[PATCH][FWTS-TEST] tests: keep in sync with changes from fwts bug LP: #1246650
Colin King
colin.king at canonical.com
Thu Oct 31 12:01:59 UTC 2013
From: Colin Ian King <colin.king at canonical.com>
Replacment of "Check" with "Test" in LP: #1246650 means we
need to update the affected tests.
Signed-off-by: Colin Ian King <colin.king at canonical.com>
---
acpitables-0001/acpitables-0001.log | 4 +-
acpitables-0002/acpitables-0001.log | 4 +-
acpitables-0002/acpitables-0002.log | 4 +-
acpitables-0003/acpitables-0001.log | 4 +-
acpitables-0004/acpitables-0001.log | 4 +-
acpitables-0005/acpitables-0001.log | 4 +-
acpitables-0006/acpitables-0001.log | 4 +-
acpitables-0007/acpitables-0001.log | 4 +-
acpitables-0008/acpitables-0001.log | 4 +-
apicinstance-0001/apicinstance-0001.log | 5 +-
apicinstance-0001/apicinstance-0002.log | 5 +-
arg-show-tests-0001/arg-show-tests-0001.log | 62 ++--
.../arg-show-tests-full-0001.log | 394 ++++++++++-----------
checksum-0001/checksum-0001.log | 4 +-
checksum-0001/checksum-0003.log | 4 +-
checksum-0001/checksum-0004.log | 4 +-
method-0001/method-0001.log | 296 ++++++++--------
wmi-0001/wmi-0001.log | 2 +-
wmi-0001/wmi-0002.log | 2 +-
wmi-0001/wmi-0003.log | 2 +-
20 files changed, 405 insertions(+), 411 deletions(-)
diff --git a/acpitables-0001/acpitables-0001.log b/acpitables-0001/acpitables-0001.log
index 2f05d15..57d8813 100644
--- a/acpitables-0001/acpitables-0001.log
+++ b/acpitables-0001/acpitables-0001.log
@@ -1,6 +1,6 @@
-acpitables acpitables: ACPI table settings sanity checks.
+acpitables acpitables: ACPI table settings sanity tests.
acpitables ----------------------------------------------------------
-acpitables Test 1 of 1: Check ACPI tables.
+acpitables Test 1 of 1: Test ACPI tables.
acpitables PASSED: Test 1, Table APIC passed.
acpitables Table ECDT not present to check.
acpitables PASSED: Test 1, Table FACP passed.
diff --git a/acpitables-0002/acpitables-0001.log b/acpitables-0002/acpitables-0001.log
index 042c83e..22f07a2 100644
--- a/acpitables-0002/acpitables-0001.log
+++ b/acpitables-0002/acpitables-0001.log
@@ -1,6 +1,6 @@
-acpitables acpitables: ACPI table settings sanity checks.
+acpitables acpitables: ACPI table settings sanity tests.
acpitables ----------------------------------------------------------
-acpitables Test 1 of 1: Check ACPI tables.
+acpitables Test 1 of 1: Test ACPI tables.
acpitables PASSED: Test 1, Table APIC passed.
acpitables Table ECDT not present to check.
acpitables Table FACP not present to check.
diff --git a/acpitables-0002/acpitables-0002.log b/acpitables-0002/acpitables-0002.log
index db437af..c16d257 100644
--- a/acpitables-0002/acpitables-0002.log
+++ b/acpitables-0002/acpitables-0002.log
@@ -1,6 +1,6 @@
-acpitables acpitables: ACPI table settings sanity checks.
+acpitables acpitables: ACPI table settings sanity tests.
acpitables ----------------------------------------------------------
-acpitables Test 1 of 1: Check ACPI tables.
+acpitables Test 1 of 1: Test ACPI tables.
acpitables FAILED [MEDIUM] MADTAPICFlagsNonZero: Test 1, MADT Local
acpitables APIC flags field, bits 1..31 are reserved and should be
acpitables zero, but are set as: f.
diff --git a/acpitables-0003/acpitables-0001.log b/acpitables-0003/acpitables-0001.log
index 2a4d63e..715978b 100644
--- a/acpitables-0003/acpitables-0001.log
+++ b/acpitables-0003/acpitables-0001.log
@@ -1,6 +1,6 @@
-acpitables acpitables: ACPI table settings sanity checks.
+acpitables acpitables: ACPI table settings sanity tests.
acpitables ----------------------------------------------------------
-acpitables Test 1 of 1: Check ACPI tables.
+acpitables Test 1 of 1: Test ACPI tables.
acpitables Table APIC not present to check.
acpitables Table ECDT not present to check.
acpitables FAILED [CRITICAL] FADTFACSZero: Test 1, FADT 32 bit
diff --git a/acpitables-0004/acpitables-0001.log b/acpitables-0004/acpitables-0001.log
index 52491c3..f33e083 100644
--- a/acpitables-0004/acpitables-0001.log
+++ b/acpitables-0004/acpitables-0001.log
@@ -1,6 +1,6 @@
-acpitables acpitables: ACPI table settings sanity checks.
+acpitables acpitables: ACPI table settings sanity tests.
acpitables ----------------------------------------------------------
-acpitables Test 1 of 1: Check ACPI tables.
+acpitables Test 1 of 1: Test ACPI tables.
acpitables Table APIC not present to check.
acpitables Table ECDT not present to check.
acpitables Table FACP not present to check.
diff --git a/acpitables-0005/acpitables-0001.log b/acpitables-0005/acpitables-0001.log
index cf09a01..2e97b45 100644
--- a/acpitables-0005/acpitables-0001.log
+++ b/acpitables-0005/acpitables-0001.log
@@ -1,6 +1,6 @@
-acpitables acpitables: ACPI table settings sanity checks.
+acpitables acpitables: ACPI table settings sanity tests.
acpitables ----------------------------------------------------------
-acpitables Test 1 of 1: Check ACPI tables.
+acpitables Test 1 of 1: Test ACPI tables.
acpitables Table APIC not present to check.
acpitables Table ECDT not present to check.
acpitables Table FACP not present to check.
diff --git a/acpitables-0006/acpitables-0001.log b/acpitables-0006/acpitables-0001.log
index 1c2633c..b931cf3 100644
--- a/acpitables-0006/acpitables-0001.log
+++ b/acpitables-0006/acpitables-0001.log
@@ -1,6 +1,6 @@
-acpitables acpitables: ACPI table settings sanity checks.
+acpitables acpitables: ACPI table settings sanity tests.
acpitables ----------------------------------------------------------
-acpitables Test 1 of 1: Check ACPI tables.
+acpitables Test 1 of 1: Test ACPI tables.
acpitables Table APIC not present to check.
acpitables Table ECDT not present to check.
acpitables Table FACP not present to check.
diff --git a/acpitables-0007/acpitables-0001.log b/acpitables-0007/acpitables-0001.log
index 3e02f91..5d17103 100644
--- a/acpitables-0007/acpitables-0001.log
+++ b/acpitables-0007/acpitables-0001.log
@@ -1,6 +1,6 @@
-acpitables acpitables: ACPI table settings sanity checks.
+acpitables acpitables: ACPI table settings sanity tests.
acpitables ----------------------------------------------------------
-acpitables Test 1 of 1: Check ACPI tables.
+acpitables Test 1 of 1: Test ACPI tables.
acpitables Table APIC not present to check.
acpitables Table ECDT not present to check.
acpitables Table FACP not present to check.
diff --git a/acpitables-0008/acpitables-0001.log b/acpitables-0008/acpitables-0001.log
index 1a127a6..80ecd20 100644
--- a/acpitables-0008/acpitables-0001.log
+++ b/acpitables-0008/acpitables-0001.log
@@ -1,6 +1,6 @@
-acpitables acpitables: ACPI table settings sanity checks.
+acpitables acpitables: ACPI table settings sanity tests.
acpitables ----------------------------------------------------------
-acpitables Test 1 of 1: Check ACPI tables.
+acpitables Test 1 of 1: Test ACPI tables.
acpitables Table APIC not present to check.
acpitables Table ECDT not present to check.
acpitables Table FACP not present to check.
diff --git a/apicinstance-0001/apicinstance-0001.log b/apicinstance-0001/apicinstance-0001.log
index a185d24..0fcec6e 100644
--- a/apicinstance-0001/apicinstance-0001.log
+++ b/apicinstance-0001/apicinstance-0001.log
@@ -1,7 +1,6 @@
-apicinstance apicinstance: Check for single instance of APIC/MADT
-apicinstance table.
+apicinstance apicinstance: Test for single instance of APIC/MADT table.
apicinstance ----------------------------------------------------------
-apicinstance Test 1 of 1: Check single instance of APIC/MADT table.
+apicinstance Test 1 of 1: Test for single instance of APIC/MADT table.
apicinstance Found APIC/MADT table APIC @ bf6dfcc6, length 0x104
apicinstance Found APIC/MADT table APIC @ bf6dff70, length 0x104
apicinstance (and differs from first APIC/MADT table).
diff --git a/apicinstance-0001/apicinstance-0002.log b/apicinstance-0001/apicinstance-0002.log
index 91fd42e..d3f2eb3 100644
--- a/apicinstance-0001/apicinstance-0002.log
+++ b/apicinstance-0001/apicinstance-0002.log
@@ -1,7 +1,6 @@
-apicinstance apicinstance: Check for single instance of APIC/MADT
-apicinstance table.
+apicinstance apicinstance: Test for single instance of APIC/MADT table.
apicinstance ----------------------------------------------------------
-apicinstance Test 1 of 1: Check single instance of APIC/MADT table.
+apicinstance Test 1 of 1: Test for single instance of APIC/MADT table.
apicinstance Found APIC/MADT table APIC @ bf6dfcc6, length 0x104
apicinstance PASSED: Test 1, Found 1 APIC/MADT table(s), as expected.
apicinstance
diff --git a/arg-show-tests-0001/arg-show-tests-0001.log b/arg-show-tests-0001/arg-show-tests-0001.log
index 06a7619..3068592 100644
--- a/arg-show-tests-0001/arg-show-tests-0001.log
+++ b/arg-show-tests-0001/arg-show-tests-0001.log
@@ -1,49 +1,49 @@
Batch tests:
- acpiinfo General ACPI information check.
- acpitables ACPI table settings sanity checks.
- apicedge APIC Edge/Level Check.
- apicinstance Check for single instance of APIC/MADT table.
- aspm PCIe ASPM check.
- bios32 Check BIOS32 Service Directory.
+ acpiinfo General ACPI information test.
+ acpitables ACPI table settings sanity tests.
+ apicedge APIC edge/level test.
+ apicinstance Test for single instance of APIC/MADT table.
+ aspm PCIe ASPM test.
+ bios32 BIOS32 Service Directory test.
bios_info Gather BIOS DMI information.
- checksum Check ACPI table checksum.
+ checksum ACPI table checksum test.
cpufreq CPU frequency scaling tests.
- crs Check PCI host bridge configuration using _CRS.
- csm Check for UEFI Compatibility Support Module.
- cstates Check processor C state support.
- dmar Check sane DMA Remapping (VT-d).
- dmicheck Test DMI/SMBIOS tables for errors.
- ebda Validate EBDA region is mapped and reserved in memory map table.
- fadt FADT SCI_EN enabled check.
- fan Simple Fan Tests.
- hda_audio Check HDA Audio Pin Configs.
- hpet_check HPET configuration test.
+ crs Test PCI host bridge configuration using _CRS.
+ csm UEFI Compatibility Support Module test.
+ cstates Processor C state support test.
+ dmar DMA Remapping (VT-d) test.
+ dmicheck DMI/SMBIOS table tests.
+ ebda Test EBDA region is mapped and reserved in memory map table.
+ fadt FADT SCI_EN enabled tests.
+ fan Simple fan tests.
+ hda_audio HDA Audio Pin Configuration test.
+ hpet_check HPET configuration tests.
klog Scan kernel log for errors and warnings.
- maxfreq Check max CPU frequencies against max scaling frequency.
- maxreadreq Checks firmware has set PCI Express MaxReadReq to a higher value on non-motherboard devices.
- mcfg MCFG PCI Express* memory mapped config space.
- method ACPI DSDT Method Semantic Tests.
- microcode Check if system is using latest microcode.
- mpcheck Check MultiProcessor Tables.
+ maxfreq Test max CPU frequencies against max scaling frequency.
+ maxreadreq Test firmware has set PCI Express MaxReadReq to a higher value on non-motherboard devices.
+ mcfg MCFG PCI Express* memory mapped config space test.
+ method ACPI DSDT Method Semantic tests.
+ microcode Test if system is using latest microcode.
+ mpcheck MultiProcessor Tables tests.
msr MSR register tests.
- mtrr MTRR validation.
+ mtrr MTRR tests.
nx Test if CPU NX is disabled by the BIOS.
oops Scan kernel log for Oopses.
os2gap OS/2 memory hole test.
osilinux Disassemble DSDT to check for _OSI("Linux").
- pcc Processor Clocking Control (PCC) Test.
- pciirq Check PCI IRQ Routing Table.
- pnp Check BIOS Support Installation structure.
+ pcc Processor Clocking Control (PCC) test.
+ pciirq PCI IRQ Routing Table test.
+ pnp BIOS Support Installation structure test.
securebootcert Ubuntu UEFI secure boot test.
syntaxcheck Re-assemble DSDT and find syntax errors and warnings.
version Gather kernel system information.
- virt Test CPU Virtualisation Configuration.
- wakealarm Test ACPI Wakealarm.
+ virt CPU Virtualisation Configuration test.
+ wakealarm ACPI Wakealarm tests.
wmi Extract and analyse Windows Management Instrumentation (WMI).
Interactive tests:
ac_adapter Interactive ac_adapter power test.
- battery Battery Tests.
+ battery Battery tests.
brightness Interactive LCD brightness test.
hotkey Hotkey scan code tests.
lid Interactive lid button test.
@@ -71,7 +71,7 @@ Unsafe tests:
uefirtvariable UEFI Runtime service variable interface tests.
UEFI tests:
- csm Check for UEFI Compatibility Support Module.
+ csm UEFI Compatibility Support Module test.
securebootcert Ubuntu UEFI secure boot test.
uefirtmisc UEFI miscellaneous runtime service interface tests.
uefirttime UEFI Runtime service time interface tests.
diff --git a/arg-show-tests-full-0001/arg-show-tests-full-0001.log b/arg-show-tests-full-0001/arg-show-tests-full-0001.log
index f6d3b89..c9c13c5 100644
--- a/arg-show-tests-full-0001/arg-show-tests-full-0001.log
+++ b/arg-show-tests-full-0001/arg-show-tests-full-0001.log
@@ -4,240 +4,240 @@ Batch tests:
Determine machine's ACPI version.
Determine AML compiler.
acpitables (1 test):
- Check ACPI tables.
+ Test ACPI tables.
apicedge (1 test):
- Legacy and PCI Interrupt Edge/Level trigger checks.
+ Legacy and PCI Interrupt Edge/Level trigger tests.
apicinstance (1 test):
- Check single instance of APIC/MADT table.
+ Test for single instance of APIC/MADT table.
aspm (2 tests):
PCIe ASPM ACPI test.
PCIe ASPM registers test.
bios32 (1 test):
- Check BIOS32 Service Directory.
+ BIOS32 Service Directory test.
bios_info (1 test):
Gather BIOS DMI information
checksum (1 test):
- Check ACPI table checksums.
+ ACPI table checksum test.
cpufreq (1 test):
- CPU P-State Checks.
+ CPU P-State tests.
crs (1 test):
- Check PCI host bridge configuration using _CRS.
+ Test PCI host bridge configuration using _CRS.
csm (1 test):
- Check for UEFI Compatibility Support Module.
+ UEFI Compatibility Support Module test.
cstates (1 test):
- Check all CPUs C-states.
+ Test all CPUs C-states.
dmar (1 test):
- Check DMA Remapping.
+ DMA Remapping test.
dmicheck (2 tests):
- Find and Check SMBIOS Table Entry Point.
+ Find and test SMBIOS Table Entry Point.
Test DMI/SMBIOS tables for errors.
ebda (1 test):
- Check EBDA is reserved in E820 table.
+ Test EBDA is reserved in E820 table.
fadt (2 tests):
- Check FADT SCI_EN bit is enabled.
- Check FADT reset register.
+ Test FADT SCI_EN bit is enabled.
+ Test FADT reset register.
fan (2 tests):
- Check fan status.
+ Test fan status.
Load system, check CPU fan status.
hda_audio (1 test):
- Check HDA Audio Pin Configs.
+ HDA Audio Pin Configuration test.
hpet_check (4 tests):
- Check HPET base in kernel log.
- Check HPET base in HPET table.
- Check HPET base in DSDT and/or SSDT.
- Sanity check HPET configuration.
+ Test HPET base in kernel log.
+ Test HPET base in HPET table.
+ Test HPET base in DSDT and/or SSDT.
+ Test HPET configuration.
klog (1 test):
Kernel log error check.
maxfreq (1 test):
- Maximum CPU frequency check.
+ Maximum CPU frequency test.
maxreadreq (1 test):
- Check firmware settings MaxReadReq for PCI Express devices.
+ Test firmware settings MaxReadReq for PCI Express devices.
mcfg (2 tests):
Validate MCFG table.
Validate MCFG PCI config space.
method (144 tests):
- Check Method Names.
- Check _AEI.
- Check _DDN (DOS Device Name).
- Check _HID (Hardware ID).
- Check _HRV (Hardware Revision Number).
- Check _PLD (Physical Device Location).
- Check _SUB (Subsystem ID).
- Check _SUN (Slot User Number).
- Check _STR (String).
- Check _UID (Unique ID).
- Check _CRS (Current Resource Settings).
- Check _DIS (Disable).
- Check _DMA (Direct Memory Access).
- Check _FIX (Fixed Register Resource Provider).
- Check _GSB (Global System Interrupt Base).
- Check _HPP (Hot Plug Parameters).
- Check _PRS (Possible Resource Settings).
- Check _PXM (Proximity).
- Check _EDL (Eject Device List).
- Check _EJD (Ejection Dependent Device).
- Check _EJ0 (Eject).
- Check _EJ1 (Eject).
- Check _EJ2 (Eject).
- Check _EJ3 (Eject).
- Check _EJ4 (Eject).
- Check _LCK (Lock).
- Check _RMV (Remove).
- Check _STA (Status).
- Check _BDN (BIOS Dock Name).
- Check _BBN (Base Bus Number).
- Check _DCK (Dock).
- Check _INI (Initialize).
- Check _SEG (Segment).
- Check _OFF (Set resource off).
- Check _ON (Set resource on).
- Check _DSW (Device Sleep Wake).
- Check _IRC (In Rush Current).
- Check _PRE (Power Resources for Enumeration).
- Check _PR0 (Power Resources for D0).
- Check _PR1 (Power Resources for D1).
- Check _PR2 (Power Resources for D2).
- Check _PR3 (Power Resources for D3).
- Check _PS0 (Power State 0).
- Check _PS1 (Power State 1).
- Check _PS2 (Power State 2).
- Check _PS3 (Power State 3).
- Check _PSC (Power State Current).
- Check _PSE (Power State for Enumeration).
- Check _PSW (Power State Wake).
- Check _S1D (S1 Device State).
- Check _S2D (S2 Device State).
- Check _S3D (S3 Device State).
- Check _S4D (S4 Device State).
- Check _S0W (S0 Device Wake State).
- Check _S1W (S1 Device Wake State).
- Check _S2W (S2 Device Wake State).
- Check _S3W (S3 Device Wake State).
- Check _S4W (S4 Device Wake State).
- Check _S0_ (S0 System State).
- Check _S1_ (S1 System State).
- Check _S2_ (S2 System State).
- Check _S3_ (S3 System State).
- Check _S4_ (S4 System State).
- Check _S5_ (S5 System State).
- Check _SWS (System Wake Source).
- Check _PSS (Performance Supported States).
- Check _CPC (Continuous Performance Control).
- Check _CSD (C State Dependencies).
- Check _CST (C States).
- Check _PCT (Performance Control).
- Check _PDL (P-State Depth Limit).
- Check _PPC (Performance Present Capabilities).
- Check _PPE (Polling for Platform Error).
- Check _TDL (T-State Depth Limit).
- Check _TPC (Throttling Present Capabilities).
- Check _TSD (Throttling State Dependencies).
- Check _TSS (Throttling Supported States).
- Check _ALC (Ambient Light Colour Chromaticity).
- Check _ALI (Ambient Light Illuminance).
- Check _ALT (Ambient Light Temperature).
- Check _ALP (Ambient Light Polling).
- Check _LID (Lid Status).
- Check _GCP (Get Capabilities).
- Check _GRT (Get Real Time).
- Check _GWS (Get Wake Status).
- Check _STP (Set Expired Timer Wake Policy).
- Check _STV (Set Timer Value).
- Check _TIP (Expired Timer Wake Policy).
- Check _TIV (Timer Values).
- Check _SBS (Smart Battery Subsystem).
- Check _BCT (Battery Charge Time).
- Check _BIF (Battery Information).
- Check _BIX (Battery Information Extended).
- Check _BMA (Battery Measurement Averaging).
- Check _BMC (Battery Maintenance Control).
- Check _BMD (Battery Maintenance Data).
- Check _BMS (Battery Measurement Sampling Time).
- Check _BST (Battery Status).
- Check _BTP (Battery Trip Point).
- Check _BTM (Battery Time).
- Check _PCL (Power Consumer List).
- Check _PIF (Power Source Information).
- Check _PSR (Power Source).
- Check _FIF (Fan Information).
- Check _FSL (Fan Set Level).
- Check _FST (Fan Status).
- Check _ACx (Active Cooling).
- Check _CRT (Critical Trip Point).
- Check _DTI (Device Temperature Indication).
- Check _HOT (Hot Temperature).
- Check _NTT (Notification Temp Threshold).
- Check _PSV (Passive Temp).
- Check _RTV (Relative Temp Values).
- Check _SCP (Set Cooling Policy).
- Check _TC1 (Thermal Constant 1).
- Check _TC2 (Thermal Constant 2).
- Check _TMP (Thermal Zone Current Temp).
- Check _TPT (Trip Point Temperature).
- Check _TSP (Thermal Sampling Period).
- Check _TST (Temperature Sensor Threshold).
- Check _TZP (Thermal Zone Polling).
- Check _PTS (Prepare to Sleep).
- Check _TTS (Transition to State).
- Check _S0 (System S0 State).
- Check _S1 (System S1 State).
- Check _S2 (System S2 State).
- Check _S3 (System S3 State).
- Check _S4 (System S4 State).
- Check _S5 (System S5 State).
- Check _WAK (System Wake).
- Check _ADR (Return Unique ID for Device).
- Check _BCL (Query List of Brightness Control Levels Supported).
- Check _BCM (Set Brightness Level).
- Check _BQC (Brightness Query Current Level).
- Check _DCS (Return the Status of Output Device).
- Check _DDC (Return the EDID for this Device).
- Check _DSS (Device Set State).
- Check _DGS (Query Graphics State).
- Check _DOD (Enumerate All Devices Attached to Display Adapter).
- Check _DOS (Enable/Disable Output Switching).
- Check _GPD (Get POST Device).
- Check _ROM (Get ROM Data).
- Check _SPD (Set POST Device).
- Check _VPO (Video POST Options).
+ Test Method Names.
+ Test _AEI.
+ Test _DDN (DOS Device Name).
+ Test _HID (Hardware ID).
+ Test _HRV (Hardware Revision Number).
+ Test _PLD (Physical Device Location).
+ Test _SUB (Subsystem ID).
+ Test _SUN (Slot User Number).
+ Test _STR (String).
+ Test _UID (Unique ID).
+ Test _CRS (Current Resource Settings).
+ Test _DIS (Disable).
+ Test _DMA (Direct Memory Access).
+ Test _FIX (Fixed Register Resource Provider).
+ Test _GSB (Global System Interrupt Base).
+ Test _HPP (Hot Plug Parameters).
+ Test _PRS (Possible Resource Settings).
+ Test _PXM (Proximity).
+ Test _EDL (Eject Device List).
+ Test _EJD (Ejection Dependent Device).
+ Test _EJ0 (Eject).
+ Test _EJ1 (Eject).
+ Test _EJ2 (Eject).
+ Test _EJ3 (Eject).
+ Test _EJ4 (Eject).
+ Test _LCK (Lock).
+ Test _RMV (Remove).
+ Test _STA (Status).
+ Test _BDN (BIOS Dock Name).
+ Test _BBN (Base Bus Number).
+ Test _DCK (Dock).
+ Test _INI (Initialize).
+ Test _SEG (Segment).
+ Test _OFF (Set resource off).
+ Test _ON (Set resource on).
+ Test _DSW (Device Sleep Wake).
+ Test _IRC (In Rush Current).
+ Test _PRE (Power Resources for Enumeration).
+ Test _PR0 (Power Resources for D0).
+ Test _PR1 (Power Resources for D1).
+ Test _PR2 (Power Resources for D2).
+ Test _PR3 (Power Resources for D3).
+ Test _PS0 (Power State 0).
+ Test _PS1 (Power State 1).
+ Test _PS2 (Power State 2).
+ Test _PS3 (Power State 3).
+ Test _PSC (Power State Current).
+ Test _PSE (Power State for Enumeration).
+ Test _PSW (Power State Wake).
+ Test _S1D (S1 Device State).
+ Test _S2D (S2 Device State).
+ Test _S3D (S3 Device State).
+ Test _S4D (S4 Device State).
+ Test _S0W (S0 Device Wake State).
+ Test _S1W (S1 Device Wake State).
+ Test _S2W (S2 Device Wake State).
+ Test _S3W (S3 Device Wake State).
+ Test _S4W (S4 Device Wake State).
+ Test _S0_ (S0 System State).
+ Test _S1_ (S1 System State).
+ Test _S2_ (S2 System State).
+ Test _S3_ (S3 System State).
+ Test _S4_ (S4 System State).
+ Test _S5_ (S5 System State).
+ Test _SWS (System Wake Source).
+ Test _PSS (Performance Supported States).
+ Test _CPC (Continuous Performance Control).
+ Test _CSD (C State Dependencies).
+ Test _CST (C States).
+ Test _PCT (Performance Control).
+ Test _PDL (P-State Depth Limit).
+ Test _PPC (Performance Present Capabilities).
+ Test _PPE (Polling for Platform Error).
+ Test _TDL (T-State Depth Limit).
+ Test _TPC (Throttling Present Capabilities).
+ Test _TSD (Throttling State Dependencies).
+ Test _TSS (Throttling Supported States).
+ Test _ALC (Ambient Light Colour Chromaticity).
+ Test _ALI (Ambient Light Illuminance).
+ Test _ALT (Ambient Light Temperature).
+ Test _ALP (Ambient Light Polling).
+ Test _LID (Lid Status).
+ Test _GCP (Get Capabilities).
+ Test _GRT (Get Real Time).
+ Test _GWS (Get Wake Status).
+ Test _STP (Set Expired Timer Wake Policy).
+ Test _STV (Set Timer Value).
+ Test _TIP (Expired Timer Wake Policy).
+ Test _TIV (Timer Values).
+ Test _SBS (Smart Battery Subsystem).
+ Test _BCT (Battery Charge Time).
+ Test _BIF (Battery Information).
+ Test _BIX (Battery Information Extended).
+ Test _BMA (Battery Measurement Averaging).
+ Test _BMC (Battery Maintenance Control).
+ Test _BMD (Battery Maintenance Data).
+ Test _BMS (Battery Measurement Sampling Time).
+ Test _BST (Battery Status).
+ Test _BTP (Battery Trip Point).
+ Test _BTM (Battery Time).
+ Test _PCL (Power Consumer List).
+ Test _PIF (Power Source Information).
+ Test _PSR (Power Source).
+ Test _FIF (Fan Information).
+ Test _FSL (Fan Set Level).
+ Test _FST (Fan Status).
+ Test _ACx (Active Cooling).
+ Test _CRT (Critical Trip Point).
+ Test _DTI (Device Temperature Indication).
+ Test _HOT (Hot Temperature).
+ Test _NTT (Notification Temp Threshold).
+ Test _PSV (Passive Temp).
+ Test _RTV (Relative Temp Values).
+ Test _SCP (Set Cooling Policy).
+ Test _TC1 (Thermal Constant 1).
+ Test _TC2 (Thermal Constant 2).
+ Test _TMP (Thermal Zone Current Temp).
+ Test _TPT (Trip Point Temperature).
+ Test _TSP (Thermal Sampling Period).
+ Test _TST (Temperature Sensor Threshold).
+ Test _TZP (Thermal Zone Polling).
+ Test _PTS (Prepare to Sleep).
+ Test _TTS (Transition to State).
+ Test _S0 (System S0 State).
+ Test _S1 (System S1 State).
+ Test _S2 (System S2 State).
+ Test _S3 (System S3 State).
+ Test _S4 (System S4 State).
+ Test _S5 (System S5 State).
+ Test _WAK (System Wake).
+ Test _ADR (Return Unique ID for Device).
+ Test _BCL (Query List of Brightness Control Levels Supported).
+ Test _BCM (Set Brightness Level).
+ Test _BQC (Brightness Query Current Level).
+ Test _DCS (Return the Status of Output Device).
+ Test _DDC (Return the EDID for this Device).
+ Test _DSS (Device Set State).
+ Test _DGS (Query Graphics State).
+ Test _DOD (Enumerate All Devices Attached to Display Adapter).
+ Test _DOS (Enable/Disable Output Switching).
+ Test _GPD (Get POST Device).
+ Test _ROM (Get ROM Data).
+ Test _SPD (Set POST Device).
+ Test _VPO (Video POST Options).
microcode (1 test):
- Check for most recent microcode being loaded.
+ Test for most recent microcode being loaded.
mpcheck (9 tests):
- Check MP header.
- Check MP CPU entries.
- Check MP Bus entries.
- Check MP IO APIC entries.
- Check MP IO Interrupt entries.
- Check MP Local Interrupt entries.
- Check MP System Address entries.
- Check MP Bus Hierarchy entries.
- Check MP Compatible Bus Address Space entries.
+ Test MP header.
+ Test MP CPU entries.
+ Test MP Bus entries.
+ Test MP IO APIC entries.
+ Test MP IO Interrupt entries.
+ Test MP Local Interrupt entries.
+ Test MP System Address entries.
+ Test MP Bus Hierarchy entries.
+ Test MP Compatible Bus Address Space entries.
msr (5 tests):
- Check CPU generic MSRs.
- Check CPU specific model MSRs.
- Check all P State Ratios.
- Check C1 and C3 autodemotion.
- Check SMRR MSR registers.
+ Test CPU generic MSRs.
+ Test CPU specific model MSRs.
+ Test all P State Ratios.
+ Test C1 and C3 autodemotion.
+ Test SMRR MSR registers.
mtrr (3 tests):
Validate the kernel MTRR IOMEM setup.
Validate the MTRR setup across all processors.
- Check for AMD MtrrFixDramModEn being cleared by the BIOS.
+ Test for AMD MtrrFixDramModEn being cleared by the BIOS.
nx (3 tests):
- Check CPU NX capability.
- Check all CPUs have same BIOS set NX flag.
- Check all CPUs have same msr setting in MSR 0x1a0.
+ Test CPU NX capability.
+ Test all CPUs have same BIOS set NX flag.
+ Test all CPUs have same msr setting in MSR 0x1a0.
oops (1 test):
Kernel log oops check.
os2gap (1 test):
- Check the OS/2 15Mb memory hole is absent.
+ Test the OS/2 15Mb memory hole is absent.
osilinux (1 test):
Disassemble DSDT to check for _OSI("Linux").
pcc (1 test):
- Check PCCH.
+ Processor Clocking Control (PCC) test.
pciirq (1 test):
- PCI IRQ Routing Table.
+ PCI IRQ Routing Table test.
pnp (1 test):
- Check PnP BIOS Support Installation structure.
+ PnP BIOS Support Installation structure test.
securebootcert (1 test):
Ubuntu UEFI secure boot test.
syntaxcheck (2 tests):
@@ -249,14 +249,14 @@ Batch tests:
Gather kernel boot command line.
Gather ACPI driver version.
virt (1 test):
- Check CPU Virtualisation Configuration.
+ CPU Virtualisation Configuration test.
wakealarm (4 tests):
- Check existence of /sys/class/rtc/rtc0/wakealarm.
+ Test existence of /sys/class/rtc/rtc0/wakealarm.
Trigger wakealarm for 1 seconds in the future.
- Check if wakealarm is fired.
+ Test if wakealarm is fired.
Multiple wakealarm firing tests.
wmi (1 test):
- Check Windows Management Instrumentation
+ Windows Management Instrumentation test.
Interactive tests:
ac_adapter (3 tests):
@@ -264,13 +264,13 @@ Interactive tests:
Test ac_adapter initial on-line state.
Test ac_adapter state changes.
battery (1 test):
- Check batteries.
+ Battery test.
brightness (5 tests):
- Check for maximum and actual brightness.
+ Test for maximum and actual brightness.
Change actual brightness.
Observe all brightness changes.
Observe min, max brightness changes.
- Check brightness hotkeys.
+ Test brightness hotkeys.
hotkey (1 test):
Hotkey keypress checks.
lid (3 tests):
@@ -328,7 +328,7 @@ Unsafe tests:
UEFI tests:
csm (1 test):
- Check for UEFI Compatibility Support Module.
+ UEFI Compatibility Support Module test.
securebootcert (1 test):
Ubuntu UEFI secure boot test.
uefirtmisc (2 tests):
diff --git a/checksum-0001/checksum-0001.log b/checksum-0001/checksum-0001.log
index 4efca9b..d720e06 100644
--- a/checksum-0001/checksum-0001.log
+++ b/checksum-0001/checksum-0001.log
@@ -1,6 +1,6 @@
-checksum checksum: Check ACPI table checksum.
+checksum checksum: ACPI table checksum test.
checksum --------------------------------------------------------------------------------------------------
-checksum Test 1 of 1: Check ACPI table checksums.
+checksum Test 1 of 1: ACPI table checksum test.
checksum PASSED: Test 1, Table DSDT has correct checksum 0x11.
checksum PASSED: Test 1, Table FACP has correct checksum 0x52.
checksum PASSED: Test 1, Table APIC has correct checksum 0xcc.
diff --git a/checksum-0001/checksum-0003.log b/checksum-0001/checksum-0003.log
index 75925bb..4ab586a 100644
--- a/checksum-0001/checksum-0003.log
+++ b/checksum-0001/checksum-0003.log
@@ -1,6 +1,6 @@
-checksum checksum: Check ACPI table checksum.
+checksum checksum: ACPI table checksum test.
checksum --------------------------------------------------------------------------------------------------
-checksum Test 1 of 1: Check ACPI table checksums.
+checksum Test 1 of 1: ACPI table checksum test.
checksum FAILED [MEDIUM] ACPITableChecksum: Test 1, Table DSDT has incorrect checksum, expected 0x11, got
checksum 0x10.
checksum
diff --git a/checksum-0001/checksum-0004.log b/checksum-0001/checksum-0004.log
index d092674..f69a42a 100644
--- a/checksum-0001/checksum-0004.log
+++ b/checksum-0001/checksum-0004.log
@@ -1,6 +1,6 @@
-checksum checksum: Check ACPI table checksum.
+checksum checksum: ACPI table checksum test.
checksum --------------------------------------------------------------------------------------------------
-checksum Test 1 of 1: Check ACPI table checksums.
+checksum Test 1 of 1: ACPI table checksum test.
checksum PASSED: Test 1, Table DSDT has correct checksum 0x11.
checksum FAILED [MEDIUM] ACPITableChecksum: Test 1, Table FACP has incorrect checksum, expected 0x52, got
checksum 0x53.
diff --git a/method-0001/method-0001.log b/method-0001/method-0001.log
index e41aa26..bf2c976 100644
--- a/method-0001/method-0001.log
+++ b/method-0001/method-0001.log
@@ -1,18 +1,18 @@
-method method: ACPI DSDT Method Semantic Tests.
+method method: ACPI DSDT Method Semantic tests.
method ----------------------------------------------------------
-method Test 1 of 144: Check Method Names.
+method Test 1 of 144: Test Method Names.
method Found 1061 Objects
method PASSED: Test 1, Method names contain legal characters.
method
-method Test 2 of 144: Check _AEI.
+method Test 2 of 144: Test _AEI.
method SKIPPED: Test 2, Skipping test for non-existant object
method _AEI.
method
-method Test 3 of 144: Check _DDN (DOS Device Name).
+method Test 3 of 144: Test _DDN (DOS Device Name).
method SKIPPED: Test 3, Skipping test for non-existant object
method _DDN.
method
-method Test 4 of 144: Check _HID (Hardware ID).
+method Test 4 of 144: Test _HID (Hardware ID).
method PASSED: Test 4, \_SB_.AMW0._HID returned a string
method 'PNP0C14' as expected.
method PASSED: Test 4, \_SB_.LID0._HID returned an integer
@@ -66,27 +66,27 @@ method integer 0x0303d041 (EISA ID PNP0303).
method PASSED: Test 4, \_SB_.PCI0.LPCB.PS2M._HID returned an
method integer 0x130fd041 (EISA ID PNP0F13).
method
-method Test 5 of 144: Check _HRV (Hardware Revision Number).
+method Test 5 of 144: Test _HRV (Hardware Revision Number).
method SKIPPED: Test 5, Skipping test for non-existant object
method _HRV.
method
-method Test 6 of 144: Check _PLD (Physical Device Location).
+method Test 6 of 144: Test _PLD (Physical Device Location).
method SKIPPED: Test 6, Skipping test for non-existant object
method _PLD.
method
-method Test 7 of 144: Check _SUB (Subsystem ID).
+method Test 7 of 144: Test _SUB (Subsystem ID).
method SKIPPED: Test 7, Skipping test for non-existant object
method _SUB.
method
-method Test 8 of 144: Check _SUN (Slot User Number).
+method Test 8 of 144: Test _SUN (Slot User Number).
method SKIPPED: Test 8, Skipping test for non-existant object
method _SUN.
method
-method Test 9 of 144: Check _STR (String).
+method Test 9 of 144: Test _STR (String).
method SKIPPED: Test 9, Skipping test for non-existant object
method _STR.
method
-method Test 10 of 144: Check _UID (Unique ID).
+method Test 10 of 144: Test _UID (Unique ID).
method PASSED: Test 10, \_SB_.AMW0._UID correctly returned sane
method looking value 0x00000000.
method PASSED: Test 10, \_SB_.PCI0.PDRC._UID correctly returned
@@ -112,7 +112,7 @@ method returned sane looking value 0x00000002.
method PASSED: Test 10, \_SB_.PCI0.LPCB.BAT1._UID correctly
method returned sane looking value 0x00000001.
method
-method Test 11 of 144: Check _CRS (Current Resource Settings).
+method Test 11 of 144: Test _CRS (Current Resource Settings).
method PASSED: Test 11, \_SB_.PCI0._CRS (WORD Address Space
method Descriptor) looks sane.
method PASSED: Test 11, \_SB_.PCI0.PDRC._CRS (32-bit Fixed
@@ -156,7 +156,7 @@ method Descriptor) looks sane.
method PASSED: Test 11, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ
method Descriptor) looks sane.
method
-method Test 12 of 144: Check _DIS (Disable).
+method Test 12 of 144: Test _DIS (Disable).
method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKA._DIS returned no
method values as expected.
method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKB._DIS returned no
@@ -174,24 +174,24 @@ method values as expected.
method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKH._DIS returned no
method values as expected.
method
-method Test 13 of 144: Check _DMA (Direct Memory Access).
+method Test 13 of 144: Test _DMA (Direct Memory Access).
method SKIPPED: Test 13, Skipping test for non-existant object
method _DMA.
method
-method Test 14 of 144: Check _FIX (Fixed Register Resource
+method Test 14 of 144: Test _FIX (Fixed Register Resource
method Provider).
method SKIPPED: Test 14, Skipping test for non-existant object
method _FIX.
method
-method Test 15 of 144: Check _GSB (Global System Interrupt Base).
+method Test 15 of 144: Test _GSB (Global System Interrupt Base).
method SKIPPED: Test 15, Skipping test for non-existant object
method _GSB.
method
-method Test 16 of 144: Check _HPP (Hot Plug Parameters).
+method Test 16 of 144: Test _HPP (Hot Plug Parameters).
method SKIPPED: Test 16, Skipping test for non-existant object
method _HPP.
method
-method Test 17 of 144: Check _PRS (Possible Resource Settings).
+method Test 17 of 144: Test _PRS (Possible Resource Settings).
method PASSED: Test 17, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ
method Descriptor) looks sane.
method PASSED: Test 17, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ
@@ -209,47 +209,47 @@ method Descriptor) looks sane.
method PASSED: Test 17, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ
method Descriptor) looks sane.
method
-method Test 18 of 144: Check _PXM (Proximity).
+method Test 18 of 144: Test _PXM (Proximity).
method SKIPPED: Test 18, Skipping test for non-existant object
method _PXM.
method
-method Test 19 of 144: Check _EDL (Eject Device List).
+method Test 19 of 144: Test _EDL (Eject Device List).
method SKIPPED: Test 19, Skipping test for non-existant object
method _EDL.
method
-method Test 20 of 144: Check _EJD (Ejection Dependent Device).
+method Test 20 of 144: Test _EJD (Ejection Dependent Device).
method SKIPPED: Test 20, Skipping test for non-existant object
method _EJD.
method
-method Test 21 of 144: Check _EJ0 (Eject).
+method Test 21 of 144: Test _EJ0 (Eject).
method SKIPPED: Test 21, Skipping test for non-existant object
method _EJ0.
method
-method Test 22 of 144: Check _EJ1 (Eject).
+method Test 22 of 144: Test _EJ1 (Eject).
method SKIPPED: Test 22, Skipping test for non-existant object
method _EJ1.
method
-method Test 23 of 144: Check _EJ2 (Eject).
+method Test 23 of 144: Test _EJ2 (Eject).
method SKIPPED: Test 23, Skipping test for non-existant object
method _EJ2.
method
-method Test 24 of 144: Check _EJ3 (Eject).
+method Test 24 of 144: Test _EJ3 (Eject).
method SKIPPED: Test 24, Skipping test for non-existant object
method _EJ3.
method
-method Test 25 of 144: Check _EJ4 (Eject).
+method Test 25 of 144: Test _EJ4 (Eject).
method SKIPPED: Test 25, Skipping test for non-existant object
method _EJ4.
method
-method Test 26 of 144: Check _LCK (Lock).
+method Test 26 of 144: Test _LCK (Lock).
method SKIPPED: Test 26, Skipping test for non-existant object
method _LCK.
method
-method Test 27 of 144: Check _RMV (Remove).
+method Test 27 of 144: Test _RMV (Remove).
method PASSED: Test 27, \_SB_.PCI0.RP03.PXSX._RMV correctly
method returned sane looking value 0x00000001.
method
-method Test 28 of 144: Check _STA (Status).
+method Test 28 of 144: Test _STA (Status).
method PASSED: Test 28, \_SB_.PCI0.PEGP.VGA_._STA correctly
method returned sane looking value 0x0000000f.
method PASSED: Test 28, \_SB_.PCI0.LPCB.LNKA._STA correctly
@@ -273,91 +273,91 @@ method returned sane looking value 0x00000000.
method PASSED: Test 28, \_SB_.PCI0.LPCB.BAT1._STA correctly
method returned sane looking value 0x0000001f.
method
-method Test 29 of 144: Check _BDN (BIOS Dock Name).
+method Test 29 of 144: Test _BDN (BIOS Dock Name).
method SKIPPED: Test 29, Skipping test for non-existant object
method _BDN.
method
-method Test 30 of 144: Check _BBN (Base Bus Number).
+method Test 30 of 144: Test _BBN (Base Bus Number).
method SKIPPED: Test 30, Skipping test for non-existant object
method _BBN.
method
-method Test 31 of 144: Check _DCK (Dock).
+method Test 31 of 144: Test _DCK (Dock).
method SKIPPED: Test 31, Skipping test for non-existant object
method _DCK.
method
-method Test 32 of 144: Check _INI (Initialize).
+method Test 32 of 144: Test _INI (Initialize).
method PASSED: Test 32, \_SB_._INI returned no values as
method expected.
method
-method Test 33 of 144: Check _SEG (Segment).
+method Test 33 of 144: Test _SEG (Segment).
method SKIPPED: Test 33, Skipping test for non-existant object
method _SEG.
method
-method Test 34 of 144: Check _OFF (Set resource off).
+method Test 34 of 144: Test _OFF (Set resource off).
method SKIPPED: Test 34, Skipping test for non-existant object
method _OFF.
method
-method Test 35 of 144: Check _ON (Set resource on).
+method Test 35 of 144: Test _ON (Set resource on).
method SKIPPED: Test 35, Skipping test for non-existant object
method _ON.
method
-method Test 36 of 144: Check _DSW (Device Sleep Wake).
+method Test 36 of 144: Test _DSW (Device Sleep Wake).
method SKIPPED: Test 36, Skipping test for non-existant object
method _DSW.
method
-method Test 37 of 144: Check _IRC (In Rush Current).
+method Test 37 of 144: Test _IRC (In Rush Current).
method SKIPPED: Test 37, Skipping test for non-existant object
method _IRC.
method
-method Test 38 of 144: Check _PRE (Power Resources for
+method Test 38 of 144: Test _PRE (Power Resources for
method Enumeration).
method SKIPPED: Test 38, Skipping test for non-existant object
method _PRE.
method
-method Test 39 of 144: Check _PR0 (Power Resources for D0).
+method Test 39 of 144: Test _PR0 (Power Resources for D0).
method SKIPPED: Test 39, Skipping test for non-existant object
method _PR0.
method
-method Test 40 of 144: Check _PR1 (Power Resources for D1).
+method Test 40 of 144: Test _PR1 (Power Resources for D1).
method SKIPPED: Test 40, Skipping test for non-existant object
method _PR1.
method
-method Test 41 of 144: Check _PR2 (Power Resources for D2).
+method Test 41 of 144: Test _PR2 (Power Resources for D2).
method SKIPPED: Test 41, Skipping test for non-existant object
method _PR2.
method
-method Test 42 of 144: Check _PR3 (Power Resources for D3).
+method Test 42 of 144: Test _PR3 (Power Resources for D3).
method SKIPPED: Test 42, Skipping test for non-existant object
method _PR3.
method
-method Test 43 of 144: Check _PS0 (Power State 0).
+method Test 43 of 144: Test _PS0 (Power State 0).
method PASSED: Test 43, \_SB_.PCI0.PEGP.VGA_._PS0 returned no
method values as expected.
method PASSED: Test 43, \_PS0 returned no values as expected.
method
-method Test 44 of 144: Check _PS1 (Power State 1).
+method Test 44 of 144: Test _PS1 (Power State 1).
method PASSED: Test 44, \_SB_.PCI0.PEGP.VGA_._PS1 returned no
method values as expected.
method
-method Test 45 of 144: Check _PS2 (Power State 2).
+method Test 45 of 144: Test _PS2 (Power State 2).
method SKIPPED: Test 45, Skipping test for non-existant object
method _PS2.
method
-method Test 46 of 144: Check _PS3 (Power State 3).
+method Test 46 of 144: Test _PS3 (Power State 3).
method PASSED: Test 46, \_SB_.PCI0.PEGP.VGA_._PS3 returned no
method values as expected.
method PASSED: Test 46, \_PS3 returned no values as expected.
method
-method Test 47 of 144: Check _PSC (Power State Current).
+method Test 47 of 144: Test _PSC (Power State Current).
method PASSED: Test 47, \_SB_.PCI0.PEGP.VGA_._PSC correctly
method returned an integer.
method PASSED: Test 47, \_PSC correctly returned an integer.
method
-method Test 48 of 144: Check _PSE (Power State for Enumeration).
+method Test 48 of 144: Test _PSE (Power State for Enumeration).
method SKIPPED: Test 48, Skipping test for non-existant object
method _PSE.
method
-method Test 49 of 144: Check _PSW (Power State Wake).
+method Test 49 of 144: Test _PSW (Power State Wake).
method PASSED: Test 49, \_SB_.PCI0.USB1._PSW returned no values
method as expected.
method PASSED: Test 49, \_SB_.PCI0.USB2._PSW returned no values
@@ -369,15 +369,15 @@ method as expected.
method PASSED: Test 49, \_SB_.PCI0.USB5._PSW returned no values
method as expected.
method
-method Test 50 of 144: Check _S1D (S1 Device State).
+method Test 50 of 144: Test _S1D (S1 Device State).
method SKIPPED: Test 50, Skipping test for non-existant object
method _S1D.
method
-method Test 51 of 144: Check _S2D (S2 Device State).
+method Test 51 of 144: Test _S2D (S2 Device State).
method SKIPPED: Test 51, Skipping test for non-existant object
method _S2D.
method
-method Test 52 of 144: Check _S3D (S3 Device State).
+method Test 52 of 144: Test _S3D (S3 Device State).
method PASSED: Test 52, \_SB_.PCI0._S3D correctly returned an
method integer.
method PASSED: Test 52, \_SB_.PCI0.USB1._S3D correctly returned
@@ -395,7 +395,7 @@ method an integer.
method PASSED: Test 52, \_SB_.PCI0.EHC2._S3D correctly returned
method an integer.
method
-method Test 53 of 144: Check _S4D (S4 Device State).
+method Test 53 of 144: Test _S4D (S4 Device State).
method PASSED: Test 53, \_SB_.PCI0._S4D correctly returned an
method integer.
method PASSED: Test 53, \_SB_.PCI0.USB1._S4D correctly returned
@@ -413,115 +413,114 @@ method an integer.
method PASSED: Test 53, \_SB_.PCI0.EHC2._S4D correctly returned
method an integer.
method
-method Test 54 of 144: Check _S0W (S0 Device Wake State).
+method Test 54 of 144: Test _S0W (S0 Device Wake State).
method SKIPPED: Test 54, Skipping test for non-existant object
method _S0W.
method
-method Test 55 of 144: Check _S1W (S1 Device Wake State).
+method Test 55 of 144: Test _S1W (S1 Device Wake State).
method SKIPPED: Test 55, Skipping test for non-existant object
method _S1W.
method
-method Test 56 of 144: Check _S2W (S2 Device Wake State).
+method Test 56 of 144: Test _S2W (S2 Device Wake State).
method SKIPPED: Test 56, Skipping test for non-existant object
method _S2W.
method
-method Test 57 of 144: Check _S3W (S3 Device Wake State).
+method Test 57 of 144: Test _S3W (S3 Device Wake State).
method SKIPPED: Test 57, Skipping test for non-existant object
method _S3W.
method
-method Test 58 of 144: Check _S4W (S4 Device Wake State).
+method Test 58 of 144: Test _S4W (S4 Device Wake State).
method SKIPPED: Test 58, Skipping test for non-existant object
method _S4W.
method
-method Test 59 of 144: Check _S0_ (S0 System State).
+method Test 59 of 144: Test _S0_ (S0 System State).
method \_S0_ PM1a_CNT.SLP_TYP value: 0x00000000
method \_S0_ PM1b_CNT.SLP_TYP value: 0x00000000
method PASSED: Test 59, \_S0_ correctly returned a sane looking
method package.
method
-method Test 60 of 144: Check _S1_ (S1 System State).
+method Test 60 of 144: Test _S1_ (S1 System State).
method SKIPPED: Test 60, Skipping test for non-existant object
method _S1_.
method
-method Test 61 of 144: Check _S2_ (S2 System State).
+method Test 61 of 144: Test _S2_ (S2 System State).
method SKIPPED: Test 61, Skipping test for non-existant object
method _S2_.
method
-method Test 62 of 144: Check _S3_ (S3 System State).
+method Test 62 of 144: Test _S3_ (S3 System State).
method \_S3_ PM1a_CNT.SLP_TYP value: 0x00000005
method \_S3_ PM1b_CNT.SLP_TYP value: 0x00000005
method PASSED: Test 62, \_S3_ correctly returned a sane looking
method package.
method
-method Test 63 of 144: Check _S4_ (S4 System State).
+method Test 63 of 144: Test _S4_ (S4 System State).
method \_S4_ PM1a_CNT.SLP_TYP value: 0x00000006
method \_S4_ PM1b_CNT.SLP_TYP value: 0x00000006
method PASSED: Test 63, \_S4_ correctly returned a sane looking
method package.
method
-method Test 64 of 144: Check _S5_ (S5 System State).
+method Test 64 of 144: Test _S5_ (S5 System State).
method \_S5_ PM1a_CNT.SLP_TYP value: 0x00000007
method \_S5_ PM1b_CNT.SLP_TYP value: 0x00000007
method PASSED: Test 64, \_S5_ correctly returned a sane looking
method package.
method
-method Test 65 of 144: Check _SWS (System Wake Source).
+method Test 65 of 144: Test _SWS (System Wake Source).
method SKIPPED: Test 65, Skipping test for non-existant object
method _SWS.
method
-method Test 66 of 144: Check _PSS (Performance Supported States).
+method Test 66 of 144: Test _PSS (Performance Supported States).
method SKIPPED: Test 66, Skipping test for non-existant object
method _PSS.
method
-method Test 67 of 144: Check _CPC (Continuous Performance
+method Test 67 of 144: Test _CPC (Continuous Performance
method Control).
method SKIPPED: Test 67, Skipping test for non-existant object
method _CPC.
method
-method Test 68 of 144: Check _CSD (C State Dependencies).
+method Test 68 of 144: Test _CSD (C State Dependencies).
method SKIPPED: Test 68, Skipping test for non-existant object
method _CSD.
method
-method Test 69 of 144: Check _CST (C States).
+method Test 69 of 144: Test _CST (C States).
method SKIPPED: Test 69, Skipping test for non-existant object
method _CST.
method
-method Test 70 of 144: Check _PCT (Performance Control).
+method Test 70 of 144: Test _PCT (Performance Control).
method SKIPPED: Test 70, Skipping test for non-existant object
method _PCT.
method
-method Test 71 of 144: Check _PDL (P-State Depth Limit).
+method Test 71 of 144: Test _PDL (P-State Depth Limit).
method SKIPPED: Test 71, Skipping test for non-existant object
method _PDL.
method
-method Test 72 of 144: Check _PPC (Performance Present
+method Test 72 of 144: Test _PPC (Performance Present
method Capabilities).
method SKIPPED: Test 72, Skipping test for non-existant object
method _PPC.
method
-method Test 73 of 144: Check _PPE (Polling for Platform Error).
+method Test 73 of 144: Test _PPE (Polling for Platform Error).
method SKIPPED: Test 73, Skipping test for non-existant object
method _PPE.
method
-method Test 74 of 144: Check _TDL (T-State Depth Limit).
+method Test 74 of 144: Test _TDL (T-State Depth Limit).
method SKIPPED: Test 74, Skipping test for non-existant object
method _TDL.
method
-method Test 75 of 144: Check _TPC (Throttling Present
+method Test 75 of 144: Test _TPC (Throttling Present
method Capabilities).
method PASSED: Test 75, \_PR_.CPU0._TPC correctly returned an
method integer.
method PASSED: Test 75, \_PR_.CPU1._TPC correctly returned an
method integer.
method
-method Test 76 of 144: Check _TSD (Throttling State
-method Dependencies).
+method Test 76 of 144: Test _TSD (Throttling State Dependencies).
method PASSED: Test 76, \_PR_.CPU0._TSD correctly returned a sane
method looking package.
method PASSED: Test 76, \_PR_.CPU1._TSD correctly returned a sane
method looking package.
method
-method Test 77 of 144: Check _TSS (Throttling Supported States).
+method Test 77 of 144: Test _TSS (Throttling Supported States).
method \_PR_.CPU0._TSS values:
method T-State CPU Power Latency Control Status
method Freq (mW) (usecs)
@@ -549,125 +548,123 @@ method 7 13% 125 0 09 00
method PASSED: Test 77, \_PR_.CPU1._TSS correctly returned a sane
method looking package.
method
-method Test 78 of 144: Check _ALC (Ambient Light Colour
+method Test 78 of 144: Test _ALC (Ambient Light Colour
method Chromaticity).
method SKIPPED: Test 78, Skipping test for non-existant object
method _ALC.
method
-method Test 79 of 144: Check _ALI (Ambient Light Illuminance).
+method Test 79 of 144: Test _ALI (Ambient Light Illuminance).
method SKIPPED: Test 79, Skipping test for non-existant object
method _ALI.
method
-method Test 80 of 144: Check _ALT (Ambient Light Temperature).
+method Test 80 of 144: Test _ALT (Ambient Light Temperature).
method SKIPPED: Test 80, Skipping test for non-existant object
method _ALT.
method
-method Test 81 of 144: Check _ALP (Ambient Light Polling).
+method Test 81 of 144: Test _ALP (Ambient Light Polling).
method SKIPPED: Test 81, Skipping test for non-existant object
method _ALP.
method
-method Test 82 of 144: Check _LID (Lid Status).
+method Test 82 of 144: Test _LID (Lid Status).
method PASSED: Test 82, \_SB_.LID0._LID correctly returned sane
method looking value 0x00000000.
method
-method Test 83 of 144: Check _GCP (Get Capabilities).
+method Test 83 of 144: Test _GCP (Get Capabilities).
method SKIPPED: Test 83, Skipping test for non-existant object
method _GCP.
method
-method Test 84 of 144: Check _GRT (Get Real Time).
+method Test 84 of 144: Test _GRT (Get Real Time).
method SKIPPED: Test 84, Skipping test for non-existant object
method _GRT.
method
-method Test 85 of 144: Check _GWS (Get Wake Status).
+method Test 85 of 144: Test _GWS (Get Wake Status).
method SKIPPED: Test 85, Skipping test for non-existant object
method _GWS.
method
-method Test 86 of 144: Check _STP (Set Expired Timer Wake
-method Policy).
+method Test 86 of 144: Test _STP (Set Expired Timer Wake Policy).
method SKIPPED: Test 86, Skipping test for non-existant object
method _STP.
method
-method Test 87 of 144: Check _STV (Set Timer Value).
+method Test 87 of 144: Test _STV (Set Timer Value).
method SKIPPED: Test 87, Skipping test for non-existant object
method _STV.
method
-method Test 88 of 144: Check _TIP (Expired Timer Wake Policy).
+method Test 88 of 144: Test _TIP (Expired Timer Wake Policy).
method SKIPPED: Test 88, Skipping test for non-existant object
method _TIP.
method
-method Test 89 of 144: Check _TIV (Timer Values).
+method Test 89 of 144: Test _TIV (Timer Values).
method SKIPPED: Test 89, Skipping test for non-existant object
method _TIV.
method
-method Test 90 of 144: Check _SBS (Smart Battery Subsystem).
+method Test 90 of 144: Test _SBS (Smart Battery Subsystem).
method SKIPPED: Test 90, Skipping test for non-existant object
method _SBS.
method
-method Test 91 of 144: Check _BCT (Battery Charge Time).
+method Test 91 of 144: Test _BCT (Battery Charge Time).
method SKIPPED: Test 91, Skipping test for non-existant object
method _BCT.
method
-method Test 92 of 144: Check _BIF (Battery Information).
+method Test 92 of 144: Test _BIF (Battery Information).
method PASSED: Test 92, \_SB_.PCI0.LPCB.BAT1._BIF correctly
method returned a sane looking package.
method
-method Test 93 of 144: Check _BIX (Battery Information Extended).
+method Test 93 of 144: Test _BIX (Battery Information Extended).
method SKIPPED: Test 93, Skipping test for non-existant object
method _BIX.
method
-method Test 94 of 144: Check _BMA (Battery Measurement
-method Averaging).
+method Test 94 of 144: Test _BMA (Battery Measurement Averaging).
method SKIPPED: Test 94, Skipping test for non-existant object
method _BMA.
method
-method Test 95 of 144: Check _BMC (Battery Maintenance Control).
+method Test 95 of 144: Test _BMC (Battery Maintenance Control).
method SKIPPED: Test 95, Skipping test for non-existant object
method _BMC.
method
-method Test 96 of 144: Check _BMD (Battery Maintenance Data).
+method Test 96 of 144: Test _BMD (Battery Maintenance Data).
method SKIPPED: Test 96, Skipping test for non-existant object
method _BMD.
method
-method Test 97 of 144: Check _BMS (Battery Measurement Sampling
+method Test 97 of 144: Test _BMS (Battery Measurement Sampling
method Time).
method SKIPPED: Test 97, Skipping test for non-existant object
method _BMS.
method
-method Test 98 of 144: Check _BST (Battery Status).
+method Test 98 of 144: Test _BST (Battery Status).
method PASSED: Test 98, \_SB_.PCI0.LPCB.BAT1._BST correctly
method returned a sane looking package.
method
-method Test 99 of 144: Check _BTP (Battery Trip Point).
+method Test 99 of 144: Test _BTP (Battery Trip Point).
method SKIPPED: Test 99, Skipping test for non-existant object
method _BTP.
method
-method Test 100 of 144: Check _BTM (Battery Time).
+method Test 100 of 144: Test _BTM (Battery Time).
method SKIPPED: Test 100, Skipping test for non-existant object
method _BTM.
method
-method Test 101 of 144: Check _PCL (Power Consumer List).
+method Test 101 of 144: Test _PCL (Power Consumer List).
method
-method Test 102 of 144: Check _PIF (Power Source Information).
+method Test 102 of 144: Test _PIF (Power Source Information).
method SKIPPED: Test 102, Skipping test for non-existant object
method _PIF.
method
-method Test 103 of 144: Check _PSR (Power Source).
+method Test 103 of 144: Test _PSR (Power Source).
method PASSED: Test 103, \_SB_.PCI0.LPCB.ACAD._PSR correctly
method returned sane looking value 0x00000000.
method
-method Test 104 of 144: Check _FIF (Fan Information).
+method Test 104 of 144: Test _FIF (Fan Information).
method SKIPPED: Test 104, Skipping test for non-existant object
method _FIF.
method
-method Test 105 of 144: Check _FSL (Fan Set Level).
+method Test 105 of 144: Test _FSL (Fan Set Level).
method SKIPPED: Test 105, Skipping test for non-existant object
method _FSL.
method
-method Test 106 of 144: Check _FST (Fan Status).
+method Test 106 of 144: Test _FST (Fan Status).
method SKIPPED: Test 106, Skipping test for non-existant object
method _FST.
method
-method Test 107 of 144: Check _ACx (Active Cooling).
+method Test 107 of 144: Test _ACx (Active Cooling).
method PASSED: Test 107, \_SB_.PCI0.LPCB.EC0_.BAC0 correctly
method returned a sane looking return type.
method
@@ -699,65 +696,64 @@ method SKIPPED: Test 107, Skipping test for non-existant object
method AC9.
method
method
-method Test 108 of 144: Check _CRT (Critical Trip Point).
+method Test 108 of 144: Test _CRT (Critical Trip Point).
method SKIPPED: Test 108, Skipping test for non-existant object
method _CRT.
method
-method Test 109 of 144: Check _DTI (Device Temperature
+method Test 109 of 144: Test _DTI (Device Temperature
method Indication).
method SKIPPED: Test 109, Skipping test for non-existant object
method _DTI.
method
-method Test 110 of 144: Check _HOT (Hot Temperature).
+method Test 110 of 144: Test _HOT (Hot Temperature).
method SKIPPED: Test 110, Skipping test for non-existant object
method _HOT.
method
-method Test 111 of 144: Check _NTT (Notification Temp Threshold).
+method Test 111 of 144: Test _NTT (Notification Temp Threshold).
method SKIPPED: Test 111, Skipping test for non-existant object
method _NTT.
method
-method Test 112 of 144: Check _PSV (Passive Temp).
+method Test 112 of 144: Test _PSV (Passive Temp).
method SKIPPED: Test 112, Skipping test for non-existant object
method _PSV.
method
-method Test 113 of 144: Check _RTV (Relative Temp Values).
+method Test 113 of 144: Test _RTV (Relative Temp Values).
method SKIPPED: Test 113, Skipping test for non-existant object
method _RTV.
method
-method Test 114 of 144: Check _SCP (Set Cooling Policy).
+method Test 114 of 144: Test _SCP (Set Cooling Policy).
method SKIPPED: Test 114, Skipping test for non-existant object
method _DTI.
method
-method Test 115 of 144: Check _TC1 (Thermal Constant 1).
+method Test 115 of 144: Test _TC1 (Thermal Constant 1).
method SKIPPED: Test 115, Skipping test for non-existant object
method _TC1.
method
-method Test 116 of 144: Check _TC2 (Thermal Constant 2).
+method Test 116 of 144: Test _TC2 (Thermal Constant 2).
method SKIPPED: Test 116, Skipping test for non-existant object
method _TC2.
method
-method Test 117 of 144: Check _TMP (Thermal Zone Current Temp).
+method Test 117 of 144: Test _TMP (Thermal Zone Current Temp).
method SKIPPED: Test 117, Skipping test for non-existant object
method _TMP.
method
-method Test 118 of 144: Check _TPT (Trip Point Temperature).
+method Test 118 of 144: Test _TPT (Trip Point Temperature).
method SKIPPED: Test 118, Skipping test for non-existant object
method _TPT.
method
-method Test 119 of 144: Check _TSP (Thermal Sampling Period).
+method Test 119 of 144: Test _TSP (Thermal Sampling Period).
method SKIPPED: Test 119, Skipping test for non-existant object
method _TSP.
method
-method Test 120 of 144: Check _TST (Temperature Sensor
-method Threshold).
+method Test 120 of 144: Test _TST (Temperature Sensor Threshold).
method SKIPPED: Test 120, Skipping test for non-existant object
method _TST.
method
-method Test 121 of 144: Check _TZP (Thermal Zone Polling).
+method Test 121 of 144: Test _TZP (Thermal Zone Polling).
method SKIPPED: Test 121, Skipping test for non-existant object
method _TZP.
method
-method Test 122 of 144: Check _PTS (Prepare to Sleep).
+method Test 122 of 144: Test _PTS (Prepare to Sleep).
method Test _PTS(1).
method PASSED: Test 122, \_PTS returned no values as expected.
method
@@ -774,35 +770,35 @@ method Test _PTS(5).
method PASSED: Test 122, \_PTS returned no values as expected.
method
method
-method Test 123 of 144: Check _TTS (Transition to State).
+method Test 123 of 144: Test _TTS (Transition to State).
method SKIPPED: Test 123, Optional control method _TTS does not
method exist.
method
-method Test 124 of 144: Check _S0 (System S0 State).
+method Test 124 of 144: Test _S0 (System S0 State).
method SKIPPED: Test 124, Skipping test for non-existant object
method _S0.
method
-method Test 125 of 144: Check _S1 (System S1 State).
+method Test 125 of 144: Test _S1 (System S1 State).
method SKIPPED: Test 125, Skipping test for non-existant object
method _S1.
method
-method Test 126 of 144: Check _S2 (System S2 State).
+method Test 126 of 144: Test _S2 (System S2 State).
method SKIPPED: Test 126, Skipping test for non-existant object
method _S2.
method
-method Test 127 of 144: Check _S3 (System S3 State).
+method Test 127 of 144: Test _S3 (System S3 State).
method SKIPPED: Test 127, Skipping test for non-existant object
method _S3.
method
-method Test 128 of 144: Check _S4 (System S4 State).
+method Test 128 of 144: Test _S4 (System S4 State).
method SKIPPED: Test 128, Skipping test for non-existant object
method _S4.
method
-method Test 129 of 144: Check _S5 (System S5 State).
+method Test 129 of 144: Test _S5 (System S5 State).
method SKIPPED: Test 129, Skipping test for non-existant object
method _S5.
method
-method Test 130 of 144: Check _WAK (System Wake).
+method Test 130 of 144: Test _WAK (System Wake).
method Test _WAK(1) System Wake, State S1.
method PASSED: Test 130, \_WAK correctly returned a sane looking
method package.
@@ -824,7 +820,7 @@ method PASSED: Test 130, \_WAK correctly returned a sane looking
method package.
method
method
-method Test 131 of 144: Check _ADR (Return Unique ID for Device).
+method Test 131 of 144: Test _ADR (Return Unique ID for Device).
method PASSED: Test 131, \_SB_.PCI0.MCHC._ADR correctly returned
method an integer.
method PASSED: Test 131, \_SB_.PCI0.PEGP._ADR correctly returned
@@ -936,7 +932,7 @@ method returned an integer.
method PASSED: Test 131, \_SB_.PCI0.SBUS._ADR correctly returned
method an integer.
method
-method Test 132 of 144: Check _BCL (Query List of Brightness
+method Test 132 of 144: Test _BCL (Query List of Brightness
method Control Levels Supported).
method Brightness levels for \_SB_.PCI0.PEGP.VGA_.LCD_._BCL:
method Level on full power : 70
@@ -951,20 +947,20 @@ method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70
method PASSED: Test 132, \_SB_.PCI0.GFX0.DD03._BCL returned a
method sane package of 10 integers.
method
-method Test 133 of 144: Check _BCM (Set Brightness Level).
+method Test 133 of 144: Test _BCM (Set Brightness Level).
method PASSED: Test 133, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned
method no values as expected.
method PASSED: Test 133, \_SB_.PCI0.GFX0.DD03._BCM returned no
method values as expected.
method
-method Test 134 of 144: Check _BQC (Brightness Query Current
+method Test 134 of 144: Test _BQC (Brightness Query Current
method Level).
method PASSED: Test 134, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly
method returned an integer.
method PASSED: Test 134, \_SB_.PCI0.GFX0.DD03._BQC correctly
method returned an integer.
method
-method Test 135 of 144: Check _DCS (Return the Status of Output
+method Test 135 of 144: Test _DCS (Return the Status of Output
method Device).
method PASSED: Test 135, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly
method returned an integer.
@@ -983,12 +979,12 @@ method returned an integer.
method PASSED: Test 135, \_SB_.PCI0.GFX0.DD05._DCS correctly
method returned an integer.
method
-method Test 136 of 144: Check _DDC (Return the EDID for this
+method Test 136 of 144: Test _DDC (Return the EDID for this
method Device).
method SKIPPED: Test 136, Skipping test for non-existant object
method _DDC.
method
-method Test 137 of 144: Check _DSS (Device Set State).
+method Test 137 of 144: Test _DSS (Device Set State).
method PASSED: Test 137, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned
method no values as expected.
method PASSED: Test 137, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned
@@ -1006,7 +1002,7 @@ method values as expected.
method PASSED: Test 137, \_SB_.PCI0.GFX0.DD05._DSS returned no
method values as expected.
method
-method Test 138 of 144: Check _DGS (Query Graphics State).
+method Test 138 of 144: Test _DGS (Query Graphics State).
method PASSED: Test 138, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly
method returned an integer.
method PASSED: Test 138, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly
@@ -1024,8 +1020,8 @@ method returned an integer.
method PASSED: Test 138, \_SB_.PCI0.GFX0.DD05._DGS correctly
method returned an integer.
method
-method Test 139 of 144: Check _DOD (Enumerate All Devices
-method Attached to Display Adapter).
+method Test 139 of 144: Test _DOD (Enumerate All Devices Attached
+method to Display Adapter).
method Device 0:
method Instance: 0
method Display port attachment: 0
@@ -1059,26 +1055,26 @@ method Head or pipe ID: 0
method PASSED: Test 139, \_SB_.PCI0.GFX0._DOD correctly returned
method a sane looking package.
method
-method Test 140 of 144: Check _DOS (Enable/Disable Output
+method Test 140 of 144: Test _DOS (Enable/Disable Output
method Switching).
method PASSED: Test 140, \_SB_.PCI0.PEGP.VGA_._DOS returned no
method values as expected.
method PASSED: Test 140, \_SB_.PCI0.GFX0._DOS returned no values
method as expected.
method
-method Test 141 of 144: Check _GPD (Get POST Device).
+method Test 141 of 144: Test _GPD (Get POST Device).
method SKIPPED: Test 141, Skipping test for non-existant object
method _GPD.
method
-method Test 142 of 144: Check _ROM (Get ROM Data).
+method Test 142 of 144: Test _ROM (Get ROM Data).
method SKIPPED: Test 142, Skipping test for non-existant object
method _ROM.
method
-method Test 143 of 144: Check _SPD (Set POST Device).
+method Test 143 of 144: Test _SPD (Set POST Device).
method SKIPPED: Test 143, Skipping test for non-existant object
method _SPD.
method
-method Test 144 of 144: Check _VPO (Video POST Options).
+method Test 144 of 144: Test _VPO (Video POST Options).
method SKIPPED: Test 144, Skipping test for non-existant object
method _VPO.
method
diff --git a/wmi-0001/wmi-0001.log b/wmi-0001/wmi-0001.log
index 0540ba3..aca6243 100644
--- a/wmi-0001/wmi-0001.log
+++ b/wmi-0001/wmi-0001.log
@@ -1,7 +1,7 @@
wmi wmi: Extract and analyse Windows Management
wmi Instrumentation (WMI).
wmi ----------------------------------------------------------
-wmi Test 1 of 1: Check Windows Management Instrumentation
+wmi Test 1 of 1: Windows Management Instrumentation test.
wmi
wmi \_SB_.WMI1._WDG (1 of 9)
wmi GUID: 51F5230E-9677-46CD-A1CF-C0B23EE34DB7
diff --git a/wmi-0001/wmi-0002.log b/wmi-0001/wmi-0002.log
index ab5b704..1732e65 100644
--- a/wmi-0001/wmi-0002.log
+++ b/wmi-0001/wmi-0002.log
@@ -1,7 +1,7 @@
wmi wmi: Extract and analyse Windows Management
wmi Instrumentation (WMI).
wmi ----------------------------------------------------------
-wmi Test 1 of 1: Check Windows Management Instrumentation
+wmi Test 1 of 1: Windows Management Instrumentation test.
wmi
wmi \_SB_.ATKD._WDG (1 of 2)
wmi GUID: 97845ED0-4E6D-11DE-8A39-0800200C9A66
diff --git a/wmi-0001/wmi-0003.log b/wmi-0001/wmi-0003.log
index 5f4084d..f1e9aa3 100644
--- a/wmi-0001/wmi-0003.log
+++ b/wmi-0001/wmi-0003.log
@@ -1,7 +1,7 @@
wmi wmi: Extract and analyse Windows Management
wmi Instrumentation (WMI).
wmi ----------------------------------------------------------
-wmi Test 1 of 1: Check Windows Management Instrumentation
+wmi Test 1 of 1: Windows Management Instrumentation test.
wmi
wmi \_SB_.AMW0._WDG (1 of 6)
wmi GUID: 8D9DDCBC-A997-11DA-B012-B622A1EF5492
--
1.8.3.2
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