+method SKIPPED: Test 133, Skipping test for non-existant object
method _DTI.
method
-method Test 125 of 157: Test _TC1 (Thermal Constant 1).
-method SKIPPED: Test 125, Skipping test for non-existant object
+method Test 134 of 169: Test _TC1 (Thermal Constant 1).
+method SKIPPED: Test 134, Skipping test for non-existant object
method _TC1.
method
-method Test 126 of 157: Test _TC2 (Thermal Constant 2).
-method SKIPPED: Test 126, Skipping test for non-existant object
+method Test 135 of 169: Test _TC2 (Thermal Constant 2).
+method SKIPPED: Test 135, Skipping test for non-existant object
method _TC2.
method
-method Test 127 of 157: Test _TMP (Thermal Zone Current Temp).
-method SKIPPED: Test 127, Skipping test for non-existant object
+method Test 136 of 169: Test _TMP (Thermal Zone Current Temp).
+method SKIPPED: Test 136, Skipping test for non-existant object
method _TMP.
method
-method Test 128 of 157: Test _TPT (Trip Point Temperature).
-method SKIPPED: Test 128, Skipping test for non-existant object
+method Test 137 of 169: Test _TPT (Trip Point Temperature).
+method SKIPPED: Test 137, Skipping test for non-existant object
method _TPT.
method
-method Test 129 of 157: Test _TSP (Thermal Sampling Period).
-method SKIPPED: Test 129, Skipping test for non-existant object
+method Test 138 of 169: Test _TRT (Thermal Relationship Table).
+method SKIPPED: Test 138, Skipping test for non-existant object
+method _TRT.
+method
+method Test 139 of 169: Test _TSP (Thermal Sampling Period).
+method SKIPPED: Test 139, Skipping test for non-existant object
method _TSP.
method
-method Test 130 of 157: Test _TST (Temperature Sensor Threshold).
-method SKIPPED: Test 130, Skipping test for non-existant object
+method Test 140 of 169: Test _TST (Temperature Sensor Threshold).
+method SKIPPED: Test 140, Skipping test for non-existant object
method _TST.
method
-method Test 131 of 157: Test _TZP (Thermal Zone Polling).
-method SKIPPED: Test 131, Skipping test for non-existant object
+method Test 141 of 169: Test _TZD (Thermal Zone Devices).
+method SKIPPED: Test 141, Skipping test for non-existant object
+method _TZD.
+method
+method Test 142 of 169: Test _TZM (Thermal Zone member).
+method SKIPPED: Test 142, Skipping test for non-existant object
+method _TZM.
+method
+method Test 143 of 169: Test _TZP (Thermal Zone Polling).
+method SKIPPED: Test 143, Skipping test for non-existant object
method _TZP.
method
-method Test 132 of 157: Test _PTS (Prepare to Sleep).
+method Test 144 of 169: Test _PTS (Prepare to Sleep).
method Test _PTS(1).
-method PASSED: Test 132, \_PTS returned no values as expected.
+method PASSED: Test 144, \_PTS returned no values as expected.
method
method Test _PTS(2).
-method PASSED: Test 132, \_PTS returned no values as expected.
+method PASSED: Test 144, \_PTS returned no values as expected.
method
method Test _PTS(3).
-method PASSED: Test 132, \_PTS returned no values as expected.
+method PASSED: Test 144, \_PTS returned no values as expected.
method
method Test _PTS(4).
-method PASSED: Test 132, \_PTS returned no values as expected.
+method PASSED: Test 144, \_PTS returned no values as expected.
method
method Test _PTS(5).
-method PASSED: Test 132, \_PTS returned no values as expected.
+method PASSED: Test 144, \_PTS returned no values as expected.
method
method
-method Test 133 of 157: Test _TTS (Transition to State).
-method SKIPPED: Test 133, Optional control method _TTS does not
+method Test 145 of 169: Test _TTS (Transition to State).
+method SKIPPED: Test 145, Optional control method _TTS does not
method exist.
method
-method Test 134 of 157: Test _S0 (System S0 State).
-method SKIPPED: Test 134, Skipping test for non-existant object
+method Test 146 of 169: Test _S0 (System S0 State).
+method SKIPPED: Test 146, Skipping test for non-existant object
method _S0.
method
-method Test 135 of 157: Test _S1 (System S1 State).
-method SKIPPED: Test 135, Skipping test for non-existant object
+method Test 147 of 169: Test _S1 (System S1 State).
+method SKIPPED: Test 147, Skipping test for non-existant object
method _S1.
method
-method Test 136 of 157: Test _S2 (System S2 State).
-method SKIPPED: Test 136, Skipping test for non-existant object
+method Test 148 of 169: Test _S2 (System S2 State).
+method SKIPPED: Test 148, Skipping test for non-existant object
method _S2.
method
-method Test 137 of 157: Test _S3 (System S3 State).
-method SKIPPED: Test 137, Skipping test for non-existant object
+method Test 149 of 169: Test _S3 (System S3 State).
+method SKIPPED: Test 149, Skipping test for non-existant object
method _S3.
method
-method Test 138 of 157: Test _S4 (System S4 State).
-method SKIPPED: Test 138, Skipping test for non-existant object
+method Test 150 of 169: Test _S4 (System S4 State).
+method SKIPPED: Test 150, Skipping test for non-existant object
method _S4.
method
-method Test 139 of 157: Test _S5 (System S5 State).
-method SKIPPED: Test 139, Skipping test for non-existant object
+method Test 151 of 169: Test _S5 (System S5 State).
+method SKIPPED: Test 151, Skipping test for non-existant object
method _S5.
method
-method Test 140 of 157: Test _WAK (System Wake).
+method Test 152 of 169: Test _WAK (System Wake).
method Test _WAK(1) System Wake, State S1.
-method PASSED: Test 140, \_WAK correctly returned a sane looking
+method PASSED: Test 152, \_WAK correctly returned a sane looking
method package.
method
method Test _WAK(2) System Wake, State S2.
-method PASSED: Test 140, \_WAK correctly returned a sane looking
+method PASSED: Test 152, \_WAK correctly returned a sane looking
method package.
method
method Test _WAK(3) System Wake, State S3.
-method PASSED: Test 140, \_WAK correctly returned a sane looking
+method PASSED: Test 152, \_WAK correctly returned a sane looking
method package.
method
method Test _WAK(4) System Wake, State S4.
-method PASSED: Test 140, \_WAK correctly returned a sane looking
+method PASSED: Test 152, \_WAK correctly returned a sane looking
method package.
method
method Test _WAK(5) System Wake, State S5.
-method PASSED: Test 140, \_WAK correctly returned a sane looking
+method PASSED: Test 152, \_WAK correctly returned a sane looking
method package.
method
method
-method Test 141 of 157: Test _ADR (Return Unique ID for Device).
-method PASSED: Test 141, \_SB_.PCI0.MCHC._ADR correctly returned
+method Test 153 of 169: Test _ADR (Return Unique ID for Device).
+method PASSED: Test 153, \_SB_.PCI0.MCHC._ADR correctly returned
method an integer.
-method PASSED: Test 141, \_SB_.PCI0.PEGP._ADR correctly returned
+method PASSED: Test 153, \_SB_.PCI0.PEGP._ADR correctly returned
method an integer.
-method PASSED: Test 141, \_SB_.PCI0.PEGP.VGA_._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.PEGP.VGA_._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.GFX0._ADR correctly returned
+method PASSED: Test 153, \_SB_.PCI0.GFX0._ADR correctly returned
method an integer.
-method PASSED: Test 141, \_SB_.PCI0.GFX0.DD01._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.GFX0.DD01._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.GFX0.DD02._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.GFX0.DD02._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.GFX0.DD03._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.GFX0.DD03._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.GFX0.DD04._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.GFX0.DD04._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.GFX0.DD05._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.GFX0.DD05._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.HDEF._ADR correctly returned
+method PASSED: Test 153, \_SB_.PCI0.HDEF._ADR correctly returned
method an integer.
-method PASSED: Test 141, \_SB_.PCI0.RP01._ADR correctly returned
+method PASSED: Test 153, \_SB_.PCI0.RP01._ADR correctly returned
method an integer.
-method PASSED: Test 141, \_SB_.PCI0.RP01.PXSX._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.RP01.PXSX._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.RP02._ADR correctly returned
+method PASSED: Test 153, \_SB_.PCI0.RP02._ADR correctly returned
method an integer.
-method PASSED: Test 141, \_SB_.PCI0.RP02.PXSX._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.RP02.PXSX._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.RP03._ADR correctly returned
+method PASSED: Test 153, \_SB_.PCI0.RP03._ADR correctly returned
method an integer.
-method PASSED: Test 141, \_SB_.PCI0.RP03.PXSX._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.RP03.PXSX._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.RP04._ADR correctly returned
+method PASSED: Test 153, \_SB_.PCI0.RP04._ADR correctly returned
method an integer.
-method PASSED: Test 141, \_SB_.PCI0.RP04.PXSX._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.RP04.PXSX._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.RP05._ADR correctly returned
+method PASSED: Test 153, \_SB_.PCI0.RP05._ADR correctly returned
method an integer.
-method PASSED: Test 141, \_SB_.PCI0.RP05.PXSX._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.RP05.PXSX._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.RP06._ADR correctly returned
+method PASSED: Test 153, \_SB_.PCI0.RP06._ADR correctly returned
method an integer.
-method PASSED: Test 141, \_SB_.PCI0.RP06.PXSX._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.RP06.PXSX._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.USB1._ADR correctly returned
+method PASSED: Test 153, \_SB_.PCI0.USB1._ADR correctly returned
method an integer.
-method PASSED: Test 141, \_SB_.PCI0.USB2._ADR correctly returned
+method PASSED: Test 153, \_SB_.PCI0.USB2._ADR correctly returned
method an integer.
-method PASSED: Test 141, \_SB_.PCI0.USB3._ADR correctly returned
+method PASSED: Test 153, \_SB_.PCI0.USB3._ADR correctly returned
method an integer.
-method PASSED: Test 141, \_SB_.PCI0.USB4._ADR correctly returned
+method PASSED: Test 153, \_SB_.PCI0.USB4._ADR correctly returned
method an integer.
-method PASSED: Test 141, \_SB_.PCI0.USB5._ADR correctly returned
+method PASSED: Test 153, \_SB_.PCI0.USB5._ADR correctly returned
method an integer.
-method PASSED: Test 141, \_SB_.PCI0.EHC1._ADR correctly returned
+method PASSED: Test 153, \_SB_.PCI0.EHC1._ADR correctly returned
method an integer.
-method PASSED: Test 141, \_SB_.PCI0.EHC1.HUB7._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.EHC1.HUB7._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.EHC2._ADR correctly returned
+method PASSED: Test 153, \_SB_.PCI0.EHC2._ADR correctly returned
method an integer.
-method PASSED: Test 141, \_SB_.PCI0.EHC2.HUB7._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.EHC2.HUB7._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.PCIB._ADR correctly returned
+method PASSED: Test 153, \_SB_.PCI0.PCIB._ADR correctly returned
method an integer.
-method PASSED: Test 141, \_SB_.PCI0.LPCB._ADR correctly returned
+method PASSED: Test 153, \_SB_.PCI0.LPCB._ADR correctly returned
method an integer.
-method PASSED: Test 141, \_SB_.PCI0.PATA._ADR correctly returned
+method PASSED: Test 153, \_SB_.PCI0.PATA._ADR correctly returned
method an integer.
-method PASSED: Test 141, \_SB_.PCI0.PATA.PRID._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.PATA.PRID._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.SATA._ADR correctly returned
+method PASSED: Test 153, \_SB_.PCI0.SATA._ADR correctly returned
method an integer.
-method PASSED: Test 141, \_SB_.PCI0.SATA.PRT0._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.SATA.PRT0._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.SATA.PRT1._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.SATA.PRT1._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.SATA.PRT2._ADR correctly
+method PASSED: Test 153, \_SB_.PCI0.SATA.PRT2._ADR correctly
method returned an integer.
-method PASSED: Test 141, \_SB_.PCI0.SBUS._ADR correctly returned
+method PASSED: Test 153, \_SB_.PCI0.SBUS._ADR correctly returned
method an integer.
method
-method Test 142 of 157: Test _BCL (Query List of Brightness
+method Test 154 of 169: Test _BCL (Query List of Brightness
method Control Levels Supported).
method Brightness levels for \_SB_.PCI0.PEGP.VGA_.LCD_._BCL:
method Level on full power : 70
method Level on battery power: 40
method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70
-method PASSED: Test 142, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned
+method PASSED: Test 154, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned
method a sane package of 10 integers.
method Brightness levels for \_SB_.PCI0.GFX0.DD03._BCL:
method Level on full power : 70
method Level on battery power: 40
method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70
-method PASSED: Test 142, \_SB_.PCI0.GFX0.DD03._BCL returned a
+method PASSED: Test 154, \_SB_.PCI0.GFX0.DD03._BCL returned a
method sane package of 10 integers.
method
-method Test 143 of 157: Test _BCM (Set Brightness Level).
-method PASSED: Test 143, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned
+method Test 155 of 169: Test _BCM (Set Brightness Level).
+method PASSED: Test 155, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned
method no values as expected.
-method PASSED: Test 143, \_SB_.PCI0.GFX0.DD03._BCM returned no
+method PASSED: Test 155, \_SB_.PCI0.GFX0.DD03._BCM returned no
method values as expected.
method
-method Test 144 of 157: Test _BQC (Brightness Query Current
+method Test 156 of 169: Test _BQC (Brightness Query Current
method Level).
-method PASSED: Test 144, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly
+method PASSED: Test 156, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly
method returned an integer.
-method PASSED: Test 144, \_SB_.PCI0.GFX0.DD03._BQC correctly
+method PASSED: Test 156, \_SB_.PCI0.GFX0.DD03._BQC correctly
method returned an integer.
method
-method Test 145 of 157: Test _DCS (Return the Status of Output
+method Test 157 of 169: Test _DCS (Return the Status of Output
method Device).
-method PASSED: Test 145, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly
+method PASSED: Test 157, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly
method returned an integer.
-method PASSED: Test 145, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly
+method PASSED: Test 157, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly
method returned an integer.
-method PASSED: Test 145, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly
+method PASSED: Test 157, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly
method returned an integer.
-method PASSED: Test 145, \_SB_.PCI0.GFX0.DD01._DCS correctly
+method PASSED: Test 157, \_SB_.PCI0.GFX0.DD01._DCS correctly
method returned an integer.
-method PASSED: Test 145, \_SB_.PCI0.GFX0.DD02._DCS correctly
+method PASSED: Test 157, \_SB_.PCI0.GFX0.DD02._DCS correctly
method returned an integer.
-method PASSED: Test 145, \_SB_.PCI0.GFX0.DD03._DCS correctly
+method PASSED: Test 157, \_SB_.PCI0.GFX0.DD03._DCS correctly
method returned an integer.
-method PASSED: Test 145, \_SB_.PCI0.GFX0.DD04._DCS correctly
+method PASSED: Test 157, \_SB_.PCI0.GFX0.DD04._DCS correctly
method returned an integer.
-method PASSED: Test 145, \_SB_.PCI0.GFX0.DD05._DCS correctly
+method PASSED: Test 157, \_SB_.PCI0.GFX0.DD05._DCS correctly
method returned an integer.
method
-method Test 146 of 157: Test _DDC (Return the EDID for this
+method Test 158 of 169: Test _DDC (Return the EDID for this
method Device).
-method SKIPPED: Test 146, Skipping test for non-existant object
+method SKIPPED: Test 158, Skipping test for non-existant object
method _DDC.
method
-method Test 147 of 157: Test _DSS (Device Set State).
-method PASSED: Test 147, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned
+method Test 159 of 169: Test _DSS (Device Set State).
+method PASSED: Test 159, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned
method no values as expected.
-method PASSED: Test 147, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned
+method PASSED: Test 159, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned
method no values as expected.
-method PASSED: Test 147, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned
+method PASSED: Test 159, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned
method no values as expected.
-method PASSED: Test 147, \_SB_.PCI0.GFX0.DD01._DSS returned no
+method PASSED: Test 159, \_SB_.PCI0.GFX0.DD01._DSS returned no
method values as expected.
-method PASSED: Test 147, \_SB_.PCI0.GFX0.DD02._DSS returned no
+method PASSED: Test 159, \_SB_.PCI0.GFX0.DD02._DSS returned no
method values as expected.
-method PASSED: Test 147, \_SB_.PCI0.GFX0.DD03._DSS returned no
+method PASSED: Test 159, \_SB_.PCI0.GFX0.DD03._DSS returned no
method values as expected.
-method PASSED: Test 147, \_SB_.PCI0.GFX0.DD04._DSS returned no
+method PASSED: Test 159, \_SB_.PCI0.GFX0.DD04._DSS returned no
method values as expected.
-method PASSED: Test 147, \_SB_.PCI0.GFX0.DD05._DSS returned no
+method PASSED: Test 159, \_SB_.PCI0.GFX0.DD05._DSS returned no
method values as expected.
method
-method Test 148 of 157: Test _DGS (Query Graphics State).
-method PASSED: Test 148, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly
+method Test 160 of 169: Test _DGS (Query Graphics State).
+method PASSED: Test 160, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly
method returned an integer.
-method PASSED: Test 148, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly
+method PASSED: Test 160, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly
method returned an integer.
-method PASSED: Test 148, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly
+method PASSED: Test 160, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly
method returned an integer.
-method PASSED: Test 148, \_SB_.PCI0.GFX0.DD01._DGS correctly
+method PASSED: Test 160, \_SB_.PCI0.GFX0.DD01._DGS correctly
method returned an integer.
-method PASSED: Test 148, \_SB_.PCI0.GFX0.DD02._DGS correctly
+method PASSED: Test 160, \_SB_.PCI0.GFX0.DD02._DGS correctly
method returned an integer.
-method PASSED: Test 148, \_SB_.PCI0.GFX0.DD03._DGS correctly
+method PASSED: Test 160, \_SB_.PCI0.GFX0.DD03._DGS correctly
method returned an integer.
-method PASSED: Test 148, \_SB_.PCI0.GFX0.DD04._DGS correctly
+method PASSED: Test 160, \_SB_.PCI0.GFX0.DD04._DGS correctly
method returned an integer.
-method PASSED: Test 148, \_SB_.PCI0.GFX0.DD05._DGS correctly
+method PASSED: Test 160, \_SB_.PCI0.GFX0.DD05._DGS correctly
method returned an integer.
method
-method Test 149 of 157: Test _DOD (Enumerate All Devices Attached
+method Test 161 of 169: Test _DOD (Enumerate All Devices Attached
method to Display Adapter).
method Device 0:
method Instance: 0
@@ -1091,7 +1152,7 @@ method Type of display: 2 (TV/HDTV or other Analog-Video Moni
method BIOS can detect device: 0
method Non-VGA device: 0
method Head or pipe ID: 0
-method PASSED: Test 149, \_SB_.PCI0.PEGP.VGA_._DOD correctly
+method PASSED: Test 161, \_SB_.PCI0.PEGP.VGA_._DOD correctly
method returned a sane looking package.
method Device 0:
method Instance: 0
@@ -1100,45 +1161,45 @@ method Type of display: 4 (Internal/Integrated Digital Flat P
method BIOS can detect device: 0
method Non-VGA device: 0
method Head or pipe ID: 0
-method PASSED: Test 149, \_SB_.PCI0.GFX0._DOD correctly returned
+method PASSED: Test 161, \_SB_.PCI0.GFX0._DOD correctly returned
method a sane looking package.
method
-method Test 150 of 157: Test _DOS (Enable/Disable Output
+method Test 162 of 169: Test _DOS (Enable/Disable Output
method Switching).
-method PASSED: Test 150, \_SB_.PCI0.PEGP.VGA_._DOS returned no
+method PASSED: Test 162, \_SB_.PCI0.PEGP.VGA_._DOS returned no
method values as expected.
-method PASSED: Test 150, \_SB_.PCI0.GFX0._DOS returned no values
+method PASSED: Test 162, \_SB_.PCI0.GFX0._DOS returned no values
method as expected.
method
-method Test 151 of 157: Test _GPD (Get POST Device).
-method SKIPPED: Test 151, Skipping test for non-existant object
+method Test 163 of 169: Test _GPD (Get POST Device).
+method SKIPPED: Test 163, Skipping test for non-existant object
method _GPD.
method
-method Test 152 of 157: Test _ROM (Get ROM Data).
-method SKIPPED: Test 152, Skipping test for non-existant object
+method Test 164 of 169: Test _ROM (Get ROM Data).
+method SKIPPED: Test 164, Skipping test for non-existant object
method _ROM.
method
-method Test 153 of 157: Test _SPD (Set POST Device).
-method SKIPPED: Test 153, Skipping test for non-existant object
+method Test 165 of 169: Test _SPD (Set POST Device).
+method SKIPPED: Test 165, Skipping test for non-existant object
method _SPD.
method
-method Test 154 of 157: Test _VPO (Video POST Options).
-method SKIPPED: Test 154, Skipping test for non-existant object
+method Test 166 of 169: Test _VPO (Video POST Options).
+method SKIPPED: Test 166, Skipping test for non-existant object
method _VPO.
method
-method Test 155 of 157: Test _CBA (Configuration Base Address).
-method SKIPPED: Test 155, Skipping test for non-existant object
+method Test 167 of 169: Test _CBA (Configuration Base Address).
+method SKIPPED: Test 167, Skipping test for non-existant object
method _CBA.
method
-method Test 156 of 157: Test _IFT (IPMI Interface Type).
-method SKIPPED: Test 156, Skipping test for non-existant object
+method Test 168 of 169: Test _IFT (IPMI Interface Type).
+method SKIPPED: Test 168, Skipping test for non-existant object
method _IFT.
method
-method Test 157 of 157: Test _SRV (IPMI Interface Revision).
-method SKIPPED: Test 157, Skipping test for non-existant object
+method Test 169 of 169: Test _SRV (IPMI Interface Revision).
+method SKIPPED: Test 169, Skipping test for non-existant object
method _SRV.
method
method ==========================================================
-method 237 passed, 0 failed, 0 warning, 0 aborted, 125 skipped, 0
+method 240 passed, 3 failed, 0 warning, 0 aborted, 135 skipped, 0
method info only.
method ==========================================================
--
1.9.1
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