ACK: [PATCH][FWTS-TEST] tests: keep in sync with changes from fwts bug LP: #1246650
IvanHu
ivan.hu at canonical.com
Mon Nov 11 10:27:57 UTC 2013
On 10/31/2013 08:01 PM, Colin King wrote:
> From: Colin Ian King <colin.king at canonical.com>
>
> Replacment of "Check" with "Test" in LP: #1246650 means we
> need to update the affected tests.
>
> Signed-off-by: Colin Ian King <colin.king at canonical.com>
> ---
> acpitables-0001/acpitables-0001.log | 4 +-
> acpitables-0002/acpitables-0001.log | 4 +-
> acpitables-0002/acpitables-0002.log | 4 +-
> acpitables-0003/acpitables-0001.log | 4 +-
> acpitables-0004/acpitables-0001.log | 4 +-
> acpitables-0005/acpitables-0001.log | 4 +-
> acpitables-0006/acpitables-0001.log | 4 +-
> acpitables-0007/acpitables-0001.log | 4 +-
> acpitables-0008/acpitables-0001.log | 4 +-
> apicinstance-0001/apicinstance-0001.log | 5 +-
> apicinstance-0001/apicinstance-0002.log | 5 +-
> arg-show-tests-0001/arg-show-tests-0001.log | 62 ++--
> .../arg-show-tests-full-0001.log | 394 ++++++++++-----------
> checksum-0001/checksum-0001.log | 4 +-
> checksum-0001/checksum-0003.log | 4 +-
> checksum-0001/checksum-0004.log | 4 +-
> method-0001/method-0001.log | 296 ++++++++--------
> wmi-0001/wmi-0001.log | 2 +-
> wmi-0001/wmi-0002.log | 2 +-
> wmi-0001/wmi-0003.log | 2 +-
> 20 files changed, 405 insertions(+), 411 deletions(-)
>
> diff --git a/acpitables-0001/acpitables-0001.log b/acpitables-0001/acpitables-0001.log
> index 2f05d15..57d8813 100644
> --- a/acpitables-0001/acpitables-0001.log
> +++ b/acpitables-0001/acpitables-0001.log
> @@ -1,6 +1,6 @@
> -acpitables acpitables: ACPI table settings sanity checks.
> +acpitables acpitables: ACPI table settings sanity tests.
> acpitables ----------------------------------------------------------
> -acpitables Test 1 of 1: Check ACPI tables.
> +acpitables Test 1 of 1: Test ACPI tables.
> acpitables PASSED: Test 1, Table APIC passed.
> acpitables Table ECDT not present to check.
> acpitables PASSED: Test 1, Table FACP passed.
> diff --git a/acpitables-0002/acpitables-0001.log b/acpitables-0002/acpitables-0001.log
> index 042c83e..22f07a2 100644
> --- a/acpitables-0002/acpitables-0001.log
> +++ b/acpitables-0002/acpitables-0001.log
> @@ -1,6 +1,6 @@
> -acpitables acpitables: ACPI table settings sanity checks.
> +acpitables acpitables: ACPI table settings sanity tests.
> acpitables ----------------------------------------------------------
> -acpitables Test 1 of 1: Check ACPI tables.
> +acpitables Test 1 of 1: Test ACPI tables.
> acpitables PASSED: Test 1, Table APIC passed.
> acpitables Table ECDT not present to check.
> acpitables Table FACP not present to check.
> diff --git a/acpitables-0002/acpitables-0002.log b/acpitables-0002/acpitables-0002.log
> index db437af..c16d257 100644
> --- a/acpitables-0002/acpitables-0002.log
> +++ b/acpitables-0002/acpitables-0002.log
> @@ -1,6 +1,6 @@
> -acpitables acpitables: ACPI table settings sanity checks.
> +acpitables acpitables: ACPI table settings sanity tests.
> acpitables ----------------------------------------------------------
> -acpitables Test 1 of 1: Check ACPI tables.
> +acpitables Test 1 of 1: Test ACPI tables.
> acpitables FAILED [MEDIUM] MADTAPICFlagsNonZero: Test 1, MADT Local
> acpitables APIC flags field, bits 1..31 are reserved and should be
> acpitables zero, but are set as: f.
> diff --git a/acpitables-0003/acpitables-0001.log b/acpitables-0003/acpitables-0001.log
> index 2a4d63e..715978b 100644
> --- a/acpitables-0003/acpitables-0001.log
> +++ b/acpitables-0003/acpitables-0001.log
> @@ -1,6 +1,6 @@
> -acpitables acpitables: ACPI table settings sanity checks.
> +acpitables acpitables: ACPI table settings sanity tests.
> acpitables ----------------------------------------------------------
> -acpitables Test 1 of 1: Check ACPI tables.
> +acpitables Test 1 of 1: Test ACPI tables.
> acpitables Table APIC not present to check.
> acpitables Table ECDT not present to check.
> acpitables FAILED [CRITICAL] FADTFACSZero: Test 1, FADT 32 bit
> diff --git a/acpitables-0004/acpitables-0001.log b/acpitables-0004/acpitables-0001.log
> index 52491c3..f33e083 100644
> --- a/acpitables-0004/acpitables-0001.log
> +++ b/acpitables-0004/acpitables-0001.log
> @@ -1,6 +1,6 @@
> -acpitables acpitables: ACPI table settings sanity checks.
> +acpitables acpitables: ACPI table settings sanity tests.
> acpitables ----------------------------------------------------------
> -acpitables Test 1 of 1: Check ACPI tables.
> +acpitables Test 1 of 1: Test ACPI tables.
> acpitables Table APIC not present to check.
> acpitables Table ECDT not present to check.
> acpitables Table FACP not present to check.
> diff --git a/acpitables-0005/acpitables-0001.log b/acpitables-0005/acpitables-0001.log
> index cf09a01..2e97b45 100644
> --- a/acpitables-0005/acpitables-0001.log
> +++ b/acpitables-0005/acpitables-0001.log
> @@ -1,6 +1,6 @@
> -acpitables acpitables: ACPI table settings sanity checks.
> +acpitables acpitables: ACPI table settings sanity tests.
> acpitables ----------------------------------------------------------
> -acpitables Test 1 of 1: Check ACPI tables.
> +acpitables Test 1 of 1: Test ACPI tables.
> acpitables Table APIC not present to check.
> acpitables Table ECDT not present to check.
> acpitables Table FACP not present to check.
> diff --git a/acpitables-0006/acpitables-0001.log b/acpitables-0006/acpitables-0001.log
> index 1c2633c..b931cf3 100644
> --- a/acpitables-0006/acpitables-0001.log
> +++ b/acpitables-0006/acpitables-0001.log
> @@ -1,6 +1,6 @@
> -acpitables acpitables: ACPI table settings sanity checks.
> +acpitables acpitables: ACPI table settings sanity tests.
> acpitables ----------------------------------------------------------
> -acpitables Test 1 of 1: Check ACPI tables.
> +acpitables Test 1 of 1: Test ACPI tables.
> acpitables Table APIC not present to check.
> acpitables Table ECDT not present to check.
> acpitables Table FACP not present to check.
> diff --git a/acpitables-0007/acpitables-0001.log b/acpitables-0007/acpitables-0001.log
> index 3e02f91..5d17103 100644
> --- a/acpitables-0007/acpitables-0001.log
> +++ b/acpitables-0007/acpitables-0001.log
> @@ -1,6 +1,6 @@
> -acpitables acpitables: ACPI table settings sanity checks.
> +acpitables acpitables: ACPI table settings sanity tests.
> acpitables ----------------------------------------------------------
> -acpitables Test 1 of 1: Check ACPI tables.
> +acpitables Test 1 of 1: Test ACPI tables.
> acpitables Table APIC not present to check.
> acpitables Table ECDT not present to check.
> acpitables Table FACP not present to check.
> diff --git a/acpitables-0008/acpitables-0001.log b/acpitables-0008/acpitables-0001.log
> index 1a127a6..80ecd20 100644
> --- a/acpitables-0008/acpitables-0001.log
> +++ b/acpitables-0008/acpitables-0001.log
> @@ -1,6 +1,6 @@
> -acpitables acpitables: ACPI table settings sanity checks.
> +acpitables acpitables: ACPI table settings sanity tests.
> acpitables ----------------------------------------------------------
> -acpitables Test 1 of 1: Check ACPI tables.
> +acpitables Test 1 of 1: Test ACPI tables.
> acpitables Table APIC not present to check.
> acpitables Table ECDT not present to check.
> acpitables Table FACP not present to check.
> diff --git a/apicinstance-0001/apicinstance-0001.log b/apicinstance-0001/apicinstance-0001.log
> index a185d24..0fcec6e 100644
> --- a/apicinstance-0001/apicinstance-0001.log
> +++ b/apicinstance-0001/apicinstance-0001.log
> @@ -1,7 +1,6 @@
> -apicinstance apicinstance: Check for single instance of APIC/MADT
> -apicinstance table.
> +apicinstance apicinstance: Test for single instance of APIC/MADT table.
> apicinstance ----------------------------------------------------------
> -apicinstance Test 1 of 1: Check single instance of APIC/MADT table.
> +apicinstance Test 1 of 1: Test for single instance of APIC/MADT table.
> apicinstance Found APIC/MADT table APIC @ bf6dfcc6, length 0x104
> apicinstance Found APIC/MADT table APIC @ bf6dff70, length 0x104
> apicinstance (and differs from first APIC/MADT table).
> diff --git a/apicinstance-0001/apicinstance-0002.log b/apicinstance-0001/apicinstance-0002.log
> index 91fd42e..d3f2eb3 100644
> --- a/apicinstance-0001/apicinstance-0002.log
> +++ b/apicinstance-0001/apicinstance-0002.log
> @@ -1,7 +1,6 @@
> -apicinstance apicinstance: Check for single instance of APIC/MADT
> -apicinstance table.
> +apicinstance apicinstance: Test for single instance of APIC/MADT table.
> apicinstance ----------------------------------------------------------
> -apicinstance Test 1 of 1: Check single instance of APIC/MADT table.
> +apicinstance Test 1 of 1: Test for single instance of APIC/MADT table.
> apicinstance Found APIC/MADT table APIC @ bf6dfcc6, length 0x104
> apicinstance PASSED: Test 1, Found 1 APIC/MADT table(s), as expected.
> apicinstance
> diff --git a/arg-show-tests-0001/arg-show-tests-0001.log b/arg-show-tests-0001/arg-show-tests-0001.log
> index 06a7619..3068592 100644
> --- a/arg-show-tests-0001/arg-show-tests-0001.log
> +++ b/arg-show-tests-0001/arg-show-tests-0001.log
> @@ -1,49 +1,49 @@
> Batch tests:
> - acpiinfo General ACPI information check.
> - acpitables ACPI table settings sanity checks.
> - apicedge APIC Edge/Level Check.
> - apicinstance Check for single instance of APIC/MADT table.
> - aspm PCIe ASPM check.
> - bios32 Check BIOS32 Service Directory.
> + acpiinfo General ACPI information test.
> + acpitables ACPI table settings sanity tests.
> + apicedge APIC edge/level test.
> + apicinstance Test for single instance of APIC/MADT table.
> + aspm PCIe ASPM test.
> + bios32 BIOS32 Service Directory test.
> bios_info Gather BIOS DMI information.
> - checksum Check ACPI table checksum.
> + checksum ACPI table checksum test.
> cpufreq CPU frequency scaling tests.
> - crs Check PCI host bridge configuration using _CRS.
> - csm Check for UEFI Compatibility Support Module.
> - cstates Check processor C state support.
> - dmar Check sane DMA Remapping (VT-d).
> - dmicheck Test DMI/SMBIOS tables for errors.
> - ebda Validate EBDA region is mapped and reserved in memory map table.
> - fadt FADT SCI_EN enabled check.
> - fan Simple Fan Tests.
> - hda_audio Check HDA Audio Pin Configs.
> - hpet_check HPET configuration test.
> + crs Test PCI host bridge configuration using _CRS.
> + csm UEFI Compatibility Support Module test.
> + cstates Processor C state support test.
> + dmar DMA Remapping (VT-d) test.
> + dmicheck DMI/SMBIOS table tests.
> + ebda Test EBDA region is mapped and reserved in memory map table.
> + fadt FADT SCI_EN enabled tests.
> + fan Simple fan tests.
> + hda_audio HDA Audio Pin Configuration test.
> + hpet_check HPET configuration tests.
> klog Scan kernel log for errors and warnings.
> - maxfreq Check max CPU frequencies against max scaling frequency.
> - maxreadreq Checks firmware has set PCI Express MaxReadReq to a higher value on non-motherboard devices.
> - mcfg MCFG PCI Express* memory mapped config space.
> - method ACPI DSDT Method Semantic Tests.
> - microcode Check if system is using latest microcode.
> - mpcheck Check MultiProcessor Tables.
> + maxfreq Test max CPU frequencies against max scaling frequency.
> + maxreadreq Test firmware has set PCI Express MaxReadReq to a higher value on non-motherboard devices.
> + mcfg MCFG PCI Express* memory mapped config space test.
> + method ACPI DSDT Method Semantic tests.
> + microcode Test if system is using latest microcode.
> + mpcheck MultiProcessor Tables tests.
> msr MSR register tests.
> - mtrr MTRR validation.
> + mtrr MTRR tests.
> nx Test if CPU NX is disabled by the BIOS.
> oops Scan kernel log for Oopses.
> os2gap OS/2 memory hole test.
> osilinux Disassemble DSDT to check for _OSI("Linux").
> - pcc Processor Clocking Control (PCC) Test.
> - pciirq Check PCI IRQ Routing Table.
> - pnp Check BIOS Support Installation structure.
> + pcc Processor Clocking Control (PCC) test.
> + pciirq PCI IRQ Routing Table test.
> + pnp BIOS Support Installation structure test.
> securebootcert Ubuntu UEFI secure boot test.
> syntaxcheck Re-assemble DSDT and find syntax errors and warnings.
> version Gather kernel system information.
> - virt Test CPU Virtualisation Configuration.
> - wakealarm Test ACPI Wakealarm.
> + virt CPU Virtualisation Configuration test.
> + wakealarm ACPI Wakealarm tests.
> wmi Extract and analyse Windows Management Instrumentation (WMI).
>
> Interactive tests:
> ac_adapter Interactive ac_adapter power test.
> - battery Battery Tests.
> + battery Battery tests.
> brightness Interactive LCD brightness test.
> hotkey Hotkey scan code tests.
> lid Interactive lid button test.
> @@ -71,7 +71,7 @@ Unsafe tests:
> uefirtvariable UEFI Runtime service variable interface tests.
>
> UEFI tests:
> - csm Check for UEFI Compatibility Support Module.
> + csm UEFI Compatibility Support Module test.
> securebootcert Ubuntu UEFI secure boot test.
> uefirtmisc UEFI miscellaneous runtime service interface tests.
> uefirttime UEFI Runtime service time interface tests.
> diff --git a/arg-show-tests-full-0001/arg-show-tests-full-0001.log b/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> index f6d3b89..c9c13c5 100644
> --- a/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> +++ b/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> @@ -4,240 +4,240 @@ Batch tests:
> Determine machine's ACPI version.
> Determine AML compiler.
> acpitables (1 test):
> - Check ACPI tables.
> + Test ACPI tables.
> apicedge (1 test):
> - Legacy and PCI Interrupt Edge/Level trigger checks.
> + Legacy and PCI Interrupt Edge/Level trigger tests.
> apicinstance (1 test):
> - Check single instance of APIC/MADT table.
> + Test for single instance of APIC/MADT table.
> aspm (2 tests):
> PCIe ASPM ACPI test.
> PCIe ASPM registers test.
> bios32 (1 test):
> - Check BIOS32 Service Directory.
> + BIOS32 Service Directory test.
> bios_info (1 test):
> Gather BIOS DMI information
> checksum (1 test):
> - Check ACPI table checksums.
> + ACPI table checksum test.
> cpufreq (1 test):
> - CPU P-State Checks.
> + CPU P-State tests.
> crs (1 test):
> - Check PCI host bridge configuration using _CRS.
> + Test PCI host bridge configuration using _CRS.
> csm (1 test):
> - Check for UEFI Compatibility Support Module.
> + UEFI Compatibility Support Module test.
> cstates (1 test):
> - Check all CPUs C-states.
> + Test all CPUs C-states.
> dmar (1 test):
> - Check DMA Remapping.
> + DMA Remapping test.
> dmicheck (2 tests):
> - Find and Check SMBIOS Table Entry Point.
> + Find and test SMBIOS Table Entry Point.
> Test DMI/SMBIOS tables for errors.
> ebda (1 test):
> - Check EBDA is reserved in E820 table.
> + Test EBDA is reserved in E820 table.
> fadt (2 tests):
> - Check FADT SCI_EN bit is enabled.
> - Check FADT reset register.
> + Test FADT SCI_EN bit is enabled.
> + Test FADT reset register.
> fan (2 tests):
> - Check fan status.
> + Test fan status.
> Load system, check CPU fan status.
> hda_audio (1 test):
> - Check HDA Audio Pin Configs.
> + HDA Audio Pin Configuration test.
> hpet_check (4 tests):
> - Check HPET base in kernel log.
> - Check HPET base in HPET table.
> - Check HPET base in DSDT and/or SSDT.
> - Sanity check HPET configuration.
> + Test HPET base in kernel log.
> + Test HPET base in HPET table.
> + Test HPET base in DSDT and/or SSDT.
> + Test HPET configuration.
> klog (1 test):
> Kernel log error check.
> maxfreq (1 test):
> - Maximum CPU frequency check.
> + Maximum CPU frequency test.
> maxreadreq (1 test):
> - Check firmware settings MaxReadReq for PCI Express devices.
> + Test firmware settings MaxReadReq for PCI Express devices.
> mcfg (2 tests):
> Validate MCFG table.
> Validate MCFG PCI config space.
> method (144 tests):
> - Check Method Names.
> - Check _AEI.
> - Check _DDN (DOS Device Name).
> - Check _HID (Hardware ID).
> - Check _HRV (Hardware Revision Number).
> - Check _PLD (Physical Device Location).
> - Check _SUB (Subsystem ID).
> - Check _SUN (Slot User Number).
> - Check _STR (String).
> - Check _UID (Unique ID).
> - Check _CRS (Current Resource Settings).
> - Check _DIS (Disable).
> - Check _DMA (Direct Memory Access).
> - Check _FIX (Fixed Register Resource Provider).
> - Check _GSB (Global System Interrupt Base).
> - Check _HPP (Hot Plug Parameters).
> - Check _PRS (Possible Resource Settings).
> - Check _PXM (Proximity).
> - Check _EDL (Eject Device List).
> - Check _EJD (Ejection Dependent Device).
> - Check _EJ0 (Eject).
> - Check _EJ1 (Eject).
> - Check _EJ2 (Eject).
> - Check _EJ3 (Eject).
> - Check _EJ4 (Eject).
> - Check _LCK (Lock).
> - Check _RMV (Remove).
> - Check _STA (Status).
> - Check _BDN (BIOS Dock Name).
> - Check _BBN (Base Bus Number).
> - Check _DCK (Dock).
> - Check _INI (Initialize).
> - Check _SEG (Segment).
> - Check _OFF (Set resource off).
> - Check _ON (Set resource on).
> - Check _DSW (Device Sleep Wake).
> - Check _IRC (In Rush Current).
> - Check _PRE (Power Resources for Enumeration).
> - Check _PR0 (Power Resources for D0).
> - Check _PR1 (Power Resources for D1).
> - Check _PR2 (Power Resources for D2).
> - Check _PR3 (Power Resources for D3).
> - Check _PS0 (Power State 0).
> - Check _PS1 (Power State 1).
> - Check _PS2 (Power State 2).
> - Check _PS3 (Power State 3).
> - Check _PSC (Power State Current).
> - Check _PSE (Power State for Enumeration).
> - Check _PSW (Power State Wake).
> - Check _S1D (S1 Device State).
> - Check _S2D (S2 Device State).
> - Check _S3D (S3 Device State).
> - Check _S4D (S4 Device State).
> - Check _S0W (S0 Device Wake State).
> - Check _S1W (S1 Device Wake State).
> - Check _S2W (S2 Device Wake State).
> - Check _S3W (S3 Device Wake State).
> - Check _S4W (S4 Device Wake State).
> - Check _S0_ (S0 System State).
> - Check _S1_ (S1 System State).
> - Check _S2_ (S2 System State).
> - Check _S3_ (S3 System State).
> - Check _S4_ (S4 System State).
> - Check _S5_ (S5 System State).
> - Check _SWS (System Wake Source).
> - Check _PSS (Performance Supported States).
> - Check _CPC (Continuous Performance Control).
> - Check _CSD (C State Dependencies).
> - Check _CST (C States).
> - Check _PCT (Performance Control).
> - Check _PDL (P-State Depth Limit).
> - Check _PPC (Performance Present Capabilities).
> - Check _PPE (Polling for Platform Error).
> - Check _TDL (T-State Depth Limit).
> - Check _TPC (Throttling Present Capabilities).
> - Check _TSD (Throttling State Dependencies).
> - Check _TSS (Throttling Supported States).
> - Check _ALC (Ambient Light Colour Chromaticity).
> - Check _ALI (Ambient Light Illuminance).
> - Check _ALT (Ambient Light Temperature).
> - Check _ALP (Ambient Light Polling).
> - Check _LID (Lid Status).
> - Check _GCP (Get Capabilities).
> - Check _GRT (Get Real Time).
> - Check _GWS (Get Wake Status).
> - Check _STP (Set Expired Timer Wake Policy).
> - Check _STV (Set Timer Value).
> - Check _TIP (Expired Timer Wake Policy).
> - Check _TIV (Timer Values).
> - Check _SBS (Smart Battery Subsystem).
> - Check _BCT (Battery Charge Time).
> - Check _BIF (Battery Information).
> - Check _BIX (Battery Information Extended).
> - Check _BMA (Battery Measurement Averaging).
> - Check _BMC (Battery Maintenance Control).
> - Check _BMD (Battery Maintenance Data).
> - Check _BMS (Battery Measurement Sampling Time).
> - Check _BST (Battery Status).
> - Check _BTP (Battery Trip Point).
> - Check _BTM (Battery Time).
> - Check _PCL (Power Consumer List).
> - Check _PIF (Power Source Information).
> - Check _PSR (Power Source).
> - Check _FIF (Fan Information).
> - Check _FSL (Fan Set Level).
> - Check _FST (Fan Status).
> - Check _ACx (Active Cooling).
> - Check _CRT (Critical Trip Point).
> - Check _DTI (Device Temperature Indication).
> - Check _HOT (Hot Temperature).
> - Check _NTT (Notification Temp Threshold).
> - Check _PSV (Passive Temp).
> - Check _RTV (Relative Temp Values).
> - Check _SCP (Set Cooling Policy).
> - Check _TC1 (Thermal Constant 1).
> - Check _TC2 (Thermal Constant 2).
> - Check _TMP (Thermal Zone Current Temp).
> - Check _TPT (Trip Point Temperature).
> - Check _TSP (Thermal Sampling Period).
> - Check _TST (Temperature Sensor Threshold).
> - Check _TZP (Thermal Zone Polling).
> - Check _PTS (Prepare to Sleep).
> - Check _TTS (Transition to State).
> - Check _S0 (System S0 State).
> - Check _S1 (System S1 State).
> - Check _S2 (System S2 State).
> - Check _S3 (System S3 State).
> - Check _S4 (System S4 State).
> - Check _S5 (System S5 State).
> - Check _WAK (System Wake).
> - Check _ADR (Return Unique ID for Device).
> - Check _BCL (Query List of Brightness Control Levels Supported).
> - Check _BCM (Set Brightness Level).
> - Check _BQC (Brightness Query Current Level).
> - Check _DCS (Return the Status of Output Device).
> - Check _DDC (Return the EDID for this Device).
> - Check _DSS (Device Set State).
> - Check _DGS (Query Graphics State).
> - Check _DOD (Enumerate All Devices Attached to Display Adapter).
> - Check _DOS (Enable/Disable Output Switching).
> - Check _GPD (Get POST Device).
> - Check _ROM (Get ROM Data).
> - Check _SPD (Set POST Device).
> - Check _VPO (Video POST Options).
> + Test Method Names.
> + Test _AEI.
> + Test _DDN (DOS Device Name).
> + Test _HID (Hardware ID).
> + Test _HRV (Hardware Revision Number).
> + Test _PLD (Physical Device Location).
> + Test _SUB (Subsystem ID).
> + Test _SUN (Slot User Number).
> + Test _STR (String).
> + Test _UID (Unique ID).
> + Test _CRS (Current Resource Settings).
> + Test _DIS (Disable).
> + Test _DMA (Direct Memory Access).
> + Test _FIX (Fixed Register Resource Provider).
> + Test _GSB (Global System Interrupt Base).
> + Test _HPP (Hot Plug Parameters).
> + Test _PRS (Possible Resource Settings).
> + Test _PXM (Proximity).
> + Test _EDL (Eject Device List).
> + Test _EJD (Ejection Dependent Device).
> + Test _EJ0 (Eject).
> + Test _EJ1 (Eject).
> + Test _EJ2 (Eject).
> + Test _EJ3 (Eject).
> + Test _EJ4 (Eject).
> + Test _LCK (Lock).
> + Test _RMV (Remove).
> + Test _STA (Status).
> + Test _BDN (BIOS Dock Name).
> + Test _BBN (Base Bus Number).
> + Test _DCK (Dock).
> + Test _INI (Initialize).
> + Test _SEG (Segment).
> + Test _OFF (Set resource off).
> + Test _ON (Set resource on).
> + Test _DSW (Device Sleep Wake).
> + Test _IRC (In Rush Current).
> + Test _PRE (Power Resources for Enumeration).
> + Test _PR0 (Power Resources for D0).
> + Test _PR1 (Power Resources for D1).
> + Test _PR2 (Power Resources for D2).
> + Test _PR3 (Power Resources for D3).
> + Test _PS0 (Power State 0).
> + Test _PS1 (Power State 1).
> + Test _PS2 (Power State 2).
> + Test _PS3 (Power State 3).
> + Test _PSC (Power State Current).
> + Test _PSE (Power State for Enumeration).
> + Test _PSW (Power State Wake).
> + Test _S1D (S1 Device State).
> + Test _S2D (S2 Device State).
> + Test _S3D (S3 Device State).
> + Test _S4D (S4 Device State).
> + Test _S0W (S0 Device Wake State).
> + Test _S1W (S1 Device Wake State).
> + Test _S2W (S2 Device Wake State).
> + Test _S3W (S3 Device Wake State).
> + Test _S4W (S4 Device Wake State).
> + Test _S0_ (S0 System State).
> + Test _S1_ (S1 System State).
> + Test _S2_ (S2 System State).
> + Test _S3_ (S3 System State).
> + Test _S4_ (S4 System State).
> + Test _S5_ (S5 System State).
> + Test _SWS (System Wake Source).
> + Test _PSS (Performance Supported States).
> + Test _CPC (Continuous Performance Control).
> + Test _CSD (C State Dependencies).
> + Test _CST (C States).
> + Test _PCT (Performance Control).
> + Test _PDL (P-State Depth Limit).
> + Test _PPC (Performance Present Capabilities).
> + Test _PPE (Polling for Platform Error).
> + Test _TDL (T-State Depth Limit).
> + Test _TPC (Throttling Present Capabilities).
> + Test _TSD (Throttling State Dependencies).
> + Test _TSS (Throttling Supported States).
> + Test _ALC (Ambient Light Colour Chromaticity).
> + Test _ALI (Ambient Light Illuminance).
> + Test _ALT (Ambient Light Temperature).
> + Test _ALP (Ambient Light Polling).
> + Test _LID (Lid Status).
> + Test _GCP (Get Capabilities).
> + Test _GRT (Get Real Time).
> + Test _GWS (Get Wake Status).
> + Test _STP (Set Expired Timer Wake Policy).
> + Test _STV (Set Timer Value).
> + Test _TIP (Expired Timer Wake Policy).
> + Test _TIV (Timer Values).
> + Test _SBS (Smart Battery Subsystem).
> + Test _BCT (Battery Charge Time).
> + Test _BIF (Battery Information).
> + Test _BIX (Battery Information Extended).
> + Test _BMA (Battery Measurement Averaging).
> + Test _BMC (Battery Maintenance Control).
> + Test _BMD (Battery Maintenance Data).
> + Test _BMS (Battery Measurement Sampling Time).
> + Test _BST (Battery Status).
> + Test _BTP (Battery Trip Point).
> + Test _BTM (Battery Time).
> + Test _PCL (Power Consumer List).
> + Test _PIF (Power Source Information).
> + Test _PSR (Power Source).
> + Test _FIF (Fan Information).
> + Test _FSL (Fan Set Level).
> + Test _FST (Fan Status).
> + Test _ACx (Active Cooling).
> + Test _CRT (Critical Trip Point).
> + Test _DTI (Device Temperature Indication).
> + Test _HOT (Hot Temperature).
> + Test _NTT (Notification Temp Threshold).
> + Test _PSV (Passive Temp).
> + Test _RTV (Relative Temp Values).
> + Test _SCP (Set Cooling Policy).
> + Test _TC1 (Thermal Constant 1).
> + Test _TC2 (Thermal Constant 2).
> + Test _TMP (Thermal Zone Current Temp).
> + Test _TPT (Trip Point Temperature).
> + Test _TSP (Thermal Sampling Period).
> + Test _TST (Temperature Sensor Threshold).
> + Test _TZP (Thermal Zone Polling).
> + Test _PTS (Prepare to Sleep).
> + Test _TTS (Transition to State).
> + Test _S0 (System S0 State).
> + Test _S1 (System S1 State).
> + Test _S2 (System S2 State).
> + Test _S3 (System S3 State).
> + Test _S4 (System S4 State).
> + Test _S5 (System S5 State).
> + Test _WAK (System Wake).
> + Test _ADR (Return Unique ID for Device).
> + Test _BCL (Query List of Brightness Control Levels Supported).
> + Test _BCM (Set Brightness Level).
> + Test _BQC (Brightness Query Current Level).
> + Test _DCS (Return the Status of Output Device).
> + Test _DDC (Return the EDID for this Device).
> + Test _DSS (Device Set State).
> + Test _DGS (Query Graphics State).
> + Test _DOD (Enumerate All Devices Attached to Display Adapter).
> + Test _DOS (Enable/Disable Output Switching).
> + Test _GPD (Get POST Device).
> + Test _ROM (Get ROM Data).
> + Test _SPD (Set POST Device).
> + Test _VPO (Video POST Options).
> microcode (1 test):
> - Check for most recent microcode being loaded.
> + Test for most recent microcode being loaded.
> mpcheck (9 tests):
> - Check MP header.
> - Check MP CPU entries.
> - Check MP Bus entries.
> - Check MP IO APIC entries.
> - Check MP IO Interrupt entries.
> - Check MP Local Interrupt entries.
> - Check MP System Address entries.
> - Check MP Bus Hierarchy entries.
> - Check MP Compatible Bus Address Space entries.
> + Test MP header.
> + Test MP CPU entries.
> + Test MP Bus entries.
> + Test MP IO APIC entries.
> + Test MP IO Interrupt entries.
> + Test MP Local Interrupt entries.
> + Test MP System Address entries.
> + Test MP Bus Hierarchy entries.
> + Test MP Compatible Bus Address Space entries.
> msr (5 tests):
> - Check CPU generic MSRs.
> - Check CPU specific model MSRs.
> - Check all P State Ratios.
> - Check C1 and C3 autodemotion.
> - Check SMRR MSR registers.
> + Test CPU generic MSRs.
> + Test CPU specific model MSRs.
> + Test all P State Ratios.
> + Test C1 and C3 autodemotion.
> + Test SMRR MSR registers.
> mtrr (3 tests):
> Validate the kernel MTRR IOMEM setup.
> Validate the MTRR setup across all processors.
> - Check for AMD MtrrFixDramModEn being cleared by the BIOS.
> + Test for AMD MtrrFixDramModEn being cleared by the BIOS.
> nx (3 tests):
> - Check CPU NX capability.
> - Check all CPUs have same BIOS set NX flag.
> - Check all CPUs have same msr setting in MSR 0x1a0.
> + Test CPU NX capability.
> + Test all CPUs have same BIOS set NX flag.
> + Test all CPUs have same msr setting in MSR 0x1a0.
> oops (1 test):
> Kernel log oops check.
> os2gap (1 test):
> - Check the OS/2 15Mb memory hole is absent.
> + Test the OS/2 15Mb memory hole is absent.
> osilinux (1 test):
> Disassemble DSDT to check for _OSI("Linux").
> pcc (1 test):
> - Check PCCH.
> + Processor Clocking Control (PCC) test.
> pciirq (1 test):
> - PCI IRQ Routing Table.
> + PCI IRQ Routing Table test.
> pnp (1 test):
> - Check PnP BIOS Support Installation structure.
> + PnP BIOS Support Installation structure test.
> securebootcert (1 test):
> Ubuntu UEFI secure boot test.
> syntaxcheck (2 tests):
> @@ -249,14 +249,14 @@ Batch tests:
> Gather kernel boot command line.
> Gather ACPI driver version.
> virt (1 test):
> - Check CPU Virtualisation Configuration.
> + CPU Virtualisation Configuration test.
> wakealarm (4 tests):
> - Check existence of /sys/class/rtc/rtc0/wakealarm.
> + Test existence of /sys/class/rtc/rtc0/wakealarm.
> Trigger wakealarm for 1 seconds in the future.
> - Check if wakealarm is fired.
> + Test if wakealarm is fired.
> Multiple wakealarm firing tests.
> wmi (1 test):
> - Check Windows Management Instrumentation
> + Windows Management Instrumentation test.
>
> Interactive tests:
> ac_adapter (3 tests):
> @@ -264,13 +264,13 @@ Interactive tests:
> Test ac_adapter initial on-line state.
> Test ac_adapter state changes.
> battery (1 test):
> - Check batteries.
> + Battery test.
> brightness (5 tests):
> - Check for maximum and actual brightness.
> + Test for maximum and actual brightness.
> Change actual brightness.
> Observe all brightness changes.
> Observe min, max brightness changes.
> - Check brightness hotkeys.
> + Test brightness hotkeys.
> hotkey (1 test):
> Hotkey keypress checks.
> lid (3 tests):
> @@ -328,7 +328,7 @@ Unsafe tests:
>
> UEFI tests:
> csm (1 test):
> - Check for UEFI Compatibility Support Module.
> + UEFI Compatibility Support Module test.
> securebootcert (1 test):
> Ubuntu UEFI secure boot test.
> uefirtmisc (2 tests):
> diff --git a/checksum-0001/checksum-0001.log b/checksum-0001/checksum-0001.log
> index 4efca9b..d720e06 100644
> --- a/checksum-0001/checksum-0001.log
> +++ b/checksum-0001/checksum-0001.log
> @@ -1,6 +1,6 @@
> -checksum checksum: Check ACPI table checksum.
> +checksum checksum: ACPI table checksum test.
> checksum --------------------------------------------------------------------------------------------------
> -checksum Test 1 of 1: Check ACPI table checksums.
> +checksum Test 1 of 1: ACPI table checksum test.
> checksum PASSED: Test 1, Table DSDT has correct checksum 0x11.
> checksum PASSED: Test 1, Table FACP has correct checksum 0x52.
> checksum PASSED: Test 1, Table APIC has correct checksum 0xcc.
> diff --git a/checksum-0001/checksum-0003.log b/checksum-0001/checksum-0003.log
> index 75925bb..4ab586a 100644
> --- a/checksum-0001/checksum-0003.log
> +++ b/checksum-0001/checksum-0003.log
> @@ -1,6 +1,6 @@
> -checksum checksum: Check ACPI table checksum.
> +checksum checksum: ACPI table checksum test.
> checksum --------------------------------------------------------------------------------------------------
> -checksum Test 1 of 1: Check ACPI table checksums.
> +checksum Test 1 of 1: ACPI table checksum test.
> checksum FAILED [MEDIUM] ACPITableChecksum: Test 1, Table DSDT has incorrect checksum, expected 0x11, got
> checksum 0x10.
> checksum
> diff --git a/checksum-0001/checksum-0004.log b/checksum-0001/checksum-0004.log
> index d092674..f69a42a 100644
> --- a/checksum-0001/checksum-0004.log
> +++ b/checksum-0001/checksum-0004.log
> @@ -1,6 +1,6 @@
> -checksum checksum: Check ACPI table checksum.
> +checksum checksum: ACPI table checksum test.
> checksum --------------------------------------------------------------------------------------------------
> -checksum Test 1 of 1: Check ACPI table checksums.
> +checksum Test 1 of 1: ACPI table checksum test.
> checksum PASSED: Test 1, Table DSDT has correct checksum 0x11.
> checksum FAILED [MEDIUM] ACPITableChecksum: Test 1, Table FACP has incorrect checksum, expected 0x52, got
> checksum 0x53.
> diff --git a/method-0001/method-0001.log b/method-0001/method-0001.log
> index e41aa26..bf2c976 100644
> --- a/method-0001/method-0001.log
> +++ b/method-0001/method-0001.log
> @@ -1,18 +1,18 @@
> -method method: ACPI DSDT Method Semantic Tests.
> +method method: ACPI DSDT Method Semantic tests.
> method ----------------------------------------------------------
> -method Test 1 of 144: Check Method Names.
> +method Test 1 of 144: Test Method Names.
> method Found 1061 Objects
> method PASSED: Test 1, Method names contain legal characters.
> method
> -method Test 2 of 144: Check _AEI.
> +method Test 2 of 144: Test _AEI.
> method SKIPPED: Test 2, Skipping test for non-existant object
> method _AEI.
> method
> -method Test 3 of 144: Check _DDN (DOS Device Name).
> +method Test 3 of 144: Test _DDN (DOS Device Name).
> method SKIPPED: Test 3, Skipping test for non-existant object
> method _DDN.
> method
> -method Test 4 of 144: Check _HID (Hardware ID).
> +method Test 4 of 144: Test _HID (Hardware ID).
> method PASSED: Test 4, \_SB_.AMW0._HID returned a string
> method 'PNP0C14' as expected.
> method PASSED: Test 4, \_SB_.LID0._HID returned an integer
> @@ -66,27 +66,27 @@ method integer 0x0303d041 (EISA ID PNP0303).
> method PASSED: Test 4, \_SB_.PCI0.LPCB.PS2M._HID returned an
> method integer 0x130fd041 (EISA ID PNP0F13).
> method
> -method Test 5 of 144: Check _HRV (Hardware Revision Number).
> +method Test 5 of 144: Test _HRV (Hardware Revision Number).
> method SKIPPED: Test 5, Skipping test for non-existant object
> method _HRV.
> method
> -method Test 6 of 144: Check _PLD (Physical Device Location).
> +method Test 6 of 144: Test _PLD (Physical Device Location).
> method SKIPPED: Test 6, Skipping test for non-existant object
> method _PLD.
> method
> -method Test 7 of 144: Check _SUB (Subsystem ID).
> +method Test 7 of 144: Test _SUB (Subsystem ID).
> method SKIPPED: Test 7, Skipping test for non-existant object
> method _SUB.
> method
> -method Test 8 of 144: Check _SUN (Slot User Number).
> +method Test 8 of 144: Test _SUN (Slot User Number).
> method SKIPPED: Test 8, Skipping test for non-existant object
> method _SUN.
> method
> -method Test 9 of 144: Check _STR (String).
> +method Test 9 of 144: Test _STR (String).
> method SKIPPED: Test 9, Skipping test for non-existant object
> method _STR.
> method
> -method Test 10 of 144: Check _UID (Unique ID).
> +method Test 10 of 144: Test _UID (Unique ID).
> method PASSED: Test 10, \_SB_.AMW0._UID correctly returned sane
> method looking value 0x00000000.
> method PASSED: Test 10, \_SB_.PCI0.PDRC._UID correctly returned
> @@ -112,7 +112,7 @@ method returned sane looking value 0x00000002.
> method PASSED: Test 10, \_SB_.PCI0.LPCB.BAT1._UID correctly
> method returned sane looking value 0x00000001.
> method
> -method Test 11 of 144: Check _CRS (Current Resource Settings).
> +method Test 11 of 144: Test _CRS (Current Resource Settings).
> method PASSED: Test 11, \_SB_.PCI0._CRS (WORD Address Space
> method Descriptor) looks sane.
> method PASSED: Test 11, \_SB_.PCI0.PDRC._CRS (32-bit Fixed
> @@ -156,7 +156,7 @@ method Descriptor) looks sane.
> method PASSED: Test 11, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ
> method Descriptor) looks sane.
> method
> -method Test 12 of 144: Check _DIS (Disable).
> +method Test 12 of 144: Test _DIS (Disable).
> method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKA._DIS returned no
> method values as expected.
> method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKB._DIS returned no
> @@ -174,24 +174,24 @@ method values as expected.
> method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKH._DIS returned no
> method values as expected.
> method
> -method Test 13 of 144: Check _DMA (Direct Memory Access).
> +method Test 13 of 144: Test _DMA (Direct Memory Access).
> method SKIPPED: Test 13, Skipping test for non-existant object
> method _DMA.
> method
> -method Test 14 of 144: Check _FIX (Fixed Register Resource
> +method Test 14 of 144: Test _FIX (Fixed Register Resource
> method Provider).
> method SKIPPED: Test 14, Skipping test for non-existant object
> method _FIX.
> method
> -method Test 15 of 144: Check _GSB (Global System Interrupt Base).
> +method Test 15 of 144: Test _GSB (Global System Interrupt Base).
> method SKIPPED: Test 15, Skipping test for non-existant object
> method _GSB.
> method
> -method Test 16 of 144: Check _HPP (Hot Plug Parameters).
> +method Test 16 of 144: Test _HPP (Hot Plug Parameters).
> method SKIPPED: Test 16, Skipping test for non-existant object
> method _HPP.
> method
> -method Test 17 of 144: Check _PRS (Possible Resource Settings).
> +method Test 17 of 144: Test _PRS (Possible Resource Settings).
> method PASSED: Test 17, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ
> method Descriptor) looks sane.
> method PASSED: Test 17, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ
> @@ -209,47 +209,47 @@ method Descriptor) looks sane.
> method PASSED: Test 17, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ
> method Descriptor) looks sane.
> method
> -method Test 18 of 144: Check _PXM (Proximity).
> +method Test 18 of 144: Test _PXM (Proximity).
> method SKIPPED: Test 18, Skipping test for non-existant object
> method _PXM.
> method
> -method Test 19 of 144: Check _EDL (Eject Device List).
> +method Test 19 of 144: Test _EDL (Eject Device List).
> method SKIPPED: Test 19, Skipping test for non-existant object
> method _EDL.
> method
> -method Test 20 of 144: Check _EJD (Ejection Dependent Device).
> +method Test 20 of 144: Test _EJD (Ejection Dependent Device).
> method SKIPPED: Test 20, Skipping test for non-existant object
> method _EJD.
> method
> -method Test 21 of 144: Check _EJ0 (Eject).
> +method Test 21 of 144: Test _EJ0 (Eject).
> method SKIPPED: Test 21, Skipping test for non-existant object
> method _EJ0.
> method
> -method Test 22 of 144: Check _EJ1 (Eject).
> +method Test 22 of 144: Test _EJ1 (Eject).
> method SKIPPED: Test 22, Skipping test for non-existant object
> method _EJ1.
> method
> -method Test 23 of 144: Check _EJ2 (Eject).
> +method Test 23 of 144: Test _EJ2 (Eject).
> method SKIPPED: Test 23, Skipping test for non-existant object
> method _EJ2.
> method
> -method Test 24 of 144: Check _EJ3 (Eject).
> +method Test 24 of 144: Test _EJ3 (Eject).
> method SKIPPED: Test 24, Skipping test for non-existant object
> method _EJ3.
> method
> -method Test 25 of 144: Check _EJ4 (Eject).
> +method Test 25 of 144: Test _EJ4 (Eject).
> method SKIPPED: Test 25, Skipping test for non-existant object
> method _EJ4.
> method
> -method Test 26 of 144: Check _LCK (Lock).
> +method Test 26 of 144: Test _LCK (Lock).
> method SKIPPED: Test 26, Skipping test for non-existant object
> method _LCK.
> method
> -method Test 27 of 144: Check _RMV (Remove).
> +method Test 27 of 144: Test _RMV (Remove).
> method PASSED: Test 27, \_SB_.PCI0.RP03.PXSX._RMV correctly
> method returned sane looking value 0x00000001.
> method
> -method Test 28 of 144: Check _STA (Status).
> +method Test 28 of 144: Test _STA (Status).
> method PASSED: Test 28, \_SB_.PCI0.PEGP.VGA_._STA correctly
> method returned sane looking value 0x0000000f.
> method PASSED: Test 28, \_SB_.PCI0.LPCB.LNKA._STA correctly
> @@ -273,91 +273,91 @@ method returned sane looking value 0x00000000.
> method PASSED: Test 28, \_SB_.PCI0.LPCB.BAT1._STA correctly
> method returned sane looking value 0x0000001f.
> method
> -method Test 29 of 144: Check _BDN (BIOS Dock Name).
> +method Test 29 of 144: Test _BDN (BIOS Dock Name).
> method SKIPPED: Test 29, Skipping test for non-existant object
> method _BDN.
> method
> -method Test 30 of 144: Check _BBN (Base Bus Number).
> +method Test 30 of 144: Test _BBN (Base Bus Number).
> method SKIPPED: Test 30, Skipping test for non-existant object
> method _BBN.
> method
> -method Test 31 of 144: Check _DCK (Dock).
> +method Test 31 of 144: Test _DCK (Dock).
> method SKIPPED: Test 31, Skipping test for non-existant object
> method _DCK.
> method
> -method Test 32 of 144: Check _INI (Initialize).
> +method Test 32 of 144: Test _INI (Initialize).
> method PASSED: Test 32, \_SB_._INI returned no values as
> method expected.
> method
> -method Test 33 of 144: Check _SEG (Segment).
> +method Test 33 of 144: Test _SEG (Segment).
> method SKIPPED: Test 33, Skipping test for non-existant object
> method _SEG.
> method
> -method Test 34 of 144: Check _OFF (Set resource off).
> +method Test 34 of 144: Test _OFF (Set resource off).
> method SKIPPED: Test 34, Skipping test for non-existant object
> method _OFF.
> method
> -method Test 35 of 144: Check _ON (Set resource on).
> +method Test 35 of 144: Test _ON (Set resource on).
> method SKIPPED: Test 35, Skipping test for non-existant object
> method _ON.
> method
> -method Test 36 of 144: Check _DSW (Device Sleep Wake).
> +method Test 36 of 144: Test _DSW (Device Sleep Wake).
> method SKIPPED: Test 36, Skipping test for non-existant object
> method _DSW.
> method
> -method Test 37 of 144: Check _IRC (In Rush Current).
> +method Test 37 of 144: Test _IRC (In Rush Current).
> method SKIPPED: Test 37, Skipping test for non-existant object
> method _IRC.
> method
> -method Test 38 of 144: Check _PRE (Power Resources for
> +method Test 38 of 144: Test _PRE (Power Resources for
> method Enumeration).
> method SKIPPED: Test 38, Skipping test for non-existant object
> method _PRE.
> method
> -method Test 39 of 144: Check _PR0 (Power Resources for D0).
> +method Test 39 of 144: Test _PR0 (Power Resources for D0).
> method SKIPPED: Test 39, Skipping test for non-existant object
> method _PR0.
> method
> -method Test 40 of 144: Check _PR1 (Power Resources for D1).
> +method Test 40 of 144: Test _PR1 (Power Resources for D1).
> method SKIPPED: Test 40, Skipping test for non-existant object
> method _PR1.
> method
> -method Test 41 of 144: Check _PR2 (Power Resources for D2).
> +method Test 41 of 144: Test _PR2 (Power Resources for D2).
> method SKIPPED: Test 41, Skipping test for non-existant object
> method _PR2.
> method
> -method Test 42 of 144: Check _PR3 (Power Resources for D3).
> +method Test 42 of 144: Test _PR3 (Power Resources for D3).
> method SKIPPED: Test 42, Skipping test for non-existant object
> method _PR3.
> method
> -method Test 43 of 144: Check _PS0 (Power State 0).
> +method Test 43 of 144: Test _PS0 (Power State 0).
> method PASSED: Test 43, \_SB_.PCI0.PEGP.VGA_._PS0 returned no
> method values as expected.
> method PASSED: Test 43, \_PS0 returned no values as expected.
> method
> -method Test 44 of 144: Check _PS1 (Power State 1).
> +method Test 44 of 144: Test _PS1 (Power State 1).
> method PASSED: Test 44, \_SB_.PCI0.PEGP.VGA_._PS1 returned no
> method values as expected.
> method
> -method Test 45 of 144: Check _PS2 (Power State 2).
> +method Test 45 of 144: Test _PS2 (Power State 2).
> method SKIPPED: Test 45, Skipping test for non-existant object
> method _PS2.
> method
> -method Test 46 of 144: Check _PS3 (Power State 3).
> +method Test 46 of 144: Test _PS3 (Power State 3).
> method PASSED: Test 46, \_SB_.PCI0.PEGP.VGA_._PS3 returned no
> method values as expected.
> method PASSED: Test 46, \_PS3 returned no values as expected.
> method
> -method Test 47 of 144: Check _PSC (Power State Current).
> +method Test 47 of 144: Test _PSC (Power State Current).
> method PASSED: Test 47, \_SB_.PCI0.PEGP.VGA_._PSC correctly
> method returned an integer.
> method PASSED: Test 47, \_PSC correctly returned an integer.
> method
> -method Test 48 of 144: Check _PSE (Power State for Enumeration).
> +method Test 48 of 144: Test _PSE (Power State for Enumeration).
> method SKIPPED: Test 48, Skipping test for non-existant object
> method _PSE.
> method
> -method Test 49 of 144: Check _PSW (Power State Wake).
> +method Test 49 of 144: Test _PSW (Power State Wake).
> method PASSED: Test 49, \_SB_.PCI0.USB1._PSW returned no values
> method as expected.
> method PASSED: Test 49, \_SB_.PCI0.USB2._PSW returned no values
> @@ -369,15 +369,15 @@ method as expected.
> method PASSED: Test 49, \_SB_.PCI0.USB5._PSW returned no values
> method as expected.
> method
> -method Test 50 of 144: Check _S1D (S1 Device State).
> +method Test 50 of 144: Test _S1D (S1 Device State).
> method SKIPPED: Test 50, Skipping test for non-existant object
> method _S1D.
> method
> -method Test 51 of 144: Check _S2D (S2 Device State).
> +method Test 51 of 144: Test _S2D (S2 Device State).
> method SKIPPED: Test 51, Skipping test for non-existant object
> method _S2D.
> method
> -method Test 52 of 144: Check _S3D (S3 Device State).
> +method Test 52 of 144: Test _S3D (S3 Device State).
> method PASSED: Test 52, \_SB_.PCI0._S3D correctly returned an
> method integer.
> method PASSED: Test 52, \_SB_.PCI0.USB1._S3D correctly returned
> @@ -395,7 +395,7 @@ method an integer.
> method PASSED: Test 52, \_SB_.PCI0.EHC2._S3D correctly returned
> method an integer.
> method
> -method Test 53 of 144: Check _S4D (S4 Device State).
> +method Test 53 of 144: Test _S4D (S4 Device State).
> method PASSED: Test 53, \_SB_.PCI0._S4D correctly returned an
> method integer.
> method PASSED: Test 53, \_SB_.PCI0.USB1._S4D correctly returned
> @@ -413,115 +413,114 @@ method an integer.
> method PASSED: Test 53, \_SB_.PCI0.EHC2._S4D correctly returned
> method an integer.
> method
> -method Test 54 of 144: Check _S0W (S0 Device Wake State).
> +method Test 54 of 144: Test _S0W (S0 Device Wake State).
> method SKIPPED: Test 54, Skipping test for non-existant object
> method _S0W.
> method
> -method Test 55 of 144: Check _S1W (S1 Device Wake State).
> +method Test 55 of 144: Test _S1W (S1 Device Wake State).
> method SKIPPED: Test 55, Skipping test for non-existant object
> method _S1W.
> method
> -method Test 56 of 144: Check _S2W (S2 Device Wake State).
> +method Test 56 of 144: Test _S2W (S2 Device Wake State).
> method SKIPPED: Test 56, Skipping test for non-existant object
> method _S2W.
> method
> -method Test 57 of 144: Check _S3W (S3 Device Wake State).
> +method Test 57 of 144: Test _S3W (S3 Device Wake State).
> method SKIPPED: Test 57, Skipping test for non-existant object
> method _S3W.
> method
> -method Test 58 of 144: Check _S4W (S4 Device Wake State).
> +method Test 58 of 144: Test _S4W (S4 Device Wake State).
> method SKIPPED: Test 58, Skipping test for non-existant object
> method _S4W.
> method
> -method Test 59 of 144: Check _S0_ (S0 System State).
> +method Test 59 of 144: Test _S0_ (S0 System State).
> method \_S0_ PM1a_CNT.SLP_TYP value: 0x00000000
> method \_S0_ PM1b_CNT.SLP_TYP value: 0x00000000
> method PASSED: Test 59, \_S0_ correctly returned a sane looking
> method package.
> method
> -method Test 60 of 144: Check _S1_ (S1 System State).
> +method Test 60 of 144: Test _S1_ (S1 System State).
> method SKIPPED: Test 60, Skipping test for non-existant object
> method _S1_.
> method
> -method Test 61 of 144: Check _S2_ (S2 System State).
> +method Test 61 of 144: Test _S2_ (S2 System State).
> method SKIPPED: Test 61, Skipping test for non-existant object
> method _S2_.
> method
> -method Test 62 of 144: Check _S3_ (S3 System State).
> +method Test 62 of 144: Test _S3_ (S3 System State).
> method \_S3_ PM1a_CNT.SLP_TYP value: 0x00000005
> method \_S3_ PM1b_CNT.SLP_TYP value: 0x00000005
> method PASSED: Test 62, \_S3_ correctly returned a sane looking
> method package.
> method
> -method Test 63 of 144: Check _S4_ (S4 System State).
> +method Test 63 of 144: Test _S4_ (S4 System State).
> method \_S4_ PM1a_CNT.SLP_TYP value: 0x00000006
> method \_S4_ PM1b_CNT.SLP_TYP value: 0x00000006
> method PASSED: Test 63, \_S4_ correctly returned a sane looking
> method package.
> method
> -method Test 64 of 144: Check _S5_ (S5 System State).
> +method Test 64 of 144: Test _S5_ (S5 System State).
> method \_S5_ PM1a_CNT.SLP_TYP value: 0x00000007
> method \_S5_ PM1b_CNT.SLP_TYP value: 0x00000007
> method PASSED: Test 64, \_S5_ correctly returned a sane looking
> method package.
> method
> -method Test 65 of 144: Check _SWS (System Wake Source).
> +method Test 65 of 144: Test _SWS (System Wake Source).
> method SKIPPED: Test 65, Skipping test for non-existant object
> method _SWS.
> method
> -method Test 66 of 144: Check _PSS (Performance Supported States).
> +method Test 66 of 144: Test _PSS (Performance Supported States).
> method SKIPPED: Test 66, Skipping test for non-existant object
> method _PSS.
> method
> -method Test 67 of 144: Check _CPC (Continuous Performance
> +method Test 67 of 144: Test _CPC (Continuous Performance
> method Control).
> method SKIPPED: Test 67, Skipping test for non-existant object
> method _CPC.
> method
> -method Test 68 of 144: Check _CSD (C State Dependencies).
> +method Test 68 of 144: Test _CSD (C State Dependencies).
> method SKIPPED: Test 68, Skipping test for non-existant object
> method _CSD.
> method
> -method Test 69 of 144: Check _CST (C States).
> +method Test 69 of 144: Test _CST (C States).
> method SKIPPED: Test 69, Skipping test for non-existant object
> method _CST.
> method
> -method Test 70 of 144: Check _PCT (Performance Control).
> +method Test 70 of 144: Test _PCT (Performance Control).
> method SKIPPED: Test 70, Skipping test for non-existant object
> method _PCT.
> method
> -method Test 71 of 144: Check _PDL (P-State Depth Limit).
> +method Test 71 of 144: Test _PDL (P-State Depth Limit).
> method SKIPPED: Test 71, Skipping test for non-existant object
> method _PDL.
> method
> -method Test 72 of 144: Check _PPC (Performance Present
> +method Test 72 of 144: Test _PPC (Performance Present
> method Capabilities).
> method SKIPPED: Test 72, Skipping test for non-existant object
> method _PPC.
> method
> -method Test 73 of 144: Check _PPE (Polling for Platform Error).
> +method Test 73 of 144: Test _PPE (Polling for Platform Error).
> method SKIPPED: Test 73, Skipping test for non-existant object
> method _PPE.
> method
> -method Test 74 of 144: Check _TDL (T-State Depth Limit).
> +method Test 74 of 144: Test _TDL (T-State Depth Limit).
> method SKIPPED: Test 74, Skipping test for non-existant object
> method _TDL.
> method
> -method Test 75 of 144: Check _TPC (Throttling Present
> +method Test 75 of 144: Test _TPC (Throttling Present
> method Capabilities).
> method PASSED: Test 75, \_PR_.CPU0._TPC correctly returned an
> method integer.
> method PASSED: Test 75, \_PR_.CPU1._TPC correctly returned an
> method integer.
> method
> -method Test 76 of 144: Check _TSD (Throttling State
> -method Dependencies).
> +method Test 76 of 144: Test _TSD (Throttling State Dependencies).
> method PASSED: Test 76, \_PR_.CPU0._TSD correctly returned a sane
> method looking package.
> method PASSED: Test 76, \_PR_.CPU1._TSD correctly returned a sane
> method looking package.
> method
> -method Test 77 of 144: Check _TSS (Throttling Supported States).
> +method Test 77 of 144: Test _TSS (Throttling Supported States).
> method \_PR_.CPU0._TSS values:
> method T-State CPU Power Latency Control Status
> method Freq (mW) (usecs)
> @@ -549,125 +548,123 @@ method 7 13% 125 0 09 00
> method PASSED: Test 77, \_PR_.CPU1._TSS correctly returned a sane
> method looking package.
> method
> -method Test 78 of 144: Check _ALC (Ambient Light Colour
> +method Test 78 of 144: Test _ALC (Ambient Light Colour
> method Chromaticity).
> method SKIPPED: Test 78, Skipping test for non-existant object
> method _ALC.
> method
> -method Test 79 of 144: Check _ALI (Ambient Light Illuminance).
> +method Test 79 of 144: Test _ALI (Ambient Light Illuminance).
> method SKIPPED: Test 79, Skipping test for non-existant object
> method _ALI.
> method
> -method Test 80 of 144: Check _ALT (Ambient Light Temperature).
> +method Test 80 of 144: Test _ALT (Ambient Light Temperature).
> method SKIPPED: Test 80, Skipping test for non-existant object
> method _ALT.
> method
> -method Test 81 of 144: Check _ALP (Ambient Light Polling).
> +method Test 81 of 144: Test _ALP (Ambient Light Polling).
> method SKIPPED: Test 81, Skipping test for non-existant object
> method _ALP.
> method
> -method Test 82 of 144: Check _LID (Lid Status).
> +method Test 82 of 144: Test _LID (Lid Status).
> method PASSED: Test 82, \_SB_.LID0._LID correctly returned sane
> method looking value 0x00000000.
> method
> -method Test 83 of 144: Check _GCP (Get Capabilities).
> +method Test 83 of 144: Test _GCP (Get Capabilities).
> method SKIPPED: Test 83, Skipping test for non-existant object
> method _GCP.
> method
> -method Test 84 of 144: Check _GRT (Get Real Time).
> +method Test 84 of 144: Test _GRT (Get Real Time).
> method SKIPPED: Test 84, Skipping test for non-existant object
> method _GRT.
> method
> -method Test 85 of 144: Check _GWS (Get Wake Status).
> +method Test 85 of 144: Test _GWS (Get Wake Status).
> method SKIPPED: Test 85, Skipping test for non-existant object
> method _GWS.
> method
> -method Test 86 of 144: Check _STP (Set Expired Timer Wake
> -method Policy).
> +method Test 86 of 144: Test _STP (Set Expired Timer Wake Policy).
> method SKIPPED: Test 86, Skipping test for non-existant object
> method _STP.
> method
> -method Test 87 of 144: Check _STV (Set Timer Value).
> +method Test 87 of 144: Test _STV (Set Timer Value).
> method SKIPPED: Test 87, Skipping test for non-existant object
> method _STV.
> method
> -method Test 88 of 144: Check _TIP (Expired Timer Wake Policy).
> +method Test 88 of 144: Test _TIP (Expired Timer Wake Policy).
> method SKIPPED: Test 88, Skipping test for non-existant object
> method _TIP.
> method
> -method Test 89 of 144: Check _TIV (Timer Values).
> +method Test 89 of 144: Test _TIV (Timer Values).
> method SKIPPED: Test 89, Skipping test for non-existant object
> method _TIV.
> method
> -method Test 90 of 144: Check _SBS (Smart Battery Subsystem).
> +method Test 90 of 144: Test _SBS (Smart Battery Subsystem).
> method SKIPPED: Test 90, Skipping test for non-existant object
> method _SBS.
> method
> -method Test 91 of 144: Check _BCT (Battery Charge Time).
> +method Test 91 of 144: Test _BCT (Battery Charge Time).
> method SKIPPED: Test 91, Skipping test for non-existant object
> method _BCT.
> method
> -method Test 92 of 144: Check _BIF (Battery Information).
> +method Test 92 of 144: Test _BIF (Battery Information).
> method PASSED: Test 92, \_SB_.PCI0.LPCB.BAT1._BIF correctly
> method returned a sane looking package.
> method
> -method Test 93 of 144: Check _BIX (Battery Information Extended).
> +method Test 93 of 144: Test _BIX (Battery Information Extended).
> method SKIPPED: Test 93, Skipping test for non-existant object
> method _BIX.
> method
> -method Test 94 of 144: Check _BMA (Battery Measurement
> -method Averaging).
> +method Test 94 of 144: Test _BMA (Battery Measurement Averaging).
> method SKIPPED: Test 94, Skipping test for non-existant object
> method _BMA.
> method
> -method Test 95 of 144: Check _BMC (Battery Maintenance Control).
> +method Test 95 of 144: Test _BMC (Battery Maintenance Control).
> method SKIPPED: Test 95, Skipping test for non-existant object
> method _BMC.
> method
> -method Test 96 of 144: Check _BMD (Battery Maintenance Data).
> +method Test 96 of 144: Test _BMD (Battery Maintenance Data).
> method SKIPPED: Test 96, Skipping test for non-existant object
> method _BMD.
> method
> -method Test 97 of 144: Check _BMS (Battery Measurement Sampling
> +method Test 97 of 144: Test _BMS (Battery Measurement Sampling
> method Time).
> method SKIPPED: Test 97, Skipping test for non-existant object
> method _BMS.
> method
> -method Test 98 of 144: Check _BST (Battery Status).
> +method Test 98 of 144: Test _BST (Battery Status).
> method PASSED: Test 98, \_SB_.PCI0.LPCB.BAT1._BST correctly
> method returned a sane looking package.
> method
> -method Test 99 of 144: Check _BTP (Battery Trip Point).
> +method Test 99 of 144: Test _BTP (Battery Trip Point).
> method SKIPPED: Test 99, Skipping test for non-existant object
> method _BTP.
> method
> -method Test 100 of 144: Check _BTM (Battery Time).
> +method Test 100 of 144: Test _BTM (Battery Time).
> method SKIPPED: Test 100, Skipping test for non-existant object
> method _BTM.
> method
> -method Test 101 of 144: Check _PCL (Power Consumer List).
> +method Test 101 of 144: Test _PCL (Power Consumer List).
> method
> -method Test 102 of 144: Check _PIF (Power Source Information).
> +method Test 102 of 144: Test _PIF (Power Source Information).
> method SKIPPED: Test 102, Skipping test for non-existant object
> method _PIF.
> method
> -method Test 103 of 144: Check _PSR (Power Source).
> +method Test 103 of 144: Test _PSR (Power Source).
> method PASSED: Test 103, \_SB_.PCI0.LPCB.ACAD._PSR correctly
> method returned sane looking value 0x00000000.
> method
> -method Test 104 of 144: Check _FIF (Fan Information).
> +method Test 104 of 144: Test _FIF (Fan Information).
> method SKIPPED: Test 104, Skipping test for non-existant object
> method _FIF.
> method
> -method Test 105 of 144: Check _FSL (Fan Set Level).
> +method Test 105 of 144: Test _FSL (Fan Set Level).
> method SKIPPED: Test 105, Skipping test for non-existant object
> method _FSL.
> method
> -method Test 106 of 144: Check _FST (Fan Status).
> +method Test 106 of 144: Test _FST (Fan Status).
> method SKIPPED: Test 106, Skipping test for non-existant object
> method _FST.
> method
> -method Test 107 of 144: Check _ACx (Active Cooling).
> +method Test 107 of 144: Test _ACx (Active Cooling).
> method PASSED: Test 107, \_SB_.PCI0.LPCB.EC0_.BAC0 correctly
> method returned a sane looking return type.
> method
> @@ -699,65 +696,64 @@ method SKIPPED: Test 107, Skipping test for non-existant object
> method AC9.
> method
> method
> -method Test 108 of 144: Check _CRT (Critical Trip Point).
> +method Test 108 of 144: Test _CRT (Critical Trip Point).
> method SKIPPED: Test 108, Skipping test for non-existant object
> method _CRT.
> method
> -method Test 109 of 144: Check _DTI (Device Temperature
> +method Test 109 of 144: Test _DTI (Device Temperature
> method Indication).
> method SKIPPED: Test 109, Skipping test for non-existant object
> method _DTI.
> method
> -method Test 110 of 144: Check _HOT (Hot Temperature).
> +method Test 110 of 144: Test _HOT (Hot Temperature).
> method SKIPPED: Test 110, Skipping test for non-existant object
> method _HOT.
> method
> -method Test 111 of 144: Check _NTT (Notification Temp Threshold).
> +method Test 111 of 144: Test _NTT (Notification Temp Threshold).
> method SKIPPED: Test 111, Skipping test for non-existant object
> method _NTT.
> method
> -method Test 112 of 144: Check _PSV (Passive Temp).
> +method Test 112 of 144: Test _PSV (Passive Temp).
> method SKIPPED: Test 112, Skipping test for non-existant object
> method _PSV.
> method
> -method Test 113 of 144: Check _RTV (Relative Temp Values).
> +method Test 113 of 144: Test _RTV (Relative Temp Values).
> method SKIPPED: Test 113, Skipping test for non-existant object
> method _RTV.
> method
> -method Test 114 of 144: Check _SCP (Set Cooling Policy).
> +method Test 114 of 144: Test _SCP (Set Cooling Policy).
> method SKIPPED: Test 114, Skipping test for non-existant object
> method _DTI.
> method
> -method Test 115 of 144: Check _TC1 (Thermal Constant 1).
> +method Test 115 of 144: Test _TC1 (Thermal Constant 1).
> method SKIPPED: Test 115, Skipping test for non-existant object
> method _TC1.
> method
> -method Test 116 of 144: Check _TC2 (Thermal Constant 2).
> +method Test 116 of 144: Test _TC2 (Thermal Constant 2).
> method SKIPPED: Test 116, Skipping test for non-existant object
> method _TC2.
> method
> -method Test 117 of 144: Check _TMP (Thermal Zone Current Temp).
> +method Test 117 of 144: Test _TMP (Thermal Zone Current Temp).
> method SKIPPED: Test 117, Skipping test for non-existant object
> method _TMP.
> method
> -method Test 118 of 144: Check _TPT (Trip Point Temperature).
> +method Test 118 of 144: Test _TPT (Trip Point Temperature).
> method SKIPPED: Test 118, Skipping test for non-existant object
> method _TPT.
> method
> -method Test 119 of 144: Check _TSP (Thermal Sampling Period).
> +method Test 119 of 144: Test _TSP (Thermal Sampling Period).
> method SKIPPED: Test 119, Skipping test for non-existant object
> method _TSP.
> method
> -method Test 120 of 144: Check _TST (Temperature Sensor
> -method Threshold).
> +method Test 120 of 144: Test _TST (Temperature Sensor Threshold).
> method SKIPPED: Test 120, Skipping test for non-existant object
> method _TST.
> method
> -method Test 121 of 144: Check _TZP (Thermal Zone Polling).
> +method Test 121 of 144: Test _TZP (Thermal Zone Polling).
> method SKIPPED: Test 121, Skipping test for non-existant object
> method _TZP.
> method
> -method Test 122 of 144: Check _PTS (Prepare to Sleep).
> +method Test 122 of 144: Test _PTS (Prepare to Sleep).
> method Test _PTS(1).
> method PASSED: Test 122, \_PTS returned no values as expected.
> method
> @@ -774,35 +770,35 @@ method Test _PTS(5).
> method PASSED: Test 122, \_PTS returned no values as expected.
> method
> method
> -method Test 123 of 144: Check _TTS (Transition to State).
> +method Test 123 of 144: Test _TTS (Transition to State).
> method SKIPPED: Test 123, Optional control method _TTS does not
> method exist.
> method
> -method Test 124 of 144: Check _S0 (System S0 State).
> +method Test 124 of 144: Test _S0 (System S0 State).
> method SKIPPED: Test 124, Skipping test for non-existant object
> method _S0.
> method
> -method Test 125 of 144: Check _S1 (System S1 State).
> +method Test 125 of 144: Test _S1 (System S1 State).
> method SKIPPED: Test 125, Skipping test for non-existant object
> method _S1.
> method
> -method Test 126 of 144: Check _S2 (System S2 State).
> +method Test 126 of 144: Test _S2 (System S2 State).
> method SKIPPED: Test 126, Skipping test for non-existant object
> method _S2.
> method
> -method Test 127 of 144: Check _S3 (System S3 State).
> +method Test 127 of 144: Test _S3 (System S3 State).
> method SKIPPED: Test 127, Skipping test for non-existant object
> method _S3.
> method
> -method Test 128 of 144: Check _S4 (System S4 State).
> +method Test 128 of 144: Test _S4 (System S4 State).
> method SKIPPED: Test 128, Skipping test for non-existant object
> method _S4.
> method
> -method Test 129 of 144: Check _S5 (System S5 State).
> +method Test 129 of 144: Test _S5 (System S5 State).
> method SKIPPED: Test 129, Skipping test for non-existant object
> method _S5.
> method
> -method Test 130 of 144: Check _WAK (System Wake).
> +method Test 130 of 144: Test _WAK (System Wake).
> method Test _WAK(1) System Wake, State S1.
> method PASSED: Test 130, \_WAK correctly returned a sane looking
> method package.
> @@ -824,7 +820,7 @@ method PASSED: Test 130, \_WAK correctly returned a sane looking
> method package.
> method
> method
> -method Test 131 of 144: Check _ADR (Return Unique ID for Device).
> +method Test 131 of 144: Test _ADR (Return Unique ID for Device).
> method PASSED: Test 131, \_SB_.PCI0.MCHC._ADR correctly returned
> method an integer.
> method PASSED: Test 131, \_SB_.PCI0.PEGP._ADR correctly returned
> @@ -936,7 +932,7 @@ method returned an integer.
> method PASSED: Test 131, \_SB_.PCI0.SBUS._ADR correctly returned
> method an integer.
> method
> -method Test 132 of 144: Check _BCL (Query List of Brightness
> +method Test 132 of 144: Test _BCL (Query List of Brightness
> method Control Levels Supported).
> method Brightness levels for \_SB_.PCI0.PEGP.VGA_.LCD_._BCL:
> method Level on full power : 70
> @@ -951,20 +947,20 @@ method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70
> method PASSED: Test 132, \_SB_.PCI0.GFX0.DD03._BCL returned a
> method sane package of 10 integers.
> method
> -method Test 133 of 144: Check _BCM (Set Brightness Level).
> +method Test 133 of 144: Test _BCM (Set Brightness Level).
> method PASSED: Test 133, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned
> method no values as expected.
> method PASSED: Test 133, \_SB_.PCI0.GFX0.DD03._BCM returned no
> method values as expected.
> method
> -method Test 134 of 144: Check _BQC (Brightness Query Current
> +method Test 134 of 144: Test _BQC (Brightness Query Current
> method Level).
> method PASSED: Test 134, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly
> method returned an integer.
> method PASSED: Test 134, \_SB_.PCI0.GFX0.DD03._BQC correctly
> method returned an integer.
> method
> -method Test 135 of 144: Check _DCS (Return the Status of Output
> +method Test 135 of 144: Test _DCS (Return the Status of Output
> method Device).
> method PASSED: Test 135, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly
> method returned an integer.
> @@ -983,12 +979,12 @@ method returned an integer.
> method PASSED: Test 135, \_SB_.PCI0.GFX0.DD05._DCS correctly
> method returned an integer.
> method
> -method Test 136 of 144: Check _DDC (Return the EDID for this
> +method Test 136 of 144: Test _DDC (Return the EDID for this
> method Device).
> method SKIPPED: Test 136, Skipping test for non-existant object
> method _DDC.
> method
> -method Test 137 of 144: Check _DSS (Device Set State).
> +method Test 137 of 144: Test _DSS (Device Set State).
> method PASSED: Test 137, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned
> method no values as expected.
> method PASSED: Test 137, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned
> @@ -1006,7 +1002,7 @@ method values as expected.
> method PASSED: Test 137, \_SB_.PCI0.GFX0.DD05._DSS returned no
> method values as expected.
> method
> -method Test 138 of 144: Check _DGS (Query Graphics State).
> +method Test 138 of 144: Test _DGS (Query Graphics State).
> method PASSED: Test 138, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly
> method returned an integer.
> method PASSED: Test 138, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly
> @@ -1024,8 +1020,8 @@ method returned an integer.
> method PASSED: Test 138, \_SB_.PCI0.GFX0.DD05._DGS correctly
> method returned an integer.
> method
> -method Test 139 of 144: Check _DOD (Enumerate All Devices
> -method Attached to Display Adapter).
> +method Test 139 of 144: Test _DOD (Enumerate All Devices Attached
> +method to Display Adapter).
> method Device 0:
> method Instance: 0
> method Display port attachment: 0
> @@ -1059,26 +1055,26 @@ method Head or pipe ID: 0
> method PASSED: Test 139, \_SB_.PCI0.GFX0._DOD correctly returned
> method a sane looking package.
> method
> -method Test 140 of 144: Check _DOS (Enable/Disable Output
> +method Test 140 of 144: Test _DOS (Enable/Disable Output
> method Switching).
> method PASSED: Test 140, \_SB_.PCI0.PEGP.VGA_._DOS returned no
> method values as expected.
> method PASSED: Test 140, \_SB_.PCI0.GFX0._DOS returned no values
> method as expected.
> method
> -method Test 141 of 144: Check _GPD (Get POST Device).
> +method Test 141 of 144: Test _GPD (Get POST Device).
> method SKIPPED: Test 141, Skipping test for non-existant object
> method _GPD.
> method
> -method Test 142 of 144: Check _ROM (Get ROM Data).
> +method Test 142 of 144: Test _ROM (Get ROM Data).
> method SKIPPED: Test 142, Skipping test for non-existant object
> method _ROM.
> method
> -method Test 143 of 144: Check _SPD (Set POST Device).
> +method Test 143 of 144: Test _SPD (Set POST Device).
> method SKIPPED: Test 143, Skipping test for non-existant object
> method _SPD.
> method
> -method Test 144 of 144: Check _VPO (Video POST Options).
> +method Test 144 of 144: Test _VPO (Video POST Options).
> method SKIPPED: Test 144, Skipping test for non-existant object
> method _VPO.
> method
> diff --git a/wmi-0001/wmi-0001.log b/wmi-0001/wmi-0001.log
> index 0540ba3..aca6243 100644
> --- a/wmi-0001/wmi-0001.log
> +++ b/wmi-0001/wmi-0001.log
> @@ -1,7 +1,7 @@
> wmi wmi: Extract and analyse Windows Management
> wmi Instrumentation (WMI).
> wmi ----------------------------------------------------------
> -wmi Test 1 of 1: Check Windows Management Instrumentation
> +wmi Test 1 of 1: Windows Management Instrumentation test.
> wmi
> wmi \_SB_.WMI1._WDG (1 of 9)
> wmi GUID: 51F5230E-9677-46CD-A1CF-C0B23EE34DB7
> diff --git a/wmi-0001/wmi-0002.log b/wmi-0001/wmi-0002.log
> index ab5b704..1732e65 100644
> --- a/wmi-0001/wmi-0002.log
> +++ b/wmi-0001/wmi-0002.log
> @@ -1,7 +1,7 @@
> wmi wmi: Extract and analyse Windows Management
> wmi Instrumentation (WMI).
> wmi ----------------------------------------------------------
> -wmi Test 1 of 1: Check Windows Management Instrumentation
> +wmi Test 1 of 1: Windows Management Instrumentation test.
> wmi
> wmi \_SB_.ATKD._WDG (1 of 2)
> wmi GUID: 97845ED0-4E6D-11DE-8A39-0800200C9A66
> diff --git a/wmi-0001/wmi-0003.log b/wmi-0001/wmi-0003.log
> index 5f4084d..f1e9aa3 100644
> --- a/wmi-0001/wmi-0003.log
> +++ b/wmi-0001/wmi-0003.log
> @@ -1,7 +1,7 @@
> wmi wmi: Extract and analyse Windows Management
> wmi Instrumentation (WMI).
> wmi ----------------------------------------------------------
> -wmi Test 1 of 1: Check Windows Management Instrumentation
> +wmi Test 1 of 1: Windows Management Instrumentation test.
> wmi
> wmi \_SB_.AMW0._WDG (1 of 6)
> wmi GUID: 8D9DDCBC-A997-11DA-B012-B622A1EF5492
>
Acked-by: Ivan Hu <ivan.hu at canonical.com>
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